Intersil Corporation HM-6516-883 Datasheet

HM-6516/883
March 1997
Features
• This Circuit is Processed in Accordance to MIL-STD­883 and is Fully Conformant Under the Provisions of Paragraph 1.2.1.
• Low Power Operation . . . . . . . . . . . . . 55mW/MHz Max
• Industry Standard Pinout
• Single Supply. . . . . . . . . . . . . . . . . . . . . . . . . . 5.0V VCC
• TTL Compatible
• Static Memory Cells
• High Output Drive
• On-Chip Address Latches
• Easy Microprocessor Interfacing
Ordering Information
2K x 8 CMOS RAM
Description
The HM-6516/883 is a CMOS 2048 x 8 Static Random Access Memory. Extremely low power operation is achieved by the use of complementary MOS design techniques. This low power is further enhanced by the use of synchronous cir­cuit techniques that keep the active (operating) power low, which also gives fast access times. The pinout of the HM­6516/883 is the popular 24 pin, 8-bit wide JEDEC Standard which allows easy memory board layouts, flexible enough to accommodate a variety of PROMs, RAMS, EPROMs, and ROMs.
The HM-6516/883 is ideally suited for use in microprocessor based systems. The byte wide organization simplifies the memory array design, and keeps operating power down to a minimum because only one device is enabled at a time. The address latches allow very simple interfacing to recent gen­eration microprocessors which employ a multiplexed address/data bus. The convenient output enable control also simplifies multiplexed bus interfacing by allowing the data outputs to be controlled independent of the chip enable.
Pinouts
HM-6516/883
1
A7
2
A6
3
A5
4
A4
5
A3
6
A2
7
A1
8
A0
9
DQ0
10
DQ1
11
DQ2
12
GND
(CERDIP)
TOP VIEW
120ns 200ns TEMPERA TURE RANGE PACKAGE PKG. NO.
HM1-6516B/883 HM1-6516/883 -55oC to 125oC CERDIP F24.6 HM4-6516B/883 - -55oC to +125oC CLCC J32.A
HM-6516/883
(CLCC)
TOP VIEW
NC
1
3 2
24
VCC
23
A8
22
A9
21
W
20
G
19
A10
18
E
17
DQ7
16
DQ6
15
DQ5
14
DQ4
13
DQ3
NC
DQ0
4 32 31 30
A6
5
A5
6
A4
7 8
A3
9
A2 A1
10
A0
11 12 13
14
16 17 18 19 20
15
DQ1
DQ2
GND
NC
DQ3
NC
DQ4
NC
DQ5
29
A8
28
A9
27
NC
26
W G
25
A10
24
E
23 22
DQ7 DQ6
21
VCC
NC
NC
A7
PIN DESCRIPTION
NC No Connect
A0 - A10 Address Inputs
E Chip Enable/Power Down
VSS/GND Ground
DQ0 - DQ7 Data In/Data Out
VCC Power (+5V)
W Write Enable
G Output Enable
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures. http://www.intersil.com or 407-727-9207
| Copyright © Intersil Corporation 1999
6-173
File Number 2999.1
Functional Diagram
HM-6516/883
A10
A9
LATCHED
A8
ADDRESS
A7 A6
REGISTER A5 A4
G
W
E
A
7
GATED
ROW
DECODER
A
7
LG
128
16
16
G
L
LATCHED ADDRESS
A3 A2 A1 A0
128 x 128
MATRIX
16
16
16
GATED COLUMN
DECODER
44
A
REGISTER
16 16
A
1 OF 8
16
A
8
A
DQ0 THRU
8
DQ7
6-174
HM-6516/883
Absolute Maximum Ratings Thermal Information
Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .+7.0V
Input or Output Voltage Applied for all Grades. . . . . . .GND -0.3V to
VCC +0.3V
ESD Classification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Class 1
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
Operating Conditions
Operating Voltage Range. . . . . . . . . . . . . . . . . . . . . +4.5V to +5.5V
Operating Temperature Range. . . . . . . . . . . . . . . .-55oC to +125oC
Input Low Voltage. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0V to +0.8V
TABLE 1. HM-6516/883 DC ELECTRICAL PERFORMANCE SPECIFICATIONS
Device Guaranteed and 100% Tested
Thermal Resistance θ
CERDIP Package . . . . . . . . . . . . . . . . 48oC/W 8oC/W
CLCC Package . . . . . . . . . . . . . . . . . . 66oC/W 12oC/W
Maximum Storage Temperature Range . . . . . . . . .-65oC to +150oC
Maximum Junction Temperature. . . . . . . . . . . . . . . . . . . . . .+175oC
Maximum Lead Temperature (Soldering 10s). . . . . . . . . . . .+300oC
JA
θ
JC
Die Characteristics
Gate Count . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .25953 Gates
Input High Voltage. . . . . . . . . . . . . . . . . . . . . . . . . . . . +2.4V to VCC
Data Retention Supply Voltage. . . . . . . . . . . . . . . . . . . 2.0V to 4.5V
Input Rise and Fall Time. . . . . . . . . . . . . . . . . . . . . . . . . . 40ns Max
PARAMETER SYMBOL
High Level Output Voltage
Low Level Output Voltage
High Impedance Output Leakage Current
Input Leakage Current
Operating Supply Current
Standby Supply Current
Data Retention Supply Current
VOH VCC = 4.5V
VOL VCC = 4.5V
IIOZ VCC =G = 5.5 V,
ICCOP VCC = G = 5.5V, (Note 2)
ICCSB1 VCC = 5.5V, HM-6516/883
ICCDR VCC = 2.0V, HM-6516/883
(NOTE 1)
CONDITIONS
IO = -1.0mA
IO = 3.2mA
VIO = GND or VCC
II VCC = 5.5V,
VI = GND or VCC
f = 1MHz, VI = GND or VCC
E = VCC-0.3V, IO = 0mA, VI = GND or VCC
VCC = 5.5V, HM-6516B/883 E = VCC -0.3V, IO = 0mA, VI = GND or VCC
E = VCC-0.3V, IO = 0mA, VI = GND or VCC
GROUP A
LIMITS
SUBGROUPS TEMPERATURE
1, 2, 3 -55oC TA≤ +125oC 2.4 - V
1, 2, 3 -55oC TA≤ +125oC - 0.4 V
1, 2, 3 -55oC TA≤ +125oC -1.0 1.0 µA
1, 2, 3 -55oC TA≤ +125oC -1.0 1.0 µA
1, 2, 3 -55oC TA≤ +125oC - 10 mA
1, 2, 3 -55oC TA≤ +125oC - 100 µA
1, 2, 3 -55oC TA≤ +125oC- 50 µA
1, 2, 3 -55oC TA≤ +125oC- 50 µA
UNITSMIN MAX
VCC = 2.0V, HM-6516B/883 E = VCC-0.3V, IO = 0mA, VI = GND or VCC
Functional Test FT VCC = 4.5V (Note 3) 7, 8A, 8B -55oC TA≤ +125oC---
NOTES:
1. All voltages referenced to device GND.
2. Typical derating 1.5mA/MHz increase in ICCOP.
3. Tested as follows: f = 2MHz, VIH = 2.4V, VIL = 0.4V, IOH = -4.0mA, IOL = 4.0mA, VOH1.5V, and VOL 1.5V.
1, 2, 3 -55oC TA≤ +125oC- 25 µA
6-175
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