intersil ISL22316 DATA SHEET

®
www.BDTIC.com/Intersil
Single Digitally Controlled Potentiometer (XDCP™)
Data Sheet February 18, 2008
Low Noise, Low Power I2C® Bus, 128 Taps
The ISL22316 integrates a single digitally controlled potentiometer (DCP) and non-volatile memory on a monolithic CMOS integrated circuit.
The digitally controlled potentiometer is implemented with a combination of resistor elements and CMOS switches. The position of the wipers are controlled by the user through the
2
I
C bus interface. The potentiometer has an associated volatile Wiper Register (WR) and a non-volatile Initial Value Register (IVR) that can be directly written to and read by the user. The contents of the WR controls the position of the wiper. At power-up, the device recalls the contents of the DCP’s IVR to the WR.
The DCP can be used as a three-terminal potentiometer or as a two-terminal variable resistor in a wide variety of applications including control, parameter adjustments, and signal processing.
FN6186.1
Features
• 128 resistor taps
2
•I
C serial interface
- Two address pins, up to four devices/bus
• Non-volatile storage of wiper position
• Wiper resistance: 70Ω typical @ V
• Shutdown mode
• Shutdown current 5µA max
• Power supply: 2.7V to 5.5V
•50kΩ or 10kΩ total resistance
• High reliability
- Endurance: 1,000,000 data changes per bit per register
- Register data retention: 50 years @ T +55
• 10 Ld MSOP or 10 Ld TDFN package
• Pb-free (RoHS compliant)
CC
= 3.3V
°C
Pinouts
SCL
SDA
A1
A0
SHDN
ISL22316
(10 LD MSOP)
TOP VIEW
1
2
3
4
5
10
VCC
RH
9
RW
8
7
RL
GND
6
SCL
SDA
SHDN
(10 LD TDFN)
TOP VIEW
1
2
3
A1
A0
4
5
ISL22316
O
10
VCC
RH
9
8
RW
RL
7
GND
6
Ordering Information
PART NUMBER
(Note) PART MARKING
ISL22316UFU10Z* 316UZ 50 -40 to +125 10 Ld MSOP M10.118 ISL22316WFU10Z* 316WZ 10 -40 to +125 10 Ld MSOP M10.118 ISL22316UFRT10Z* 316U 50 -40 to +125 10 Ld 3x3 TDFN L10.3x3B ISL22316WFRT10Z* 316W 10 -40 to +125 10 Ld 3x3 TDFN L10.3x3B *Add “-TK” suffix for tape and reel. Please refer to TB347 for details on reel specifications.
NOTE: These Intersil Pb-free plastic packaged products employ special Pb-free material sets; molding compounds/die attach materials and 100% matte tin plate PLUS ANNEAL - e3 termination finish, which is RoHS compliant and compatible with both SnPb and Pb-free soldering operations. Intersil Pb-free products are MSL classified at Pb-free peak reflow temperatures that meet or exceed the Pb-free requirements of IPC/JEDEC J STD-020.
RESISTANCE OPTION
(kΩ)
TEMP. RANGE
(°C) PACKAGE PKG. DWG. #
1
1-888-INTERSIL or 1-888-468-3774
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
| Intersil (and design) and XDCP are registered trademarks of Intersil Americas Inc.
All other trademarks mentioned are the property of their respective owners.
Copyright Intersil Americas Inc. 2006, 2008. All Rights Reserved
Block Diagram
www.BDTIC.com/Intersil
ISL22316
V
CC
SCL
SDA
A0 A1
SHDN
I2C
INTERFACE
POWER-UP
INTERFACE,
CONTROL
AND
STATUS
LOGIC
NON-VOLATILE
REGISTERS
GND
Pin Descriptions
MSOP PIN
NUMBER
1 1 SCL Open drain I 2 2 SDA Open drain Serial data I/O for the I2C interface 3 3 A1 Device address input for the I 4 4 A0 Device address input for the I 5 5 SHDN Shutdown active low input 6 6 GND Device ground pin 7 7 RL “Low” terminal of DCP 8 8 RW “Wiper” terminal of DCP 9 9 RH “High” terminal of DCP
10 10 VCC Power supply pin
TDFN PIN
NUMBER PIN NAME DESCRIPTION
2
C interface clock input
WR
2
C interface
2
C interface
RH
RW
RL
2
FN6186.1
February 18, 2008
ISL22316
www.BDTIC.com/Intersil
Absolute Maximum Ratings Thermal Information
Storage Temperature. . . . . . . . . . . . . . . . . . . . . . . .-65°C to +150°C
Voltage at any Digital Interface Pin
with Respect to GND . . . . . . . . . . . . . . . . . . . . . -0.3V to V
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .-0.3V to +6V
V
CC
Voltage at any DCP Pin with
Respect to GND. . . . . . . . . . . . . . . . . . . . . . . . . . . . -0.3V to V
IW (10s) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±6mA
Latchup (Note 1) . . . . . . . . . . . . . . . . . . Class II, Level B @ +125°C
ESD Ratings
Human Body Model . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5kV
Charge Device Model. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1kV
CAUTION: Do not operate at or near the maximum ratings listed for extended periods of time. Exposure to such conditions may adversely impact product reliability and result in failures not covered by warranty.
