HM-6514/883
March 1997
Features
• This Circuit is Processed in Accordance to MIL-STD883 and is Fully Conformant Under the Provisions of
Paragraph 1.2.1.
• Low Power Standby. . . . . . . . . . . . . . . . . . . 125µW Max
• Low Power Operation . . . . . . . . . . . . . 35mW/MHz Max
• Data Retention . . . . . . . . . . . . . . . . . . . . . . . at 2.0V Min
• TTL Compatible Input/Output
• Common Data Input/Output
• Three-State Output
• Standard JEDEC Pinout
• Fast Access Time. . . . . . . . . . . . . . . . . . 120/200ns Max
• 18 Pin Package for High Density
• Gated Inputs - No Pull Up or Pull Down Resistors
Required
• On-Chip Address Register
Ordering Information
120ns 200ns 300ns TEMPERATURE RANGE PACKAGE PKG. NO.
HM1-6514S/883 HM1-6514B/883 HM1-6514/883 -55oC to 125oC CERDIP F18.3
1024 x 4 CMOS RAM
Description
The HM-6514/883 is a 1024 x 4 static CMOS RAM fabricated using self-aligned silicon gate technology. The device
utilizes synchronous circuitry to achieve high performance
and low power operation.
On chip latches are provided for addresses allowing efficient
interfacing with microprocessor systems. The data output
can be forced to a high impedance state for use in expanded
memory arrays.
Gated inputs allow lower operating current and also eliminates
the need for pull up or pull down resistors. The HM-6514/883 is
fully static RAM and may be maintained in any state for an
indefinite period of time.
Data retention supply voltage and supply current are guaranteed over temperature.
Pinout
HM-6514/883
(CERDIP)
TOP VIEW
1
A6
2
A5
3
A4
4
A3
5
A0
6
A1
7
A2
8
E
9
GND
PIN DESCRIPTION
A Address Input
E Chip Enable
W Write Enable
D Data Input
Q Data Output
18
VCC
17
A7
16
A8
15
A9
14
DQ0
13
DQ1
12
DQ2
11
DQ3
10
W
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
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| Copyright © Intersil Corporation 1999
6-151
File Number 2996.1
HM-6514/883
Absolute Maximum Ratings Thermal Information
Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .+7.0V
Input, Output or I/O Voltage . . . . . . . . . . . GND -0.3V to VCC +0.3V
ESD Classification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Class 1
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
Operating Conditions
Operating Voltage Range. . . . . . . . . . . . . . . . . . . . . +4.5V to +5.5V
Operating Temperature Range. . . . . . . . . . . . . . . .-55oC to +125oC
Input Low Voltage. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0V to +0.8V
TABLE 1. HM-6514/883 DC ELECTRICAL PERFORMANCE SPECIFICATIONS
Device Guaranteed and 100% Tested
(NOTE 1)
PARAMETER SYMBOL
CONDITIONS
Thermal Resistance θ
CERDIP Package . . . . . . . . . . . . . . . . 75oC/W 15oC/W
Maximum Storage Temperature Range . . . . . . . . .-65oC to +150oC
Maximum Junction Temperature. . . . . . . . . . . . . . . . . . . . . .+175oC
Maximum Lead Temperature (Soldering 10s). . . . . . . . . . . .+300oC
JA
θ
Die Characteristics
Gate Count . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6910 Gates
Input High Voltage. . . . . . . . . . . . . . . . . . . . . . . . VCC -2.0V to VCC
Input Rise and Fall Time. . . . . . . . . . . . . . . . . . . . . . . . . . 40ns Max
GROUP A
SUBGROUPS TEMPERATURE
LIMITS
UNITSMIN MAX
JC
Output Low Voltage VOL VCC = 4.5V
IOL = 3.2mA
Output High Voltage VOH VCC = 4.5V
IOH = -1.0mA
Input Leakage Current II VCC = 5.5V,
VI = GND or VCC
Input/Output Leakage
Current
Data Retention Supply
Current
Operating Supply
Current
Standby Supply
Current
NOTES:
1. All voltages referenced to device GND.
2. Typical derating 1.5mA/MHz increase in ICCOP.
IIOZ VCC = 5.5 V,
VIO = GND or VCC
ICCDR VCC = 2.0V,
E = VCC -0.3V,
IO = 0mA
ICCOP VCC = 5.5V, (Note 2)
E = 1MHz
ICCSB VCC = 5.5V,
E = VCC-0.3V,
IO = 0mA
1, 2, 3 -55oC ≤ TA≤ +125oC - 0.4 V
1, 2, 3 -55oC ≤ TA≤ +125oC 2.4 - V
1, 2, 3 -55oC ≤ TA≤ +125oC -1.0 +1.0 µA
1, 2, 3 -55oC ≤ TA≤ +125oC -1.0 +1.0 µA
1, 2, 3 -55oC ≤ TA≤ +125oC- 25 µA
1, 2, 3 -55oC ≤ TA≤ +125oC- 7 mA
1, 2, 3 -55oC ≤ TA≤ +125oC- 50 µA
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