intersil HI-546, HI-547, HI-548, HI-549 DATA SHEET

®
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HI-546, HI-547, HI-548, HI-549
Data Sheet September 21, 2005
Single 16 and 8, Differential 8-Channel and 4-Channel CMOS Analog MUXs with Active Overvoltage Protection
The HI-546, HI-547, HI-548 and HI-549 are analog multiplexers with active overvoltage protection and guaranteed r exceed either power supply without damaging the device or disturbing the signal path of other channels. Active protection circuitry assures that signal fidelity is maintained even under fault conditions that would destroy other multiplexers.
Analog inputs can withstand constant 70V ±15V supplies. Digital inputs will also sustain continuous faults up to 4V greater than either supply. In addition, signal sources are protected from short circuiting should multiplexer supply loss occur. Each input presents 1k of resistance under this condition. These features make the HI-546, HI-547, HI-548 and HI-549 ideal for use in systems where the analog inputs originate from external equipment or separately powered circuitry. All devices are fabricated with 44V Dielectrically Isolated CMOS technology. The HI-546 is a single 16-Channel, the HI-547 is an 8-Channel differential, the HI-548 is a single 8-Channel and the HI-549 is a 4-Channel differential device. If input overvoltage protection is not needed the HI-506/507/508/509 multiplexers are recommended. For further information see Application Notes AN520 and AN521.
matching. Analog input levels may greatly
ON
levels with
P-P
FN3150.5
Features
• Analog Overvoltage Protection. . . . . . . . . . . . . . . . . . 70V
• No Channel Interaction During Overvoltage
• Guaranteed r
• Maximum Power Supply. . . . . . . . . . . . . . . . . . . . . . . 44V
• Break-Before-Make Switching
• Analog Signal Range . . . . . . . . . . . . . . . . . . . . . . . . ±15V
• Access Time (Typical) . . . . . . . . . . . . . . . . . . . . . . . 500ns
• Standby Power (Typical). . . . . . . . . . . . . . . . . . . . . 7.5mW
Pb-Free Plus Anneal Available (RoHS Compliant)
Matching
ON
P-P
Applications
• Data Acquisition
• Industrial Controls
• Telemetry
For MIL-STD-883 compliant parts, request the HI-546/883, HI-547/883, HI-548/883 and HI-549/883 datasheets.
1
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 321-724-7143
| Intersil (and design) is a registered trademark of Intersil Americas Inc.
All other trademarks mentioned are the property of their respective owners.
Copyright © Intersil Americas Inc. 2003, 2005. All Rights Reserved
HI-546, HI-547, HI-548, HI-549
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Ordering Information
TEMP.
PART
NUMBER
PART
MARKING
RANGE
o
C) PACKAGE
(
HI1-0546-5 HI1-546-5 0 to 75 28 Ld CERDIP F28.6 HI1-0546-2 HI1-546-2 -55 to 125 28 Ld CERDIP F28.6 HI3-0546-5 HI3-546-5 0 to 75 28 Ld PDIP E28.6 HI4P0546-5 HI4P546-5 0 to 75 28 Ld PLCC N28.45 HI4P0546-5Z
(Note)
HI4P546-5Z 0 to 75 28 Ld PLCC
(Pb-free) HI9P0546-9** HI9P546-9 -40 to 85 28 Ld SOIC M28.3 HI9P0546-9Z**
(Note)
HI9P546-9Z -40 to 85 28 Ld SOIC
(Pb-free) HI1-0547-5 HI1-547-5 0 to 75 28 Ld CERDIP F28.6 HI3-0547-5 HI3-547-5 0 to 75 28 Ld PDIP E28.6 HI3-0547-5Z
(Note)
HI3-0547-5Z 0 to 75 28 Ld PDIP*
(Pb-free) HI4P0547-5 HI4P547-5 0 to 75 28 Ld PLCC N28.45 HI4P0547-5Z
(Note)
HI4P547-5Z 0 to 75 28 Ld PLCC
(Pb-free) HI9P0547-9 HI9P547-9 -40 to 85 28 Ld SOIC M28.3 HI9P0547-9Z
(Note)
HI9P547-9Z -40 to 85 28 Ld SOIC
(Pb-free) HI1-0548-2 HI1-548-2 -55 to 125 16 Ld CERDIP F16.3 HI1-0548-5 HI1-548-5 0 to 75 16 Ld CERDIP F16.3 HI3-0548-5 HI3-548-5 0 to 75 16 Ld PDIP E16.3 HI4P0548-5 HI4P548-5 0 to 75 20 Ld PLCC N20.35
PKG.
DWG. #
N28.45
M28.3
E28.6
N28.45
M28.3
Ordering Information (Continued)
TEMP.
PART
NUMBER
PART
MARKING
RANGE
o
C) PACKAGE
(
HI9P0548-5** HI9P548-5 0 to 75 16 Ld SOIC M16.15 HI9P0548-5Z**
(Note)
HI9P548-5Z 0 to 75 16 Ld SOIC
(Pb-free) HI9P0548-9 HI9P548-9 -40 to 85 16 Ld SOIC M16.15 HI9P0548-9Z
(Note)
HI9P548-9Z -40 to 85 16 Ld SOIC
(Pb-free) HI1-0549-2 HI1-549-2 -55 to 125 16 Ld CERDIP F16.3 HI3-0549-5 HI3-549-5 0 to 75 16 Ld PDIP E16.3 HI4P0549-5 HI4P549-5 0 to 75 20 Ld PLCC N20.35 HI4P0549-5Z
(Note)
HI4P549-5Z 0 to 75 20 Ld PLCC
(Pb-free) HI9P0549-9 HI9P549-9 -40 to 85 16 Ld SOIC M16.15 HI9P0549-9Z
(Note)
HI9P549-9Z -40 to 85 16 Ld SOIC
(Pb-free) *Pb-free PDIPs can be used for through hole wave solder processing
only. They are not intended for use in Reflow solder processing applications.
**Add “96” suffix for tape and reel.
NOTE: Intersil Pb-free plus anneal products employ special Pb-free material sets; molding compounds/die attach materials and 100% matte tin plate termination finish, which are RoHS compliant and compatible with both SnPb and Pb-free soldering operations. Intersil Pb-free products are MSL classified at Pb-free peak reflow temperatures that meet or exceed the Pb-free requirements of IPC/JEDEC J STD-020.
PKG.
