The HGTP12N60B3 and HGT1S12N60B3S are MOS gated
high voltage switching devices combining the best features
of MOSFETs and bipolar transistors. These devices have
the highinput impedance of a MOSFET and the low on-state
conduction loss of a bipolar transistor. The much lower
on-state voltage drop varies only moderately between 25
and 150
o
C.
o
The IGBT is ideal for many high voltage switching
applications operating at moderate frequencies where low
conduction losses are essential, such as: AC and DC motor
controls, power supplies and drivers for solenoids, relays
and contactors.
Formerly developmental type TA49171.
Ordering Information
PART NUMBERPACKAGEBRAND
HGTP12N60B3TO-220ABG12N60B3
File Number4410.2
Features
• 27A, 600V, TC = 25oC
• 600V Switching SOA Capability
• Typical Fall Time. . . . . . . . . . . . . . . . 112ns at T
C
• Short Circuit Rating
= 150oC
J
• Low Conduction Loss
• Related Literature
- TB334 “Guidelines for Soldering Surface Mount
Components to PC Boards”
Packaging
JEDEC TO-220AB
E
C
COLLECTOR
(FLANGE)
G
HGT1S12N60B3STO-263ABG12N60B3
NOTE: When ordering, use the entire part number.Add the suffix 9A
to obtain the TO-263AB variant in tape and reel, e.g.,
HGT1S12N60B3S9A.
Symbol
C
G
E
INTERSIL CORPORATION IGBT PRODUCT IS COVERED BY ONE OR MORE OF THE FOLLOWING U.S. PATENTS
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
L
pkg
SC
SC
100mJ
-55 to 150
300
260
5µs
10µs
o
C
o
C
o
C
NOTES:
1. Pulse width limited by maximum junction temperature.
2. V
= 360V, TJ = 125oC, RG = 25Ω.
CE(PK)
Electrical SpecificationsT
= 25oC, Unless Otherwise Specified
C
PARAMETERSYMBOLTEST CONDITIONSMINTYPMAXUNITS
Collector to Emitter Breakdown VoltageBV
Emitter to Collector Breakdown VoltageBV
Collector to Emitter Leakage CurrentI
CES
ECS
CES
IC = 250µA, VGE = 0V600--V
IC = 10mA, VGE= 0V2028-V
VCE = BV
CES
TC = 25oC--250µA
TC = 150oC--2.0mA
Collector to Emitter Saturation VoltageV
Gate to Emitter Threshold VoltageV
Gate to Emitter Leakage CurrentI
CE(SAT)IC
GE(TH)
GES
= I
,
C110
VGE = 15V
IC = 250µA, VCE = V
TC = 25oC-1.62.1V
TC = 150oC-1.72.5V
GE
VGE = ±20V--±250nA
Switching SOASSOATJ = 150oC, RG = 25Ω,VGE = 15V
L = 100µH, VCE= 600V
Gate to Emitter Plateau VoltageV
On-State Gate ChargeQ
Current Turn-On Delay Timet
d(ON)I
Current Rise Timet
Current Turn-Off Delay Timet
d(OFF)I
Current Fall Timet
Turn-On Energy (Note 4)E
Turn-On Energy (Note 4)E
Turn-Off Energy (Note 3)E
GEP
g(ON)
rI
fI
ON1
ON2
OFF
IC = I
IC = I
VCE = 0.5 BV
, VCE = 0.5 BV
C110
,
C110
CES
VGE = 15V-5160nC
CES
VGE = 20V-6878nC
IGBT and Diode at TJ = 25oC
ICE = I
C110
VCE = 0.8 BV
CES
VGE = 15V
RG= 25Ω
L = 1mH
Test Circuit (Figure 17)
4.54.96.0V
96--A
-7.3-V
-26- ns
-23- ns
-150-ns
-62- ns
-150-µJ
-304350µJ
-250350µJ
2
HGTP12N60B3, HGT1S12N60B3S
Electrical SpecificationsT
= 25oC, Unless Otherwise Specified (Continued)
C
PARAMETERSYMBOLTEST CONDITIONSMINTYPMAXUNITS
Current Turn-On Delay Timet
d(ON)I
Current Rise Timet
Current Turn-Off Delay Timet
d(OFF)I
Current Fall Timet
Turn-On Energy (Note 4)E
Turn-On Energy (Note 4)E
Turn-Off Energy (Note 3)E
Thermal Resistance Junction To CaseR
rI
fI
ON1
ON2
OFF
θJC
IGBT and Diode at TJ = 150oC
ICE = I
C110
VCE = 0.8 BV
CES
VGE = 15V
RG= 25Ω
L = 1mH
Test Circuit (Figure 17)
-22- ns
-23- ns
-280295ns
-112175ns
-165-µJ
-500525µJ
-660800µJ
--1.2
NOTES:
3. Turn-OffEnergyLoss(E
) is defined as the integral of the instantaneous power loss starting at the trailing edge of the input pulse and ending
OFF
at the point where the collector current equals zero (ICE= 0A). All devices were tested per JEDEC Standard No. 24-1 Method for Measurement
of Power Device Turn-Off Switching Loss. This test method produces the true total Turn-Off Energy Loss.
4. Values for two Turn-On loss conditions are shown for the convenience of the circuit designer. E
is the turn-on loss of the IGBT only. E
ON1
is the turn-on loss when a typical diode is used in the test circuit and the diode is at the same TJas the IGBT. The diode type is specified in
Figure 17.