Intersil Corporation HGTP12N60B3, HGT1S12N60B3S Datasheet

HGTP12N60B3, HGT1S12N60B3S
Data Sheet January 2000
27A, 600V, UFS Series N-Channel IGBTs
The HGTP12N60B3 and HGT1S12N60B3S are MOS gated high voltage switching devices combining the best features of MOSFETs and bipolar transistors. These devices have the highinput impedance of a MOSFET and the low on-state conduction loss of a bipolar transistor. The much lower on-state voltage drop varies only moderately between 25 and 150
o
C.
o
The IGBT is ideal for many high voltage switching applications operating at moderate frequencies where low conduction losses are essential, such as: AC and DC motor controls, power supplies and drivers for solenoids, relays and contactors.
Formerly developmental type TA49171.
Ordering Information
PART NUMBER PACKAGE BRAND
HGTP12N60B3 TO-220AB G12N60B3
File Number 4410.2
Features
• 27A, 600V, TC = 25oC
• 600V Switching SOA Capability
• Typical Fall Time. . . . . . . . . . . . . . . . 112ns at T
C
• Short Circuit Rating
= 150oC
J
• Low Conduction Loss
• Related Literature
- TB334 “Guidelines for Soldering Surface Mount Components to PC Boards”
Packaging
JEDEC TO-220AB
E
C
COLLECTOR
(FLANGE)
G
HGT1S12N60B3S TO-263AB G12N60B3
NOTE: When ordering, use the entire part number.Add the suffix 9A to obtain the TO-263AB variant in tape and reel, e.g., HGT1S12N60B3S9A.
Symbol
C
G
E
INTERSIL CORPORATION IGBT PRODUCT IS COVERED BY ONE OR MORE OF THE FOLLOWING U.S. PATENTS
4,364,073 4,417,385 4,430,792 4,443,931 4,466,176 4,516,143 4,532,534 4,587,713 4,598,461 4,605,948 4,620,211 4,631,564 4,639,754 4,639,762 4,641,162 4,644,637 4,682,195 4,684,413 4,694,313 4,717,679 4,743,952 4,783,690 4,794,432 4,801,986 4,803,533 4,809,045 4,809,047 4,810,665 4,823,176 4,837,606 4,860,080 4,883,767 4,888,627 4,890,143 4,901,127 4,904,609 4,933,740 4,963,951 4,969,027
G
JEDEC TO-263AB
COLLECTOR (FLANGE)
E
1
CAUTION: These devices are sensitive to electrostatic discharge; follow proper ESD Handling Procedures.
1-888-INTERSIL or 321-724-7143
| Copyright © Intersil Corporation 2000
HGTP12N60B3, HGT1S12N60B3S
Absolute Maximum Ratings T
= 25oC, Unless Otherwise Specified
C
HGTP12N60B3, HGT1S12N60B3S UNITS
Collector to Emitter Voltage. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .BV
Collector Current Continuous. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .I
At TC = 110oC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . I
Collector Current Pulsed (Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . I
Gate to Emitter Voltage Continuous. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .V
Gate to Emitter Voltage Pulsed . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . V
CES
C25
C110
CM
GES
GEM
600 V
27 A 12 A
110 A
±20 V ±30 V
Switching Safe Operating Area at TJ = 150oC (Figure 2) . . . . . . . . . . . . . . . . . . . . . . . SSOA 96A at 600V
Maximum Power Dissipation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . P
D
104 W
Linear Derating Factor . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.83 W/oC
Reverse Voltage Avalanche Energy. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . E
Operating and Storage Junction Temperature Range . . . . . . . . . . . . . . . . . . . . . . . .TJ,T
ARV STG
Maximum Temperature for Soldering
Leads at 0.063in (1.6mm) from Case for 10s. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . T
Package Body for 10s, see Tech Brief 334. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .T
Short Circuit Withstand Time (Note 2) at VGE = 12V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .t
Short Circuit Withstand Time (Note 2) at VGE = 10V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .t
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
L
pkg
SC SC
100 mJ
-55 to 150
300 260
5 µs
10 µs
o
C
o
C
o
C
NOTES:
1. Pulse width limited by maximum junction temperature.
2. V
= 360V, TJ = 125oC, RG = 25Ω.