DWG. #
M16.15
M16.15
N20.35
M16.15
Pinouts
ADDRESS A
HI-546 (CERDIP, PDIP, SOIC)
TOP VIEW
+V
SUPPLY
NC
NC IN 16 IN 15 IN 14 IN 13 IN 12 IN 11 IN 10
IN 9
GND
V
REF
1 2 3 4 5 6 7 8
9 10 11 12 13 14
3
HI-547 (CERDIP, PDIP, SOIC)
TOP VIEW
28
OUT
28
-V
27
SUPPLY
26
IN 8
25
IN 7
24
IN 6 IN 5
23
IN 4
22 21
IN 3
20
IN 2
19
IN 1 ENABLE
18
ADDRESS A
17 16
ADDRESS A ADDRESS A
15
+V
SUPPLY
0 1 2
OUT B
NC IN 8B IN 7B IN 6B IN 5B IN 4B IN 3B IN 2B IN 1B
GND
V
REF
NC
1 2 3 4 5 6 7 8
9 10 11 12 13 14
OUT A
-V
27
SUPPLY
IN 8A
26
IN 7A
25
IN 6A
24
IN 5A
23
IN 4A
22
IN 3A
21 20
IN 2A IN 1A
19
ENABLE
18
ADDRESS A
17 16
ADDRESS A ADDRESS A
15
0 1 2
2
Pinouts (Continued)
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HI-546 (PLCC)
TOP VIEW
HI-546, HI-547, HI-548, HI-549
HI-547 (PLCC)
TOP VIEW
IN 15 IN 14 IN 13 IN 12 IN 11 IN 10
IN 9
IN 16NCNC
5 6 7 8
9 10 11
12 13 14 15 16 17 18
A3A2A
REF
GND
V
HI-548 (CERDIP, PDIP, SOIC)
TOP VIEW
1
A
0
IN 1 IN 2 IN 3 IN 4
OUT
2 3 4 5 6 7 8
ENABLE
-V
SUPPLY
SUPPLY
+V
1234
OUT
1
SUPPLY
-V
IN 8
262728
5
25
IN 7
24
IN 6
23
IN 5
22
IN 4
21
IN 3
20
IN 2
19
IN 1
0
A
ENABLE
IN 7B IN 6B IN 5B IN 4B IN 3B IN 2B IN 1B
6 7 8
9 10 11
IN 8B
NC
12 13 14 15 16 17 18
GND
V
SUPPLY
OUT B
+V
1234
2A1
A
NC
REF
SUPPLY
OUT A
-V
IN 8A
262728
25
IN 7A
24
IN 6A
23
IN 5A
22
IN 4A
21
IN 3A
20
IN 2A
19
IN 1A
0
A
ENABLE
HI-549 (CERDIP, PDIP, SOIC)
TOP VIEW
16
A
1
A
15
2
14
GND +V
13
SUPPLY
12
IN 5 IN 6
11
IN 7
10
9
IN 8
ENABLE
-V
SUPPLY
A
IN 1A IN 2A IN 3A IN 4A
OUT A
1
0
2 3 4 5 6 7 8
16 15 14 13 12 11 10
9
A
1
GND +V
SUPPLY
IN 1B IN 2B IN 3B IN 4B OUT B
HI-548 (PLCC)
TOP VIEW
A1A
193 2 201
IN 8
2
IN 7
-V
18
GND
17
+V
SUPPLY
16
NC
15
IN 5
14
IN 6
SUPPLY
IN 1A
NC
IN 2A IN 3A
-V
SUPPLY
IN 1
NC IN 2 IN 3
ENABLE
A0NC
4 5 6 7 8
9
10 11 12 13
IN 4
NC
OUT
3
HI-549 (PLCC)
TOP VIEW
ENABLE
A0NC
4 5 6 7 8
9
10 11 12 13
IN 4A
OUT A
NC
A1GND
193 2 201
IN 4B
OUT B
+V
18
SUPPLY
IN 1B
17
NC
16
IN 2B
15 14
IN 3B
HI-546, HI-547, HI-548, HI-549
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TRUTH TABLE HI-546
A
A
3
A
2
A
1
EN “ON” CHANNEL
0
XXXXL None LLLLH 1 LLLHH 2 LLHLH 3 LLHHH 4 LHLLH 5 LHLHH 6 LHHLH 7 LHHHH 8 HLLLH 9 HLLHH 10 HLHLH 11 HLHHH 12 HHL LH 13 HHLHH 14 HHHLH 15 HHHHH 16
TRUTH TABLE HI-547
A
A
2
A
1
EN “ON” CHANNEL PAIR
0
X X X L None LLLH 1 LLHH 2 LHLH 3 LHHH 4
TRUTH TABLE HI-547 (Continued)
A
A
2
A
1
EN “ON” CHANNEL PAIR
0
HLLH 5 HLHH 6 HHLH 7 HHHH 8
TRUTH TABLE HI-548
A
A
2
A
1
EN “ON” CHANNEL
0
X X X L None LLLH 1 LLHH 2 LHLH 3 LHHH 4 HLLH 5 HLHH 6 HHLH 7 HHHH 8
TRUTH TABLE HI-549
A
1
A
0
EN “ON” CHANNEL PAIR
X X L None LLH 1 LHH 2 HLH 3 HHH 4
Functional Diagrams
HI-546 HI-547
IN 1
IN 2
IN 16
1K
1K
1K
OVERVOLTAGE
CLAMP AND
SIGNAL
ISOLATION
DIGITAL INPUT
PROTECTION
5V
REF
DECODER/
DRIVER
LEVEL SHIFT
† † † †
V
REFA0A1A2
OUT
IN 1A
IN 8A IN 1B
IN 8B
EN
A
3
1K
1K 1K
1K
OVERVOLTAGE
CLAMP AND
ISOLATION
DIGITAL INPUT
PROTECTION
4
SIGNAL
5V
REF
DECODER/
DRIVER
LEVEL
SHIFT
V
REFA0A1A2
EN
OUT
A
OUT
B
Functional Diagrams (Continued)
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HI-548 HI-549
HI-546, HI-547, HI-548, HI-549
IN 1
IN 2
IN 8
1K
1K
1K
OVERVOLTAGE
CLAMP AND
SIGNAL
ISOLATION
5V
REF
DIGITAL INPUT
PROTECTION
Schematic Diagrams
EN
OUT
A
OUT
B
DECODER/
DRIVER
LEVEL SHIFT
A
0A1A2
EN
OUT
IN 1A
IN 4A IN 1B
IN 4B
1K
1K 1K
1K
OVERVOLTAGE
CLAMP AND
SIGNAL
ISOLATION
DIGITAL INPUT
PROTECTION
5V
REF
DECODER/
DRIVER
LEVEL
SHIFT
A
0
A
1
ADDRESS DECODER
V+
P
PP PP P P
A3 OR A
ENABLE DELETE A
DELETE A
OR A
A
0
OR A
A
1
1
A2 OR A
2
3
OR A3 INPUT FOR HI-547, HI-548, HI-549
3
OR A2 INPUT FOR HI-549
2
TO P-CHANNEL
N
0
N
N
N
N
NN
V-
DEVICE OF THE SWITCH
TO N-CHANNEL DEVICE OF THE SWITCH
5
Schematic Diagrams (Continued)
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FROM
DECODE
OVERVOLTAGE PROTECTION
HI-546, HI-547, HI-548, HI-549
MULTIPLEX SWITCH
N
V+
IN
FROM
DECODE
R11
1K
P
D6 D7
Q6
Q5
D4 D5
N
V-
N
P
OUT
6
Schematic Diagrams (Continued)
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TTL REFERENCE
CIRCUIT
V+
R10
R9
V
REF
Q1
Q4
D3
GND
HI-546, HI-547, HI-548, HI-549
ADDRESS INPUT BUFFER AND LEVEL SHIFTER
LEVEL SHIFTER
V+
OVERVOLTAGE
PROTECTION
V+
D2
R1
D1
200
V-
ADD
IN
P
P
N
N
P
P
R2
R3
N
N
R4
GND
P
N
P P
N
P
R5 R7
R6 N
R8
N
P
N
V-
P
LEVEL SHIFTED ADDRESS TO DECODE
N
7
HI-546, HI-547, HI-548, HI-549
