Advanced Synchronous Rectified Buck
MOSFET Drivers with Pre-POR OVP
The ISL6612A and ISL6613A are high frequency MOSFET
drivers specifically designed to drive upper and lower power
N-Channel MOSFETs in a synchronous rectified buck
converter topology. These drivers combined with HIP63xx or
ISL65xx Multi-Phase Buck PWM controllers and N-Channel
MOSFET s form complete core-voltage regulator solutions for
advanced microprocessors.
The ISL6612A drives the upper gate to 12V, while the lower
gate can be independently driven over a range from 5V to
12V. The ISL6613A drives both upper and lower gates over
a range of 5V to 12V. This drive-voltage provides the
flexibility necessary to optimize applications involving tradeoffs between gate charge and conduction losses.
An advanced adaptive zero shoot-through protection is
integrated to prevent both the upper and lower MOSFETs
from conducting simultaneously and to minimize the dead
time. These products add an overvoltage protection feature
operational before VCC exceeds its turn-on threshold, at
which the PHASE node is connected to the gate of the low
side MOSFET (LGATE). The output voltage of the converter
is then limited by the threshold of the low side MOSFET,
which provides some protection to the microprocessor if the
upper MOSFET(s) is shorted during initial startup.
These drivers also feature a three-state PWM input which,
working together with Intersil’s multi-phase PWM controllers,
prevents a negative transient on the output voltage when the
output is shut down. This feature eliminates the Schottky
diode that is used in some systems for protecting the load
from reversed output voltage events.
FN9159.6
Features
• Pin-to-pin Compatible with HIP6601 SOIC family
• Dual MOSFET Drives for Synchronous Rectified Bridge
• Advanced Adaptive Zero Shoot-Through Protection
- Body Diode Detection
- Auto-zero of r
• Adjustable Gate Voltage (5V to 12V) for Optimal Efficiency
• 36V Internal Bootstrap Schottky Diode
• Bootstrap Capacitor Overcharging Prevention
• Supports High Switching Frequency (up to 2MHz)
- 3A Sinking Current Capability
- Fast Rise/Fall Times and Low Propagation Delays
• Three-State PWM Input for Output Stage Shutdown
• Three-State PWM Input Hysteresis for Applications With
Power Sequencing Requirement
• Pre-POR Overvoltage Protection
• VCC Undervoltage Protection
• Expandable Bottom Copper Pad for Enhanced Heat
Sinking
• Dual Flat No-Lead (DFN) Package
- Near Chip-Scale Package Footprint; Improves PCB
Efficiency and Thinner in Profile
• Pb-Free Plus Anneal Available (RoHS Compliant)
Conduction Offset Effect
DS(ON)
Applications
• Core Regulators for Intel® and AMD® Microprocessors
• High Current DC/DC Converters
• High Frequency and High Efficiency VRM and VRD
Related Literature
• Techn ical Brief TB363 “Guidelines for Handling and
Processing Moisture Sensitive Surface Mount Devices
(SMDs)”
• Techn ical Brief TB417 for Power Train Design, Layout
Guidelines, and Feedback Compensation Design
1
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 1-888-468-3774
| Intersil (and design) is a registered trademark of Intersil Americas Inc.
All other trademarks mentioned are the property of their respective owners.
