Intersil Corporation HGTG20N50C1D Datasheet

April 1995
HGTG20N50C1D
20A, 500V N-Channel IGBT
with Anti-Parallel Ultrafast Diode
Features
• Latch Free Operation
• Typical Fall Time < 500ns
• High Input Impedance
• Low Conduction Loss
• With Anti-Parallel Diode < 60ns
•t
RR
Description
The IGBT is a MOS gated high voltage switching device combining the best features of MOSFETs and bipolar transistors. The device has the high input impedance of a MOSFET and the low on-state conduction loss of a bipolar transistor. The much lower on-state voltage drop varies only moderately between +25 parallel with the IGBT is an ultrafast (t recovery characteristic.
IGBTs are ideal for many high voltage switching applications operating at frequencies where low conduction losses are essential, such as: AC and DC motor controls, power supplies and drivers for solenoids, relays and contractors.
PACKAGING AVAILABILITY
PART NUMBER PACKAGE BRAND
HGTG20N50C1D TO-247 G20N50C1D
NOTE: When ordering, use the entire part number.
o
C and +150oC. The diode used in
< 60ns) with soft
RR
Package
JEDEC STYLE TO-247
COLLECTOR
(BOTTOM SIDE
METAL)
Terminal Diagram
G
EMITTER
COLLECTOR
GATE
C
E
Absolute Maximum Ratings T
Collector-Emitter Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . BV
Collector-Gate Voltage RGE = 1M . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . BV
Collector Current Continuous at TC = +25oC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .I
at TC = +90oC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .I
Collector Current Pulsed (Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . I
Gate-Emitter Voltage Continuous. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . V
Diode Forward Current at TC = +25oC. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .I
at TC = +90oC. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .I
Power Dissipation Total at TC = +25oC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . P
Power Dissipation Derating TC > +25oC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.8 W/oC
Operating and Storage Junction Temperature Range . . . . . . . . . . . . . . . . . . . . . . . . .TJ, T
Maximum Lead Temperature for Soldering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .T
NOTE: 1. TJ = +150oC, Minimum RGE = 25 without latch
INTERSIL CORPORATION IGBT PRODUCT IS COVERED BY ONE OR MORE OF THE FOLLOWING U.S. PATENTS:
4,364,073 4,417,385 4,430,792 4,443,931 4,466,176 4,516,143 4,532,534 4,567,641 4,587,713 4,598,461 4,605,948 4,618,872 4,620,211 4,631,564 4,639,754 4,639,762 4,641,162 4,644,637 4,682,195 4,684,413 4,694,313 4,717,679 4,743,952 4,783,690 4,794,432 4,801,986 4,803,533 4,809,045 4,809,047 4,810,665 4,823,176 4,837,606 4,860,080 4,883,767 4,888,627 4,890,143 4,901,127 4,904,609 4,933,740 4,963,951 4,969,027
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures. http://www.intersil.com or 407-727-9207
| Copyright © Intersil Corporation 1999
= +25oC, Unless Otherwise Specified
C
3-71
CES
CGR
C25 C90
CM
GES
F25 F90
STG
HGTG20N50C1D UNITS
500 V 500 V
26 A 20 A 35 A
±20 V
26 A 20 A
D
L
75 W
-55 to +150 260
File Number 2796.3
o
C
o
C
Specifications HGTG20N50C1D
O
SS
O
(
)
Electrical Specifications T
= +25oC, Unless Otherwise Specified
C
PARAMETERS SYMBOL TEST CONDITIONS
Collector-Emitter Breakdown Voltage BV Gate Threshold Voltage V Zero Gate Voltage Collector Current I
Gate-Emitter Leakage Current I Collector-Emitter On-Voltage V
Gate-Emitter Plateau Voltage V On-State Gate Charge Q Turn-On Delay Time t Rise Time t Turn-Off Delay Time t Fall Time t Turn-Off Energy Loss Per Cycle (Off Switching
Dissipation = W
x Frequency)
OFF
Thermal Resistance Junction-to-Case (IGBT) R Thermal Resistance of Diode R Diode Forward Voltage V Diode Reverse Recovery Time t
CES
GE(TH)
CES
GES
CE(SAT)
GEP
G(ON)
D(ON)I
RI
D(OFF)I
FI
W
OFF
θJC
θJC
EC
RR
LIMITS
UNITSMIN MAX
IC = 1mA, VGE = 0V 500 - V VGE = VCE, IC = 1mA 2 4.5 V VCE = 500V - 250 µA TC = +125oC, VCE = 500V - 1000 µA VGE = ±20V, VCE = 0V - 100 nA IC = 20A, VGE = 10V - 2.5 V IC = 35A, VGE = 20V - 3.2 V IC = 10A, VCE = 10V - 6 (Typ) V IC = 10A, VCE = 10V - 33 (Typ) nC IC = 20A, V
= 300V, L = 25µH,
CE(CLP)
-50ns
TJ = +100oC, VGE = 10V, RG = 25
-50ns
- 400 ns
400 (Typ) 500 ns
IC = 20A, V
= 300V, L = 25µH,
CE(CLP)
1070 (Typ) µJ
TJ = +100oC, VGE = 10V, RG = 25
- 1.25
o
C/W
- 1.5 ns IEC = 20A - 1.8 V IEC = 20A, diEC/dt = 100A/µs - 60 ns
Typical Performance Curves
100
% N
80
IPATI
60
WER DI
40
20
RATED P
0 +25 +50 +75 +100 +125+150
, CASE TEMPERATURE (oC)
T
C
FIGURE 1. POWER DISSIPATION vs TEMPERATURE
DERATING CURVE
+150
1.3
1.2
1.1
1.0
0.9
0.8
0.7
NORMALIZED GATE THRESHOLD VOLTAGE (V)
-50 0 +50 +100 +150 T
, JUNCTION TEMPERATURE (oC)
J
VGE = VCE, IC = 1mA
FIGURE 2. TYPICAL NORMALIZED GA TE-THRESHOLD
VOLTAGE vs JUNCTION TEMPERATURE
3-72
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