15kV ESD Protected, 3.3V, Full Fail-safe,
Low Power, High Speed or Slew Rate
Limited, RS-485/RS-422 Transceivers
The Intersil ISL317XE are ±15kV IEC61000 ESD Protected,
3.3V powered, single transceivers that meet both the
RS-485 and RS-422 standards for balanced communication.
These devices have very low bus currents (+125μA/-100μA),
so they present a true “1/8 unit load” to the RS-485 bus. This
allows up to 256 transceivers on the network without violating
the RS-485 specification’s 32 unit load maximum, and without
using repeaters. For example, in a remote utility meter reading
system, individual meter readings are routed to a concentrator
via an RS-485 network, so the high allowed node count
minimizes the number of repeaters required.
Receiver (Rx) inputs feature a “Full Fail-Safe” design, which
ensures a logic high Rx output if Rx inputs are floating,
shorted, or terminated but undriven.
Hot Plug circuitry ensures that the Tx and Rx outputs remain
in a high impedance state while the power supply stabilizes.
The ISL3170E through ISL3175E utilize slew rate limited
drivers which reduce EMI, and minimize reflections from
improperly terminated transmission lines, or unterminated
stubs in multidrop and multipoint applications. Slew rate limited
versions also include receiver input filtering to enhance noise
immunity in the presence of slow input signals.
The ISL3170E, ISL3171E, ISL3173E, ISL3174E, ISL3176E,
ISL3177E are configured for full duplex (separate Rx input
and Tx output pins) applications. The half duplex versions
multiplex the Rx inputs and Tx outputs to allow transceivers
with output disable functions in 8 lead packages.
PART NUMBERPART MARKINGTEMP. RANGE (°C)PACKAGE (Pb-Free)PKG. DWG. #
ISL3170EIBZ3170EIBZ-40 to +8514 Ld SOICM14.15
ISL3170EIUZ3170Z-40 to +8510 Ld MSOPM10.118
ISL3171EIBZ3171EIBZ-40 to +858 Ld SOICM8.15
ISL3171EIUZ3171Z-40 to +858 Ld MSOPM8.118
ISL3172EIBZ3172EIBZ-40 to +858 Ld SOICM8.15
ISL3172EIUZ3172Z-40 to +858 Ld MSOPM8.118
ISL3173EIBZ3173EIBZ-40 to +8514 Ld SOICM14.15
ISL3173EIUZ3173Z-40 to +8510 Ld MSOPM10.118
ISL3174EIBZ3174EIBZ-40 to +858 Ld SOICM8.15
ISL3174EIUZ3174Z-40 to +858 Ld MSOPM8.118
ISL3175EIBZ3175EIBZ-40 to +858 Ld SOICM8.15
ISL3175EIUZ3175Z-40 to +858 Ld MSOPM8.118
ISL3176EIBZ3176EIBZ-40 to +8514 Ld SOICM14.15
ISL3176EIUZ3176Z-40 to +8510 Ld MSOPM10.118
ISL3177EIBZ3177EIBZ-40 to +858 Ld SOICM8.15
ISL3177EIUZ3177Z-40 to +858 Ld MSOPM8.118
ISL3178EIBZ3178EIBZ-40 to +858 Ld SOICM8.15
ISL3178EIUZ3178Z-40 to +858 Ld MSOPM8.118
NOTES:
1. Units also available in Tape and Reel; Add “-T” to suffix.
2. Intersil Pb-free plus anneal products employ special Pb-free material sets; molding compounds/die attach materials and 100% matte tin plate
termination finish, which are RoHS compliant and compatible with both SnPb and Pb-free soldering operations. Intersil Pb-free products are
MSL classified at Pb-free peak reflow temperatures that meet or exceed the Pb-free requirements of IPC/JEDEC J STD-020.
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
is measured with the component mounted on a high effective thermal conductivity test board in free air. See Tech Brief TB379 for details.
