IRFF9120
Data Sheet June 1999
4A, 100V, 0.60 Ohm, P-Channel Power
MOSFET
This P-Channel enhancement mode silicon gate power
field effect transistor is designed for applications such as
switching regulators, switching converters, motor drivers,
relay drivers, and drivers for high power bipolar switching
transistors requiring high speed and low gate drive power.
These types can be operated directly from integrated
circuits.
Formerly developmental type TA17501.
Ordering Information
PART NUMBER PACKAGE BRAND
IRFF9120 TO-205AF IRFF9120
NOTE: When ordering, use the entire part number.
File Number
Features
• 4A, 100V
DS(ON)
= 0.60Ω
•r
• Single Pulse Avalanche Energy Rated
• SOA is Power-Dissipation Limited
• Nanosecond Switching Speeds
• Linear Transfer Characteristics
• High Input Impedance
Symbol
D
G
S
2287.2
Packaging
JEDEC TO-205AF
DRAIN
(CASE)
SOURCE
GATE
4-94
CAUTION: These devices are sensitive to electrostatic discharge; follow proper ESD Handling Procedures.
http://www.intersil.com or 407-727-9207
| Copyright © Intersil Corporation 1999
IRFF9120
Absolute Maximum Ratings T
= 25oC, Unless Otherwise Specified
C
IRFF9120 UNITS
Drain to Source Voltage (Note 1). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . V
Drain to Gate Voltage (RGS = 20kΩ) (Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . V
DGR
Continuous Drain Current, TC = 25oC. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . I
Pulsed Drain Current (Note 3) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . I
Gate to Source Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . V
Maximum Power Dissipation, (Figure 14) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . P
DS
D
DM
GS
D
-100 V
-100 V
-4 A
-16 A
±20 V
20 W
Linear Derating Factor (Figure 14). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.16 W/oC
Single Pulse Avalanche Energy Rating (Note 4) . . . . . . . . . . . . . . . . . . . . . . . . . . . . E
Operating and Storage Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . TJ,T
AS
STG
Maximum Temperature for Soldering
Leads at 0.063in (1.6mm) from Case for 10s. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . T
Package Body for 10s, See Techbrief 334 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . T
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operationofthe
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
L
pkg
370 mJ
-55 to 150
300
260
o
C
o
C
o
C
NOTE:
1. TJ= 25oC to 125oC.
Electrical Specifications T
= 25oC, Unless Otherwise Specified
C
PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNITS
Drain to Source Breakdown Voltage BV
Gate Threshold Voltage V
GS(TH)
Zero Gate Voltage Drain Current I
On-State Drain Current (Note 2) I
D(ON)VDS
Gate to Source Leakage Forward I
Gate to Source Leakage Reverse IG
Drain to Source On-State Resistance (Note 2) r
DS(ON)VGS
Forward Transconductance (Note 2) g
Turn-On Delay Time t
D(ON)VDD
Rise Time t
Turn-Off Delay Time t
D(OFF)
Fall Time t
Total Gate Charge
(Gate to Source + Gate to Drain)
Q
G(TOT)VGS
Gate to Source Charge Q
Gate to Drain “Miller” Charge Q
Input Capacitance C
Output Capacitance C
Reverse Transfer Capacitance C
Internal Drain Inductance L
Internal Source Inductance L
DSSVGS
DSS
GSS
SS
fs
r
f
GS
GD
ISS
OSS
RSS
D
S
= 0V, ID = 250µA -100 - - V
VDS = VGS, ID = 250µA -2.0 - -4.0 V
VDS = Max Rating, VGS = 0V - - -250 µA
= Max Rating x 0.8, VGS = 0V, TJ = 125oC - - -1000 µA
V
DS
> I
D(ON)
x r
DS(ON)MAX
, VGS = -10V -4 - - A
VGS = -20V - - -100 nA
VGS= 20V - - 100 nA
= 10V, ID = -2A - 0.5 0.6 Ω
VDS > I
≅ 0.5BV
(Figure 18) MOSFET Switching Times are
Essentially Independent of Operating
Temperature
D(ON)
x r
DS(ON) Max
, ID= 4A, RG = 9.1Ω
DSS
, ID = 2A 1.25 2 - S
-2550ns
- 50 100 ns
- 50 100 ns
- 50 100 ns
= 10V, ID = 4A, VDS = 0.8 Max BV
DSS
-1622nC
(See Figure 18 for Test Circuit) Gate Charge
is Essentially Independent of Operating
Temperature
-9-nC
-7-nC
VGS = 0V, VDS = 25V, f = 1.0MHz,
See Figure 10
- 300 - pF
- 200 - pF
-50-pF
Measured from the
Drain Lead, 5.0mm
(0.2in) From Header
to Center of Die
Measured from the
Modified MOSFET
Symbol Showing the
Internal Device
Inductances
D
- 5.0 - nH
-15-nH
Source Lead, 5.0mm
(0.2in) from Header to
Source Bonding Pad
G
Junction to Case R
Junction to Ambient R
4-95
S
θJC
Typical Socket Mount - - 175oC/W
θJA
- - 6.25oC/W
IRFF9120
Source to Drain Diode Specifications
PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNITS
Continuous Source Current I
Pulse Source Current (Note 3) I
Source to Drain Diode Voltage (Note 2) V
SD
SM
SD
Diode Reverse Recovery Time t
Reverse Recovery Charge Q
RR
NOTES:
2. Pulse test: Pulse width ≤ 300µs, Duty Cycle 2%.
3. Repetitive rating: Pulse width limited by maximum junction temperature. See Transient Thermal Impedance Curve (Figure 3).
4. VDD= 25V, starting TJ= 250oC, L = 34.7mH, RG= 25Ω, peak IAS = 4.0A. See Figures 15 and 16)
Modified MOSFET
Symbol Showing the
Integral Reverse
D
- - -4 A
- - -16 A
P-N Junction
Rectifier
G
S
TJ = 25oC, ISD = -4A, VGS = 0V - - -1.5 V
TJ = 150oC, ISD = 4A, dISD/dt = 100A/µs - 230 - ns
rr
TJ = 150oC, ISD = -4A, dISD/dt = 100A/µs - 1.3 - µC
Typical Performance Curves
1.2
1.0
0.8
0.6
0.4
0.2
POWER DISSIPATION MULTIPLIER
0
0 50 100 150
TC, CASE TEMPERATURE (oC)
FIGURE 1. NORMALIZED POWER DISSIPATION vs CASE
TEMPERATURE
1.0
0.5
0.2
0.1
0.1
, NORMALIZED
θJC
Z
THERMAL IMPEDANCE
0.01
0.05
0.02
0.01
-5
10
SINGLE PULSE
-4
10
-3
10
t1, RECTANGULAR PULSE DURATION (s)
-5
-4
-3
-2
, DRAIN CURRENT (A)
D
I
-1
0
25 50 100
TC, CASE TEMPERATURE (oC)
FIGURE 2. MAXIMUM CONTINUOUS DRAIN CURRENT vs
CASE TEMPERATURE
P
DM
t
1
t
θJC
1/t2
x R
2
θJC
NOTES:
DUTY FACTOR: D = t
PEAK TJ = PDM x Z
-2
10
-1
10
1
12575
+ T
150
C
10
FIGURE 3. NORMALIZED MAXIMUM TRANSIENT THERMAL IMPEDANCE
4-96