intersil HI-200-883 DATA SHEET

®
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HI-200/883
Data Sheet January 30, 2006
Dual SPST CMOS Analog Switch
The HI-200/883 is a monolithic device comprising two independently selectable SPST switchers which feature fast switching speeds (240ns typical) combined with low power dissipation (15mW typical @ +25°C).
Each switch provides low “ON” resistance operation for input signal voltages up to the supply rails and for signal currents up to 25mA continuous. Rugged DI construction eliminates latch-up and substrate SCR failure modes.
All devices provide break-before-make switching and are TTL and CMOS compatible for maximum application versatility. HI-200/883 is an ideal component for use in high frequency analog switching. Typical applications include signal path switching, sample and hold circuits, digital filters, and op amp gain switching networks.
Functional Diagram
LOGIC
INPUT
V+ V
REFERENCE,
LEVEL SHIFTER,
AND DRIVER
V-
REF
GATE
SOURCE
SWITCH
CELL
INPUT
GATE
DRAIN
OUTPUT
FN6059.2
Features
• This Circuit is Processed in Accordance to MIL-STD-883 and is Fully Conformant Under the Provisions of Paragraph 1.2.1.
• Low “On” Release . . . . . . . . . . . . . . . . . . . . . . .100 Max
• Wide Analog Signal Range . . . . . . . . . . . . . . . . . . . .±15V
• TTL/CMOS Compatible . . . . . . . . . . . . . . 2.4V (Logic “1”)
• Turn-On Time . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .500ns
• Analog Current Range (Continuous) . . . . . . . . . . . . 25mA
• No Latch-Up
• Replaces DG200
Applications
• High Frequency Analog Switching
• Sample and Hold Circuits
• Digital Filters
• Op Amp Gain Switching Networks
Ordering Information
TEMP.
PART NUMBER
HI2-0200/883 -55 to 125 10 Pin Metal Can T10.B
RANGE (°C) PACKAGE
PKG.
DWG. #
Pinout
HI2-200/883 (METAL CAN)
TOP VIEW
V+
A
1
10
1
IN1
9
1
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 1-888-468-3774
| Intersil (and design) is a registered trademark of Intersil Americas Inc.
All other trademarks mentioned are the property of their respective owners.
A
2
2
3
GND
4
IN2
Copyright Intersil Americas Inc. 2004, 2006. All Rights Reserved
5
OUT2
OUT1
8
7
V
REF
6
V-
HI-200/883
www.BDTIC.com/Intersil
Absolute Maximum Ratings Thermal Information
Voltage Between V+ and V- Terminals . . . . . . . . . . . . . . . . . . . .40V
±V Analog Input Voltage, (+V
Analog Input Voltage, (-V
Digital Input Voltage, (+V
Digital Input Voltage, (-V
to Ground (V+, V-) . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±20V
SUPPLY
) . . . . . . . . . . . . . . . . . . +V
S
). . . . . . . . . . . . . . . . . . . . -V
S
) . . . . . . . . . . . . . . . . . . . +V
A
). . . . . . . . . . . . . . . . . . . . . -V
A
SUPPLY
SUPPLY
SUPPLY
SUPPLY
+2V
-2V
+4V
-4V
Thermal Resistance θ
Metal Can Package . . . . . . . . . . . . . . . 160 75
Package Power Dissipation at +75°C
Metal Can Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.62W/°C
Package Power Dissipation Derating Factor above +75°C
Metal Can Package . . . . . . . . . . . . . . . . . . . . . . . . . . .8.24mW/°C
Peak Current (S or D)
(Pulse at 1ms, 10% Duty Cycle Max). . . . . . . . . . . . . . . . . . 40mA
Continuous Current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25mA
Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .+175°C
Storage Temperature Range. . . . . . . . . . . . . . . . . .-65°C to +150°C
Lead Temperature (Soldering 10s) . . . . . . . . . . . . . . . . . . . . . . ≤275°C
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
Recommended Operating Conditions
Operating Temperature Range . . . . . . . . . . . . . . . .- 55°C to +125°C
Operating Supply Voltage Range (±V Analog Input Voltage (V
Logic Low Level (VAL). . . . . . . . . . . . . . . . . . . . . . . . . . . 0V to 0.8V
Logic High Level (V
) . . . . . . . . . . . . . . . . . . . . . . . . ±V
S
) . . . . . . . . . . . . . . . . . . . . 2.4V to +V
AH
SUPPLY
(°C/W) θJC (°C/W)
JA
). . . . . . . . . . . . . . ±15V
SUPPLY
SUPPLY
Device Tested at: +V
SUPPLY
= +15V, −V
SUPPLY
= 15V, V
D.C. PARAMETERS SYMBOL CONDITIONS
TABLE 1. D.C. ELECTRICAL PERFORMANCE SPECIFICATIONS
Switch
“ON” Resistance r
VA = 0.8V, VS = 10V, ID = -1mA,
DS
All Unused Channels V
= 0.8V, VS = -10V, ID = 1mA,
V
A
All Unused Channels V
Source “OFF” Leakage Current
Drain “OFF” Leakage Current
Channel “ON” Leakage Current
I
S(OFF)VS
I
D(OFF)VD
I
D(ON)VD
= +14V, VD = -14V, VA = 2.4V,
All Unused Channels V
= +14V, VS = -14V
V
D
= -14V, VD = +14V, VA = 2.4V,
V
S
All Unused Channels V
= -14V, VS = +14V
V
D
= -14V, VS = +14V, VA = 2.4V, All Unused Channels V V
= +14V, VS = -14V
D
= +14V, VS = -14V, VA = 2.4V,
V
D
All Unused Channels V
= -14V, VS = +14V
V
D
= VS = +14V, VA = 0.8V, All Unused Channels V
= VS = -14V
V
D
= VS = -14V, VA = 0.8V,
V
D
All Unused Channels V V
= VS = +14V
D
Low Level Input Current
High Level Input Current
Supply Current +I
I
I
VAL = 0.8V
AL
All Channels V
VAH = 2.4V
AH
All Channels V
All Channels VA = 0V 1 25 - 2.0 µA
CC
All Channels V
= 2.4V
A
AH
= 3V 1 25 - 2.0 mA
A
= OPEN, GND = 0V, Unless Otherwise Specified.
REF
GROUP A
TEMPERATURE
SUBGROUPS
125-70
= 0.8V
A
2, 3 -55 to 125 - 100
125-70
= 0.8V
A
2, 3 -55 to 125 - 100
125-55nA
= 2.4V,
A
2, 3 -55 to 125 -500 500 nA
125-55nA
= 2.4V,
A
2, 3 -55 to 125 -500 500 nA
125-55nA
= 2.4V,
A
2, 3 -55 to 125 -500 500 nA
125-55nA
= 2.4V,
A
2, 3 -55 to 125 -500 500 nA
125-55nA
= 0.8V,
A
2, 3 -55 to 125 -500 500 nA
125-55nA
= 0.8V,
A
2, 3 -55 to 125 -500 500 nA
125-1.01.0µA
2, 3 -55 to 125 -1.0 1.0 µA
125-1.01.0µA
= 4.0V
2, 3 -55 to 125 -1.0 1.0 µA
2, 3 -55 to 125 - 2.0 µA
2, 3 -55 to 125 - 2.0 mA
(°C) MIN MAX UNITS
2
FN6059.2
January 30, 2006
HI-200/883
www.BDTIC.com/Intersil
TABLE 1. D.C. ELECTRICAL PERFORMANCE SPECIFICATIONS (Continued)
Device Tested at: +V
D.C. PARAMETERS SYMBOL CONDITIONS
Supply Current -I
Device Tested at: +V
PARAMETERS SYMBOL CONDITIONS
Turn “ON” Time t
Turn “OFF” Time t
Device Tested at: +V
PARAMETERS SYMBOL CONDITIONS NOTE
Address Capacitance C Switches Input
Capacitance Switch Output Capacitance C
Drain to Source Capacitance
Off Isolation V
Cross Talk V
Charge Transfer Error V
NOTE:
1. Parameters listed in Table 2 are controlled via design or process parameters and are not directly tested at final production. These parameters are lab characterized upon initial design release, or upon design changes. These parameters are guaranteed by characterization based upon data from multiple production runs which reflect lot to lot and within lot variation.
