July 1998
Semiconductor
IRF320, IRF321,
IRF322, IRF323
2.8A and 3.3A, 350V and 400V, 1.8 and 2.5 Ohm,
N-Channel Power MOSFETs
Features
• 2.8A and 3.3A, 350V and 400V
•r
• Single Pulse Avalanche Energy Rated
• SOA is Power Dissipation Limited
• Nanosecond Switching Speeds
• Linear Transfer Characteristics
• High Input Impedance
• Majority Carrier Device
• Related Literature
- TB334 “Guidelines for Soldering Surface Mount
= 1.8Ω and 2.5Ω
DS(ON)
Components to PC Boards”
Ordering Information
PART NUMBER PACKAGE BRAND
IRF320 TO-204AA IRF320
IRF321 TO-204AA IRF321
IRF322 TO-204AA IRF322
Description
These are N-Channel enhancement mode silicon gate
power field effect transistors. They are advanced power
MOSFETs designed, tested, and guaranteed to withstand a
specified level of energy in the breakdown avalanche mode
of operation. All of these power MOSFETs are designed for
applications such as switching regulators, switching convertors, motor drivers, relay drivers, and drivers for high power
bipolar switching transistors requiring high speed and low
gate drive power. These types can be operated directly from
integrated circuits.
Formerly developmental type TA17404.
Symbol
D
G
S
IRF323 TO-204AA IRF323
NOTE: When ordering, use the entire part number.
Packaging
DRAIN
(FLANGE)
JEDEC TO-204AA
GATE (PIN 1)
SOURCE (PIN 2)
CAUTION: These devices are sensitive to electrostatic discharge. Users should follow proper ESD Handling Procedures.
Copyright
© Harris Corporation 1998
5-1
File Number 1569.3
IRF320, IRF321, IRF322, IRF323
Absolute Maximum Ratings T
= 25oC, Unless Otherwise Specified
C
IRF320 IRF321 IRF322 IRF323 UNITS
Drain to Source Breakdown Voltage (Note 1). . . . . . . . . .V
Drain to Gate Voltage (RGS = 20kΩ) (Note 1) . . . . . . . V
DGR
Continuous Drain Current. . . . . . . . . . . . . . . . . . . . . . . . . . I
TC= 100oC. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . I
Pulsed Drain Current (Note 3) . . . . . . . . . . . . . . . . . . . . . I
Gate to Source Voltage . . . . . . . . . . . . . . . . . . . . . . . . . .V
Maximum Power Dissipation . . . . . . . . . . . . . . . . . . . . . . .P
DS
D
D
DM
GS
D
400 350 400 350 V
400 350 400 350 V
3.3
2.1
3.3
2.1
2.8
1.8
2.8
1.8
13 13 11 11 A
±20 ±20 ±20 ±20 V
50 50 50 50 W
A
A
Linear Derating Factor . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.4 0.4 0.4 0.4 W/oC
Single Pulse Avalanche Energy Rating (Note 4) . . . . . . .E
Operating and Storage Temperature . . . . . . . . . . . . TJ,T
AS
STG
Maximum Temperature for Soldering
Leads at 0.063in (1.6mm) from Case for 10s . . . . . . . . . T
Package Body for 10s, See TB334. . . . . . . . . . . . . . . T
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
L
pkg
190 190 190 190 mJ
-55 to 150 -55 to 150 -55 to 150 -55 to 150
300
260
300
260
300
260
300
260
o
C
o
C
o
C
NOTE:
