HI3304
August 1997
Features
• CMOS Low Power (Typ). . . . . . . . . . . . . . . . . . . . 35mW
• Parallel Conversion Technique
• Single Power Supply Voltage . . . . . . . . . . . . 3V to 7.5V
• Sampling Rate at 5V Supply . . . . . . . . . . . . . . . . . 25MHz
• 4-Bit Latched Three-State Output with Overflow and
Data Change Outputs
• Maximum Nonlinearity. . . . . . . . . . . . . . . . . . . .
• Inherent Resistance to Latch-Up
• Bipolar Input Range with Optional Second Supply
• Input Bandwidth (Typ) . . . . . . . . . . . . . . . . . . . . . 40MHz
• Linearity (INL, DNL):
- HI3304JIP . . . . . . . . . . . . . . . . . . . . . . . . . . ±0.25 LSB
- HI3304JIB . . . . . . . . . . . . . . . . . . . . . . . . . . ±0.25 LSB
• Sampling Rate:
- HI3304JIP . . . . . . . . . . . . . . . . . . . . . . . 25MHz (40ns)
- HI3304JIB . . . . . . . . . . . . . . . . . . . . . . . 25MHz (40ns)
Applications
• Video Digitizing
• High Speed Data Acquisition
• Digital Communication Systems
• Radar Signal Processing
1
/8 LSB
4-Bit, 25 MSPS, Flash A/D Converter
Description
The Intersil HI3304 is a CMOS parallel (FLASH) analog-todigital converter designed for applications demanding both
low-power consumption and high speed digitization. Digitizing at 25MHz, for example, requires only about 35mW.
The HI3304 operates over a wide, full-scale signal input voltage range of 0.5V up to the supply voltage. Power consumption is as low as 10mW, depending upon the clock frequency
selected.
Sixteen paralleled auto-balanced voltage comparators measure the input voltage with respect to a known reference to
produce the parallel-bit outputs in the HI3304. Fifteen comparators are required to quantize all input voltage levels in
this 4-bit converter, and the additional comparator is required
for the overflow bit. A data change pin indicates when the
present output differs from the previous, thus allowing compaction of data storage.
Ordering Information
TEMP.
PART NUMBER
HI3304JIP -40 to 85 16 Ld PDIP E16.3
HI3304JIB -40 to 85 16 Ld SOIC M16.3
RANGE (oC) PACKAGE PKG. NO.
Pinout
HI3304
(PDIP, SOIC)
TOP VIEW
16
V
DD
15
CLK
14
VAA-
13
V
REF
V
12
REF
V
11
IN
10
VAA+
9
CE1
BIT 2
BIT 3
BIT 4
CE2
V
SS
1
2
3
4
5
6
7
8
BIT 1 (LSB)
DATA CHANGE (DC)
OVERFLOW (OF)
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 321-724-7143 | Copyright © Intersil Corporation 1999
4-1424
+
File Number 4137.1
Functional Block Diagram
φ1 φ1 φ1 φ1φ2
V
IN
11
1
/2R
12
V
+
REF
R
†CAB #16
D
LATCH
16
HI3304HI3304
VAA+V
COUNT
16
Q
OUTPUT
φ2
DD
1610
REGISTER
DQ
CLK
DQ
CLK
DQ
CLK
THREE-STATE
DRIVERS
DAT A
5
CHANGE
6
OVERFLOW
BIT 4
4
V
REF
13
CLOCK
15
R
†CAB #8
R
R
-
1
/2R
†CAB COMPARATOR #1
50kΩ
D
LATCH
8
D
LATCH
0
COUNT
Q
COUNT
Q
φ1 (AUTO BALANCE)
φ2 (SAMPLE UNKNOWN)
8
1
ENCODER
LOGIC
ARRA Y
VAA-V
814
SS
DQ
CLK
DQ
CLK
DQ
CLK
3
BIT 3
2
BIT 2
1
BIT 1 (LSB)
9
CE1
CE2
7
†Cascaded Auto Balance (CAB)
NOTE: CE1 and CE2 inputs and data outputs have standard CMOS protection networks to VDD and VSS. Analog inputs and clock have
standard CMOS protection networks to VAA+ and VAA-.
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HI3304HI3304
Absolute Maximum Ratings Thermal Information
DC Supply Voltage Range (VDD or VAA+)
(Voltage Referenced to VSS or VAA- Terminal,
Whichever is More Negative) . . . . . . . . . . . . . . . . . . -0.5V to +8V
Input Voltage Range
CE1, CE2 Inputs. . . . . . . . . . . . . . . . . . . VSS -0.5V to VDD +0.5V
Clock, V
REF
+, V
-, VIN Inputs . . . . . . VAA -0.5V to VAA +0.5V
REF
DC Input Current, Any Input. . . . . . . . . . . . . . . . . . . . . . . . . ±20mA
Operating Conditions
Supply Voltage Range (VDD or VAA+) . . . . . . . . . . . . . . . . . .3V to 7.5V
VAA+ Voltage Range . . . . . . . . . . . . . . . . . . VDD -1V to VDD +2.5V
VAA- Voltage Range. . . . . . . . . . . . . . . . . . . .VSS -2.5V to VSS +1V
Operating Temperature Range. . . . . . . . . . . . . . . . . . -40oC to 85oC
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
1. θJA is measured with the component mounted on an evaluation PC board in free air.
