IOR IRF034 User Manual

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PD - 90585
REPETITIVE A V ALANCHE AND dv/dt RA TED IRF034
HEXFETTRANSISTORS
60V, N-CHANNEL
THRU-HOLE (TO-204AA/AE)
Product Summary
Part Number BVDSS RDS(on) ID
IRF034 60V 0.050Ω 25Α
The HEXFETtechnology is the key to International Rectifier’s advanced line of power MOSFET transistors.
The efficient geometry and unique processing of this latest “State of the Art” design achieves: very low on-state resis­tance combined with high transconductance; superior re­verse energy and diode recovery dv/dt capability.
The HEXFET transistors also feature all of the well estab­lished advantages of MOSFETs such as voltage control, very fast switching, ease of paralleling and temperature stability of the electrical parameters.
They are well suited for applications such as switching power supplies, motor controls, inverters, choppers, audio amplifiers and high energy pulse circuits.
Features:
n Repetitive Avalanche Ratings n Dynamic dv/dt Rating n Hermetically Sealed n Simple Drive Requirements n Ease of Paralleling
TO-3
Absolute Maximum Ratings
Parameter Units
ID @ VGS = 0V, TC = 25°C Continuous Drain Current 2 5
ID @ VGS = 0V, TC = 100°C Continuous Drain Current 1 6
I
DM
PD @ TC = 25°C Max. Power Dissipation 75 W
V
GS
E
AS
I
AR
E
AR
dv/dt Peak Diode Recovery dv/dt 4.5
T
J
T
STG
For footnotes refer to the last page
Pulsed Drain Current 100
Linear Derating Factor 0.60 W/°C Gate-to-Source Voltage ±20 V Single Pulse Avalanche Energy 19 mJ Avalanche Current -A Repetitive Avalanche Energy -mJ
Operating Junction -55 to 150 Storage Temperature Range Lead Temperature 300 (0.063 in. (1.6mm) from case for 10s) Weight 11.5(typical) g
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A
V/ns
o
C
01/23/01
IRF034
Electrical Characteristics @ Tj = 25°C (Unless Otherwise Specified)
Parameter Min Typ Max Units Test Conditions
BV BV
V g I
I I Q Q Q t t t
t
L
DSS
GSS
GSS
d(on)
r
d(off)
f
DSS
DSS
DS(on)
GS(th)
fs
g gs
gd
S + LD
iss oss rss
Drain-to-Source Breakdown Voltage 6 0 V VGS = 0V, ID = 1.0mA
/TJTemperature Coefficient of Breakdown 0.68 V/°C Reference to 25°C, ID = 1.0mA
Voltage Static Drain-to-Source On-State 0 .050 VGS = 10V, ID = 16A Resistance — 0.058 VGS =10V, ID =25A Gate Threshold Voltage 2 . 0 — 4.0 V VDS = VGS, ID =250µA Forward Transconductance 9.3 S ( )VDS > 15V, IDS =16A Zero Gate Voltage Drain Current 25 VDS=48V , VGS=0V
250 VDS =48V
Gate-to-Source Leakage Forward 10 0 VGS = 20V Gate-to-Source Leakage Reverse -100 VGS = -20V Total Gate Charge 21 47 VGS =10V, ID= 25A Gate-to-Source Charge 4. 4 1 0 nC VDS =30V Gate-to-Drain (‘Miller’) Charge 9. 7 2 2 Turn-On Delay Time 2 1 VDD =30V, ID = 25A, Rise Time 1 10 RG =7.5 Turn-Off Delay Time 53 Fall Time 80 Total Inductance 6. 1
Input Capacitance 1300 VGS = 0V, VDS = 25V Output Capacitance 650 p F f = 1.0MHz Reverse Transfer Capacitance 1 00
µA
VGS = 0V, TJ = 125°C
nA
ns
nH
Measured from drain lead (6mm/0.25in. from package) to source lead (6mm/0.25in. from package)
Source-Drain Diode Ratings and Characteristics
Parameter Min Typ Max Units Test Conditions
I
Continuous Source Current (Body Diode) 2 5
S
I
Pulse Source Current (Body Diode) 100
SM
V
Diode Forward Voltage 1 . 8 V Tj = 25°C, IS = 25A, VGS = 0V
SD
t
Reverse Recovery Time 2 20 nS Tj = 25°C, IF = 25A, di/dt 100A/µs
rr
Q
Reverse Recovery Charge 9 .6 µc VDD 50V
RR
t
Forward Turn-On Time Intrinsic turn-on time is negligible. Turn-on speed is substantially controlled by L
on
A
S
Thermal Resistance
Parameter Min Typ Max Units Test Conditions
thJC
thJA
For footnotes refer to the last page
2 www.irf.com
Junction to Case 1.67 Junction to Ambient — 30 Typical socket mount
°C/W
+ LD.
IRF034
Fig 2. Typical Output CharacteristicsFig 1. Typical Output Characteristics
Fig 3. Typical Transfer Characteristics
Fig 4. Normalized On-Resistance
Vs. Temperature
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