[ /Title
(RHR1
K160D
)
/Subject
(1A,
600V
Hyperfast
Dual
Diode)
/Autho
r ()
/Keywords
(Intersil
Corporation,
semiconductor,
Avalanche
Energy
Rated,
Switch
ing
Power
Supplies,
Power
Switch
ing
Circuits,
Rectifiers,
Data SheetJanuary 2000
1A, 600V Hyperfast Dual Diode
The RHR1K160D is a hyperfastdual diode withsoft recovery
characteristics (t
time of ultrafast diodes and is silicon nitride passivated ionimplanted epitaxial planar construction.
This device is intended for use as freewheeling/clamping
diodes and rectifiers in a variety of switching power supplies
and other power switching applications. Itslow stored charge
and hyperfast soft recovery minimize ringing and electrical
noise in many power switching circuits reducing power loss
in the switching transistors.
IF = 1A, dIF/dt = 200A/µs--25ns
IF = 1A, dIF/dt = 200A/µs-10.5-ns
IF = 1A, dIF/dt = 200A/µs-5-ns
IF = 1A, dIF/dt = 200A/µs-20-nC
VR = 10V, IF = 0A-10-pf
Pad Area = 0.483 in2(Note 1)--50
Pad Area = 0.027 in2(Note 2) (Figure 13)--201
Pad Area = 0.006 in2(Note 2) (Figure 13)--239
DEFINITIONS
VF = Instantaneous forward voltage (pw = 300µs, D = 2%).
IR = Instantaneous reverse current.
trr= Reverse recovery time (See Figure 10), summation of ta+tb.
ta = Time to reach peak reverse current (See Figure 10).
tb = Time from peak IRM to projected zero crossing of IRM based on a straight line from peak IRM through 25% of IRM (See Figure 10).
Qrr = Reverse recovery charge.
CJ = Junction Capacitance.
R
= Thermal resistance junction to ambient.
θJA
pw = Pulse width.
D = Duty cycle.
NOTES:
1. Measured using FR-4 copper board at 0.8 seconds.
2. 2. Measured using FR-4 copper board at 1000 seconds.
o
o
o
C/W
C/W
C/W
Typical Performance Curve
10
100oC
1
, FORWARD CURRENT (A)
F
I
0.1
00.511.522.54
150oC
VF, FORWARD VOLTAGE (V)
25oC
3.53
FIGURE 1. FORWARD CURRENT vs FORWARD VOLTAGEFIGURE 2. REVERSE CURRENT vs REVERSE VOLTAGE
2
10
1
0.1
REVERSE CURRENT ( A)
0.01
R,
I
0.001
0600100500200
o
C
150
o
100
C
25oC
300400
VR, REVERSE VOLTAGE (V)
Typical Performance Curve (Continued)
RHR1K160D
20
TA = 25oC, dIF/dt = 200A/µs
16
12
8
4
t, RECOVERY TIMES (ns)
0
0.1
t
rr
t
a
t
b
0.5
IF, FORWARD CURRENT (A)
1
35
TA = 100oC, dIF/dt = 200A/µs
30
25
20
15
10
t, RECOVERY TIMES (ns)
5
0
0.1
t
rr
t
b
t
a
0.5
IF, FORWARD CURRENT (A)
FIGURE 3. trr,taAND tbCURVES vs FORWARD CURRENTFIGURE 4. trr,taAND tbCURVES vs FORWARD CURRENT
50
TA = 150oC, dIF/dt = 200A/µs
40
30
20
t
rr
t
b
1.0
0.8
0.6
0.4
SQ. WAVE
DC
R
θJA
= 50oC/W
1
t, RECOVERY TIMES (ns)
10
0
0.1
a
0.5
IF, FORWARD CURRENT (A)
1
0.2
, AVERAGE FORWARD CURRENT (A)
0
F(AV)
I
507512525150100
T
, AMBIENT TEMPERATURE (oC)
A
t
FIGURE 5. trr,taAND tbCURVES vs FORWARD CURRENTFIGURE 6. CURRENT DERATING CURVE
50
40
30
20
10
, JUNCTION CAPACITANCE (pF)
J
C
0
020406010080
V
, REVERSE VOLTAGE (V)
R
FIGURE 7. JUNCTION CAPACITANCE vs REVERSE VOLTAGE
3
Typical Performance Curve (Continued)
RHR1K160D
10
DUTY CYCLE - DESCENDING ORDER
0.5
0.2
0.1
0.05
1
0.02
0.01
, NORMALIZED
0.1
θJA
Z
THERMAL IMPEDANCE
SINGLE PULSE
0.01
-5
10
-4
10
FIGURE 8. NORMALIZED MAXIMUM TRANSIENT THERMAL IMPEDANCE
Test Circuits and Waveforms
VGE AMPLITUDE AND
RG CONTROL dIF/dt
AND t2CONTROL I
t
1
F
L
R
= 50oC/W
θJA
P
DM
t
1
t
NOTES:
DUTY FACTOR: D = t
PEAK TJ = PDM x Z
-3
10
-2
10
-1
10
0
10
1
10
θJA
1/t2
10
x R
2
θJA
2
+ T
A
3
10
t, RECTANGULAR PULSE DURATION (s)
DUT
CURRENT
R
G
V
GE
t
1
t
2
IGBT
SENSE
dI
+
V
DD
-
0
F
I
F
dt
t
rr
t
a
FIGURE 9. trr TEST CIRCUITFIGURE 10. trr WAVEFORMS AND DEFINITIONS
L = 20mH
R < 0.1Ω
E
AVL
Q
= IGBT (BV
1
= 1/2LI2 [V
R(AVL)
CES
/(V
> DUT V
R(AVL)
R(AVL)
- VDD)]
)
LR
V
CURRENT
SENSE
Q
1
DUT
+
V
DD
I
L
IV
V
DD
t
0
AVL
I
L
t
1
t
2
FIGURE 11. AVALANCHE ENERGY TEST CIRCUITFIGURE 12. AVALANCHE CURRENT AND VOLTAGE
WAVEFORMS
t
b
0.25 I
RM
I
RM
t
4
RHR1K160D
Thermal Resistance vs Mounting Pad Area
The maximum rated junction temperature, TJM, and the
thermal resistance of the heat dissipating path determines
the maximum allowable device power dissipation, P
application.Thereforetheapplication’sambienttemperature,
T
(oC), and thermal resistance R
A
reviewed to ensure that T
JM
is never exceeded. Equation 1
(oC/W) must be
θJA
mathematically represents the relationship and serves as
the basis for establishing the rating of the part.
P
TJMTA–()
-----------------------------=
DM
Z
θJA
In using surface mount devicessuch as the SOP-8 package,
the environment in which it is applied will have a significant
influence on the part’s current and maximum power
dissipation ratings. Precise determination of P
DM
and influenced by many factors:
1. Mounting pad areaonto which the device is attached and
whether there is copper on one side or both sides of the
board.
2. The number of copper layersand the thickness of the
board.
3. The use of external heat sinks.
4. The use of thermal vias.
5. Air flow and board orientation.
6. For non steady state applications, the pulse width, the
duty cycle and the transientthermal response of thepart,
the board and the environment they are in.
Intersil provides thermal information to assist the designer’s
preliminary application evaluation. Figure 13 defines the
R
for the device as a function of the top copper
θJA
(component side) area. This is for a horizontally positioned
FR-4 board with 2 oz. copper after 1000 seconds of steady
state power with no air flow. This graph provides the
necessary information for calculation of the steady state
junction temperature or power dissipation. Pulse
applications can be evaluated using the Intersil device
SPICE thermal model or manually utilizing the normalized
maximum transient thermal impedance curve.
,inan
DM
(EQ. 1)
is complex
350
R
= 110.2 - 25.24 x ln (AREA)
θJA
300
C/W)
o
250
200
150
, THERMAL IMPEDANCE
θJA
100
R
JUNCTION TO AMBIENT (
Rθβ= 43.81 - 22.66 x ln (AREA)
50
0.001
FIGURE 13. THERMAL RESISTANCE vs MOUNTING PAD AREA
Displayed on the curve are R
239oC/W - 0.006in
0.010.1
AREA, TOP COPPER AREA (in2)
values listed in the
θJA
2
201oC/W - 0.027in
2
Electrical Specifications table. These points were chosen to
depict the compromise between the copper board area, the
thermal resistance and ultimately the power dissipation,
P
. Thermal resistances corresponding to other
DM
component side copper areas can be obtained from Figure
13 or by calculation using Equation 2. The area, in square
inches is the top copper board area, the thermal resistance
and ultimately the power dissipation, P
θJA
110.18 25.24Area()ln×–=
R
DM
.
