Intersil Corporation HGTP3N60A4, HGTD3N60A4S, HGT1S3N60A4S Datasheet

HGTD3N60A4S, HGT1S3N60A4S, HGTP3N60A4
Data Sheet January 2000
600V, SMPS Series N-Channel IGBT
The HGTD3N60A4S, HGT1S3N60A4S and the HGTP3N60A4 are MOS gated high voltage switching devices combining the best features of MOSFETs and bipolar transistors. These devices have the high input impedance of a MOSFET and the low on-state conduction loss of a bipolar transistor. The much lower on-state voltage drop varies only moderately between 25
o
C and 150oC.
This IGBT is ideal for many high voltage switching applications operating at high frequencies where low conduction losses are essential. This device has been
optimized for high frequency switch mode power supplies.
Formerly Developmental Type TA49327.
Ordering Information
PART NUMBER PACKAGE BRAND
HGTD3N60A4S TO-252AA 3N60A4 HGT1S3N60A4S TO-263AB 3N60A4 HGTP3N60A4 TO-220AB 3N60A4
NOTE: When ordering,use theentirepart number. Addthe suffix 9A to obtain the TO-252AA or the TO-263AB in tape and reel, i.e. HGT1S3N60A4S9A
File Number 4825
Features
• >100kHz Operation at 390V, 3A
• 200kHz Operation at 390V, 2.5A
• 600V Switching SOA Capability
• Typical Fall Time. . . . . . . . . . . . . . . . . 70ns at T
• 12mJ E
Capability
AS
• Low Conduction Loss
Temperature Compensating SABER Model www.intersil.com
• Related Literature
- TB334 “Guidelines for Soldering Surface Mount
Components to PC Boards”
Packaging
JEDEC TO-252AA
COLLECTOR
(FLANGE)
G
E
JEDEC TO-263AB
= 125oC
J
Symbol
C
G
E
G
JEDEC TO-220AB
E
COLLECTOR
(FLANGE)
INTERSIL CORPORATION IGBT PRODUCT IS COVERED BY ONE OR MORE OF THE FOLLOWING U.S. PATENTS
4,364,073 4,417,385 4,430,792 4,443,931 4,466,176 4,516,143 4,532,534 4,587,713 4,598,461 4,605,948 4,620,211 4,631,564 4,639,754 4,639,762 4,641,162 4,644,637 4,682,195 4,684,413 4,694,313 4,717,679 4,743,952 4,783,690 4,794,432 4,801,986 4,803,533 4,809,045 4,809,047 4,810,665 4,823,176 4,837,606 4,860,080 4,883,767 4,888,627 4,890,143 4,901,127 4,904,609 4,933,740 4,963,951 4,969,027
COLLECTOR
(FLANGE)
E
C
G
1
CAUTION: These devices are sensitive to electrostatic discharge; follow proper ESD Handling Procedures.
1-888-INTERSIL or 321-724-7143
| Copyright © Intersil Corporation 1999
HGTD3N60A4S, HGT1S3N60A4S, HGTP3N60A4
Absolute Maximum Ratings T
= 25oC, Unless Otherwise Specified
C
ALL TYPES UNITS
Collector to Emitter Voltage. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . BV
CES
600 V
Collector Current Continuous
At TC = 25oC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . I
At TC = 110oC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . I
Collector Current Pulsed (Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .I
Gate to Emitter Voltage Continuous . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . V
Gate to Emitter Voltage Pulsed . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .V
C25
C110
CM
GES
GEM
17 A
8A
40 A
±20 V ±30 V
Switching Safe Operating Area at TJ = 150oC, Figure 2. . . . . . . . . . . . . . . . . . . . . . . .SSOA 15A at 600V
Single Pulse Avalanche Energy at TC = 25oC. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . E
Power Dissipation Total at TC = 25oC. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . P
AS
D
12mJ at 3A
70 W
Power Dissipation Derating TC > 25oC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.56 W/oC
Operating and Storage Junction Temperature Range. . . . . . . . . . . . . . . . . . . . . . . TJ, T
STG
-55 to 150
Maximum Lead Temperature for Soldering
Leads at 0.063in (1.6mm) from Case for 10s. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .T
Package Body for 10s, See Tech Brief 334 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . T
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
L
PKG
300 260
o
C
o
C
o
C
NOTE:
