Intersil Corporation HM-6514 Datasheet

HM-6514
March 1997
Features
• Low Power Standby. . . . . . . . . . . . . . . . . . . 125µW Max
• Low Power Operation . . . . . . . . . . . . . 35mW/MHz Max
• Data Retention . . . . . . . . . . . . . . . . . . . . . . . at 2.0V Min
• TTL Compatible Input/Output
• Three-State Output
• Standard JEDEC Pinout
Description
The HM-6514 is a 1024 x 4 static CMOS RAM fabricated using self-aligned silicon gate technology. The device utilizes synchronous circuitry to achieve high performance and low power operation.
On-chip latches are provided for addresses allowing efficient interfacing with microprocessor systems. The data output can be forced to a high impedance state for use in expanded memory arrays.
Gated inputs allow lower operating current and also elimi-
1024 x 4 CMOS RAM
nate the need for pull up or pull down resistors. The
• Fast Access Time. . . . . . . . . . . . . . . . . . 120/200ns Max
• 18 Pin Package for High Density
• On-Chip Address Register
HM-6514 is a fully static RAM and may be maintained in any state for an indefinite period of time.
Data retention supply voltage and supply current are guaran­teed over temperature.
• Gated Inputs - No Pull Up or Pull Down Resistors Required
Ordering Information
120ns 200ns 300ns TEMPERATURE RANGE PACKAGE PKG. NO.
HM3-6514S-9 HM3-6514B-9 HM3-6514-9 -40oC to +85oC PDIP E18.3 HM1-6514S-9 HM1-6514B-9 HM1-6514-9 -40oC to +85oC CERDIP F18.3 24502BVA - - - JAN# F18.3 8102402VA 8102404VA 8102406VA - SMD# F18.3
----40
- - HM4-6514-B -55oC to +125oC J18.B
o
C to +85oC CLCC J18.B
Pinouts
HM-6514 (PDIP, CERDIP)
TOP VIEW
1
A6
2
A5
3
A4
4
A3
5
A0
6
A1
7
A2
8
E
9
GND
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures. http://www.intersil.com or 407-727-9207
18
V
CC
17
A7
16
A8
15
A9
14
DQ0
13
DQ1
12
DQ2
11
DQ3
10
W
| Copyright © Intersil Corporation 1999
PIN DESCRIPTION
A Address Input E Chip Enable
W Write Enable
D Data Input Q Data Output
6-1
A4 A3 A0 A1 A2
3 4 5 6 7
HM-6514 (CLCC)
TOP VIEW
A6
GND
CC
V
18
W
A5
21 17
8 9 10 11
E
File Number 2995.1
A7
DQ3
16
A8 A9
15 14
DQ0
13
DQ1
12
DQ2
Functional Diagram
HM-6514
LSB
LSB
A9 A8 A7 A6 A5 A4
A2 A1 A0 A3
A
A
A
A
6
6
4
4
GATED
ROW
DECODER
G
64
16 16 16 16
I/O SELECT
G
64 x 64
MATRIX
GATED
COLUMN
4
1 OF 4
DQ
LATCHED ADDRESS REGISTER
L L
LATCHED ADDRESS REGISTER
E
W
6-2
HM-6514
Absolute Maximum Ratings Thermal Information
Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .+7.0V
Input, Output or I/O Voltage . . . . . . . . . . . GND -0.3V to VCC+0.3V
ESD Classification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Class 1
Operating Conditions
Operating Voltage Range . . . . . . . . . . . . . . . . . . . . . +4.5V to +5.5V
Operating Temperature Ranges:
HM-6514S-9, HM-6514B-9, HM-6514-9. . . . . . . . -40oC to +85oC
HM-6514B-8, HM-6514-8 . . . . . . . . . . . . . . . . . . -55oC to +125oC
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
Thermal Resistance (Typical) θ
CERDIP Package . . . . . . . . . . . . . . . . 75oC/W 15oC/W
PDIP Package. . . . . . . . . . . . . . . . . . . 75oC/W N/A
CLCC Package . . . . . . . . . . . . . . . . . . 90oC/W 33oC/W
Maximum Storage Temperature Range . . . . . . . . .-65oC to +150oC
Maximum Junction Temperature
Ceramic Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +175oC
Plastic Package. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +150oC
Maximum Lead Temperature (Soldering 10s). . . . . . . . . . . . +300oC
JA
θ
JC
Die Characteristics
Gate Count . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6910 Gates
DC Electrical Specifications V
SYMBOL PARAMETER
ICCSB Standby Supply Current HM-6514-9 - 25 µA IO = 0mA, E = VCC-0.3V, VCC = 5.5V
ICCOP Operating Supply Current (Note 1) - 7 mA E = 1MHz, IO = 0mA, VI = GND,
ICCDR Data Retention Supply
Current
VCCDR Data Retention Supply Voltage 2.0 - V
II Input Leakage Current -1.0 +1.0 µA VI = VCC or GND, VCC = 5.5V
IIOZ Input/Output Leakage Current -1.0 +1.0 µA VIO = VCC or GND, VCC = 5.5V
VIL Input Low Voltage -0.3 0.8 V VCC = 4.5V
VIH Input High Voltage VCC -2.0 VCC +0.3 V VCC = 5.5V
VOL Output Low Voltage - 0.4 V IO = 2.0mA, VCC = 4.5V
VOH1 Output High Voltage 2.4 - V IO = -1.0mA, VCC = 4.5V
= 5V ±10%; TA = -40oC to +85oC (HM-6514S-9, HM-6514B-9, HM-6514-9)
CC
HM-6514-8 - 50 µA
HM-6514-9 - 15 µA IO = 0mA, VCC = 2.0V, E = V HM-6514-8 - 25 µA
TA = -55oC to +125oC (HM-6514B-8, HM-6514-8)
LIMITS
UNITS TEST CONDITIONSMIN MAX
VCC = 5.5V
CC
VOH2 Output High Voltage (Note 2) VCC -0.4 - V IO = -100µA, VCC = 4.5V
Capacitance T
SYMBOL PARAMETER MAX UNITS TEST CONDITIONS
CI Input Capacitance (Note 2) 8 pF f = 1MHz, All measurements are
CIO Input/Output Capacitance (Note 2) 10 pF
NOTES:
1. Typical derating 5mA/MHz increase in ICCOP.
2. Tested at initial design and after major design changes.
= +25oC
A
referenced to device GND
6-3
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