(EQ. 2)
While Equation 2 describes the thermal resistance of a
single die, the dual die SOP-8 package introduces an
additional thermal component, thermal coupling resistance,
R
. Equation 3 describes Rθβ as a function of the top
θβ
copper mounting pad area.
R
θβ
43.81 22.66Area()ln×–=
(EQ. 3)
The thermal coupling resistance vs. copper area is also
graphically depicted in Figure 13. It is important to note the
thermal resistance (R
(
R
) are equivalent for both die. For example at 0.1 square
θβ
) and thermal coupling resistance
θJA
inches of copper:
R
R
θJA1
θβ1
= R
= R
θJA2
= 96oC/W
θβ2
= 168oC/W
TJ1 and TJ2 define the junction temperature of the
respective die. Similarly, P
and P2 define the power
1
dissipated in each die. The steady state junction
temperature can be calculated using Equation 4 for die 1
and Equation 5 for die 2.
Example: Use Equation 4 to calculate T
calculate T
with the following conditions. Die 2 is
J2
and Equation 5 to
J1
dissipating 0.5W; die 1 is dissipating 0W; the ambient
temperature is 60
varied top copper board area. Figure 14 shows the effect of
200
COPPER BOARD AREA - DESCENDING ORDER
2
0.020 in
2
0.140 in
150
C/W)
o
100
, THERMAL
θJA
Z
IMPEDANCE (
50
0.257 in
0.380 in
0.483 in
2
2
2
copper pad area on single pulse transient thermal
impedance. Each trace represents a copper pad area in
square inches corresponding to the descending list in the
graph. SPICE and SABER thermal models are provided for
each of the listed pad areas.
Copper pad area has no perceivable effect on transient
thermal impedance for pulse widths less than 100ms. For
pulse widths less than 100ms the transient thermal
impedance is determinedby the die andpackage.Therefore,
CTHERM1 through CTHERM6 and RTHERM1 through
RTHERM5 remain constant for each of the thermal models.
A listing of the model component values is availab le in Table 1.
0
-1
10
0
10
t, RECTANGULAR PULSE DURATION (s)
1
10
2
10
3
10
FIGURE 14. TRANSIENT THERMAL IMPEDANCE vs MOUNTING PAD AREA
1. All dimensions are within allowabledimensions of Rev.C of
JEDEC MS-012AA outline dated 5-90.
2. Dimension “D” does not include mold flash, protrusions or gate
burrs. Mold flash, protrusions or gate burrs shall not exceed
0o-8
0.004 IN
0.10 mm
o
0.006 inches (0.15mm) per side.
3. Dimension “E1” does not include inter-lead flash or protrusions.
Inter-lead flash and protrusions shall not exceed 0.010 inches
(0.25mm) per side.
0.050
1.27
4. “L” is the length of terminal for soldering.
5. The chamferon the bodyis optional. Ifit is notpresent, a visualindex
feature must be located within the crosshatched area.
0.024
0.6
1.5mm
DIA. HOLE
6. Controlling dimension: Millimeter.
7. Revision 8 dated 5-99.
4.0mm
USER DIRECTION OF FEED
2.0mm
1.75mm
MS-012AA
12mm TAPE AND REEL
C
L
12mm
8.0mm
40mm MIN.
ACCESS HOLE
18.4mm
COVER TAPE
13mm
330mm
GENERAL INFORMATION
1. 2500 PIECES PER REEL.
2. ORDER IN MULTIPLES OF FULL REELS ONLY.
3. MEETS EIA-481 REVISION “A” SPECIFICATIONS.
50mm
12.4mm
8
RHR1K160D
All Intersil semiconductor products are manufactured, assembled and tested under ISO9000 quality systems certification.
Intersil semiconductor products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time without notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and
reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result
from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
For information regarding Intersil Corporation and its products, see web site www.intersil.com
Sales Office Headquarters
NORTH AMERICA
Intersil Corporation
P. O. Box 883, Mail Stop 53-204
Melbourne, FL 32902
TEL: (321) 724-7000
FAX: (321) 724-7240
9
EUROPE
Intersil SA
Mercure Center
100, Rue de la Fusee
1130 Brussels, Belgium
TEL: (32) 2.724.2111
FAX: (32) 2.724.22.05
ASIA
Intersil (Taiwan) Ltd.
7F-6, No. 101 Fu Hsing North Road
Taipei, Taiwan
Republic of China
TEL: (886) 2 2716 9310
FAX: (886) 2 2715 3029
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