This N-Channel enhancementmode silicon gate power field
effect transistor is an advanced power MOSFET designed,
tested, and guaranteed to withstand a specified level of
energy in the breakdownavalanchemodeof operation. All of
these power MOSFETs are designed for applications such
as switching regulators, switching convertors, motor drivers,
relay drivers, and drivers for high power bipolar switching
transistors requiring high speed and low gate drive power.
These types can be operated directly from integrated
circuits.
Formerly developmental type TA17411.
Ordering Information
PART NUMBERPACKAGEBRAND
IRF130TO-204AAIRF130
NOTE: When ordering, use the entire part number .
File Number
Features
• 14A, 100V
•r
• Single Pulse Avalanche Energy Rated
• SOA is Power Dissipation Limited
• Nanosecond Switching Speeds
• Linear Transfer Characteristics
• High Input Impedance
• Related Literature
- TB334 “Guidelines for Soldering Surface Mount
= 0.160Ω
DS(ON)
Components to PC Boards”
Symbol
D
G
1566.4
Packaging
DRAIN
(FLANGE)
JEDEC TO-204AA
GATE (PIN 1)
S
SOURCE (PIN 2)
1
CAUTION: These devices are sensitive to electrostatic discharge; follow proper ESD Handling Procedures.
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operationofthe
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
L
pkg
50mJ
-55 to 175
300
260
o
C
o
C
o
C
NOTE:
1. TJ= 25oC to 150oC.
Electrical SpecificationsT
= 25oC, Unless Otherwise Specified
C
PARAMETERSYMBOLTEST CONDITIONSMINTYPMAX UNITS
Drain to Source Breakdown VoltageBV
Gate Threshold VoltageV
GS(TH)VDS
Zero Gate Voltage Drain CurrentI
On-State Drain Current (Note 2)I
D(ON)VDS
Gate to Source Leakage CurrentI
Drain to Source On Resistance (Note 2)r
FIGURE 6. SATURATION CHARACTERISTICSFIGURE 7. TRANSFER CHARACTERISTICS
1.5
80µs PULSE TEST
1.2
0.9
0.6
0.3
DRAIN TO SOURCE ON RESISTANCE
0.0
01224364860
I
, DRAIN CURRENT (A)
D
VGS = 10V
VGS = 20V
3.0
ID = 14A
V
= 10V
GS
2.4
1.8
1.2
ON RESISTANCE
0.6
NORMALIZED DRAIN TO SOURCE
0.0
-60060120180
T
, JUNCTION TEMPERATURE (oC)
J
FIGURE 8. DRAIN TO SOURCE ON RESISTANCE vs GATE
VOLTAGE AND DRAIN CURRENT
4
FIGURE 9. NORMALIZED DRAIN TOSOURCE ON
RESISTANCE vs JUNCTION TEMPERATURE
IRF130
Typical Performance Curves
1.25
ID = 250µA
1.15
1.05
0.95
BREAKDOWN VOLTAGE
0.85
NORMALIZED DRAIN TO SOURCE
0.75
-60060120180
TJ, JUNCTION TEMPERATURE (oC)
Unless Otherwise Specified (Continued)
FIGURE 10. NORMALIZED DRAINTO SOURCE BREAKDOWN
VOLTAGE vs JUNCTION TEMPERATURE
10
VDS 50V
80µs PULSE TEST
8
6
4
, TRANSCONDUCTANCE (S)
2
fs
g
TJ = 25oC
TJ = 175oC
1500
1200
900
600
C, CAPACITANCE (pF)
300
0
110
C
RSS
2525
, DRAIN TO SOURCE VOLTAGE (V)
V
DS
VGS = 0V, f = 1MHz
= CGS + C
C
ISS
C
= C
RSS
ISS
OSS
≈ C
GD
DS
C
C
C
OSS
+ C
GD
GD
10
FIGURE 11. CAPACITANCE vs DRAIN TO SOURCE VOLTAGE
3
10
2
10
10
TJ = 175oC
, DRAIN CURRENT (A)
1
SD
I
TJ = 25oC
2
0
5101520250
ID, DRAIN CURRENT (A)
FIGURE 12. TRANSCONDUCTANCE vs DRAIN CURRENT
20
ID = 14A
FOR TEST CIRCUIT
SEE FIGURE 18
16
12
8
4
, GATE TO SOURCE VOLTAGE (V)
GS
V
0
0612182430
Q
g(TOT)
FIGURE 14. GATE TO SOURCE VOLTAGE vs GATE CHARGE
0.1
0
FIGURE 13. SOURCE TO DRAIN DIODE VOLTAGE
VDS = 50V
VDS = 20V
, TOTAL GATE CHARGE (nC)
0.4
VSD, SOURCE TO DRAIN VOLTAGE (V)
VDS = 80V
1.21.62.00.8
5
Test Circuits and Waveforms
VARY t
TO OBTAIN
P
REQUIRED PEAK I
V
GS
t
0V
P
AS
R
G
IRF130
V
DS
BV
DSS
L
+
V
DD
-
DUT
I
AS
0
0.01Ω
t
P
I
AS
t
AV
V
DS
V
DD
FIGURE 15. UNCLAMPED ENERGY TEST CIRCUIT
R
L
R
G
+
V
DD
-
FIGURE 16. UNCLAMPED ENERGY WAVEFORMS
t
ON
t
d(ON)
t
V
DS
0
r
90%
10%
DUT
V
GS
V
GS
10%
0
50%
PULSE WIDTH
FIGURE 17. SWITCHING TIME TEST CIRCUITFIGURE 18. RESISTIVE SWITCHING WAVEFORMS
V
DS
(ISOLATED
SUPPLY)
SAME TYPE
AS DUT
V
DD
Q
g(TOT)
Q
gd
Q
gs
12V
BATTERY
0.2µF
50kΩ
CURRENT
REGULATOR
0.3µF
t
d(OFF)
90%
V
GS
t
OFF
50%
t
f
90%
10%
D
V
DS
S
CURRENT
I
D
SAMPLING
DUT
0
V
DS
I
G(REF)
0
G
I
0
g(REF)
IG CURRENT
SAMPLING
RESISTORRESISTOR
FIGURE 19. GATE CHARGE TEST CIRCUITFIGURE 20. GATE CHARGE WAVEFORMS
6
IRF130
All Intersil semiconductor products are manufactured, assembled and tested under ISO9000 quality systems certification.
Intersil semiconductor products are sold by description only.Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time without notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and
reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result
from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
For information regarding Intersil Corporation and its products, see web site http://www.intersil.com
Sales Office Headquarters
NORTH AMERICA
Intersil Corporation
P. O. Box 883, Mail Stop 53-204
Melbourne, FL 32902
TEL: (407) 724-7000
FAX: (407) 724-7240
7
EUROPE
Intersil SA
Mercure Center
100, Rue de la Fusee
1130 Brussels, Belgium
TEL: (32) 2.724.2111
FAX: (32) 2.724.22.05
ASIA
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Taipei, Taiwan
Republic of China
TEL: (886) 2 2716 9310
FAX: (886) 2 2715 3029
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