IOR IRF130 User Manual
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PD - 90333F
IRF130
REPETITIVE A V ALANCHE AND dv/dt RA TED JANTX2N6756
HEXFETTRANSISTORS
THRU-HOLE (TO-204AA/AE)
Product Summary
Part Number BVDSS RDS(on) ID
IRF130 100V 0.18Ω 14A
The HEXFETtechnology is the key to International
Rectifier’s advanced line of power MOSFET transistors.
The efficient geometry and unique processing of this latest
“State of the Art” design achieves: very low on-state resistance combined with high transconductance; superior reverse energy and diode recovery dv/dt capability.
The HEXFET transistors also feature all of the well established advantages of MOSFETs such as voltage control,
very fast switching, ease of paralleling and temperature
stability of the electrical parameters.
They are well suited for applications such as switching
power supplies, motor controls, inverters, choppers, audio
amplifiers and high energy pulse circuits.
100V, N-CHANNEL
[REF:MIL-PRF-19500/542]
Features:
n Repetitive Avalanche Ratings
n Dynamic dv/dt Rating
n Hermetically Sealed
n Simple Drive Requirements
n Ease of Paralleling
JANTXV2N6756
TO-3
Absolute Maximum Ratings
Parameter Units
ID @ VGS =0V, TC = 25°C Continuous Drain Current 1 4
ID @ VGS = 0V, TC = 100°C Continuous Drain Current 9. 0
I
DM
PD @ TC = 25°C Max. Power Dissipation 7 5 W
V
GS
E
AS
I
AR
E
AR
dv/dt Peak Diode Recovery dv/dt ➂ 5.5
T
J
T
STG
For footnotes refer to the last page
Pulsed Drain Current ➀ 56
Linear Derating Factor 0.60 W/°C
Gate-to-Source Voltage ±20 V
Single Pulse Avalanche Energy ➁ 75 mJ
Avalanche Current ➀ 14 A
Repetitive Avalanche Energy ➀ 7.5 mJ
Operating Junction -55 to 150
Storage Temperature Range
Lead Temperature 300 (0.063 in. (1.6mm) from case for 10s)
Weight 11.5(typical) g
www.irf.com 1
A
V/ns
o
C
01/22/01
IRF130
Electrical Characteristics @ Tj = 25°C (Unless Otherwise Specified)
Parameter Min Typ Max Units Test Conditions
BV
∆BV
R
V
g
I
I
I
Q
Q
Q
t
t
t
t
L
C
C
C
DSS
GSS
GSS
d(on)
r
d(off)
f
DSS
DSS
DS(on)
GS(th)
fs
g
gs
gd
S + LD
iss
oss
rss
Drain-to-Source Breakdown Voltage 10 0 — — V VGS = 0V, ID = 1.0mA
/∆TJTemperature Coefficient of Breakdown — 0.13 — V/°C Reference to 25°C, ID = 1.0mA
Voltage
Static Drain-to-Source On-State — — 0.18 VGS = 10V, ID = 9.0A➃
Resistance — — 0.21 VGS = 10V, ID =14A➃
Gate Threshold Voltage 2. 0 — 4.0 V VDS = VGS, ID =250µA
Forward Transconductance 4 .6 — — S ( )VDS > 15V, IDS = 9.0A➃
Zero Gate Voltage Drain Current — — 2 5 VDS=80V , VGS=0V
— — 250 VDS = 80V
Gate-to-Source Leakage Forward — — 10 0 VGS = 20V
Gate-to-Source Leakage Reverse — — -100 VGS = -20V
Total Gate Charge 1 2 — 3 5 VGS =10V, ID=14A
Gate-to-Source Charge 2. 5 — 1 0 n C VDS = 50V
Gate-to-Drain (‘Miller’) Charge 5. 0 — 1 5
Turn-On Delay Time — — 35 VDD =50V, ID =14A,
Rise Time — — 8 0 RG =7.5Ω
Turn-Off Delay Time — — 60
Fall Time — — 45
Total Inductance — 6 .1 —
Input Capacitance — 6 50 VGS = 0V, VDS = 25V
Output Capacitance — 25 0 — pF f = 1.0MHz
Reverse Transfer Capacitance — 4 4 —
Ω
Ω
µA
nA
ns
nH
VGS = 0V, TJ = 125°C
Measured from drain lead (6mm/0.25in. from
package) to source lead (6mm/0.25in. from
package)
Source-Drain Diode Ratings and Characteristics
Parameter Min Typ Max Units Test Conditions
I
Continuous Source Current (Body Diode) — — 1 4
S
I
Pulse Source Current (Body Diode) ➀ —— 56
SM
V
Diode Forward Voltage — — 1. 5 V Tj = 25°C, IS = 14A, VGS = 0V ➃
SD
t
Reverse Recovery Time — — 300 nS Tj = 25°C, IF = 14A, di/dt ≤ 100A/µs
rr
Q
Reverse Recovery Charge — — 3. 0 µC VDD ≤ 50V ➃
RR
t
Forward Turn-On Time Intrinsic turn-on time is negligible. Turn-on speed is substantially controlled by L
on
A
S
Thermal Resistance
Parameter Min Typ Max Units Test Conditions
R
thJC
R
thJA
For footnotes refer to the last page
2 www.irf.com
Junction to Case — — 1.67
Junction to Ambient — — 30 Typical socket mount
°C/W
+ LD.
IRF130
Fig 2. Typical Output CharacteristicsFig 1. Typical Output Characteristics
Fig 3. Typical Transfer Characteristics
Fig 4. Normalized On-Resistance
Vs. Temperature
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