3. θ
JA
θ
JA
(°C/W)
Electrical SpecificationsTest Conditions: V
Note 4
PARAMETERSYMBOLTEST CONDITIONS
DC CHARACTERISTICS
Driver Differential V
OUT
Change in Magnitude of Driver
Differential V
OUT
for
Complementary Output States
Driver Common-Mode V
OUT
Change in Magnitude of Driver
Common-Mode V
OUT
for
Complementary Output States
Logic Input High VoltageV
Logic Input Low VoltageV
Logic Input HysteresisV
Logic Input CurrentI
Input Current (A, B, A/Y, B/Z)I
Maximum Data Ratef
Driver Differential Output Delayt
Driver Differential Output Skewt
Driver Differential Rise or Fall Timet
Driver Enable to Output Hight
Driver Enable to Output Lowt
Driver Disable from Output Hight
Driver Disable from Output Lowt
Time to Shutdownt
Driver Enable from Shutdown to
t
ZH(SHDN)RL
Output High
Driver Enable from Shutdown to
Output Low
t
ZL(SHDN)RL
MAX
DD
SKEW
R
ZH
ZL
HZ
LZ
SHDN
VOD = ±1.5V, CD = 820pF (Figure 4, Note 16)Full250800-kbps
R
Maximum Data Ratef
Driver Differential Output Delayt
Driver Differential Output Skewt
Driver Differential Rise or Fall Timet
Driver Enable to Output Hight
MAX
DD
SKEW
R
ZH
VOD = ±1.5V, CD = 820pF (Figure 4, Note 16)Full5001600-kbps
R
= 3.0V to 3.6V; Unless Otherwise Specified. Typicals are at VCC = 3.3V, TA = +25°C,
CC
TEMP
PARAMETERSYMBOLTEST CONDITIONS
Receiver Disable from Output Lowt
Time to Shutdownt
Receiver Enable from Shutdown to
t
ZH(SHDN)RL
Output High
Receiver Enable from Shutdown to
t
ZL(SHDN)RL
Output Low
LZ
SHDN
RL = 1kΩ, CL = 15pF,
SW = V
(Note 12)
(Figure 6),
CC
ISL3170E-75EFull51320ns
ISL3176E-78EFull4715ns
(Notes 9, 12)Full50180600ns
= 1kΩ, CL = 15pF, SW = GND (Figure 6),
(Notes 9, 11, 12)
= 1kΩ, CL = 15pF, SW = VCC (Figure 6),
(Notes 9, 11, 12)
(°C)MINTYPMAXUNITS
Full-240500ns
Full-240500ns
NOTES:
4. All currents into device pins are positive; all currents out of device pins are negative. All voltages are referenced to device ground unless otherwise
specified.
5. Supply current specification is valid for loaded drivers when DE = 0V.
6. Applies to peak current. See “Typical Performance Curves” for more information.
7. When testing devices with the shutdown feature, keep RE
8. When testing devices with the shutdown feature, the RE
= 0 to prevent the device from entering SHDN.
signal high time must be short enough (typically <100ns) to prevent the device from
entering SHDN.
9. Versions with a shutdown feature are put into shutdown by bringing RE high and DE low . If the inputs are in this state for less than 50ns, the parts
are guaranteed not to enter shutdown. If the inputs are in this state for at least 600ns, the parts are guaranteed to have entered shutdown. See
“Low-Power Shutdown Mode” section.
10. Keep RE
11. Set the RE
= VCC, and set the DE signal low time >600ns to ensure that the device enters SHDN.
signal high time >600ns to ensure that the device enters SHDN.
12. Does not apply to the ISL3171E, ISL3174E and ISL3177E.
13. Δt
is the magnitude of the difference in propagation delays of the specified terminals of two units tested with identical test conditions (VCC,
SKEW
temperature, etc.). Only applies to the ISL3176E - 78E.
14. ISL3170E - ISL3 175E only.
CC
≥ 3.15V
15. V
16. Guaranteed by design and characterization, but not production tested.
17. If the Tx or Rx enable function isn’t needed, connect the enable pin to the appropriate supply (see “Pin Descriptions” table) through a 1kΩ to 3kΩ
resistor.