CE(PK)
Electrical Specifications T
= 25oC, Unless Otherwise Specified
C
PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNITS
Collector to Emitter Breakdown Voltage BV Emitter to Collector Breakdown Voltage BV Collector to Emitter Leakage Current I
CES ECS
CES
IC = 250µA, VGE = 0V 600 - - V IC = 10mA, VGE= 0V 20 28 - V VCE = BV
CES
TC = 25oC - - 250 µA TC = 150oC - - 2.0 mA
Collector to Emitter Saturation Voltage V
Gate to Emitter Threshold Voltage V Gate to Emitter Leakage Current I
CE(SAT)IC
GE(TH)
GES
= I
,
C110
VGE = 15V
IC = 250µA, VCE = V
TC = 25oC - 1.6 2.1 V TC = 150oC - 1.7 2.5 V
GE
VGE = ±20V - - ±250 nA
Switching SOA SSOA TJ = 150oC, RG = 25Ω,VGE = 15V
L = 100µH, VCE= 600V Gate to Emitter Plateau Voltage V On-State Gate Charge Q
Current Turn-On Delay Time t
d(ON)I
Current Rise Time t Current Turn-Off Delay Time t
d(OFF)I
Current Fall Time t Turn-On Energy (Note 4) E Turn-On Energy (Note 4) E Turn-Off Energy (Note 3) E
GEP
g(ON)
rI
fI ON1 ON2 OFF
IC = I IC = I
VCE = 0.5 BV
, VCE = 0.5 BV
C110
,
C110
CES
VGE = 15V - 51 60 nC
CES
VGE = 20V - 68 78 nC
IGBT and Diode at TJ = 25oC ICE = I
C110
VCE = 0.8 BV
CES
VGE = 15V RG= 25 L = 1mH Test Circuit (Figure 17)
4.5 4.9 6.0 V
96 - - A
- 7.3 - V
-26- ns
-23- ns
- 150 - ns
-62- ns
- 150 - µJ
- 304 350 µJ
- 250 350 µJ
2
HGTP12N60B3, HGT1S12N60B3S
Electrical Specifications T
= 25oC, Unless Otherwise Specified (Continued)
C
PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNITS
Current Turn-On Delay Time t
d(ON)I
Current Rise Time t Current Turn-Off Delay Time t
d(OFF)I
Current Fall Time t Turn-On Energy (Note 4) E Turn-On Energy (Note 4) E Turn-Off Energy (Note 3) E Thermal Resistance Junction To Case R
rI
fI ON1 ON2 OFF
θJC
IGBT and Diode at TJ = 150oC ICE = I
C110
VCE = 0.8 BV
CES
VGE = 15V RG= 25 L = 1mH Test Circuit (Figure 17)
-22- ns
-23- ns
- 280 295 ns
- 112 175 ns
- 165 - µJ
- 500 525 µJ
- 660 800 µJ
- - 1.2
NOTES:
3. Turn-OffEnergyLoss(E
) is defined as the integral of the instantaneous power loss starting at the trailing edge of the input pulse and ending
OFF
at the point where the collector current equals zero (ICE= 0A). All devices were tested per JEDEC Standard No. 24-1 Method for Measurement of Power Device Turn-Off Switching Loss. This test method produces the true total Turn-Off Energy Loss.
4. Values for two Turn-On loss conditions are shown for the convenience of the circuit designer. E
is the turn-on loss of the IGBT only. E
ON1
is the turn-on loss when a typical diode is used in the test circuit and the diode is at the same TJas the IGBT. The diode type is specified in Figure 17.
Typical Performance Curves Unless Otherwise Specified
30
25
20
15
10
, DC COLLECTOR CURRENT (A)
5
CE
I
0
25 75 100 125 150
50
TC, CASE TEMPERATURE (oC)
V
GE
= 15V
100
90
TJ= 150oC, RG = 25, VGE= 15V, L = 100µH
80 70 60 50 40 30 20 10
, COLLECTOR TO EMITTER CURRENT (A)
0
CE
I
0
VCE, COLLECTOR TO EMITTER VOLTAGE (V)
300 400200100 500 600
o
C/W
ON2
700
FIGURE 1. DC COLLECTORCURRENT vs CASE
TEMPERATURE
3
FIGURE 2. MINIMUM SWITCHING SAFE OPERATING AREA
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