Intersil Corporation HGTP20N35G3VL, HGT1S20N35G3VLS, HGT1S20N35G3VL Datasheet

April 1995
HGTP20N35G3VL,
HGT1S20N35G3VL,
HGT1S20N35G3VLS
20A, 350V N-Channel,
Logic Level, Voltage Clamping IGBTs
Features
• Logic Level Gate Drive
• Internal Voltage Clamp
• ESD Gate Protection = 175oC
•T
J
• Ignition Energy Capable
Description
This N-Channel IGBT is a MOS gated, logic level device which is intended to be used as an ignition coil driver in auto­motive ignition circuits. Unique features include an active voltage clamp between the collector and the gate which pro­vides Self Clamped Inductive Switching (SCIS) capability in ignition circuits. Internal diodes provide ESD protection for the logic level gate. Both a series resistor and a shunt resis­tor are provided in the gate circuit.
PACKAGING AVAILABILITY
PART NUMBER PACKAGE BRAND
HGTP20N35G3VL T0-220AB 20N35GVL HGT1S20N35G3VL T0-262AA 20N35GVL HGT1S20N35G3VLS T0-263AB 20N35GVL
NOTE: When ordering, use the entire part number. Add the suf fix 9A to obtain the TO-263AB variant in the tape and reel, i.e., HGT1S20N35G3VLS9A.
The development type number for this device is TA49076.
JEDEC TO-220AB
COLLECTOR (FLANGE)
JEDEC TO-262AA
COLLECTOR (FLANGE)
JEDEC TO-263AB
GATE
EMITTER
Terminal Diagram
N-CHANNEL ENHANCEMENT MODE
GATE
R
1
EMITTER
EMITTER
A
A
M
A
COLLECTOR
GATE
COLLECTOR
GATE
COLLECTOR (FLANGE)
COLLECTOR
R
2
EMITTER
Absolute Maximum Ratings T
= +25oC, Unless Otherwise Specified
C
HGTP20N35G3VL
HGT1S20N35G3VL
HGT1S20N35G3VLS UNITS
Collector-Emitter Bkdn Voltage At 10mA, R
Emitter-Collector Bkdn Voltage At 10mA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . BV
Collector Current Continuous At V
Gate-Emitter-Voltage (Note). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . V
= 5.0V, TC = +25oC, Figure 7 . . . . . . . . . . . . . I
GE
= 5.0V, TC = +100oC . . . . . . . . . . . . . . . . . . . .I
At V
GE
Inductive Switching Current At L = 2.3mH, T
At L = 2.3mH, T Collector to Emitter Avalanche Energy At L = 2.3mH, T Power Dissipation Total At T Power Dissipation Derating T
Operating and Storage Junction Temperature Range . . . . . . . . . . . . . . . . . . . . .T
= +25oC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . P
C
> +25oC. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1.0 W/oC
C
Maximum Lead Temperature for Soldering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .T
Electrostatic Voltage at 100pF, 1500. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ESD 6 KV
NOTE: May be exceeded if I
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures. 1-888-INTERSIL or 321-724-7143 | Copyright © Intersil Corporation 1999
is limited to 10mA.
GEM
= 1k. . . . . . . . . . . . . . . . . . . . . . . BV
GE
= +25o C . . . . . . . . . . . . . . . . . . . . . I
C
= +175oC . . . . . . . . . . . . . . . . . . . . . I
C
= +25oC . . . . . . . . . . . . . . E
C
3-66
CER ECS
C25
C100
GES SCIS SCIS
AS
D
, T
J
STG
L
375 V
24 V 20 A 20 A
±10 V
26 A
18 A 775 mJ 150 W
-40 to +175 260
File Number
o
C
o
C
4006
Specifications HGTP20N35G3VL, HGT1S20N35G3VL, HGT1S20N35G3VLS
Electrical Specifications T
= +25oC, Unless Otherwise Specified
C
PARAMETERS SYMBOL TEST CONDITIONS
Collector-Emitter Breakdown Voltage BV
Collector-Emitter Breakdown Voltage
Gate-Emitter Plateau Voltage V
Gate Charge Q
Collector-Emitter Clamp Bkdn. Voltage BV
Emitter-Collector Breakdown Voltage BV
CES
BV
CER
GEP
G(ON)
CE(CL)IC
ECS
LIMITS
UNITSMIN TYP MAX
IC = 10mA,
TC = +175oC 310 345 380 V
VGE = 0V
TC = +25oC 320 350 380 V
TC = -40oC 320 355 390 V
IC = 10mA
TC = +175oC 300 340 375 V VGE = 0V RGE= 1k
TC = +25oC 315 345 375 V
TC = -40oC 315 350 390 V
IC = 10A
TC = +25oC - 3.7 - V VCE = 12V
IC = 10A
TC = +25oC - 28.7 - nC VGE = 5V VCE = 12V
= 10A
TC = +175oC 325 360 395 V RG = 0
IC = 10mA TC = +25oC2032-V
Collector-Emitter Leakage Current I
Collector-Emitter Saturation Voltage V
Gate-Emitter Threshold Voltage V
CE(SAT)IC
GE(TH)IC
Gate Series Resistance R
Gate-Emitter Resistance R
Gate-Emitter Leakage Current I
Gate-Emitter Breakdown Voltage BV
Current Turn-Off Time-Inductive Load t
D(OFF)I
t
F(OFF)I
Inductive Use Test I
Thermal Resistance R
CES
1
2
GES
GESIGES
+
SCIS
θJC
VCE = 250V TC = +25oC--5µA
VCE = 250V TC = +175oC - - 250 µA
= 10A
TC = +25oC - 1.3 1.6 V VGE = 4.5V
TC = +175oC - 1.25 1.5 V
IC = 20A
TC = +25oC - 1.6 2.8 V VGE = 5.0V
TC = +175oC - 1.9 3.5 V
= 1mA
VCE = V
GE
TC = +25oC 1.3 1.8 2.3 V
TC = +25oC - 1.0 - k
TC = +25oC 101725k
VGE = ±10V ±400 ±590 ±1000 µA
= ±2mA ±12 ±14 - V
IC = 10A, RG = 25,
-1530µs L = 550 H, RL = 26.4, VGE = 5V, VCL= 300V, TC= +175oC
L = 2.3mH,
TC = +175oC18--A VG = 5V, RG = 0
TC = +25oC26--A
- - 1.0
o
C/W
3-67
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