1. TJ = 25oC to 125oC.
Electrical Specifications T
= 25oC, Unless Otherwise Specified
C
PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNITS
Drain to Source Breakdown Voltage BV
DSSID
= 250µA, VGS = 0V, (Figure 10)
IRF320, IRF322 400 - - V
IRF321, IRF323 350 - - V
Gate to Threshold Voltage V
Zero Gate Voltage Drain Current I
GS(TH)VGS
DSS
= VDS, ID = 250µA 2.0 - 4.0 V
VDS = Rated BV
VDS = 0.8 x Rated BV
, VGS = 0V - - 25 µA
DSS
DSS
, VGS = 0V
- - 250 µA
TJ = 125oC
On-State Drain Current (Note 2) I
D(ON)VDS
IRF320, IRF321 3.3 - - A
> I
(Figure 7)
D(ON)
x r
DS(ON)MAX
, VGS = 10V
IRF322, IRF323 2.8 - - A
Gate to Source Leakage Current I
Drain to Source On Resistance (Note 2) r
GSS
DS(ON)ID
VGS = ±20V ±100 nA
= 1.8A, VGS = 10V, (Figures 8, 9)
IRF320, IRF321 - 1.5 1.8 Ω
IRF322, IRF323 - 1.8 2.5 Ω
Forward Transconductance (Note 2) g
Turn-On Delay Time t
d(ON)VDD
VDS≥ 10V, ID = 2.0A, (Figure 12) 1.7 2.7 - S
fs
= 200V, ID≈ 3.3A, RG = 18Ω, RL = 60Ω,
-1015ns
VGS = 10V, (Figures 17, 18)
Rise Time t
Turn-Off Delay Time t
d(OFF)
Fall Time t
Total Gate Charge
Q
g(TOT)VGS
(Gate to Source + Gate to Drain)
MOSFET Switching Times are Essentially
r
Independent of Operating Temperature
f
= 10V , ID = 3.3A, VDS = 0.8 x Rated BV
I
= 1.5mA, (Figures 14, 19, 20)
G(REF)
DSS
-1420ns
-3045ns
-1320ns
,
-1220nC
Gate Charge is Essentially Independent of
Gate to Source Charge Q
Gate to Drain “Miller” Charge Q
Operating Temperature
gs
gd
-4-nC
-8-nC
5-2
IRF320, IRF321, IRF322, IRF323
Electrical Specifications T
= 25oC, Unless Otherwise Specified (Continued)
C
PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNITS
Input Capacitance C
Output Capacitance C
Reverse Transfer Capacitance C
Internal Drain Inductance L
Internal Source Inductance L
Thermal Resistance Junction to Case R
Thermal Resistance Junction to Ambient R
Source to Drain Diode Specifications
PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNITS
VDS = 25V, VGS = 0V, f = 1MHz
ISS
(Figure 11)
OSS
RSS
Measured Between the
D
Contact Screw on the
Flange that is Closer to
Source and Gate Pins
and the Center of Die
Measured from the
S
Source Lead, 6mm
(0.25in) From the
Flange and the Source
Bonding Pad
θJC
Free Air Operation - - 30
θJA
Modified MOSFET
Symbol Showing the
Internal Devices
Inductances
D
L
D
G
L
S
S
- 450 - pF
- 100 - pF
-20- pF
- 5.0 - nH
- 12.5 - nH
- - 2.5
o
o
C/W
C/W
Continuous Source to Drain Current I
Pulse Source to Drain Current
I
(Note 3)
Source to Drain Diode Voltage (Note 2) V
Reverse Recovery Time t
Reverse Recovery Charge Q
SDM
Modified MOSFET
SD
Symbol Showing the
Integral Reverse P-N
D
- - 3.3 A
- - 13 A
Junction Diode
G
S
TC = 25oC, ISD = 3.3A, VGS = 0V, (Figure 13) - - 1.8 V
SD
TJ = 25oC, ISD = 3.3A, dISD/dt = 100A/µs 120 270 600 ns
rr
TJ = 25oC, ISD = 3.3A, dISD/dt = 100A/µs 0.64 1.4 3.0 µC
RR
NOTES:
2. Pulse test: pulse width ≤ 300µs, duty cycle ≤ 2%.
3. Repetitive rating: pulse width limited by Max junction temperature. See Transient Thermal Impedance curve (Figure 3).
4. VDD = 50V, starting TJ = 25oC, L = 31mH, RG = 25Ω, peak IAS = 3.3A. See Figures 15, 16.
5-3