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Absolute Maximum Ratings Thermal Information
V+ to V- . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .+44V
V+ to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .+22V
V- to GND. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -25V
Digital Input Voltage (V Analog Signal (V
Continuous Current, IN or OUT . . . . . . . . . . . . . . . . . . . . . . . . 20mA
Peak Current, IN or OUT (Pulsed 1ms, 10% Duty Cycle Max). . 40mA
IN
, VA) . . . . . . . . . . . . . (V-) -4V to (V+) +4V
EN
, V
). . . . . . . . . . . . . . . (V-) -20V to (V+) +20V
OUT
or 20mA, Whichever Occurs First
Operating Conditions
Temperature Ranges
HI-546/548/549-2 . . . . . . . . . . . . . . . . . . . . . . . . . -55
HI-546/547/548/549-5 . . . . . . . . . . . . . . . . . . . . . . . 0
HI-546/547/548/549-9 . . . . . . . . . . . . . . . . . . . . . . -40
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied .
NOTE:
1. θ
is measured with the component mounted on an evaluation PC board in free air.
JA
o
C to 125oC
o
C to 75oC
o
C to 85oC
Thermal Resistance (Typical, Note 1) θ
16 Ld CERDIP Package. . . . . . . . . . . 85 32
28 Ld CERDIP Package. . . . . . . . . . . 55 18
28 Ld PDIP Package*. . . . . . . . . . . . . 60 N/A
16 Ld PDIP Package . . . . . . . . . . . . . 90 N/A
28 Ld PLCC Package. . . . . . . . . . . . . 70 N/A
20 Ld PLCC Package. . . . . . . . . . . . . 80 N/A
28 Ld SOIC Package . . . . . . . . . . . . . 75 N/A
16 Ld SOIC Package . . . . . . . . . . . . . 105 N/A
Maximum Junction Temperature
Ceramic Packages. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .175
Plastic Packages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .150
Maximum Storage Temperature Range. . . . . . . . . . -65
Maximum Lead Temperature (Soldering 10s) . . . . . . . . . . . . .300
(PLCC, SOIC - Lead Tips Only)
*Pb-free PDIPs can be used for through hole wave solder processing only. They are not intended for use in Reflow solder processing applications.
(oC/W) θJC (oC/W)
JA
o
C to 150oC
o o
o
C C
C
Electrical Specifications Supplies = +15V, -15V; V
Otherwise Specified. For Test Conditions, Consult Test Circuits Section
TEST
PARAMETER
SWITCHING CHARACTERISTICS
Access Time, t
Break-Before Make Delay, t Enable Delay (ON), t
Enable Delay (OFF), t
Settling Time To 0.1% 25 - 1.2 - - 1.2 - µs
Off Isolation Note 6 25 50 68 - 50 68 - dB Channel Input Capacitance, C Channel Output Capacitance C
HI-546 25 - 52 - - 52 - pF HI-547 25 - 30 - - 30 - pF HI-548 25 - 25 - - 25 - pF HI-549 25 - 12 - - 12 - pF
Input to Output Capacitance, C
DIGITAL INPUT CHARACTERISTICS
Input Low Threshold, TTL Drive, V Input High Threshold, V MOS Drive, V
A
OPEN
ON(EN)
OFF(EN)
S(OFF)
D(OFF)
DS(OFF)
AL
(Note 8) Full 4.0 - - 4.0 - - V
AH
(HI-546/547 Only) V
AL
CONDITIONS
To 0.01% 25 - 3.5 - - 3.5 - µs
= 10V 25 - - 0.8 - - 0.8 V
REF
Pin = Open; VAH (Logic Level High) = 4V; VAL (Logic Level Low) = 0.8V; Unless
REF
TEMP
o
C)
(
25 - 0.5 - - 0.5 - µs
Full - - 1.0 - - 1.0 µs
25 25 80 - 25 80 - ns 25 - 300 500 - 300 - ns
Full - - 1000 - - 1000 ns
25 - 300 500 - 300 - ns
Full - - 1000 - - 1000 ns
25-10- -10-pF
25 - 0.1 - - 0.1 - pF
Full - - 0.8 - - 0.8 V
-2 -5, -9 UNITSMIN TYP MAX MIN TYP MAX
8
HI-546, HI-547, HI-548, HI-549
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Electrical Specifications Supplies = +15V, -15V; V
Otherwise Specified. For Test Conditions, Consult Test Circuits Section (Continued)
PARAMETER
MOS Drive, V Input Leakage Current (High or Low), I
ANALOG CHANNEL CHARACTERISTICS
Analog Signal Range, V On Resistance, r
r
, (Any Two Channels) 25 - - 7.0 - - 7.0 %
ON
Off Input Leakage Current, I
Off Output Leakage Current, I
HI-546 Full - - 300 - - 300 nA HI-547 Full - - 200 - - 200 nA HI-548 Full - - 200 - - 200 nA HI-549 Full - - 100 - - 100 nA
I
With Input Overvoltage Applied Note 4 25 - 4.0 - - 4.0 - nA
D(OFF)
On Channel Leakage Current, I
HI-546 Full - - 300 - - 300 nA HI-547 Full - - 200 - - 200 nA HI-548 Full - - 200 - - 200 nA HI-549 Full - - 100 - - 100 nA
Differential Off Output Leakage Current
(HI-547, HI-549 Only)
I
DIFF
POWER SUPPLY CHARACTERISTICS
Power Dissipation, P Current, I+ Note 7 Full - 0.5 2.0 - 0.5 2.0 mA Current, I- Note 7 Full - 0.02 1.0 - 0.02 1.0 mA
NOTES:
2. V
OUT
3. 10nA is the practical lower limit for high speed measurement in the production test environments.