FIGURE 5A. TEST CIRCUITFIGURE 5B. MEASUREMENT POINTS
RE
B
A
RO
R
SIGNAL
GENERATOR
GND
PARAMETERDEASW
t
HZ
t
LZ
X+1.5VGND
X-1.5VV
tZH (Note 8)0+1.5VGND
(Note 8)0-1.5VV
t
ZL
t
ZH(SHDN)
t
ZL(SHDN)
(Note 11)0+1.5VGND
(Note 11)0-1.5VV
FIGURE 6A. TEST CIRCUITFIGURE 6B. MEASUREMENT POINTS
FIGURE 6. RECEIVER ENABLE AND DISABLE TIMES (EXCEPT ISL3171E, ISL3174E, ISL3177E)
15pF
A
RO
FIGURE 5. RECEIVER PROPAGATION DELAY
RE
tZH, t
RO
t
ZL
RO
NOTE 9
ZH(SHDN)
NOTE 9
, t
ZL(SHDN)
NOTE 9
1kΩ
15pF
SW
CC
CC
CC
V
CC
GND
t
PLH
1.5V1.5V
OUTPUT HIGH
1.5V
1.5V
OUTPUT LOW
t
PHL
0V0V
1.5V1.5V
t
HZ
t
LZ
+1.5V
-1.5V
3V
0V
VOH - 0.25V
VOL + 0.25V
V
CC
0V
V
OH
0V
V
CC
V
OL
Application Information
RS-485 and RS-422 are differential (balanced) data
transmission standards for use in long haul or noisy
environments. RS-422 is a subset of RS-485, so RS-485
transceivers are also RS-422 compliant. RS-422 is a pointto-multipoint (multidrop) standard, which allows only one
driver and up to 10 (assuming one unit load devices)
receivers on each bus. RS-485 is a true multipoint standard,
which allows up to 32 one unit load devices (any
combination of drivers and receivers) on each bus. To allow
for multipoint operation, the RS-485 spec requires that
drivers must handle bus contention without sustaining any
damage.
Another important advantage of RS-485 is the extended
common mode range (CMR), which specifies that the driver
outputs and receiver inputs withstand signals that range from
+12V to -7V. RS-422 and RS-485 are intended for runs as
long as 4000’, so the wide CMR is necessary to handle
ground potential differences, as well as voltages induced in
the cable by external fields.
10
Receiver Features
These devices utilize a differential input receiver for maximum
noise immunity and common mode rejection. Input sensitivity
is better than ±200mV , as require d by the RS-422 and RS-485
specifications.
Receiver input resistance of 96kΩ surpasses the RS-422
spec of 4kΩ, and is eight times the RS-485 “Unit Load (UL)”
requirement of 12kΩ minimum. Thus, these products are
known as “one-eighth UL” transceivers, and there can be up
to 256 of these devices on a network while still complying
with the RS-485 loading spec.
Receiver inputs function with common mode volta ges as great
as +9V/-7V outside the power supplies (i.e., +12V and -7V),
making them ideal for long networks where induced voltages,
and ground potential differences, are realistic concerns.
All the receivers include a “full fail-safe” function that
guarantees a high level receiver output if the receiver inputs
are unconnected (floating) or shorted. Fail-safe with shorted
inputs is achieved by setting the Rx upper switching point to
-50mV , thereby ensuring that the Rx sees 0V differential as a
high input level.
Receivers easily meet the data rates supported by the
corresponding driver, and all receiver outputs - except on the
ISL3171E, ISL3174E and ISL3177E- are tri-statable via the
active low RE
input.
Driver Features
The RS-485/422 driver is a differential output device that
delivers at least 1.5V across a 54Ω load (RS-485), and at
least 2V across a 100Ω load (RS-422). The drivers feature
low propagation delay skew to maximize bit width, and to
minimize EMI.
