The HGTD7N60B3S, HGT1S7N60B3S and HGTP7N60B3
are MOS gated high voltage switching devices combining the
best features of MOSFETs and bipolar transistors. These
devices have the high input impedance of a MOSFET and the
low on-state conduction loss of a bipolar transistor. The much
lower on-state voltage drop varies only moderately between
o
25
C and 150oC.
The IGBT is ideal for many high voltage switching applications
operating at moderate frequencies where low conduction
losses are essential, such as: AC and DC motor controls,
power suppliesanddriv ersfor solenoids, relays and contactors.
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
ARV
STG
L
SC
SC
100mJ
-55 to 150
260
2µs
12µs
o
C
o
C
NOTES:
1. Single Pulse; Pulse width limited by maximum junction temperature. Parts may current limit at less than ICM.
2. VCE = 360V, TJ = 125oC, RG = 50Ω.
Electrical SpecificationsT
= 25oC, Unless Otherwise Specified
C
PARAMETERSYMBOLTEST CONDITIONSMINTYPMAXUNITS
Collector to Emitter Breakdown VoltageBV
Emitter to Collector Breakdown VoltageBV
Collector to Emitter Leakage CurrentI
CESIC
ECSIC
CES
= 250µA, VGE = 0V600--V
= 3mA, VGE= 0V1528-V
VCE = BV
CES
TC = 25oC--100µA
TC = 150oC--2.0mA
Collector to Emitter Saturation VoltageV
Gate to Emitter Threshold VoltageV
Gate to Emitter Leakage CurrentI
CE(SAT)IC
GE(TH)IC
GES
Switching SOASSOATJ = 150oC
= I
,
C110
VGE = 15V
= 250µA, VCE = V
TC = 25oC-1.82.1V
TC = 150oC-2.12.4V
GE
3.05.16.0V
VGE = ±20V--±100nA
VCE= 480V42--A
RG = 50Ω
VGE = 15V
VCE= 600V35--A
L = 100µH
Gate to Emitter Plateau VoltageV
On-State Gate ChargeQ
Current Turn-On Delay Timet
d(ON)I
Current Rise Timet
Current Turn-Off Delay Timet
d(OFF)I
Current Fall Timet
Turn-On Energy (Note 4)E
Turn-On Energy (Note 4)E
Turn-Off Energy (Note 3)E
GEPIC
G(ON)IC
rI
fI
ON1
ON2
OFF
= I
, VCE = 0.5 BV
C110
= I
,
C110
VCE = 0. 5BV
CES
CES
VGE = 15V-2328nC
VGE = 20V-3037nC
IGBT and Diode Both at TJ = 25oC
ICE = I
, VCE = 0.8 BV
C110
CES
,
VGE = 15V, RG= 50Ω, L = 2mH
Test Circuit (Figure 17)
-7.7-V
-26-ns
-21-ns
-130160ns
-6080ns
-72-µJ
-160200µJ
-120200µJ
2
HGTD7N60B3S, HGT1S7N60B3S, HGTP7N60B3
Electrical SpecificationsT
= 25oC, Unless Otherwise Specified (Continued)
C
PARAMETERSYMBOLTEST CONDITIONSMINTYPMAXUNITS
Current Turn-On Delay Timet
d(ON)I
Current Rise Timet
Current Turn-Off Delay Timet
d(OFF)I
Current Fall Timet
Turn-On Energy (Note 4)E
Turn-On Energy (Note 4)E
Turn-Off Energy (Note 3)E
Thermal Resistance Junction To CaseR
ON1
ON2
OFF
θJC
IGBT and Diode Both at TJ = 150oC
ICE = I
rI
VGE = 15V, RG=50Ω, L = 2mH
, VCE = 0.8 BV
C110
Test Circuit (Figure 17)
fI
CES
-24-ns
,
-22-ns
-230295ns
-120175ns
-80-µJ
-310350µJ
-350500µJ
--2.1
NOTE:
3. Turn-OffEnergy Loss (E
) is defined as the integral of the instantaneous power loss starting at the trailing edge of the input pulse and ending
OFF
at the point where the collector current equals zero (ICE= 0A). All devices were tested per JEDEC standard No. 24-1 Method for Measurement
of Power Device Turn-Off Switching Loss. This test method produces the true total Turn-Off Energy Loss. Turn-On losses include losses due
to diode recovery.
4. Values for two Turn-On loss conditions are shown for the convenience of the circuit designer. E
is the Turn-On loss of the IGBT only. E
ON1
is the Turn-On loss when a typical diode is used in the test circuit and the diode is at the same TJ as the IGBT. The diode type is specified in
Figure 17.