4. Analog Overvoltage = ±33V.
5. Digital input leakage is primarily due to the clamp diodes (see Schematic). Typical leakage is less than 1nA at 25 = 0.8V, RL = 1K, CL = 15pF, VS = 7V
6. V
EN
7. V
, VA = 0V or 4V.
EN
8. To drive from DTL/TTLCircuits, 1k pull-up resistors to +5V supply are recommended.
(HI-546/547 Only) V
AH
IN
ON
D
= ±10V, I
= 100µA.
OUT
±
A
S(OFF)
D(OFF)
D(ON)
TEST
CONDITIONS
= 10V 25 6.0 - - 6.0 - - V
REF
Note 5 Full - - 1.0 - - 1.0 µA
Note 2 25 - 1.2 1.5 - 1.5 1.8 k
Note 3 25 - 0.03 - - 0.03 - nA
Note 3 25 - 0.1 - - 0.1 - nA
Note 3 25 - 0.1 - - 0.1 - nA
, f = 100kHz.
RMS
Pin = Open; VAH (Logic Level High) = 4V; VAL (Logic Level Low) = 0.8V; Unless
REF
TEMP
o
(
C)
Full -15 - +15 -15 - +15 V
Full - 1.5 1.8 - 1.8 2.0 k
Full - - 50 - - 50 nA
Full--2.0---µA
Full - - 50 - - 50 nA
Full - 7.5 - - 7.5 - mW
-2 -5, -9
o
C.
UNITSMIN TYP MAX MIN TYP MAX
9
HI-546, HI-547, HI-548, HI-549
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T est Circuits and W a veforms T
= 25oC, V
A
V
IN
SUPPLY
FIGURE 1A. ON RESISTANCE TEST CIRCUIT
1.4
1.3
1.2
1.1
1.0
0.9
ON RESISTANCE (kΩ)
0.8
0.7
0.6
-10-8-6-4-20246810
125oC
25oC
-55oC
ANALOG INPUT (V)
FIGURE 1B. ON RESISTANCE vs ANALOG INPUT VOLTAGE
FIGURE 1. ON RESISTANCE
= ±15V, VAH = 4V, VAL = 0.8V, V
100µA
V
2
OUTIN
rON =
1.5
1.4
1.3
1.2
1.1
1.0
NORMALIZED ON RESIST ANCE
0.9
(REFERRED TO VALUE AT ±15V)
0.8 5 6 7 8 9 101112131415
FIGURE 1C. NORMALIZED ON RESISTANCE vs SUPPLY
= Open, Unless Otherwise Specified
REF
V
2
100µA
SUPPLY VOLTAGE (±V)
VOLTAGE
100nA
10nA
OFF OUTPUT
CURRENT ON LEAKAGE CURRENT
I
1nA
LEAKAGE CURRENT
100pA
10pA
D(ON)
25 50 75 100 125
TEMPERATURE (
I
D(OFF)
OFF INPUT
LEAKAGE CURRENT
I
S(OFF)
o
C)
±10V
FIGURE 2A. LEAKAGE CURRENT vs TEMPERATURE FIGURE 2B. I
10
TEST CIRCUIT (NOTE 9)
D(OFF)
EN
OUT
A
+0.8V
I
D(OFF)
±
10V
HI-546, HI-547, HI-548, HI-549
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T est Circuits and W avef orms T
I
A
S(OFF)
±10V
FIGURE 2C. I
±
10V
TEST CIRCUIT (NOTE 9) FIGURE 2D. I
S(OFF)
= 25oC, V
A
EN
= ±15V, VAH = 4V , VAL = 0.8V , V
SUPPLY
OUT
+0.8V
±
NOTE:
9. Two measurements per channel: ±10V and 10V. (Two measurements per device for I
±
FIGURE 2. LEAKAGE CURRENTS
18
ANALOG INPUT
15
12
9
6
3
ANALOG INPUT CURRENT (mA)
CURRENT (I
OUTPUT OFF LEAKAGE
CURRENT ID
IN
(OFF)
)
5
4
3
A
2
1
10V
I
IN
±V
IN
= Open, Unless Otherwise Specified (Continued)
REF
OUT
EN
4V
TEST CIRCUIT (NOTE 9)
D(ON)
: ±10V and 10V.)
D(OFF)
±
A
I
D(ON)
±10V
I
A
D(OFF)
0
15 18 21 24 27 30 33 36
ANALOG INPUT OVERVOLTAGE (±V)
FIGURE 3A. ANALOG INPUT CURRENT AND OUTPUT OFF
OUTPUT OFF LEAKAGE CURRENT (nA)
0
FIGURE 3B. TEST CIRCUIT LEAKAGE CURRENT vs ANALOG INPUT OVER-VOLTAGE
FIGURE 3. ANALOG INPUT OVERVOLTAGE CHARA CTERISTICS
±14
±12
±10
SWITCH CURRENT (mA)
±8
±6
±4
±2
0
2 4 6 8 10 12 14
0
VOLTAGE ACROSS SWITCH (±V)
-55oC 25oC
125oC
±V
IN
FIGURE 4A. ON CHANNEL CURRENT vs VOLTAGE FIGURE 4B. TEST CIRCUIT
FIGURE 4. ON CHANNEL CURRENT
A
11
HI-546, HI-547, HI-548, HI-549
www.BDTIC.com/Intersil
T est Circuits and W avef orms T
8
6
V
4
2
SUPPLY CURRENT (mA)
0
1K
TOGGLE FREQUENCY (Hz)
SUPPLY
V
= ± 10V
SUPPLY
10K 100K 1M 10M
= ± 15V
= 25oC, V
A
= ±15V, VAH = 4V , VAL = 0.8V , V
SUPPLY
= Open, Unless Otherwise Specified (Continued)
REF
A
V+
A
3
HI-546
2
1
0
GND
THRU
IN 15
IN 16
V-
A
A
50
V
A
+4V
Similar connection for HI-547/HI-548/HI-549.
