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Data Sheet No. PD60146 Rev N
IR2117(S)/IR2118(S) & ( PbF)
SINGLE CHANNEL DRIVER
Features
Floating channel designed for bootstrap operation
•
Fully operational to +600V
Tolerant to negative transient voltage
dV/dt immune
Gate drive supply range from 10 to 20V
•
Undervoltage lockout
•
CMOS Schmitt-triggered inputs with pull-down
•
• Output in phase with input (IR2117) or out of
phase with input (IR2118)
Also available LEAD-FREE
•
Description
The IR2117/IR2118(S) is a high voltage, high speed
power MOSFET and IGBT driver. Proprietary HVIC and
latch immune CMOS technologies enable ruggedized
monolithic construction. The logic input is compatible
with standard CMOS outputs. The output driver features a high pulse current buffer stage designed for
minimum cross-conduction. The floating channel can
be used to drive an N-channel power MOSFET or IGBT
in the high or low side configuration which operates up
to 600 volts.
Typical Connection
Product Summary
V
OFFSET
+/- 200 mA / 420 mA
I
O
V
OUT
t
(typ.) 125 & 105 ns
on/off
Packages
8-Lead PDIP
IR2117/IR2118
up to 600V
600V max.
10 - 20V
8-Lead SOIC
IR2117S/IR2118S
V
CC
IN
V
CC
COM
V
B
HOIN
V
S
TO
LOAD
IR2117
up to 600V
(Refer to Lead Assignments for correct pin configuration).
This/These diagram(s) show electrical connections only.
Please refer to our Application Notes and DesignTips for
proper circuit board layout.
V
CC
IN
V
CC
COM
V
B
HOIN
V
S
IR2118
TO
LOAD
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IR2117(S)/IR2118(S) & ( PbF)
Absolute Maximum Ratings
Absolute maximum ratings indicate sustained limits beyond which damage to the device may occur. All voltage parameters are absolute voltages referenced to COM. The thermal resistance and power dissipation ratings are measured
under board mounted and still air conditions. Additional information is shown in Figures 5 through 8.
Symbol Definition Min. Max. Units
V
B
V
S
V
HO
V
CC
V
IN
dVs/dt Allowable offset supply voltage transient (figure 2) — 50 V/ns
P
D
Rth
JA
T
J
T
S
T
L
High side floating supply voltage -0.3 625
High side floating supply offset voltage VB - 25 VB + 0.3
CC
B
+ 0.3
+ 0.3
High side floating output voltage VS - 0.3 V
Logic supply voltage -0.3 25
Logic input voltage -0.3 V
Package power dissipation @ TA ≤ +25°C (8 lead PDIP) — 1.0
(8 lead SOIC) — 0.625
Thermal resistance, junction to ambient (8 lead PDIP) — 125
(8 lead SOIC) — 200
Junction temperature — 150
Storage temperature -55 150
Lead temperature (soldering, 10 seconds) — 300
W
°C/W
°C
V
Recommended Operating Conditions
The input/output logic timing diagram is shown in figure 1. For proper operation the device should be used within the
recommended conditions. The VS offset rating is tested with all supplies biased at 15V differential.
Symbol Definition Min. Max. Units
V
B
V
S
V
HO
V
CC
V
IN
T
A
Note 1: Logic operational for VS of -5 to +600V. Logic state held for VS of -5V to -VBS. (Please refer to the Design Tip
DT97-3 for more details).
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High side floating supply absolute voltage VS + 10 VS + 20
High side floating supply offset voltage Note 1 600
High side floating output voltage V
Logic supply voltage 10 20
Logic input voltage 0 V
Ambient temperature -40 125 °C
S
V
B
CC
V
IR2117(S)/IR2118(S) & ( PbF)
Dynamic Electrical Characteristics
V
(VCC, VBS) = 15V, CL = 1000 pF and TA = 25°C unless otherwise specified. The dynamic electrical characteristics
BIAS
are measured using the test circuit shown in Figure 3.