ISL6612ACBISL6612ACB0 to 858 Ld SOIC
ISL6612ACB-TISL6612ACB8 Ld SOIC Tape and Reel
ISL6612ACBZ (Note)6612ACBZ0 to 858 Ld SOIC (Pb-free)
ISL6612ACBZ-T (Note)6612ACBZ8 Ld SOIC Tape and Reel (Pb-free)
ISL6612ACBZA (Note)6612ACBZ0 to 858 Ld SOIC (Pb-free)
ISL6612ACBZA-T (Note)6612ACBZ8 Ld SOIC Tape and Reel (Pb-free)
ISL6612ACR12AC0 to 8510 Ld 3x3 DFN
ISL6612ACR-T12AC10 Ld 3x3 DFN Tape and Reel
ISL6612ACRZ (Note)12AZ0 to 8510 Ld 3x3 DF N ( Pb - f r e e )
ISL6612ACRZ-T (Note)12AZ10 Ld 3 x 3 DF N Tape an d Re e l ( P b -f r e e )
ISL6612AECB6612AECB0 to 858 Ld EPSOIC
ISL6612AECB-T6612AECB8 Ld EPSOIC Tape and Reel
ISL6612AECBZ (Note)6612AECBZ0 to 858 Ld EPSOIC (Pb-free)
ISL6612AECBZ-T (Note)6612AECBZ8 Ld EPSOIC Tape and Reel (Pb-free)
ISL6612AEIB6612AEIB-40 to +858 Ld EPSOIC
ISL6612AEIB-T6612AEIB8 Ld EPSOIC Tape and Reel
ISL6612AEIBZ (Note)6612AEIBZ-40 to +858 Ld EPSOIC (Pb-free)
ISL6612AEIBZ-T (Note)6612AEIBZ8 Ld EPSOIC Tape and Reel (Pb-free)
ISL6612AIBISL6612AIB-40 to +858 Ld SOIC
ISL6612AIB-TISL6612AIB8 Ld SOIC Tape and Reel
ISL6612AIBZ (Note)6612AIBZ-40 to +858 Ld SOIC (Pb-free)
ISL6612AIBZ-T (Note)6612AIBZ8 Ld SOIC Tape and Reel (Pb-free)
ISL6612AIR12AI-40 to +8510 Ld 3x3 DFN
ISL6612AIR-T12AI10 Ld 3x3 DFN Tape and Reel
ISL6612AIRZ (Note)2AIZ-40 to +8510 Ld 3x3 DFN (Pb-free)
ISL6612AIRZ-T (Note)2AIZ10 Ld 3x3 DFN Tape and Reel (Pb-free)
ISL6613ACBISL6613ACB0 to 858 Ld SOIC
ISL6613ACB-TISL6613ACB8 Ld SOIC Tape and Reel
ISL6613ACBZ (Note)6613ACBZ0 to 858 Ld SOIC (Pb-free)
ISL6613ACBZ-T (Note)6613ACBZ8 Ld SOIC Tape and Reel (Pb-free)
ISL6613ACR13AC0 to 8510 Ld 3x3 DFN
ISL6613ACR-T13AC10 Ld 3x3 DFN Tape and Reel
ISL6613ACRZ (Note)13AZ0 to 8510 Ld 3x3 DF N ( Pb - f r e e )
ISL6613ACRZ-T (Note)13AZ10 Ld 3 x 3 DF N Tape an d Re e l ( P b -f r e e )
ISL6613AECB6613AECB0 to 858 Ld EPSOIC
ISL6613AECB-T6613AECB8 Ld EPSOIC Tape and Reel
ISL6613AECBZ (Note)6613AECBZ0 to 858 Ld EPSOIC (Pb-free)
ISL6613AECBZ-T (Note)6613AECBZ8 Ld EPSOIC Tape and Reel (Pb-free)
ISL6613AEIB6613AEIB-40 to +858 Ld EPSOIC
ISL6613AEIB-T6613AEIB8 Ld EPSOIC Tape and Reel
ISL6613AEIBZ (Note)6613AEIBZ-40 to +858 Ld EPSOIC (Pb-free)
ISL6613AEIBZ-T (Note)6613AEIBZ8 Ld EPSOIC Tape and Reel (Pb-free)
ISL6613AIBISL6613AIB-40 to +858 Ld SOIC
ISL6613AIB-TISL6613AIB8 Ld SOIC Tape and Reel
ISL6613AIBZ (Note)6613AIBZ-40 to +858 Ld SOIC (Pb-free)
ISL6613AIBZ-T (Note)6613AIBZ8 Ld SOIC Tape and Reel (Pb-free)
ISL6613AIR13AI-40 to +8510 Ld 3x3 DFN
ISL6613AIR-T13AI10 Ld 3x3 DFN Tape and Reel
ISL6613AIRZ (Note)3AIZ-40 to +8510 Ld 3x3 DFN (Pb-free)
ISL6613AIRZ-T (Note)3AIZ10 Ld 3x3 DFN Tape and Reel (Pb-free)
NOTE: Intersil Pb-free plus anneal products employ special Pb-free material sets; molding compounds/die attach materials and 100% matte tin plate
termination finish, which are RoHS compliant and compatible with both SnPb and Pb-free soldering operations. Intersil Pb-free products are MSL
classified at Pb-free peak reflow temperatures that meet or exceed the Pb-free requirements of IPC/JEDEC J STD-020.
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTES:
is measured with the component mounted on a high effective thermal conductivity test board in free air.