A A
EN
+15V/+10V
+I
IN 1
IN 2
OUT
-I
-15V/-10V
FIGURE 5A. SUPPLY CURRENT vs TOGGLE FREQUENCY FIGURE 5B. TEST CIRCUIT
FIGURE 5. DYNAMIC SUPPLY CURRENT
V+
IN 2 THRU
IN 15
HI-546
IN 16
OUT
V-
+15V
IN 1
-15V
900
800
700
600
500
ACCESS TIME (ns)
400
300
3
VA INPUT
V
= OPEN FOR LOGIC HIGH LEVEL < 6V
REF
V
= LOGIC HIGH FOR LOGIC HIGH LEVELS > 6V
REF
579 151311
4 6 8101214
LOGIC LEVEL (HIGH) (V)
2V/DIV.
S1 ON S16 ON
100ns/DIV.
V
REF
A
3
A
2
50
V
A
OUTPUT
0.5V/DIV.
+4V
Similar connection for HI-547/HI-548/HI-549.
A A
EN
1
0
GND
FIGURE 6A. ACCESS TIME vs LOGIC LEVEL (HIGH) FIGURE 6B. TEST CIRCUIT
SUPPLY
SUPPLY
±
10V
±10V/±5V
10V/±5V
10M
±10V
10k 50pF
±
14pF
VA INPUT 2V/DIV.
S1 ON
+10V
50%
t
A
VAH = 4.0V
10%
ADDRESS DRIVE (V
OUTPUT
A
-10V
)
0V
FIGURE 6C. MEASUREMENT POINTS FIGURE 6D. WAVEFORMS
FIGURE 6. ACCESS TIME
12
200ns/DIV.
OUTPUT 5V/DIV.
S16 ON
HI-546, HI-547, HI-548, HI-549
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T est Circuits and W avef orms T
A
3
HI-546
A
2
50
V
A
+4V
Similar connection for HI-547/HI-548/HI-549
A A
EN
1
0
GND
FIGURE 7A. TEST CIRCUIT FIGURE 7B. MEASUREMENT POINTS
IN 1
IN 2 THRU
IN 15 IN 16
OUT
1k
= 25oC, V
A
= ±15V, VAH = 4V , VAL = 0.8V , V
SUPPLY
+5V
V
OUT
50pF
= Open, Unless Otherwise Specified (Continued)
REF
VAH = 4V
ADDRESS
t
OPEN
DRIVE (V
0V
50% 50%
)
A
OUTPUT
A
3
HI-546
A
2
IN 2 THRU
A
1
A
0
EN
V
A
Similar connection for HI-547/HI-548/HI-549
50
GND
FIGURE 8A. TEST CIRCUIT FIGURE 8B. MEASUREMENT POINTS
13
IN 1
IN16
OUT
FIGURE 7C. WAVEFORMS
FIGURE 7. BREAK-BEFORE-MAKE DELAY
+10V
V
OUT
1k
50pF
50%
t
ON(EN)
VAH = 4V
90%
50%
t
OFF(EN)
ENABLE DRIVE (VA)
0V
OUTPUT
10%
0V
HI-546, HI-547, HI-548, HI-549
www.BDTIC.com/Intersil
T est Circuits and W avef orms T
= 25oC, V
A
DISABLED
= ±15V, VAH = 4V , VAL = 0.8V , V
SUPPLY
ENABLE
DRIVE
2V/DIV.
OUTPUT
2V/DIV.
ENABLED (S1 ON)
100ns/DIV.
FIGURE 8C. WAVEFORMS
FIGURE 8. ENABLE DELAYS
= Open, Unless Otherwise Specified (Continued)
REF
14
Die Characteristics
www.BDTIC.com/Intersil
HI-546, HI-547, HI-548, HI-549
DIE DIMENSIONS:
83.9 mils x 159 mils
METALLIZATION:
Type: CuAl Thickness: 16k
Å ±2kÅ
SUBSTRATE POTENTIAL (NOTE):
-V
SUPPLY
NOTE: The substrate appears resistive to the -V conductor at -V
SUPPLY
potential.
Metallization Mask Layouts
HI-546 HI-547
EN
(18) (17) (16) (15) (13) (12)
A
0
A
A
2
1
A
(14)
V
REF
3
PASSIVATION:
Type: Nitride Over Silox Nitride Thickness: 3.5kÅ ±1kÅ Silox Thickness: 12kÅ ±2kÅ
WORST CASE CURRENT DENSITY:
5
2
1.4 x 10
A/cm
TRANSISTOR COUNT:
485
PROCESS:
CMOS-DI
terminal, therefore it may be left floating (Insulating Die Mount) or it may be mounted on a
SUPPLY
NC
GND
A
EN
(18) (17) (16) (15)
A
A
0
1
2
V
REF
(14)
(13) (12)
GND
IN 1 (19)
IN 2 (20)
IN 3 (21)
IN 4 (22)
IN 5 (23)
IN 6 (24)
IN 7 (25)
IN 8 (26)
V- (27) +V (1) NC (2)
OUT (28)
IN 9 (11)
IN 10
(10)
IN 11
(9)
IN 12
(8)
IN 13
(7)
IN 14
(6)
IN 15
(5)
IN 16
(4)
IN 1A
(19)
IN 2A
(20)
IN 3A
(21)
IN 4A
(22)
IN 5A
(23)
IN 6A
(24)
IN 7A
(25)
IN 8A
(26)
V- (27) +V (1) OUT B(2)
OUT A (28)
IN 1B
(11)
IN 2B
(10)
IN 3B
(9)
IN 4B
(8)
IN 5B
(7)
IN 6B
(6)
IN 7B
(5)
IN 8B
(4)
15
Die Characteristics
www.BDTIC.com/Intersil
HI-546, HI-547, HI-548, HI-549
DIE DIMENSIONS:
83 mils x 108 mils
METALLIZATION:
Type: CuAl Thickness: 16k
Å ±2kÅ
SUBSTRATE POTENTIAL (NOTE):
-V
SUPPLY
NOTE: The substrate appears resistive to the -V conductor at -V
SUPPLY
potential.