NOTES:
1. Jedec Class II pulse conditions and failure criterion used. Level B exceptions are: using a max positive pulse of 6.5V on the SHDN pin, and using a max negative pulse of -1V for all pins.
2. For θ
3. θ
Analog Specifications Over recommended operating conditions, unless otherwise stated.
SYMBOL PARAMETER TEST CONDITIONS
R
VRH, V
C
H/CL/CW
(Note 17)
I
LkgDCP
VOLTAGE DIVIDER MODE (0V @ R
(Note 9)
(Note 8)
ZSerror
(Note 6)
FSerror
(Note 7)
(Notes 10, 17)
, the “case temp” location is the center of the exposed metal pad on the package underside.
JC
is for the location in the center of the exposed metal pad on the package underside.
JC
TOTAL
R
W
INL
DNL
TC
RH to RL Resistance W option 10 kΩ
to RL Resistance Tolerance -20 +20 %
R
H
End-to-End Temperature Coefficient W option ±50 ppm/°C
Wiper Resistance VCC = 3.3V , wiper current = VCC/R
RLVRH
V
and VRL Terminal Voltages VRH and VRL to GND 0 V
Potentiometer Capacitance 10/10/25 pF
Leakage on DCP Pins Voltage at pin from GND to VCC 0.1 1 µA
; VCC @ RH; measured at RW, unloaded)
L
Integral Non-linearity Monotonic over all tap positions, W and U
Differential Non-linearity Monotonic over all tap positions, W and U
Zero-scale Error W option 0 1 5 LSB
Full-scale Error W option -5 -1 0 LSB
Ratiometric Temperature Coefficient DCP register set to 40 hex for W and U
+0.3
CC
CC
U option 50 kΩ
U option ±80 ppm/°C
option
option
U option 0 0.5 2
U option -2 -1 0
option
Thermal Resistance (Typical) θ
10 Lead MSOP (Note 2). . . . . . . . . . . . 120 N/A
10 Lead TDFN (Notes 2, 3) . . . . . . . . . 150 48.3
Maximum Junction Temperature (Plastic Package). . . . . . . .+150°C
Pb-free reflow profile . . . . . . . . . . . . . . . . . . . . . . . . . .see link below
http://www.intersil.com/pbfree/Pb-FreeReflow.asp
Recommended Operating Conditions
Temperature Range (Extended Industrial). . . . . . . .-40°C to +125°C
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2.7V to 5.5V
V
CC
Power Rating of each DCP . . . . . . . . . . . . . . . . . . . . . . . . . . . .5mW
Wiper Current of each DCP. . . . . . . . . . . . . . . . . . . . . . . . . .±3.0mA
MIN
(Note 18)
TOTAL
-1 1 LSB
-0.5 0.5 LSB
TYP
(Note 4)
(°C/W) θJC (°C/W)
JA
MAX
(Note 18) UNIT
(Note 17)
(Note 17)
70 200 Ω
CC
±4 ppm/°C
V
(Note 5)
(Note 5)
(Note 5)
(Note 5)
3
FN6186.1
February 18, 2008
ISL22316
www.BDTIC.com/Intersil
Analog Specifications Over recommended operating conditions, unless otherwise stated. (Continued)
SYMBOL PARAMETER TEST CONDITIONS
RESISTOR MODE (Measurements between RW and RL with RH not connected, or between RW and RH with RL not connected)
RINL
(Note 14)
RDNL
(Note 13)
Roffset
(Note 12)
Integral Non-linearity DCP register set between 10 hex and 7F
Differential Non-linearity W option -1 1 MI
Offset W option 0 1 5 MI
hex; monotonic over all tap positions; W and U option
U option -0.5 0.5 MI
U option 0 0.5 2 MI
MIN
(Note 18)
-1 1 MI
Operating Specifications Over the recommended operating conditions, unless otherwise specified.