All drivers are tri-statable via the active high DE input, except
on the ISL3171E, ISL3174E and ISL3177E.
The 250kbps and 500kbps driver outputs are slew rate
limited to minimize EMI, and to reduce reflections in
unterminated or improperly terminated networks. Outputs of
the ISL3176E - ISL3178E drivers are not limited, so faster
output transition times allow data rates of at least 20Mbps.
Hot Plug Function
When a piece of equipment powers up, there is a period of
time where the processor or ASIC driving the RS-485 control
lines (DE, RE
Rx outputs are kept disabled. If the equipment is connected
to the bus, a driver activating prematurely during power up
may crash the bus. To avoid this scenario, the ISL317XE
family incorporates a “Hot Plug” function. During power up,
circuitry monitoring V
remain disabled for a period of time, regardless of the state of
DE and RE
stabilize and drive the RS-485 control lines to the proper states.
) is unable to ensure that the RS-485 Tx and
ensures that the Tx and Rx outputs
CC
. This gives the processor/ASIC a chance to
ESD Protection
All pins on these devices include class 3 (>7kV) Human
Body Model (HBM) ESD protection structures, but the
RS-485 pins (driver outputs and receiver inputs)
incorporate advanced structures allowing them to survive
ESD events in excess of ±15kV HBM and ±15kV
IEC61000. The RS-485 pins are particularly vulnerable to
ESD damage because they typically connect to an exposed
port on the exterior of the finished product. Simply touching
the port pins, or connecting a cable, can cause an ESD
event that might destroy unprotected ICs. These new ESD
structures protect the device whether or not it is powered
up, and without degrading the RS-485 common mode
range of -7V to +12V. This built-in ESD protection
eliminates the need for board level protection structures
(e.g., transient suppression diodes), and the associated,
undesirable capacitive load they present.
IEC61000-4-2 Testing
The IEC61000 test method applies to finished equipment,
rather than to an individual IC. Therefore, the pins most likely
to suffer an ESD event are those that are exposed to the
outside world (the RS-485 pins in this case), and the IC is
tested in its typical application configuration (power applied)
rather than testing each pin-to-pin combination. The lower
current limiting resistor coupled with the larger charge
storage capacitor yields a test that is much more severe than
the HBM test. The extra ESD protection built into this
device’s RS-485 pins allows the design of equipment
meeting level 4 criteria without the need for additional board
level protection on the RS-485 port.
AIR-GAP DISCHARGE TEST METHOD
For this test method, a charged probe tip moves toward the
IC pin until the voltage arcs to it. The current waveform
delivered to the IC pin depends on approach speed,
humidity, temperature, etc., so it is difficult to obtain
repeatable results. The ISL317XE RS-485 pins withstand
±15kV air-gap discharges.
CONTACT DISCHARGE TEST METHOD
During the contact discharge test, the probe contacts the
tested pin before the probe tip is energized, thereby
eliminating the variables associated with the air-gap
discharge. The result is a more repeatable and predictable
test, but equipment limits prevent testing devices at voltages
higher than ±8kV. The ISL317XE survive ±8kV contact
discharges on the RS-485 pins.
Data Rate, Cables, and Termination s
RS-485/422 are intended for network lengths up to 4000’,
but the maximum system data rate decreases as the
transmission length increases. Devices operating at 20Mbps
are limited to lengths less than 100’, while the 250kbps
versions can operate at full data rates with lengths of several
thousand feet.
Twisted pair is the cable of choice for RS-485/422 networks.
Twisted pair cables tend to pick up noise and other
electromagnetically induced voltages as common mode
signals, which are effectively rejected by the differential
receivers in these ICs.
Proper termination is imperative, when using the 20Mbps
devices, to minimize reflections. Short networks using the
250kbps versions need not be terminated, but, terminations
are recommended unless power dissipation is an overriding
concern.