Metallization Mask Layouts
HI-548 HI-549
IN 6 IN 7 IN 8 OUT IN 4 IN 3 (11) (10) (9) (8) (7) (6)
PASSIVATION:
Type: Nitride Over Silox Nitride Thickness: 3.5kÅ ±1kÅ Silox Thickness: 12kÅ ±2kÅ
WORST CASE CURRENT DENSITY:
5
1.4 x 10
A/cm
TRANSISTOR COUNT:
253
PROCESS:
CMOS-DI
terminal, therefore it may be left floating (Insulating Die Mount) or it may be mounted on a
SUPPLY
IN 3B IN 4B OUT B OUT A IN 4AIN 3A
(11) (10) (9) (8) (7) (6)
IN 5 (12)
+V
(13)
GND
(14)
A
2
(15) (16) (1)
A
1
IN 2
(5)
IN 1
(4)
-V
(3)
A
EN
0
(2)
IN 2B
(12)
IN 1B
(13)
+V
(14)
GND
(15) (16) (1)
16
IN 2A
(5)
IN 1A
(4)
-V
(3)
A
A
1
EN
0
(2)
HI-546, HI-547, HI-548, HI-549
www.BDTIC.com/Intersil
17
HI-546, HI-547, HI-548, HI-549
www.BDTIC.com/Intersil
Ceramic Dual-In-Line Frit Seal Packages (CERDIP)
LEAD FINISH
c1
-A-
-B-
bbb C A - B
S
BASE
PLANE
SEATING
PLANE
S1
b2
b
ccc C A - BMD
D
A
A
e
S
S
NOTES:
1. Index area: A notch or a pin one identification mark shall be locat­ed adjacent to pin one and shall be located within the shaded area shown. The manufacturer’s identification shall not be used as a pin one identification mark.
2. The maximum limits of lead dimensions b and c or M shall be measured at the centroid of the finished lead surfaces, when solder dip or tin plate lead finish is applied.
3. Dimensions b1 and c1 apply to lead base metal only. Dimension M applies to lead plating and finish thickness.
4. Corner leads (1, N, N/2, and N/2+1) may be configured with a partial lead paddle. For this configuration dimension b3 replaces dimension b2.
5. This dimension allows for off-center lid, meniscus, and glass overrun.
6. Dimension Q shall be measured from the seating plane to the base plane.
7. Measure dimension S1 at all four corners.
8. N is the maximum number of terminal positions.
9. Dimensioning and tolerancing per ANSI Y14.5M - 1982.
10. Controlling dimension: INCH.
-D­BASE
E
D
S
S
Q
A
-C­L
METAL
b1
M
(b)
SECTION A-A
α
(c)
M
eA
eA/2
aaa CA - B
M
c
D
S
S
F28.6 MIL-STD-1835 GDIP1-T28 (D-10, CONFIGURATION A)
28 LEAD CERAMIC DUAL-IN-LINE FRIT SEAL PACKAGE
INCHES MILLIMETERS
SYMBOL
A - 0.232 - 5.92 -
b 0.014 0.026 0.36 0.66 2 b1 0.014 0.023 0.36 0.58 3 b2 0.045 0.065 1.14 1.65 ­b3 0.023 0.045 0.58 1.14 4
c 0.008 0.018 0.20 0.46 2 c1 0.008 0.015 0.20 0.38 3
D - 1.490 - 37.85 5 E 0.500 0.610 12.70 15.49 5
e 0.100 BSC 2.54 BSC -
eA 0.600 BSC 15.24 BSC -
eA/2 0.300 BSC 7.62 BSC -
L 0.125 0.200 3.18 5.08 -
Q 0.015 0.060 0.38 1.52 6
S1 0.005 - 0.13 - 7
o
α
90
105
o
90
o
105 aaa - 0.015 - 0.38 ­bbb - 0.030 - 0.76 ­ccc - 0.010 - 0.25 -
M - 0.0015 - 0.038 2, 3 N28 288
NOTESMIN MAX MIN MAX
o
Rev. 0 4/94
-
18
HI-546, HI-547, HI-548, HI-549
www.BDTIC.com/Intersil
Dual-In-Line Plastic Packages (PDIP)
N
D1
E1
-B-
-C-
A1
A2
E
A
L
e
C
C
L
e
A
C
e
B
INDEX
AREA
BASE
PLANE
SEATING
PLANE
D1
NOTES:
1. Controlling Dimensions: INCH. In case of conflict between English and Metric dimensions, the inch dimensions control.
2. Dimensioning and tolerancing per ANSI Y14.5M-1982.
3. Symbols are defined in the “MO Series Symbol List” in Section 2.2 of Publication No. 95.
4. Dimensions A, A1 and L are measured with the package seated in JEDEC seating plane gauge GS-3.
5. D, D1, and E1 dimensions do not include mold flash or protrusions. Mold flash or protrusions shall not exceed 0.010 inch (0.25mm).
6. E and are measured with the leads constrained to be perpendic­ular to datum .
7. e e
8. B1 maximum dimensions do not include dambar protrusions. Dambar protrusions shall not exceed 0.010 inch (0.25mm).
9. N is the maximum number of terminal positions.
10. Corner leads (1, N, N/2 and N/2 + 1) for E8.3, E16.3, E18.3, E28.3, E42.6 will have a B1 dimension of 0.030 - 0.045 inch (0.76 - 1.14mm).
12 3 N/2
-A-
B1
B
e
A
and eC are measured at the lead tips with the leads unconstrained.
B
must be zero or greater.