1. θ
JA
is measured in free air with the component mounted on a high effective thermal conductivity test board with “direct attach” features. See T ech
2. θ
JA
Brief TB379.
3. For θ
, the “case temp” location is the center of the exposed metal pad on the package underside.
Upper Drive Source Current I
Upper Drive Source ImpedanceR
Upper Drive Sink Current I
Upper Drive Transition Sink Impedance R
Upper Drive DC Sink ImpedanceR
Lower Drive Source Current I
Lower Drive Source ImpedanceR
Lower Drive Sink CurrentI
Lower Drive Sink ImpedanceR
NOTE:
4. Guaranteed by design. Not 100% tested in production.
U_SOURCEVPVCC
U_SOURCE
U_SINK_TR
U_SINK_DC
L_SOURCEVPVCC
L_SOURCE
TSSHD
RU
RL
FU
FL
PDHU
PDHL
PDLU
PDLL
PDTS
U_SINK
L_SINK
L_SINK
V
= 12V, 3nF Load, 10% to 90%-26-ns
PVCC
V
= 12V, 3nF Load, 10% to 90%-18-ns
PVCC
V
= 12V, 3nF Load, 90% to 10%-18-ns
PVCC
V
= 12V, 3nF Load, 90% to 10%-12-ns
PVCC
V
= 12V, 3nF Load, Adaptive-10-ns
PVCC
V
= 12V, 3nF Load, Adaptive-10-ns
PVCC
V
= 12V, 3nF Load-10-ns
PVCC
V
= 12V, 3nF Load-10-ns
PVCC
V
= 12V, 3nF Load-10-ns
PVCC
= 12V, 3nF Load-1.25-A
150mA Source Current1.252.03.0Ω
V
= 12V, 3nF Load-2-A
PVCC
70ns With Respect To PWM Falling-1.32.2Ω
150mA Source Current0.91.653.0Ω
= 12V, 3nF Load-2-A
150mA Source Current0.851.252.2Ω
V
= 12V, 3nF Load-3-A
PVCC
150mA Sink Current0.600.801.35Ω
-245-ns
Functional Pin Description
PACKAGE PIN #
11UGATEUpper gate drive output. Connect to gate of high-side power N-Channel MOSFET.
22BOOTFloating bootstrap supply pin for the upper gate drive. Connect the bootstrap capacitor between this pin and the
-3, 8N/CNo Connection.
34PWMThe PWM signal is the control input for the driver. The PWM signal can enter three distinct states during operation, see
45GNDBias and reference ground. All signals are referenced to this node. It is also the power ground return of the driver.
56LGATELower gate drive output. Connect to gate of the low-side power N-Channel MOSFET.
67VCCConnect this pin to a +12V bias supply. Place a high quality low ESR ceramic capacitor from this pin to GND.
79PVCCThis pin supplies power to both upper and lower gate drives in ISL6613A; only the lower gate drive in ISL6612A.
810PHASEConnect this pin to the SOURCE of the upper MOSFET and the DRAIN of the lower MOSFET. This pin provides
911PADConnect this pad to the power ground plane (GND) via thermally enhanced connection.
PIN
SYMBOLFUNCTIONSOICDFN
PHASE pin. The bootstrap capacitor provides the charge to turn on the upper MOSFET. See the Internal Bootstrap
Device section under DESCRIPTION for guidance in choosing the capacitor value.
the three-state PWM Input section under DESCRIPTION for further details. Connect this pin to the PWM output of the
controller.
Its operating range is +5V to 12V. Place a high quality low ESR ceramic capacitor from this pin to GND.
a return path for the upper gate drive.
6
FN9159.6
July 27, 2006
Description
www.BDTIC.com/Intersil
ISL6612A, ISL6613A
PWM
t
PDLU
t
FU
t
RL
FIGURE 1. TIMING DIAGRAM
UGATE
LGATE
t
PDLL
t
PDHU
t
RU
t
FL
t
PDHL
Operation
Designed for versatility and speed, the ISL6612A and
ISL6613A MOSFET drivers control both high-side and lowside N-Channel FETs of a half-bridge power train from one
externally provided PWM signal.