In point-to-point, or point-to-multipoint (single driver on bus)
networks, the main cable should be terminated in its
characteristic impedance (typically 120Ω) at the end farthest
from the driver. In multi-receiver applications, stubs
connecting receivers to the main cable should be kept as
short as possible. Multipoint (multi-driver) systems require
that the main cable be terminated in its ch ara c t eri st ic
impedance at both ends. Stubs connecting a transceiver to
the main cable should be kept as short as possible.
Built-In Driver Overload Protection
As stated previously, the RS-485 spec requires that drivers
survive worst case bus contentions undamaged. These
devices meet this requirement via driver output short circuit
current limits, and on-chip thermal shutdown circuitry.
The driver output stages incorporate short circuit current
limiting circuitry which ensures that the output current never
exceeds the RS-485 spec, even at the common mode
voltage range extremes. Additionally, these devices utilize a
foldback circuit which reduces the short circuit current, and
thus the power dissipation, whenever the contending voltage
exceeds either supply.
In the event of a major short circuit condition, devices also
include a thermal shutdown feature that disables the drivers
whenever the die temperature becomes excessive. This
eliminates the power dissipation, allowing the die to coo l. The
drivers automatically re-enable after the die tempe rature
drops about 15 degrees. If the contention persists, the thermal
shutdown/re-enable cycle repeats until the fault is cleared .
Receivers stay operational during thermal shutdown.
Typical Performance Curves V
120
100
80
60
40
20
DRIVER OUTPUT CURRENT (mA)
0
00.511.522.533.5
DIFFERENTIAL OUTPUT VOLTAGE (V)
FIGURE 7. DRIVER OUTPUT CURRENT vs DIFFERENTIAL
OUTPUT VOLTAGE
= 3.3V, TA = +25°C; Unless Otherwise Specified
CC
Low Power Shutdown Mode
These CMOS transceivers all use a fraction of the power
required by their bipolar counterparts, but some also include
a shutdown feature that reduces the already low quiescent
to a 10nA trickle. These devices enter shutdown
I
CC
whenever the receiver and driver are simultaneously
disabled (RE
600ns. Disabling both the driver and the receiver for less
than 50ns guarantees that the transceiver will not enter
shutdown.
Note that receiver and driver enable times increase when the
transceiver enables from shutdown. Refer to Notes 7-11, at the
end of the Electrical Specification table, for more information.
1. These package dimensions are within allowable dimensions of
JEDEC MO-187BA.
2. Dimensioning and tolerancing per ANSI Y14.5M-1994.
3. Dimension “D” does not include mold flash, protrusions or gate
burrs and are measured at Datum Plane. Mold flash, protrusion
and gate burrs shall not exceed 0.15mm (0.006 inch) per side.
4. Dimension “E1” does not include interlead flash or protrusions
and are measured at Datum Plane.Interlead flash and
- H -
protrusions shall not exceed 0.15mm (0.006 inch) per side.
5. Formed leads shall be planar with respect to one another within
0.10mm (0.004) at seating Plane.
6. “L” is the length of terminal for soldering to a substrate.
7. “N” is the number of terminal positions.
8. Terminal numbers are shown for reference only.
9. Dimension “b” does not include dambar protrusion. Allowable
dambar protrusion shall be 0.08mm (0.003 inch) total in excess
of “b” dimension at maximum material condition. Minimum space
between protrusion and adjacent lead is 0.07mm (0.0027 inch).
- B -
- H -
-A -
.
10. Datumsandto be determined at Datum plane
11. Controlling dimension: MILLIMETER. Converted inch dimensions are for reference only.
1. Symbols are defined in the “MO Series Symbol List” in Section 2.2 of
Publication Number 95.
2. Dimensioning and tolerancing per ANSI Y14.5M-1982.
3. Dimension “D” does not include mold flash, protrusions or gate burrs.
Mold flash, protrusion and gate burrs shall not exceed 0.15mm (0.006
inch) per side.
4. Dimension “E” does not include interlead flash or protrusions. Interlead flash and protrusions shall not exceed 0.25mm (0.010 inch) per
side.
