6.2A, 1200V, NPT Series N-Channel IGBT
with Anti-Parallel Hyperfast Diode
The HGTP1N120CND and the HGT1S1N120CNDS are
Non-Punch Through (NPT) IGBT designs. They are new
members of the MOS gated high voltage switching IGBT
family. IGBTs combine the best features of MOSFETs and
bipolar transistors.This device has the high inputimpedance
of a MOSFET and the low on-state conduction loss of a
bipolar transistor.
The IGBT is development type number TA49317. The diode
used in anti-parallel with the IGBT is the RHRD4120
(TA49056).
The IGBT is ideal for many high voltage switching
applications operating at moderate frequencies where low
conduction losses are essential, such as: AC and DC motor
controls, power supplies and drivers for solenoids, relays
and contactors.
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
L
pkg
SC
SC
300
260
8µs
11µs
o
C
o
C
NOTES:
1. Single Pulse; VGE = 15V; Pulse width limited by maximum junction temperature.
2. V
= 840V, TJ = 125oC, RG = 82Ω.
CE(PK)
Electrical SpecificationsT
= 25oC, Unless Otherwise Specified
C
PARAMETERSYMBOLTEST CONDITIONSMINTYPMAXUNITS
Collector to Emitter Breakdown VoltageBV
Collector to Emitter Leakage CurrentI
Gate to Emitter Threshold VoltageV
Gate to Emitter Leakage CurrentI
CE(SAT)IC
GE(TH)
GES
= 1.0A,
VGE = 15V
IC = 50µA, VCE = V
TC = 25oC-2.052.4V
TC = 150oC-2.753.2V
GE
VGE = ±20V--±250nA
Switching SOASSOATJ = 150oC, RG = 82Ω, VGE = 15V,
Gate to Emitter Plateau VoltageV
On-State Gate ChargeQ
Current Turn-On Delay Timet
d(ON)I
Current Rise Timet
Current Turn-Off Delay Timet
d(OFF)I
Current Fall Timet
Turn-On Energy (Note 3)E
Turn-Off Energy (Note 3)E
GEP
G(ON)
rI
fI
ON
OFF
L = 2mH, V
IC = 1.0A, VCE = 0.5 BV
IC = 1.0A,
VCE = 0.5 BV
IGBT and Diode at TJ = 25oC
ICE = 1.0A, VCE = 0.8 BV
VGE = 15V, RG = 82Ω, L = 4mH,
Test Circuit (Figure 20)
CE(PK)
CES
= 1200V
CES
VGE = 15V-1319nC
VGE = 20V-1628nC
CES,
6.07.1-V
6- - A
-9.7-V
-1521ns
-1115ns
-6595ns
-365450ns
-175195J
-140155J
2
HGTP1N120CND, HGT1S1N120CNDS
Electrical SpecificationsT
= 25oC, Unless Otherwise Specified (Continued)
C
PARAMETERSYMBOLTEST CONDITIONSMINTYPMAXUNITS
Current Turn-On Delay Timet
d(ON)I
Current Rise Timet
Current Turn-Off Delay Timet
d(OFF)I
Current Fall Timet
Turn-On Energy (Note 3)E
Turn-Off Energy (Note 3)E
Diode Forward VoltageV
Diode Reverse Recovery Timet
Thermal Resistance Junction To CaseR
rI
fI
ON
OFF
EC
rr
θJC
IGBT and Diode at TJ = 150oC,
ICE= 1.0 A, VCE= 0.8 BV
CES,
VGE = 15V, RG = 82Ω, L = 4mH,
Test Circuit (Figure 20)
) is defined as the integral of the instantaneous power loss starting at the trailing edgeof the inputpulse and ending
OFF
at the point where the collector current equals zero (ICE= 0A). All devices were tested per JEDEC Standard No.24-1 Method for Measurement
of Power Device Turn-Off Switching Loss. This test methodproduces the true total Turn-Off Energy Loss. Turn-on losses include lossesdue to
diode recovery.