C
D
e
0.010 (0.25) C AM BS
-C-
E28.6 (JEDEC MS-011-AB ISSUE B)
28 LEAD DUAL-IN-LINE PLASTIC PACKAGE
INCHES MILLIMETERS
SYMBOL
A - 0.250 - 6.35 4 A1 0.015 - 0.39 - 4 A2 0.125 0.195 3.18 4.95 -
B 0.014 0.022 0.356 0.558 ­B1 0.030 0.070 0.77 1.77 8
C 0.008 0.015 0.204 0.381 -
D 1.380 1.565 35.1 39.7 5 D1 0.005 - 0.13 - 5
E 0.600 0.625 15.24 15.87 6 E1 0.485 0.580 12.32 14.73 5
e 0.100 BSC 2.54 BSC -
e
A
e
B
L 0.115 0.200 2.93 5.08 4
N28 289
0.600 BSC 15.24 BSC 6
- 0.700 - 17.78 7
NOTESMIN MAX MIN MAX
Rev. 1 12/00
19
HI-546, HI-547, HI-548, HI-549
www.BDTIC.com/Intersil
Plastic Leaded Chip Carrier Packages (PLCC)
0.042 (1.07)
0.048 (1.22) PIN (1) IDENTIFIER
0.020 (0.51) MAX 3 PLCS
0.045 (1.14) MIN
NOTES:
1. Controlling dimension: INCH. Converted millimeter dimensions are
not necessarily exact.
2. Dimensions and tolerancing per ANSI Y14.5M-1982.
3. Dimensions D1 and E1 do not include mold protrusions. Allowable
mold protrusion is 0.010 inch (0.25mm) per side. Dimensions D1 and E1 include mold mismatch and are measured at the extreme material condition at the body parting line.
4. To be measured at seating plane contact point.
5. Centerline to be determined where center leads exit plastic body.
6. “N” is the number of terminal positions.
C
L
D1
D
0.026 (0.66)
0.032 (0.81)
0.050 (1.27) TP
0.042 (1.07)
0.056 (1.42)
EE1
VIEW “A” TYP.
-C-
C
L
A1
A
0.013 (0.33)
0.021 (0.53)
0.025 (0.64) MIN
0.004 (0.10) C
0.025 (0.64)
0.045 (1.14)
D2/E2
D2/E2
VIEW “A”
0.020 (0.51) MIN
SEATING
-C-
PLANE
N28.45 (JEDEC MS-018AB ISSUE A)
28 LEAD PLASTIC LEADED CHIP CARRIER PACKAGE
R
SYMBOL
A 0.165 0.180 4.20 4.57 -
A1 0.090 0.120 2.29 3.04 -
D 0.485 0.495 12.32 12.57 ­D1 0.450 0.456 11.43 11.58 3 D2 0.191 0.219 4.86 5.56 4, 5
E 0.485 0.495 12.32 12.57 ­E1 0.450 0.456 11.43 11.58 3 E2 0.191 0.219 4.86 5.56 4, 5
N28 286
INCHES MILLIMETERS
NOTESMIN MAX MIN MAX
Rev. 2 11/97
20
HI-546, HI-547, HI-548, HI-549
www.BDTIC.com/Intersil
Small Outline Plastic Packages (SOIC)
N
INDEX AREA
123
-A-
E
-B-
SEATING PLANE
D
A
-C-
0.25(0.010) BM M
H
L
h x 45
o
α
e
B
0.25(0.010) C AM BS
NOTES:
1. Symbols are defined in the “MO Series Symbol List” in Section 2.2 of Publication Number 95.
2. Dimensioning and tolerancing per ANSI Y14.5M-1982.
3. Dimension “D” does not include mold flash, protrusions or gate burrs. Mold flash, protrusion and gate burrs shall not exceed
0.15mm (0.006 inch) per side.
4. Dimension “E” does not include interlead flash or protrusions. In­terlead flash and protrusions shall not exceed 0.25mm (0.010 inch) per side.
5. The chamfer on the body is optional. If it is not present, a visual index feature must be located within the crosshatched area.
6. “L” is the length of terminal for soldering to a substrate.
7. “N” is the number of terminal positions.
8. Terminal numbers are shown for reference only.
9. The lead width “B”, as measured 0.36mm (0.014 inch) or greater above the seating plane, shall not exceed a maximum value of
0.61mm (0.024 inch)
10. Controlling dimension: MILLIMETER. Converted inch dimen­sions are not necessarily exact.
M
A1
0.10(0.004)
M28.3 (JEDEC MS-013-AE ISSUE C)
28 LEAD WIDE BODY SMALL OUTLINE PLASTIC PACKAGE
INCHES MILLIMETERS
SYMBOL
A 0.0926 0.1043 2.35 2.65 -
A1 0.0040 0.0118 0.10 0.30 -
B 0.013 0.0200 0.33 0.51 9 C 0.0091 0.0125 0.23 0.32 ­D 0.6969 0.7125 17.70 18.10 3 E 0.2914 0.2992 7.40 7.60 4 e 0.05 BSC 1.27 BSC ­H 0.394 0.419 10.00 10.65 -
C
h 0.01 0.029 0.25 0.75 5 L 0.016 0.050 0.40 1.27 6 N28 287
o
α
0
o
8
o
0
o
8
Rev. 0 12/93
NOTESMIN MAX MIN MAX
-
21
HI-546, HI-547, HI-548, HI-549
www.BDTIC.com/Intersil
Ceramic Dual-In-Line Frit Seal Packages (CERDIP)
LEAD FINISH
c1
-A-
-B-
bbb C A - B
S
BASE
PLANE
SEATING
PLANE
S1
b2
b
ccc C A - BMD
D
A
A
e
S
S
NOTES:
1. Index area: A notch or a pin one identification mark shall be locat­ed adjacent to pin one and shall be located within the shaded area shown. The manufacturer’s identification shall not be used as a pin one identification mark.
2. The maximum limits of lead dimensions b and c or M shall be measured at the centroid of the finished lead surfaces, when solder dip or tin plate lead finish is applied.
3. Dimensions b1 and c1 apply to lead base metal only. Dimension M applies to lead plating and finish thickness.
4. Corner leads (1, N, N/2, and N/2+1) may be configured with a partial lead paddle. For this configuration dimension b3 replaces dimension b2.
