The ISL22316 integrates a single digitally controlled
potentiometer (DCP) and non-volatile memory on a
monolithic CMOS integrated circuit.
The digitally controlled potentiometer is implemented with a
combination of resistor elements and CMOS switches. The
position of the wipers are controlled by the user through the
2
I
C bus interface. The potentiometer has an associated
volatile Wiper Register (WR) and a non-volatile Initial Value
Register (IVR) that can be directly written to and read by the
user. The contents of the WR controls the position of the
wiper. At power-up, the device recalls the contents of the
DCP’s IVR to the WR.
The DCP can be used as a three-terminal potentiometer or
as a two-terminal variable resistor in a wide variety of
applications including control, parameter adjustments, and
signal processing.
FN6186.1
Features
• 128 resistor taps
2
•I
C serial interface
- Two address pins, up to four devices/bus
• Non-volatile storage of wiper position
• Wiper resistance: 70Ω typical @ V
• Shutdown mode
• Shutdown current 5µA max
• Power supply: 2.7V to 5.5V
•50kΩ or 10kΩ total resistance
• High reliability
- Endurance: 1,000,000 data changes per bit per register
- Register data retention: 50 years @ T ≤ +55
• 10 Ld MSOP or 10 Ld TDFN package
• Pb-free (RoHS compliant)
CC
= 3.3V
°C
Pinouts
SCL
SDA
A1
A0
SHDN
ISL22316
(10 LD MSOP)
TOP VIEW
1
2
3
4
5
10
VCC
RH
9
RW
8
7
RL
GND
6
SCL
SDA
SHDN
(10 LD TDFN)
TOP VIEW
1
2
3
A1
A0
4
5
ISL22316
O
10
VCC
RH
9
8
RW
RL
7
GND
6
Ordering Information
PART NUMBER
(Note)PART MARKING
ISL22316UFU10Z*316UZ50-40 to +12510 Ld MSOPM10.118
ISL22316WFU10Z*316WZ10-40 to +12510 Ld MSOPM10.118
ISL22316UFRT10Z*316U50-40 to +12510 Ld 3x3 TDFNL10.3x3B
ISL22316WFRT10Z*316W10-40 to +12510 Ld 3x3 TDFNL10.3x3B
*Add “-TK” suffix for tape and reel. Please refer to TB347 for details on reel specifications.
NOTE: These Intersil Pb-free plastic packaged products employ special Pb-free material sets; molding compounds/die attach materials and 100%
matte tin plate PLUS ANNEAL - e3 termination finish, which is RoHS compliant and compatible with both SnPb and Pb-free soldering operations.
Intersil Pb-free products are MSL classified at Pb-free peak reflow temperatures that meet or exceed the Pb-free requirements of IPC/JEDEC J
STD-020.
RESISTANCE OPTION
(kΩ)
TEMP. RANGE
(°C)PACKAGEPKG. DWG. #
1
1-888-INTERSIL or 1-888-468-3774
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
| Intersil (and design) and XDCP are registered trademarks of Intersil Americas Inc.
All other trademarks mentioned are the property of their respective owners.
Copyright Intersil Americas Inc. 2006, 2008. All Rights Reserved
Block Diagram
www.BDTIC.com/Intersil
ISL22316
V
CC
SCL
SDA
A0
A1
SHDN
I2C
INTERFACE
POWER-UP
INTERFACE,
CONTROL
AND
STATUS
LOGIC
NON-VOLATILE
REGISTERS
GND
Pin Descriptions
MSOP PIN
NUMBER
11SCLOpen drain I
22SDAOpen drain Serial data I/O for the I2C interface
33A1Device address input for the I
44A0Device address input for the I
55SHDNShutdown active low input
66GNDDevice ground pin
77RL“Low” terminal of DCP
88RW“Wiper” terminal of DCP
99RH“High” terminal of DCP
CAUTION: Do not operate at or near the maximum ratings listed for extended periods of time. Exposure to such conditions may adversely impact product reliability and
result in failures not covered by warranty.
NOTES:
1. Jedec Class II pulse conditions and failure criterion used. Level B exceptions are: using a max positive pulse of 6.5V on the SHDN pin, and using
a max negative pulse of -1V for all pins.
2. For θ
3. θ
Analog SpecificationsOver recommended operating conditions, unless otherwise stated.
SYMBOLPARAMETERTEST CONDITIONS
R
VRH, V
C
H/CL/CW
(Note 17)
I
LkgDCP
VOLTAGE DIVIDER MODE (0V @ R
(Note 9)
(Note 8)
ZSerror
(Note 6)
FSerror
(Note 7)
(Notes 10, 17)
, the “case temp” location is the center of the exposed metal pad on the package underside.
JC
is for the location in the center of the exposed metal pad on the package underside.
