This N-Channel enhancement mode silicon gate power field
effect transistor is an advanced power MOSFET designed,
tested, and guaranteed to withstand a specified level of
energy in the breakdown avalanche mode of operation. All of
these power MOSFETs are designed for applications such
as switching regulators, switching convertors, motor drivers,
relay drivers, and drivers for high power bipolar switching
transistors requiring high speed and low gate drive power.
These types can be operated directly from integrated
circuits.
Formerly developmental type TA17405.
Ordering Information
PART NUMBERPACKAGEBRAND
IRFF420TO-205AFIRFF420
NOTE: When ordering, include the entire part number.
File Number1891.4
Features
• 1.6A, 500V
•r
DS(ON)
• Single Pulse Avalanche Energy Rated
• SOA is Power Dissipation Limited
• Nanosecond Switching Speeds
• Linear Transfer Characteristics
• High Input Impedance
• Related Literature
- TB334 “Guidelines for Soldering Surface Mount
= 3.000Ω
Components to PC Boards”
Symbol
D
G
Packaging
DRAIN
(CASE)
S
JEDEC TO-205AF
SOURCE
GATE
1
CAUTION: These devices are sensitive to electrostatic discharge; follow proper ESD Handling Procedures.
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
L
pkg
210mJ
-55 to 150
300
260
o
C
o
C
o
C
NOTE:
1. TJ= 25oC to 125oC.
Electrical SpecificationsT
= 25oC, Unless Otherwise Specified
C
PARAMETERSYMBOLTEST CONDITIONSMINTYPMAXUNITS
Drain to Source Breakdown VoltageBV
Gate to Threshold VoltageV
Zero-Gate Voltage Drain CurrentI
On-State Drain Current (Note 2)I
Gate to Source LeakageI
Drain to Source On Resistance
r
DS(ON)VGS
DSSVGS
GS(TH)VGS
DSS
D(ON)
GSS
= 0V, ID = 250µA (Figure 10)500--V
= VDS, ID = 250µA2.0-4.0V
VDS = Rated BV
VDS = 0.8 x Rated BV
VDS> I
FIGURE 6. SATURATION CHARACTERISTICSFIGURE 7. TRANSFER CHARACTERISTICS
9
8
7
6
5
, DRAIN TO SOURCE
4
ON RESISTANCE (Ω)
DS(ON)
r
3
2
2µs PULSE TEST
= 25oC
T
J
2468010
ID, DRAIN CURRENT (A)
VGS = 10V
VGS = 20V
NOTE: Heating effect of 2µs pulse is minimal.
FIGURE 8. DRAIN TO SOURCE ON RESISTANCE vs GATE
VOLTAGE AND DRAIN CURRENT
1214
2
1
, ON-STATE DRAIN CURRENT (A)
D
I
0
0246810
2.6
2.2
1.8
1.4
1.0
ON RESISTANCE
0.6
NORMALIZED DRAIN TO SOURCE
0.2
TJ = 125oC
TJ = -25oC
TJ = -55oC
VGS, GATE TO SOURCE VOLTAGE (V)
ID = 1A
VGS = 10V
-4040120
0160
, JUNCTION TEMPERATURE (oC)
T
J
80
FIGURE 9. NORMALIZED DRAIN TO SOURCE ON
RESISTANCE vs JUNCTION TEMPERATURE
4
Typical Performance Curves (Continued)
IRFF420
1.25
ID = 250µA
1.15
1.05
0.95
BREAKDOWN VOLTAGE
0.85
NORMALIZED DRAIN TO SOURCE
0.75
-404080120
0160
TJ, JUNCTION TEMPERATURE (oC)
FIGURE 10. NORMALIZED DRAIN TOSOURCE BREAKDOWN
VOLTAGE vs JUNCTION TEMPERATURE
5
80µs PULSE TEST
4
TJ = -50oC
3
2
TJ = 25oC
TJ = 125oC
1000
800
600
400
C, CAPACITANCE (pF)
200
0
C
ISS
C
C
RSS
1020304050
VDS, DRAIN TO SOURCE VOLTAGE (V)
OSS
VGS = 0V, f = 1MHz
C
= CGS + C
C
C
ISS
RSS
OSS
= C
GD
≈ CDS + C
GD
GD
FIGURE 11. CAPACITANCE vs DRAIN TO SOURCE VOLTAGE
100
80µs PULSE TEST
TJ = 25oC
TJ = 150oC
10
TJ = 150oC
, TRANSCONDUCTANCE (S)
1
fs
g
0
, SOURCE TO DRAIN CURRENT (A)
SD
I
1
123405
ID, DRAIN CURRENT (A)
0134
TJ = 25oC
2
VSD, SOURCE TO DRAIN VOLTAGE (V)
FIGURE 12. TRANSCONDUCTANCE vs DRAIN CURRENTFIGURE 13. SOURCE TO DRAIN DIODE VOLTAGE
20
ID = 1.6A
15
10
5
, GATE TO SOURCE VOLTAGE (V)
GS
V
0
VDS = 100V
VDS = 250V
V
= 400V
DS
481216020
Q
, TOTAL GATE CHARGE (nC)
g(TOT)
FIGURE 14. GATE TO SOURCE VOLTAGE vs GATE CHARGE
5
IRFF420
Test Circuits and Waveforms
V
DS
BV
DSS
L
VARY t
TO OBTAIN
P
REQUIRED PEAK I
V
GS
AS
R
G
+
V
DD
-
DUT
0V
P
I
AS
0.01Ω
0
t
FIGURE 15. UNCLAMPED ENERGY TEST CIRCUITFIGURE 16. UNCLAMPED ENERGY WAVEFORMS
t
P
I
AS
t
AV
V
DS
V
DD
t
ON
t
d(ON)
t
R
L
+
V
R
G
DD
-
V
DS
0
r
90%
10%
DUT
V
GS
V
GS
10%
0
50%
PULSE WIDTH
FIGURE 17. SWITCHING TIME TEST CIRCUITFIGURE 18. RESISTIVE SWITCHING WAVEFORMS
V
DS
(ISOLATED
SUPPLY)
SAME TYPE
AS DUT
V
DD
Q
g(TOT)
Q
gd
Q
gs
12V
BATTERY
0.2µF
50kΩ
CURRENT
REGULATOR
0.3µF
t
d(OFF)
90%
V
GS
t
OFF
50%
t
f
90%
10%
D
G
I
0
G(REF)
IG CURRENT
SAMPLING
RESISTORRESISTOR
DUT
S
CURRENT
I
D
SAMPLING
0
V
DS
I
G(REF)
0
V
DS
FIGURE 19. GATE CHARGE TEST CIRCUITFIGURE 20. GATE CHARGE WAVEFORMS
6
IRFF420
All Intersil semiconductor products are manufactured, assembled and tested under ISO9000 quality systems certification.
Intersil semiconductor products are sold by description only. Intersil Corporation reserves the rightto make changes in circuit design and/or specifications at any time without notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and
reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result
from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
For information regarding Intersil Corporation and its products, see web site http://www.intersil.com
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NORTH AMERICA
Intersil Corporation
P. O. Box 883, Mail Stop 53-204
Melbourne, FL 32902
TEL: (407) 724-7000
FAX: (407) 724-7240
7
EUROPE
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1130 Brussels, Belgium
TEL: (32) 2.724.2111
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Republic of China
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