5. The chamfer on the body is optional. If it is not present, a visual index
feature must be located within the crosshatched area.
6. “L” is the length of terminal for soldering to a substrate.
7. “N” is the number of terminal positions.
8. Terminal numbers are shown for reference only.
9. The lead width “B”, as measured 0.36mm (0.014 inch) or greater
above the seating plane, shall not exceed a maximum value of
0.61mm (0.024 inch).
10. Controlling dimension: MILLIMETER. Converted inch dimensions
are not necessarily exact.
1. These package dimensions are within allowable dimensions of
JEDEC MO-187BA.
2. Dimensioning and tolerancing per ANSI Y14.5M-1994.
3. Dimension “D” does not include mold flash, protrusions or gate
burrs and are measured at Datum Plane. Mold flash, protrusion
and gate burrs shall not exceed 0.15mm (0.006 inch) per side.
4. Dimension “E1” does not include interlead flash or protrusions
and are measured at Datum Plane.Interlead flash and
- H -
protrusions shall not exceed 0.15mm (0.006 inch) per side.
5. Formed leads shall be planar with respect to one another within
0.10mm (.004) at seating Plane.
6. “L” is the length of terminal for soldering to a substrate.
7. “N” is the number of terminal positions.
8. Terminal numbers are shown for reference only.
9. Dimension “b” does not include dambar protrusion. Allowable
dambar protrusion shall be 0.08mm (0.003 inch) total in excess
of “b” dimension at maximum material condition. Minimum space
between protrusion and adjacent lead is 0.07mm (0.0027 inch).
- B -
- H -
-A -
.
10. Datums and to be determined at Datum plane
11. Controlling dimension: MILLIMETER. Converted inch dimensions are for reference only
1. Symbols are defined in the “MO Series Symbol List” in Section 2.2 of
Publication Number 95.
2. Dimensioning and tolerancing per ANSI Y14.5M-1982.
3. Dimension “D” does not include mold flash, protrusions or gate burrs.
Mold flash, protrusion and gate burrs shall not exceed 0.15mm (0.006
inch) per side.
4. Dimension “ E” does not include interlead flash or protrusions. Interlead
flash and protrusions shall not exceed 0.25mm (0.010 inch) per side.
5. The chamfer on the body is optional. If it is not present, a visual index
feature must be located within the crosshatched area.
6. “L” is the length of terminal for soldering to a substrate.
7. “N” is the number of terminal positions.
8. Terminal numbers are shown for reference only.
9. The lead width “B”, as measured 0.36mm (0.014 inch) or greater
above the seating plane, shall not exceed a maximum value of
0.61mm (0.024 inch).
10. Controlling dimension: MILLIMETER. Converted inch dimensions
are not necessarily exact.
A1
C
0.10(0.004)
M14.15 (JEDEC MS-012-AB ISSUE C)
14 LEAD NARROW BODY SMALL OUTLINE PLASTIC
PACKAGE
INCHESMILLIMETERS
SYMBOL
A0.05320.06881.351.75-
A10.00400.00980.100.25-
B0.0130.0200.330.519
C0.00750.00980.190.25-
D0.33670.34448.558.753
E0.14970.15743.804.004
e0.050 BSC1.27 BSC-
H0.22840.24405.806.20-
h0.00990.01960.250.505
L0.0160.0500.401.276
N14147
o
α
0
o
8
o
0
o
8
Rev. 0 12/93
NOTESMINMAXMINMAX
-
All Intersil U.S. products are manufactured, assembled and tested utilizing ISO9000 quality systems.
Intersil Corporation’s quality certifications can be viewed at www.intersil.com/design/quality
Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design, software and/or specifications at any time without
notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and
reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result
from its use. No license is granted by implicat ion or oth erwise u nde r any p a tent or p at ent r ights of Intersil or its subsidiari es.
For information regarding Intersil Corporation and its products, see www.intersil.com
19
FN6307.2
August 28, 2006
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