1. Pulse width limited by maximum junction temperature.
Electrical Specifications T
= 25oC, Unless Otherwise Specified
J
PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNITS
Collector to Emitter Breakdown Voltage BV Emitter to Collector Breakdown Voltage BV Collector to Emitter Leakage Current I
CES ECS
CES
IC = 250µA, VGE = 0V 600 - - V IC = 10mA, VGE= 0V 15 - - V VCE = 600V TJ = 25oC - - 250 µA
TJ = 125oC - - 2.0 mA
Collector to Emitter Saturation Voltage V
Gate to Emitter Threshold Voltage V Gate to Emitter Leakage Current I
CE(SAT)IC
GE(TH)
GES
Switching SOA SSOA TJ = 150oC, RG = 50Ω, VGE = 15V
= 3A,
VGE = 15V
TJ = 25oC - 2.0 2.7 V
TJ = 125oC - 1.6 2.2 V IC = 250µA, VCE = 600V 4.5 6.1 7.0 V VGE = ±20V - - ±250 nA
15 - - A
L = 200µH, VCE= 600V
Pulsed Avalanche Energy E Gate to Emitter Plateau Voltage V On-State Gate Charge Q
Current Turn-On Delay Time t
d(ON)I
Current Rise Time t Current Turn-Off Delay Time t
d(OFF)I
Current Fall Time t Turn-On Energy (Note 3) E Turn-On Energy (Note 3) E Turn-Off Energy (Note 2) E
AS
GEP
g(ON)
rI
fI ON1 ON2 OFF
ICE = 3A, L = 2.7mH 12 - - mJ IC = 3A, VCE = 300V - 8.8 - V IC = 3A,
VCE = 300V
IGBT and Diode at TJ = 25oC ICE = 3A VCE = 390V VGE = 15V RG= 50 L = 1mH Test Circuit - Figure 20
VGE = 15V - 21 25 nC VGE = 20V - 26 32 nC
-6-ns
-11- ns
-73- ns
-47- ns
-37- µJ
-5570µJ
-2535µJ
2
HGTD3N60A4S, HGT1S3N60A4S, HGTP3N60A4
Electrical Specifications T
= 25oC, Unless Otherwise Specified (Continued)
J
PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNITS
Current Turn-On Delay Time t
d(ON)I
Current Rise Time t Current Turn-Off Delay Time t
d(OFF)I
Current Fall Time t Turn-On Energy (Note 3) E Turn-On Energy (Note 3) E Turn-Off Energy (Note 2) E Thermal Resistance Junction To Case R
rI
fI ON1 ON2 OFF
θJC
IGBT and Diode at TJ = 125oC ICE = 3A VCE = 390V VGE = 15V RG= 50 L = 1mH Test Circuit - Figure 20
- 5.5 8 ns
-1215ns
- 110 165 ns
- 70 100 ns
-37- µJ
- 90 100 µJ
-5080µJ
- - 1.8
NOTES:
2. Turn-OffEnergy Loss (E
) is defined as the integral of the instantaneous powerloss starting atthe trailing edgeof the inputpulse and ending
OFF
at the point where the collector current equals zero (ICE= 0A). All devices were tested per JEDEC Standard No. 24-1 Method for Measurement of Power Device Turn-Off Switching Loss. This test method produces the true total Turn-Off Energy Loss.
3. Values for two Turn-On loss conditions are shown for the convenience of the circuit designer. E
is the turn-on loss of the IGBT only. E
ON1
is the turn-on loss when a typical diode is used in the test circuit and the diode is at the same TJ as the IGBT. The diode type is specified in Figure 20.
Typical Performance Curves Unless Otherwise Specified
20
VGE= 15V
20
TJ= 150oC, RG = 50, VGE= 15V, L = 200µH
o
C/W
ON2
16
12
8
4
, DC COLLECTOR CURRENT (A)
CE
I
0
25 75 100 125 150
50
TC, CASE TEMPERATURE (oC)
FIGURE 1. DC COLLECTOR CURRENT vs CASE
TEMPERATURE
600
300
200
f
= 0.05 / (t
MAX1
f
= (PD- PC) / (E
MAX2
100
= CONDUCTION DISSIPATION
P
C
, OPERATING FREQUENCY (kHz)
MAX
f
50
(DUTY FACTOR = 50%)
R
= 1.8oC/W, SEE NOTES
ØJC
TJ= 125oC, RG = 50, L = 1mH, VCE= 390V
1
ICE, COLLECTOR TO EMITTER CURRENT (A)
d(OFF)I
+ t
ON2
d(ON)I
+ E
OFF
)
)
TCV
o
C
75
54
15V
FIGURE 3. OPERATINGFREQUENCY vs COLLECTOR TO
EMITTER CURRENT
GE
16
12
8
4
, COLLECTOR TO EMITTER CURRENT (A)
0
CE
I
0
, COLLECTOR TO EMITTER VOLTAGE (V)
V
CE
300 400200100 500 600
700
FIGURE 2. MINIMUM SWITCHING SAFE OPERATING AREA
20 64
VCE = 390V, RG = 50, TJ= 125oC
t
SC
16
14
12
10
8
6
, SHORT CIRCUIT WITHSTAND TIME (µs)
4
SC
623
t
10 11 12 15
, GATE TO EMITTER VOLTAGE (V)
V
GE
I
SC
13 14
5618
48
40
32
24
16
8
, PEAK SHORT CIRCUIT CURRENT (A)
SC
I
0
FIGURE 4. SHORT CIRCUIT WITHSTAND TIME
3
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