5. This dimension allows for off-center lid, meniscus, and glass overrun.
6. Dimension Q shall be measured from the seating plane to the base plane.
7. Measure dimension S1 at all four corners.
8. N is the maximum number of terminal positions.
9. Dimensioning and tolerancing per ANSI Y14.5M - 1982.
10. Controlling dimension: INCH.
-D­BASE
E
D
S
S
Q
A
-C­L
METAL
b1
M
(b)
SECTION A-A
α
(c)
M
eA
eA/2
aaa CA - B
M
c
D
S
S
F16.3 MIL-STD-1835 GDIP1-T16 (D-2, CONFIGURATION A)
16 LEAD CERAMIC DUAL-IN-LINE FRIT SEAL PACKAGE
INCHES MILLIMETERS
SYMBOL
A - 0.200 - 5.08 -
b 0.014 0.026 0.36 0.66 2 b1 0.014 0.023 0.36 0.58 3 b2 0.045 0.065 1.14 1.65 ­b3 0.023 0.045 0.58 1.14 4
c 0.008 0.018 0.20 0.46 2 c1 0.008 0.015 0.20 0.38 3
D - 0.840 - 21.34 5 E 0.220 0.310 5.59 7.87 5
e 0.100 BSC 2.54 BSC -
eA 0.300 BSC 7.62 BSC -
eA/2 0.150 BSC 3.81 BSC -
L 0.125 0.200 3.18 5.08 -
Q 0.015 0.060 0.38 1.52 6
S1 0.005 - 0.13 - 7
o
α
90
105
o
90
o
105 aaa - 0.015 - 0.38 ­bbb - 0.030 - 0.76 ­ccc - 0.010 - 0.25 -
M - 0.0015 - 0.038 2, 3 N16 168
NOTESMIN MAX MIN MAX
o
Rev. 0 4/94
-
22
HI-546, HI-547, HI-548, HI-549
www.BDTIC.com/Intersil
Dual-In-Line Plastic Packages (PDIP)
N
D1
E1
-B-
-C-
A1
A2
E
A
L
e
C
C
L
e
A
C
e
B
INDEX
AREA
BASE
PLANE
SEATING
PLANE
D1
NOTES:
1. Controlling Dimensions: INCH. In case of conflict between English and Metric dimensions, the inch dimensions control.
2. Dimensioning and tolerancing per ANSI Y14.5M-1982.
3. Symbols are defined in the “MO Series Symbol List” in Section 2.2 of Publication No. 95.
4. Dimensions A, A1 and L are measured with the package seated in JE­DEC seating plane gauge GS-3.
5. D, D1, and E1 dimensions do not include mold flash or protrusions. Mold flash or protrusions shall not exceed 0.010 inch (0.25mm).
6. E and are measured with the leads constrained to be perpendic­ular to datum .
7. e e
8. B1 maximum dimensions do not include dambar protrusions. Dambar protrusions shall not exceed 0.010 inch (0.25mm).
9. N is the maximum number of terminal positions.
10. Corner leads (1, N, N/2 and N/2 + 1) for E8.3, E16.3, E18.3, E28.3, E42.6 will have a B1 dimension of 0.030 - 0.045 inch (0.76 - 1.14mm).
12 3 N/2
-A-
B1
B
e
A
and eC are measured at the lead tips with the leads unconstrained.
B
must be zero or greater.
C
D
e
0.010 (0.25) C AM BS
-C-
E16.3 (JEDEC MS-001-BB ISSUE D)
16 LEAD DUAL-IN-LINE PLASTIC PACKAGE
INCHES MILLIMETERS
SYMBOL
A - 0.210 - 5.33 4 A1 0.015 - 0.39 - 4 A2 0.115 0.195 2.93 4.95 -
B 0.014 0.022 0.356 0.558 ­B1 0.045 0.070 1.15 1.77 8, 10
C 0.008 0.014 0.204 0.355 -
D 0.735 0.775 18.66 19.68 5 D1 0.005 - 0.13 - 5
E 0.300 0.325 7.62 8.25 6 E1 0.240 0.280 6.10 7.11 5
e 0.100 BSC 2.54 BSC -
e
A
e
B
L 0.115 0.150 2.93 3.81 4
N16 169
0.300 BSC 7.62 BSC 6
- 0.430 - 10.92 7
NOTESMIN MAX MIN MAX
Rev. 0 12/93
23
HI-546, HI-547, HI-548, HI-549
www.BDTIC.com/Intersil
Plastic Leaded Chip Carrier Packages (PLCC)
0.042 (1.07)
0.048 (1.22) PIN (1) IDENTIFIER
0.020 (0.51) MAX 3 PLCS
C
L
D1
D
0.026 (0.66)
0.032 (0.81)
0.045 (1.14) MIN
0.042 (1.07)
0.056 (1.42)
0.050 (1.27) TP
VIEW “A” TYP.
C
L
EE1
0.013 (0.33)
0.021 (0.53)
0.025 (0.64) MIN
0.004 (0.10) C
0.025 (0.64)
0.045 (1.14)
D2/E2
D2/E2
A1
A
-C-
VIEW “A”
0.020 (0.51) MIN
SEATING PLANE
N20.35 (JEDEC MS-018AA ISSUE A)
20 LEAD PLASTIC LEADED CHIP CARRIER PACKAGE
R
SYMBOL
A 0.165 0.180 4.20 4.57 -
A1 0.090 0.120 2.29 3.04 -
D 0.385 0.395 9.78 10.03 ­D1 0.350 0.356 8.89 9.04 3 D2 0.141 0.169 3.59 4.29 4, 5
E 0.385 0.395 9.78 10.03 ­E1 0.350 0.356 8.89 9.04 3 E2 0.141 0.169 3.59 4.29 4, 5
N20 206
INCHES MILLIMETERS
NOTESMIN MAX MIN MAX
Rev. 2 11/97
NOTES:
1. Controlling dimension: INCH. Converted millimeter dimensions are not necessarily exact.
2. Dimensions and tolerancing per ANSI Y14.5M-1982.
3. Dimensions D1 and E1 do not include mold protrusions. Allowable mold protrusion is 0.010 inch (0.25mm) per side. Dimensions D1 and E1 include mold mismatch and are measured at the extreme material condition at the body parting line.
4. To be measured at seating plane contact point.
-C-
5. Centerline to be determined where center leads exit plastic body.
6. “N” is the number of terminal positions.
All Intersil U.S. products are manufactured, assembled and tested utilizing ISO9000 quality systems.
Intersil Corporation’s quality certifications can be viewed at www.intersil.com/design/quality
Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design, software and/or specifications at any time without notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted b y implica tion or ot herw ise un der any patent or patent rights of Intersil or its subsidi aries.
For information regarding Intersil Corporation and its products, see www.intersil.com
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