Thermal Resistance (Typical, Note 1) θJA(oC/W)
PDIP Package. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 90
SOIC Package. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 100
Maximum Junction Temperature. . . . . . . . . . . . . . . . . . . . . . .150oC
Maximum Storage Temperature Range (T
) . . . .-65oC to 150oC
STG
Maximum Lead Temperature (Soldering 10s). . . . . . . . . . . . .300oC
(SOIC - Lead Tips Only)
Electrical Specifications T
= 25oC, V
A
+ = 2V, VDD = VAA+ = 5V, VAA- = V
REF
- = VSS = GND, f
REF
CLK
= 25MHz
Unless Otherwise Specified
PARAMETER TEST CONDITIONS MIN TYP MAX UNITS
SYSTEM PERFORMANCE
Resolution 4 - - Bits
Input Errors Integral Linearity Error - ±0.125 ±0.25 LSB
Differential Linearity Error - ±0.125 ±0.25 LSB
Offset Error (Unadjusted) - - ±1.0 LSB
Gain Error (Unadjusted) - - ±1.0 LSB
DYNAMIC CHARACTERISTICS Input Signal Level 0.5dB Below Full Scale
Conversion Timing Aperture Delay - 3 - ns
Signal to Noise Ratio (SNR) f
RMS Signal
----------------------------------
=
RMS Noise
Signal to Noise Ratio (SINAD) f
RMS Signal
--------------------------------------------------------------- -
=
RMSNoise + Distortion
= 25MHz, fIN = 100kHz - 23.7 - dB
S
= 25MHz, fIN = 5MHz - 23.6 - dB
f
S
= 25MHz, fIN = 100kHz - 23.4 - dB
S
= 25MHz, fIN = 5MHz - 22.8 - dB
f
S
Total Harmonic Distortion, THD fS = 25MHz, fIN = 100kHz - -34.5 - dBc
= 25MHz, fIN = 5MHz - -31.0 - dBc
f
S
Effective Number of Bits, ENOB f
= 25MHz, fIN = 100kHz - 3.67 - Bits
S
= 25MHz, fIN = 5MHz - 3.57 - Bits
f
S
ANALOG INPUTS
Input Range Full Scale Input Range (Notes 1, 4) 0.5 - V
AA
V
Input Loading Input Capacitance - 10 - pF
Input Current V
= 2V (Note 2) - 150 200 µA
IN
-3dB Input Bandwidth - 40 - MHz
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HI3304HI3304
Electrical Specifications T
= 25oC, V
A
+ = 2V, VDD = VAA+ = 5V, VAA- = V
REF
Unless Otherwise Specified (Continued)
PARAMETER TEST CONDITIONS MIN TYP MAX UNITS
REFERENCE INPUTS
Input Range V
+ Range (Note 4) VAA- +0.5 - VAA+V
REF
- Range (Note 4) VAA--V
V
REF
Input Loading Resistor Ladder Impedance V
DIGITAL INPUTS
Digital Input Maximum V
, Low CLOCK (Notes 3, 4) - - 0.3 x V
IN
CE1, CE2 (Note 4) - - 0.3 x V
Minimum V
, High CLOCK (Notes 3, 4) 0.7 x V
IN
CE1, CE2 (Note 4) 0.7 x V
Input Leakage, Except CLK V = 0V, 5V - - ±1 µA
Input Leakage, CLK (Note 3) - ±100 ±150 µA
DIGITAL OUTPUTS
Digital Outputs Output Low (Sink) Current V
Output High (Source) Current V
Three-State Leakage Current V
TIMING CHARACTERISTICS
- = VSS = GND, f
REF
= 5V, CLK = Low 640 - 960 Ω
IN
AA
DD
= 0.4V 6 - - mA
O
= 4.6V -3 - - mA
O
= 0V, 5V - ±0.2 ±5 µA
O
= 25MHz
CLK
+ -0.5 V
AA
AA
DD
--V
--V
V
V
Conversion Timing Maximum Conversion Speed CLK = Square Wave 25 35 - MSPS
Auto-Balance Time (
Sample Time (
φ2) 20 - 5000 ns
φ1) 20 -
-
ns
Output Timing Data Valid Delay (Note 4) - 30 40 ns
Data Hold Time (Note 4) 15 25 - ns
Output Enable Time - 15 - ns
Output Disable Time - 10 - ns
POWER SUPPLY CHARACTERISTICS
Device Current, I
Device Current, I
AA
DD
V
AA
+ = 5V,
Continuous Clock - 5.5 - mA
Continuous
Continuous
φ2 - 0.4 - mA
φ1-2-mA
Continuous Clock - 1.5 - mA
Continuous φ2-510mA
VSS = CE1 = VAA- = CLK = GND
V
+ = 7V Continuous φ1-520mA
AA
NOTES:
1. Full scale input range, V
REF
+ - V
-, may be in the range of 0.5V to VAA+ -VAA- volts. Linearity errors increase at lower full scale ranges,
REF
however.
2. Input current is due to energy transferred to the input at the start of the sample period. The average value is dependent on input and V
voltage.
3. The CLK input is a CMOS inverter with a 50kΩ feedback resistor. It operates from the VAA+ and VAA- supplies. It may be AC-coupled
with a 1V
minimum source.
P-P
4. Parameter not tested, but guaranteed by design or characterization.
DD
4-1427