Prior to VCC exceeding its POR level, the Pre-POR
overvoltage protection function is activated during initial startup;
the upper gate (UGATE) is held low and the lower gate
(LGATE), controlled by the Pre-POR overvoltage protection
circuits, is connected to the PHASE. Once the VCC voltage
surpasses the VCC Rising Threshold (See Electrical
Specifications), the PWM signal takes control of gate
transitions. A rising edge on PWM initiates the turn-off of the
lower MOSFET (see Timing Diagram). Af ter a short
propagation delay [t
fall times [t
] are provided in the Electrical Specifications
FL
section. Adaptive shoot-through circuitry monitors the PHASE
voltage and determines the upper gate delay time [t
prevents both the lower and upper MOSFETs from conducting
simultaneously . Once this delay period is complete, the upper
gate drive begins to rise [t
A falling transition on PWM results in the turn-off of the upper
MOSFET and the turn-on of the lower MOSFET. A short
propagation delay [t
gate begins to fall [t
circuitry determines the lower gate delay time, t
PHASE voltage and the UGATE voltage are monitored, and
the lower gate is allowed to rise after PHASE drops below a
level or the voltage of UGATE to PHASE reaches a level
depending upon the current direction (See next se c ti o n f o r
details). The lower gate then rises [t
MOSFET.
], the lower gate begins to fall. Typical
PDLL
PDHU
] and the upper MOSFET turns on.
RU
] is encountered before the upper
PDLU
]. Again, the adaptive shoot-through
FU
PDHL
], turning on the lower
RL
]. This
. The
1.5V<PWM<3.2V
t
TSSHD
Advanced Adaptive Zero Shoot-Through Deadtime
Control (Patent Pending)
These drivers incorporate a unique adaptive deadtime control
technique to minimize deadtime, resulting in high efficiency
from the reduced freewheeling time of the lower MOSFET s’
body-diode conduction, and to prevent the upper and lower
MOSFETs from conducting simultaneously. This is
accomplished by ensuring either rising gate turns on its
MOSFET with minimum and sufficient delay after the other has
turned off.
During turn-off of the lower MOSFET, the PHASE voltage is
monitored until it reaches a -0.2V/+0.8V trip point for a
forward/reverse current, at which time the UGATE is released
to rise. An auto-zero comparator is used to correct the r
drop in the phase voltage preventing from false detection of the
-0.2V phase level during r
of zero current, the UGATE is released after 35ns delay of the
LGATE dropping below 0.5V. During the phase detection, the
disturbance of LGATE’s falling transition on the PHASE node is
blanked out to prevent falsely tripping. Once the PHASE is
high, the advanced adaptive shoot-through circuitry monitors
the PHASE and UGA TE volt ages during a PWM falling edge
and the subsequent UGATE turn-off. If either the UGATE falls
to less than 1.75V above the PHASE or the PHASE falls to less
than +0.8V , the LGATE is released to turn on.
Three-State PWM Input
A unique feature of these drivers and other Intersil drivers is
the addition of a shutdown window to the PWM input. If the
PWM signal enters and remains within the shutdown window
for a set holdoff time, the driver outputs are disabled and
both MOSFET gates are pulled and held low. The shutdown
state is removed when the PWM signal moves outside the
shutdown window. Otherwise, the PWM rising and falling
t
PDTS
1.0V<PWM<2.6V
t
TSSHD
conduction period. In the case
DS(ON
t
PDTS
DS(ON)
7
FN9159.6
July 27, 2006
ISL6612A, ISL6613A
www.BDTIC.com/Intersil
thresholds outlined in the ELECTRICAL SPECIFICATIONS
determine when the lower and upper gates are enabled.
This feature helps prevent a negative transient on the output
voltage when the output is shut down, eliminating the
Schottky diode that is used in some systems for protecting
the load from reversed output voltage events.
In addition, more than 400mV hysteresis also incorporates
into the three-state shutdown window to eliminate PWM
input oscillations due to the capacitive load seen by the
PWM input through the body diode of the controller’s PWM
output when the power-up and/or power-down sequence of
bias supplies of the driver and PWM controller are required.
Power-On Reset (POR) Function
During initial startup, the VCC voltage rise is monitored.
Once the rising VCC voltage exceeds 9.8V (typically),
operation of the driver is enabled and the PWM input signal
takes control of the gate drives. If VCC drops below the
falling threshold of 7.6V (typically), operation of the driver is
disabled.
Pre-POR Overvoltage Protection
Prior to VCC exceeding its POR level, the upper gate is held
low and the lower gate is controlled by the overvoltage
protection circuits during initial startup. The PHASE is
connected to the gate of the low side MOSFET (LGATE),
which provides some protection to the microprocessor if the
upper MOSFET(s) is shorted during initial startup. For
complete protection, the low side MOSFET should have a
gate threshold well below the maximum voltage rating of the
load/microprocessor.