SUPPLY
SUPPLY
SUPPLY
= +15V, −V
CC
TABLE 2. A.C. ELECTRICAL PERFORMANCE SPECIFICATIONS
= +15V, −V
ON
OFF
TABLE 3. ELECTRICAL PERFORMANCE SPECIFICATIONS (NOTE 1)
= +15V, −V
A
C
S (OFF)
D (OFF)
C
D (ON)
C
DS
ISO
CT
CTE
= 15V, V
SUPPLY
All Channels VA = 0V 1 25 -2.0 - µA
All Channels V
= 15V, V
SUPPLY
C
= 35pF,
L
R
= 1k
L
C
= 33pF,
L
= 1k
R
L
= 15V, V
SUPPLY
f = 1MHz, VAL = 0V 1 25 - 20 pF f = 1MHz, VAH = 5V,
Measured Source to GND f = 1MHz, VAH = 5V,
Measured Output to Ground f = 1MHz, VAL = 0V,
Measured Output to Ground f = 1MHz, VAH = 5V 1 25 - 2.0 pF
f = 200kHz, VA = 2.4, RL = 1K,
= 1V
V
GEN
f = 200kHz, VA = 2.4, RL = 1K, V
= 1V
GEN
f = 200kHz, VA = 0 to 4V,
= 0.01µF
C
L
= OPEN, GND = 0V, Unless Otherwise Specified.
REF
GROUP A
SUBGROUPS
2, 3 -55 to 125 -2.0 - µA
= 3V 1 25 -2.0 - µA
A
2, 3 -55 to 125 -2.0 - µA
= OPEN, GND = 0V, Unless Otherwise Specified.
REF
GROUP A
SUB-
GROUPS
9 25 - 500 ns
10, 11 55 to 125 - 800 ns
9 25 - 500 ns
10, 11 55 to 125 - 650 ns
= OPEN, GND = 0V
REF
1 25 - 20 pF
1 25 - 20 pF
1 25 - 30 pF
12555-dB
= 10pF
P-P, CL
12560-dB
1 25 -10 10 mV
P-P, CL
= 10pF
TEMPERATURE
(°C) MIN MAX UNITS
TEMPERATURE
(°C) MIN MAX UNITS
TEMPERATURE
(°C) MIN MAX UNITS
TABLE 4. ELECTRICAL TEST REQUIREMENTS
MIL-STD-883 TEST REQUIREMENTS SUBGROUPS (Tables 1 and 2)
Interim Electrical Parameters (Pre Burn-in) 1 Final Electrical Test Parameters 1 (Note 2), 2, 3, 9, 10, 11 Group A Test Requirements 1, 2, 3, 9, 10, 11 Groups C & D Endpoints 1
NOTE:
2. PDA applies to Subgroup 1 only.
3
FN6059.2
January 30, 2006
Test Circuits
www.BDTIC.com/Intersil
HI-200/883
+V
CC
S
V
IN
I
IN
-V
GND
CC
D
FIGURE 1. INPUT LEAKAGE CURRENT
+V
CC
V
S
I
S
V
IN
-V
GND
FIGURE 3. IS
CC
(OFF)
S
V
D
S
V
S
V
IN
GND
FIGURE 2. I
V
IN
GND
FIGURE 4. I
+V
CC
D
I
D
-V
CC
V
D
D (OFF)
+V
CC
S
I
D(ON)
D
V
-V
CC
D (ON)
+V
CC
I
1
STEP
S
V
IN
GND
I
2
-V
CC
D
FIGURE 5. SUPPLY CURRENTS
GENERATOR
TEST
POINT
0.01µF
TEST
POINT
0.01µF
FIGURE 6. CHARGE TRANSFER ERROR
15V
V+
IN
1
S
1
D
1
IN
2
S
2
D
2
GNDV-
-15V GND
IN
3
S
3
D
3
IN
4
S
4
D
4
STEP
GENERATOR
(SEE NOTE)
TEST POINT
0.01µF
TEST POINT
0.01µF
4
FN6059.2
January 30, 2006
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