MIN
SYMBOL PARAMETER TEST CONDITIONS
I
CC1
I
CC2
I
I
I
LkgDig
t
DCP
(Note 17)
t
ShdnRec
(Note 17)
Vpor Power-on Recall Voltage Minimum V
V
CC
VCC Supply Current (Volatile Write/Read) f
VCC Supply Current (Non-volatile Write/Read) f
VCC Current (Standby) V
SB
VCC Current (Shutdown) V
SD
Leakage Current, at Pins A0, A1, SHDN, SDA and SCL
DCP Wiper Response Time SCL falling edge of last bit of DCP data byte
DCP Recall Time from Shutdown Mode From rising edge of SHDN
Ramp VCC Ramp Rate 0.2 V/ms
Power-up Delay VCC above Vpor, to DCP Initial Value
t
D
= 400kHz; SDA = Open; (for I2C,
SCL
active, read and write states)
= 400kHz; SDA = Open; (for I2C,
SCL
active, read and write states)
= +5.5V @ +85°C, I2C interface in
CC
standby state
= +5.5V @ +125°C, I2C interface in
V
CC
standby state
= +3.6V @ +85°C, I2C interface in
V
CC
standby state
= +3.6V @ +125°C, I2C interface in
V
CC
standby state
= +5.5V @ +85°C, I2C interface in
CC
standby state
= +5.5V @ +125°C, I2C interface in
V
CC
standby state
= +3.6V @ +85°C, I2C interface in
V
CC
standby state
= +3.6V @ +125°C, I2C interface in
V
CC
standby state Voltage at pin from GND to V
SDA is inactive
to wiper new position
stored position and RH connection SCL falling edge of last bit of ACR data byte
to wiper stored position and RH connection
at which memory recall occurs 2.0 2.6 V
CC
Register recall completed and I in standby state
CC,
signal to wiper
2
C Interface
(Note 18)
-1 1 µA
TYP
(Note 4)
TYP
(Note 4)
1.5 µs
1.5 µs
1.5 µs
MAX
(Note 18) UNIT
MAX
(Note 18) UNIT
0.5 mA
3mA
A
A
A
A
A
A
A
A
3ms
(Note 11)
(Note 11)
(Note 11)
(Note 11)
(Note 11)
4
FN6186.1
February 18, 2008
ISL22316
www.BDTIC.com/Intersil
Operating Specifications Over the recommended operating conditions, unless otherwise specified. (Continued)
SYMBOL PARAMETER TEST CONDITIONS
EEPROM SPECIFICATION
EEPROM Endurance 1,000,000 Cycles EEPROM Retention Temperature T
t
(Note 16)
SERIAL INTERFACE SPECIFICATIONS
V
V
Hysteresis
V
Cpin
(Note 17)
f
SCL
t
t
BUF
t
LOW
t
HIGH
t
SU:STA
t
HD:STA
t
SU:DAT
t
HD:DAT
t
SU:STO
t
HD:STO
t
Non-volatile Write Cycle Time 12 20 ms
WC
A1, A0, SHDN, SDA, and SCL Input Buffer
IL
LOW Voltage A1, A0, SHDN, SDA, and SCL Input Buffer
IH
HIGH Voltage SDA and SCL Input Buffer Hysteresis 0.05*V SDA Output Buffer LOW Voltage, Sinking
OL
4mA A1, A0, SHDN
Capacitance SCL Frequency 400 kHz
t
Pulse Width Suppression Time at SDA and
sp
SCL Inputs SCL Falling Edge to SDA Output Data Valid SCL falling edge crossing 30% of VCC, until
AA
Time the Bus Must be Free Before the Start
of a New Transmission
Clock LOW Time Measured at the 30% of VCC crossing 1300 ns Clock HIGH Time Measured at the 70% of VCC crossing 600 ns START Condition Setup Time SCL rising edge to SDA falling edge; both
STAR T Condition Hold Time From SDA falling edge crossing 30% of VCC
Input Data Setup Time From SDA exiting the 30% to 70% of VCC
Input Data Hold Time From SCL rising edge crossing 70% of VCC
STOP Condition Setup Time From SCL rising edge crossing 70% of VCC,
STOP Condition Hold Time for Read, or Volatile Only Write
Output Data Hold Time From SCL falling edge crossing 30% of
DH
SDA and SCL Rise Time From 30% to 70% of V
t
R
SDA and SCL Fall Time From 70% to 30% of V
t
F
Cb Capacitive Loading of SDA or SCL Total on-chip and off-chip 10 400 pF
, SDA, and SCL Pin
Any pulse narrower than the max spec is suppressed
SDA exits the 30% to 70% of V SDA crossing 70% of VCC during a STOP
condition, to SDA crossing 70% of V during the following START condition
crossing 70% of V
to SCL falling edge crossing 70% of V
window, to SCL rising edge crossing 30% of V
CC
to SDA entering the 30% to 70% of V window
to SDA rising edge crossing 30% of V From SDA rising edge to SCL falling edge;
both crossing 70% of V
V
, until SDA enters the 30% to 70% of
CC
window
V
CC
+55°C 50 Years
window
CC
CC
CC
CC
CC
CC
CC
CC
CC
MIN
(Note 18)
-0.3 0.3*V
0.7*V
00.4V
1300 ns
600 ns
600 ns
100 ns
0ns
600 ns
1300 ns
0ns
20 +
0.1*Cb 20 +
0.1*Cb
CC
CC
TYP
(Note 4)
10 pF
MAX
(Note 18) UNIT
V
+ 0.3 V
CC
50 ns
900 ns
250 ns
250 ns
CC
V
V
5
FN6186.1
February 18, 2008
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