This N-Channel enhancementmode silicon gate power field
effect transistor is an advanced power MOSFET designed,
tested, and guaranteed to withstand a specified level of
energy in the breakdownavalanchemodeof operation. All of
these power MOSFETs are designed for applications such
as switching regulators, switching convertors, motor drivers,
relay drivers, and drivers for high power bipolar switching
transistors requiring high speed and low gate drive power.
These types can be operated directly from integrated
circuits.
Formerly developmental type TA09850.
Ordering Information
PART NUMBERPACKAGEBRAND
IRFPG40TO-247IRFPG40
NOTE: When ordering, include the entire part number.
File Number
Features
• 4.3A, 1000V
•r
• UIS SOA Rating Curve (Single Pulse)
• -55
= 3.500Ω
DS(ON)
o
C to 150oC Operating and Storage Temperature
Symbol
D
G
S
2879.2
Packaging
JEDEC STYLE TO-247
SOURCE
DRAIN
GATE
DRAIN
(TAB)
4-365
CAUTION: These devices are sensitive to electrostatic discharge; follow proper ESD Handling Procedures.
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operationofthe
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
L
pkg
490mJ
-55 to 150
300
260
o
C
o
C
o
C
NOTE:
1. TJ= 25oC to 125oC.
Electrical SpecificationsT
= 25oC, Unless Otherwise Specified
C
PARAMETERSYMBOLTEST CONDITIONSMINMAXUNITS
Drain to Source Breakdown VoltageBV
Gate Threshold VoltageV
GS(TH)VDS
Zero Gate Voltage Drain CurrentI
Gate to Source Leakage CurrentI
Drain to Source On Resistance (Note 2)r
FIGURE 5. SATURATION CHARACTERISTICSFIGURE 6. TRANSFER CHARACTERISTICS
VGS= 4V
4-367
IRFPG40
Typical Performance Curves
6
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
V
= 10V
GS
5
4
3
2
RESISTANCE (Ω)
DRAIN TO SOURCE ON
1
0
048
261210
ID, DRAIN CURRENT (A)
Unless Otherwise Specified (Continued)
FIGURE 7. DRAIN TOSOURCEONRESISTANCE vs GATE
VOLTAGE AND DRAIN CURRENT
1.3
ID= 250µA
1.2
1.1
1.0
BREAKDOWN VOLTAGE
0.9
NORMALIZED DRAIN TO SOURCE
0
-60060120150
-40 -20204080 100140
TJ, JUNCTION TEMPERATURE (oC)
3.0
PULSE DURATION = 80µs
2.7
DUTY CYCLE = 0.5% MAX
I
= 2.5A, VGS = 10V
D
2.5
2.2
2.0
1.7
1.5
ON RESISTANCE
1.3
1.0
NORMALIZED DRAIN TO SOURCE
0.8
0
-50050100150
, JUNCTION TEMPERATURE (oC)
T
J
FIGURE 8. NORMALIZED DRAIN TO SOURCE ON
RESISTANCE vs JUNCTION TEMPERATURE
3000
2500
2000
1500
1000
C, CAPACITANCE (pF)
C
ISS
C
OSS
C
RSS
500
0
1100
V
, DRAIN TO SOURCE VOLTAGE (V)
DS
10
VGS= 0V, f = 1MHz
C
= CGS + C
ISS
C
= C
RSS
C
≈ C
OSS
GD
DS
+ C
GD
GD
FIGURE 9. NORMALIZED DRAIN TO SOURCE BREAKDOWN
FIGURE 10. CAPACITANCE vs. DRAIN TO SOURCE VOLTAGE
VOLTAGE vs. JUNCTION TEMPERATURE
8
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
V
≥ 70V
DS
6
4
2
FORWARD TRANSCONDUCTANCE (S)
fs,
g
0
0123
ID, DRAIN CURRENT (A)
25oC
150oC
45
6
100
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
10
1
, SOURCE TO DRAIN CURRENT (A)
SD
I
0.1
0
0.3
150oC
0.60.91.21.5
SOURCE TO DRAIN VOLTAGE (V)
25oC
FIGURE 11. TRANSCONDUCTANCE vs DRAIN CURRENTFIGURE 12. SOURCE TO DRAIN DIODE VOLTAGE
4-368
IRFPG40
Typical Performance Curves
GATE TO SOURCE VOLTAGE (V)
FIGURE 13. GATE TO SOURCE VOLTAGE vs GATE CHARGE
Test Circuits and Waveforms
VARY t
TO OBTAIN
P
REQUIRED PEAK I
V
GS
AS
R
G
Unless Otherwise Specified (Continued)
16
14
12
10
8
6
4
2
0
0102030
V
DS
L
DUT
VDS = 100V
V
= 200V
DS
VDS = 400V
4050
Qg, GATE CHARGE (nC)
+
V
DD
-
607080
I
AS
BV
DSS
t
P
V
DS
V
DD
0V
P
I
AS
0.01Ω
0
t
AV
t
FIGURE 14. UNCLAMPED ENERGY TEST CIRCUITFIGURE 15. UNCLAMPED ENERGY WAVEFORMS
t
ON
R
G
V
GS
FIGURE 16. SWITCHING TIME TEST CIRCUIT
t
d(ON)
t
R
L
+
V
DD
-
DUT
V
DS
0
V
GS
0
90%
10%
r
10%
50%
PULSE WIDTH
FIGURE 17. RESISTIVE SWITCHING WAVEFORMS
t
d(OFF)
90%
t
OFF
50%
t
f
90%
10%
4-369
IRFPG40
Test Circuits and Waveforms
CURRENT
REGULATOR
12V
BATTERY
0
0.2µF
50kΩ
I
G(REF)
0.3µF
G
IG CURRENT
SAMPLING
RESISTORRESISTOR
FIGURE 18. GATE CHARGE TEST CIRCUIT
(Continued)
V
DS
(ISOLATED
SUPPLY)
SAME TYPE
AS DUT
D
DUT
S
CURRENT
I
D
SAMPLING
V
DD
Q
g(TOT)
Q
gd
Q
gs
V
DS
0
V
DS
0
I
G(REF)
V
GS
FIGURE 19. GATE CHARGE WAVEFORMS
All Intersil semiconductor products are manufactured, assembled and tested under ISO9000 quality systems certification.
Intersil semiconductor products are sold by description only.Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time without notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and
reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result
from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
For information regarding Intersil Corporation and its products, see web site http://www.intersil.com
Sales Office Headquarters
NORTH AMERICA
Intersil Corporation
P. O. Box 883, Mail Stop 53-204
Melbourne, FL 32902
TEL: (407) 724-7000
FAX: (407) 724-7240
4-370
EUROPE
Intersil SA
Mercure Center
100, Rue de la Fusee
1130 Brussels, Belgium
TEL: (32) 2.724.2111
FAX: (32) 2.724.22.05
ASIA
Intersil (Taiwan) Ltd.
7F-6, No. 101 Fu Hsing North Road
Taipei, Taiwan
Republic of China
TEL: (886) 2 2716 9310
FAX: (886) 2 2715 3029
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