When VCC drops below its POR level, both gates pull low
and the Pre-POR overvoltage protection circuits are not
activated until VCC resets.
Internal Bootstrap Device
Both drivers feature an internal bootstrap schottky diode.
Simply adding an external capacitor across the BOOT and
PHASE pins completes the bootstrap circuit. The bootstrap
function is also designed to prevent the bootstrap capacitor
from overcharging due to the large negative swing at the
trailing-edge of the PHASE node. This reduces voltage
stress on the boot to phase pins.
The bootstrap capacitor must have a maximum voltage
rating above UVCC + 5V and its capacitance value can be
chosen from the following equation:
Q
GATE
C
BOOT_CAP
Q
GATE
--------------------------------------
≥
∆V
BOOT_CAP
QG1UVCC•
------------------------------------
V
GS1
(EQ. 1)
•=
N
Q1
where Q
at V
control MOSFETs. The ∆V
is the amount of gate charge per upper MOSFET
G1
gate-source voltage and NQ1 is the number of
GS1
BOOT_CAP
term is defined as the
allowable droop in the rail of the upper gate drive.
As an example, suppose two IRLR7821 FET s are chosen as
the upper MOSFETs. The gate charge, Q
sheet is 10nC at 4.5V (V
Q
is calculated to be 53nC for UVCC (i.e. PVCC in
GATE
) gate-source voltage. Then the
GS
, from the data
G
ISL6613A, VCC in ISL6612A) = 12V. We will assume a
200mV droop in drive voltage over the PWM cycle. We find
that a bootstrap capacitance of at least 0.267µF is required.
1.6
1.4
1.2
1.
(µF)
0.8
0.6
BOOT_CAP
C
0.4
0.2
20nC
0.0
FIGURE 2. BOOTSTRAP CAPACITANCE vs BOOT RIPPLE
Q
50nC
VOLTAGE
= 100nC
GATE
0.30.0 0.1 0.20.4 0.5 0.60.90.7 0.81.0
∆V
BOOT_CAP
(V)
Gate Drive Voltage Versatility
The ISL6612A and ISL6613A provide the user flexibility in
choosing the gate drive voltage for efficiency optimization.
The ISL6612A upper gate drive is fixed to VCC [+12V], but
the lower drive rail can range from 12V down to 5V
depending on what voltage is applied to PVCC. The
ISL6613A ties the upper and lower drive rails together.
Simply applying a voltage from 5V up to 12V on PVCC sets
both gate drive rail voltages simultaneously.
Power Dissipation
Package power dissipation i s mai nl y a fu nction of the
switching frequency (F
external gate resistance, and the selected MOSFET’s
internal gate resistance and total gate charge. Calculating
the power dissipation in the driver for a desired application is
critical to ensure safe operation. Exceeding the maximum
allowable power dissipation level will push the IC beyond the
maximum recommended operating junction temperature of
125°C. The maximum allowable IC power dissipation for the
SO8 package is approximately 800mW at room temperature,
while the power dissipation capacity in the EPSOIC and DFN
packages, with an exposed heat escape pad, is more than
2W and 1.5W, respectively. Both EPSOIC and DFN
), the output drive impedance, the
SW
8
FN9159.6
July 27, 2006
ISL6612A, ISL6613A
www.BDTIC.com/Intersil
packages are more suitable for high frequency applications.
See Layout Considerations paragraph for thermal transfer
improvement suggestions. When designing the driver into an
application, it is recommended that the following calculation
is used to ensure safe operation at the desired frequency for
thresholds outlined in the ELECTRICAL SPECIFICATIONS
determine when the lower and upper gates are enabled.
the selected MOSFETs. The total gate drive power losses
due to the gate charge of MOSFETs and the driver’s internal
circuitry and their corresponding average driver current can
be estimated with Equations 2 and 3, respectively,
where the gate charge (Q
particular gate to source voltage (V
corresponding MOSFET datasheet; I
quiescent current with no load at both drive outputs; N
and N
are number of upper and lower MOSFETs,
Q2
and QG2) is defined at a
G1
and V
GS1
Q
GS2
is the driver’s total
) in the
Q1
respectively; UVCC and LVCC are the drive voltages for
both upper and lower FETs, respectively. The I
Q*
VCC
product is the quiescent power of the driver without
capacitive load and is typically 116mW at 300kHz.