JC
TOTAL
R
W
INL
DNL
TC
RH to RL ResistanceW option10kΩ
to RL Resistance Tolerance-20+20%
R
H
End-to-End Temperature CoefficientW option±50ppm/°C
Wiper ResistanceVCC = 3.3V , wiper current = VCC/R
RLVRH
V
and VRL Terminal VoltagesVRH and VRL to GND0V
Potentiometer Capacitance10/10/25pF
Leakage on DCP PinsVoltage at pin from GND to VCC0.11µA
; VCC @ RH; measured at RW, unloaded)
L
Integral Non-linearityMonotonic over all tap positions, W and U
Differential Non-linearityMonotonic over all tap positions, W and U
Zero-scale ErrorW option015LSB
Full-scale ErrorW option-5-10LSB
Ratiometric Temperature CoefficientDCP register set to 40 hex for W and U
Wiper Current of each DCP. . . . . . . . . . . . . . . . . . . . . . . . . .±3.0mA
MIN
(Note 18)
TOTAL
-11LSB
-0.50.5LSB
TYP
(Note 4)
(°C/W) θJC (°C/W)
JA
MAX
(Note 18)UNIT
(Note 17)
(Note 17)
70200Ω
CC
±4ppm/°C
V
(Note 5)
(Note 5)
(Note 5)
(Note 5)
3
FN6186.1
February 18, 2008
ISL22316
www.BDTIC.com/Intersil
Analog SpecificationsOver recommended operating conditions, unless otherwise stated. (Continued)
SYMBOLPARAMETERTEST CONDITIONS
RESISTOR MODE (Measurements between RW and RL with RH not connected, or between RW and RH with RL not connected)
RINL
(Note 14)
RDNL
(Note 13)
Roffset
(Note 12)
Integral Non-linearityDCP register set between 10 hex and 7F
Differential Non-linearityW option-11MI
OffsetW option015MI
hex; monotonic over all tap positions;
W and U option
U option-0.50.5MI
U option00.52MI
MIN
(Note 18)
-11MI
Operating Specifications Over the recommended operating conditions, unless otherwise specified.
MIN
SYMBOLPARAMETERTEST CONDITIONS
I
CC1
I
CC2
I
I
I
LkgDig
t
DCP
(Note 17)
t
ShdnRec
(Note 17)
VporPower-on Recall VoltageMinimum V
V
CC
VCC Supply Current (Volatile Write/Read)f
VCC Supply Current (Non-volatile Write/Read) f
VCC Current (Standby)V
SB
VCC Current (Shutdown)V
SD
Leakage Current, at Pins A0, A1, SHDN,
SDA and SCL
DCP Wiper Response TimeSCL falling edge of last bit of DCP data byte
DCP Recall Time from Shutdown ModeFrom rising edge of SHDN
Ramp VCC Ramp Rate0.2V/ms
Power-up DelayVCC above Vpor, to DCP Initial Value
t
D
= 400kHz; SDA = Open; (for I2C,
SCL
active, read and write states)
= 400kHz; SDA = Open; (for I2C,
SCL
active, read and write states)
= +5.5V @ +85°C, I2C interface in
CC
standby state
= +5.5V @ +125°C, I2C interface in
V
CC
standby state
= +3.6V @ +85°C, I2C interface in
V
CC
standby state
= +3.6V @ +125°C, I2C interface in
V
CC
standby state
= +5.5V @ +85°C, I2C interface in
CC
standby state
= +5.5V @ +125°C, I2C interface in
V
CC
standby state
= +3.6V @ +85°C, I2C interface in
V
CC
standby state
= +3.6V @ +125°C, I2C interface in
V
CC
standby state
Voltage at pin from GND to V
SDA is inactive
to wiper new position
stored position and RH connection
SCL falling edge of last bit of ACR data byte
to wiper stored position and RH connection
at which memory recall occurs2.02.6V
CC
Register recall completed and I
in standby state
CC,
signal to wiper
2
C Interface
(Note 18)
-11µA
TYP
(Note 4)
TYP
(Note 4)
1.5µs
1.5µs
1.5µs
MAX
(Note 18)UNIT
MAX
(Note 18)UNIT
0.5mA
3mA
5µA
7µA
3µA
5µA
3µA
5µA
2µA
4µA
3ms
(Note 11)
(Note 11)
(Note 11)
(Note 11)
(Note 11)
4
FN6186.1
February 18, 2008
ISL22316
www.BDTIC.com/Intersil
Operating Specifications Over the recommended operating conditions, unless otherwise specified. (Continued)
SYMBOLPARAMETERTEST CONDITIONS
EEPROM SPECIFICATION
EEPROM Endurance1,000,000Cycles
EEPROM RetentionTemperature T ≤
t
(Note 16)
SERIAL INTERFACE SPECIFICATIONS
V
V
Hysteresis
V
Cpin
(Note 17)
f
SCL
t
t
BUF
t
LOW
t
HIGH
t
SU:STA
t
HD:STA
t
SU:DAT
t
HD:DAT
t
SU:STO
t
HD:STO
t
Non-volatile Write Cycle Time1220ms
WC
A1, A0, SHDN, SDA, and SCL Input Buffer
IL
LOW Voltage
A1, A0, SHDN, SDA, and SCL Input Buffer
IH
HIGH Voltage
SDA and SCL Input Buffer Hysteresis0.05*V
SDA Output Buffer LOW Voltage, Sinking
OL
4mA
A1, A0, SHDN
Capacitance
SCL Frequency400kHz
t
Pulse Width Suppression Time at SDA and
sp
SCL Inputs
SCL Falling Edge to SDA Output Data Valid SCL falling edge crossing 30% of VCC, until
AA
Time the Bus Must be Free Before the Start
of a New Transmission
Clock LOW TimeMeasured at the 30% of VCC crossing1300ns
Clock HIGH TimeMeasured at the 70% of VCC crossing600ns
START Condition Setup TimeSCL rising edge to SDA falling edge; both
STAR T Condition Hold TimeFrom SDA falling edge crossing 30% of VCC
Input Data Setup TimeFrom SDA exiting the 30% to 70% of VCC
Input Data Hold TimeFrom SCL rising edge crossing 70% of VCC