Symbol Definition Min. Typ. Max. Units Test Conditions
t
on
t
off
t
t
Static Electrical Characteristics
V
(VCC, VBS) = 15V and TA = 25°C unless otherwise specified. The VIN, VTH and IIN parameters are referenced to
BIAS
COM. The VO and IO parameters are referenced to COM and are applicable to the respective output leads: HO or LO.
Symbol Definition Min. Typ. Max. Units Test Conditions
V
IH
V
V
OH
V
OL
I
LK
I
QBS
I
QCC
I
IN+
I
IN-
V
BSUV+
V
BSUV-
V
CCUV+VCC
V
CCUV-
I
O+
I
O-
Turn-on propagation delay — 125 200 VS = 0V
Turn-off propagation delay — 105 180 VS = 600V
Turn-on rise time — 80 130
r
Turn-off fall time — 40 65
f
input voltage - logic “1” (IR2117) logic “0” (IR2118) 9.5 — —
Input voltage - logic “0” (IR2117) logic “1” (IR2118) — — 6.0
IL
High level output voltage, V
Low level output voltage, V
BIAS
O
- V
O
— — 100 IO = 0A
— — 100 IO = 0A
ns
V
mV
Offset supply leakage current — — 50 VB = VS = 600V
Quiescent VBS supply current — 50 240 V
Quiescent VCC Supply Current — 70 340 VIN = 0V or V
Logic “1” input bias current (IR2117) VIN = V
(IR2118) VIN = 0V
Logic “0” input bias current (IR2117) VIN = 0V
(IR2118) VIN = V
— 20 40
— — 1.0
µA
VBS supply undervoltage positive going threshold 7.6 8.6 9.6
VBS supply undervoltage negative going threshold 7.2 8.2 9.2
V
supply undervoltage positive going threshold 7.6 8.6 9.6
V
supply undervoltage negative going threshold 7.2 8.2 9.2
CC
Output high short circuit pulsed current 200 250 — VO = 0V
Output low short circuit pulsed current 420 500 — VO = 15V
mA
= 0V or V
IN
V
= Logic “1”
IN
PW ≤ 10 µs
V
= Logic “0”
IN
PW ≤ 10 µs
CC
CC
CC
CC
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IR2117(S)/IR2118(S) & ( PbF)
Functional Block Diagram (IR2117)
V
CC
COM
IN
UV
DETECT
PULSE
GEN
Functional Block Diagram (IR2118)
V
CC
IN
PULSE
GEN
LEVEL
HV
LEVEL
SHIFT
HV
SHIFT
UV
DETECT
PULSE
FILTER
UV
DETECT
PULSE
FILTER
V
B
R
Q
R
S
R
Q
R
S
V
HO
V
HO
V
S
B
S
UV
DETECT
COM
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IR2117(S)/IR2118(S) & ( PbF)
Lead Definitions
Symbol Description
V
CC
IN Logic input for gate driver output (HO), in phase with HO (IR2117)
IN Logic input for gate driver output (HO), out of phase with HO (IR2118)
COM Logic ground
V
B
HO High side gate drive output
V
S
Lead Assignments
Logic and gate drive supply
High side floating supply
High side floating supply return
1
V
CC
2
IN
3
COM
4
V
HO
V
8
B
7
6
S
5
1
2
IN
3
COM
4
8 Lead PDIP 8 Lead SOIC
IR2117 IR2117S
1
V
CC
2
IN
3
COM
4
8 Lead PDIP 8 Lead SOIC
V
HO
V
8
B
7
6
S
5
1
V
2
IN
3
COM
4
IR2118 IR2118S
V
CC
CC
V
HO
V
V
HO
V
8
B
7
6
S
5
8
B
7
6
S
5
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IR2117(S)/IR2118(S) & ( PbF)
IN
(IR2118)
IN
(IR2117)
HO
Figure 1. Input/Output Timing Diagram
IR2117/IR2118
IR2117/IR2118
<50 V/ns
Figure 2. Floating Supply Voltage Transient Test Circuit
IN
(IR2118)
50%
50%
50%50%
IN
(IR2117)
t
t
r
on
90% 90%
t
t
f
off
HO
10% 10%
Figure 3. Switching Time Test Circuit Figure 4. Switching Time Waveform Definition
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