The total gate drive power losses are dissipated among the
resistive components along the transition path. The drive
resistance dissipates a portion of the total gate drive power
losses, the rest will be dissipated by the external gate
resistors (R
(R
and R
GI1
and RG2) and the internal gate resistors
G1
) of MOSFETs. Figures 3 and 4 show the
GI2
typical upper and lower gate drives turn-on transition path.
The power dissipation on the driver can be roughly
estimated as:
P
DRPDR_UPPDR_LOWIQ
R
⎛⎞
HI1
P
DR_UP
--------------------------------------
⎜⎟
R
+
⎝⎠
HI1REXT1
VCC•++=
R
LO1
----------------------------------------+
R
+
LO1REXT1
P
Qg_Q1
---------------------
•=
(EQ. 4)
2
FIGURE 4. TYPICAL LOWER-GATE DRIVE TURN-ON PATH
Layout Considerations
For heat spreading, place copper underneath the IC whether
it has an exposed pad or not. The copper area can be
extended beyond the bottom area of the IC and/or
connected to buried copper plane(s) with thermal vias. This
combination of vias for vertical heat escape, extended
copper plane, and buried planes for heat spreading allows
the IC to achieve its full thermal potential.
Place each channel power component as close to each
other as possible to reduce PCB copper losses and PCB
parasitics: shortest distance between DRAINs of upper FETs
and SOURCEs of lower FETs; shortest distance between
DRAINs of lower FETs and the power ground. Thus, smaller
amplitudes of positive and negative ringing are on the
switching edges of the PHASE node. However, some space
in between the power components is required for good
airflow. The traces from the drivers to the FETs should be
kept short and wide to reduce the inductance of the traces
and to promote clean drive signals.
P
DR_LOW
R
EXT1RG1
R
⎛⎞
HI2
--------------------------------------
⎜⎟
R
+
⎝⎠
HI2REXT2
R
GI1
-------------+=
N
Q1
R
LO2
----------------------------------------+
R
+
LO2REXT2
R
EXT2RG2
P
Qg_Q2
---------------------
•=
R
GI2
-------------+=
N
Q2
2
9
FN9159.6
July 27, 2006
ISL6612A, ISL6613A
www.BDTIC.com/Intersil
Dual Flat No-Lead Plastic Package (DFN)
INDEX
SEATING
(DATUM B)
6
INDEX
AREA
(DATUM A)
NX (b)
5
SECTION "C-C"
6
AREA
C
PLANE
NX L
8
A
12
D
TOP VIEW
SIDE VIEW
8
7
D2
D2/2
N-1N
e
(Nd-1)Xe
REF.
BOTTOM VIEW
(A1)
2X
A3
NX b
5
0.415
0.15
C
E
B
A
NX
E2
E2/2
0.10 MC
0.200
NX b
C
A
0.152XB
0.10 C
0.08
C
k
AB
NX L
L10.3x3
10 LEAD DUAL FLAT NO-LEAD PLASTIC PACKAGE
MILLIMETERS
C
SYMBOL
A0.800.901.00-
A1--0.05-
A30.20 REF-
b0.180.230.285,8
D3.00 BSC-
D21.952.002.057,8
E3.00 BSC-
E21.551.601.657,8
e0.50 BSC-
k0.25 - - L0.300.350.408
N102
Nd53
NOTES:
1. Dimensioning and tolerancing conform to ASME Y14.5-1994.
2. N is the number of terminals.
3. Nd refers to the number of terminals on D.
4. All dimensions are in millimeters. Angles are in degrees.
5. Dimension b applies to the metallized terminal and is measured
between 0.15mm and 0.30mm from the terminal tip.
6. The configuration of the pin #1 identifier is optional, but must be
located within the zone indicated. The pin #1 identifier may be
either a mold or mark feature.
7. Dimensions D2 and E2 are for the exposed pads which provide
improved electrical and thermal performance.
8. Nominal dimensions are provided to assist with PCB Land
Pattern Design efforts, see Intersil Technical Brief TB389.
C
L
L
e
CC
FOR ODD TERMINAL/SIDE
TERMINAL TIP
NOTESMINNOMINALMAX
Rev. 3 6/04
10
FN9159.6
July 27, 2006
ISL6612A, ISL6613A
www.BDTIC.com/Intersil
Small Outline Exposed Pad Plastic Packages (EPSOIC)
N
INDEX
AREA
123
TOP VIEW
-AD
e
B
0.25(0.010)C AMBS
SIDE VIEW
123
N
P
BOTTOM VIEW
H
E
-B-
SEATING PLANE
A
-C-
A1
M
P1
0.25(0.010)BMM
L
h x 45
α
0.10(0.004)
M8.15B
8 LEAD NARROW BODY SMALL OUTLINE EXPOSED PAD
PLASTIC PACKAGE
1. Symbols are defined in the “MO Series Symbol List” in Section
2.2 of Publication Number 95.
2. Dimensioning and tolerancing per ANSI Y14.5M-1982.
3. Dimension “D” does not include mold flash, protrusions or gate
burrs. Mold flash, protrusion and gate burrs shall not exceed
0.15mm (0.006 inch) per side.
4. Dimension “E” does not include interlead flash or protrusions.
Interlead flash and protrusions shall not exceed 0.25mm (0.010
inch) per side.
5. The chamfer on the body is optional. If it is not present, a visual
index feature must be located within the crosshatched area.
6. “L” is the length of terminal for soldering to a substrate.
7. “N” is the number of terminal positions.
8. Terminal numbers are shown for reference only.
9. The lead width “B”, as measured 0.36mm (0.014 inch) or greater
above the seating plane, shall not exceed a maximum value of
0.61mm (0.024 inch).
10. Controlling dimension: MILLIMETER. Converted inch
dimensions are not necessarily exact.
11. Dimensions “P” and “P1” are thermal and/or electrical enhanced
variations. Values shown are maximum size of exposed pad
within lead count and body size.
0°8°0°8°-
NOTESMINMAXMINMAX
Rev. 3 6/05
11
FN9159.6
July 27, 2006
ISL6612A, ISL6613A
www.BDTIC.com/Intersil
Small Outline Plastic Packages (SOIC)
N
INDEX
AREA
123
-A-
E
-B-
SEATING PLANE
D
A
-C-
0.25(0.010)BMM
H
L
h x 45°
α
e
B
0.25(0.010)C AMBS
NOTES:
1. Symbols are defined in the “MO Series Symbol List” in Section 2.2 of
Publication Number 95.
2. Dimensioning and tolerancing per ANSI Y14.5M-1982.
3. Dimension “D” does not include mold flash, protrusions or gate burrs.
Mold flash, protrusion and gate burrs shall not exceed 0.15mm (0.006
inch) per side.
4. Dimension “E” does not include interlead flash or protrusions. Interlead flash and protrusions shall not exceed 0.25mm (0.010 inch) per
side.
5. The chamfer on the body is optional. If it is not present, a visual index
feature must be located within the crosshatched area.
6. “L” is the length of terminal for soldering to a substrate.
7. “N” is the number of terminal positions.
8. Terminal numbers are shown for reference only.
9. The lead width “B”, as measured 0.36mm (0.014 inch) or greater
above the seating plane, shall not exceed a maximum value of
0.61mm (0.024 inch).
10. Controlling dimension: MILLIMETER. Converted inch dimensions
are not necessarily exact.
M
A1
C
0.10(0.004)
M8.15 (JEDEC MS-012-AA ISSUE C)
8 LEAD NARROW BODY SMALL OUTLINE PLASTIC PACKAGE
INCHESMILLIMETERS
SYMBOL
A0.05320.06881.351.75-
A10.00400.00980.100.25-
B0.0130.0200.330.519
C0.00750.00980.190.25-
D0.18900.19684.805.003
E0.14970.15743.804.004
e0.050 BSC1.27 BSC-
H0.22840.24405.806.20-
h0.00990.01960.250.505
L0.0160.0500.401.276
N887
α
0°8°0°8°-
NOTESMINMAXMINMAX
Rev. 1 6/05
All Intersil U.S. products are manufactured, assembled and tested utilizing ISO9000 quality systems.
Intersil Corporation’s quality certifications can be viewed at www.intersil.com/design/quality
Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design, software and/or specifications at any time without
notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and
reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result
from its use. No license is granted by implic atio n or other wise u nde r any p a tent or patent rights of Intersil or its subsidi aries.
For information regarding Intersil Corporation and its products, see www.intersil.com
12
FN9159.6
July 27, 2006
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