August 1995
HCTS14MS
Radiation Hardened
HEX Inverting Schmitt Trigger
Features
• 3 Micron Radiation Hardened SOS CMOS
• Total Dose 200K RAD (Si)
2
• SEP Effective LET No Upsets: >100 MEV-cm
• Single Event Upset (SEU) Immunity < 2 x 10
/mg
-9
Errors/Bit-Day
(Typ)
12
• Dose Rate Survivability: >1 x 10
10
• Dose Rate Upset >10
RAD (Si)/s 20ns Pulse
• Cosmic Ray Upset Rate 2 x 10
RAD (Si)/s
-9
Errors/Bit Day
• Latch-Up Free Under Any Conditions
o
• Military Temperature Range: -55
C to +125oC
• Significant Power Reduction Compared to LSTTL ICs
• DC Operating Voltage Range: 4.5V to 5.5V
• LSTTL Input Compatibility
- VIL = 0.8V Max
- VIH = VCC/2 Min
• Input Current Levels Ii ≤ 5µA at VOL, VOH
Description
The Intersil HCTS14MS is a Radiation Hardened HEX Inverting
Schmitt trigger. A high on any input forces the output to a Low
state.
The HCTS14MS utilizes advanced CMOS/SOS technology to
achieve high-speed operation. This device is a member of
radiation hardened, high-speed, CMOS/SOS Logic Family.
The HCTS14MS is supplied in a 14 lead Ceramic flatpack
Package (K suffix) or a 14 lead SBDIP Package (D suffix).
Ordering Information
PART
NUMBER
HCTS14DMSR -55oC to +125oC Intersil Class
TEMPERATURE
RANGE
SCREENING
LEVEL PACKAGE
14 Lead SBDIP
S Equivalent
Pinouts
14 LEAD CERAMIC DUAL-IN-LINE
METAL SEAL PACKAGE (SBDIP)
MIL-STD-1835 CDIP2-T14
A1
Y1
A2
Y2
A3
Y3
GND
14 LEAD CERAMIC METAL SEAL
FLATPACK PACKAGE (FLATPACK)
MIL-STD-1835 CDFP3-F14
Y1
A2
Y2
A3
Y3
GND
INPUTS
NOTE: L = Logic Level Low,
H = Logic level High
TOP VIEW
1
2
3
4
5
6
7
TOP VIEW
1A1
2
3
4
5
6
7
TRUTH TABLE
An
LH
HL
14
VCC
13
A6
12
Y6
11
A5
10
Y5
9
A4
8
Y4
14
13
12
11
10
9
8
OUTPUTS
Yn
VCC
A6
Y6
A5
Y5
A4
Y4
HCTS14KMSR -55oC to +125oC Intersil Class
S Equivalent
HCTS14D/
Sample
HCTS14K/
Sample
HCTS14HMSR +25oC Die Die
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
http://www.intersil.com or 407-727-9207
+25oC Sample 14 Lead SBDIP
+25oC Sample 14 Lead Ceramic
| Copyright © Intersil Corporation 1999
14 Lead Ceramic
Flatpack
Flatpack
390
Functional Diagram
YnAn
DB NA
Spec Number 518607
File Number 3205.1
Specifications HCTS14MS
Absolute Maximum Ratings Reliability Information
Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .-0.5V to +7.0V
Input Voltage Range, All Inputs . . . . . . . . . . . . .-0.5V to VCC +0.5V
DC Input Current, Any One Input . . . . . . . . . . . . . . . . . . . . . . . .±10mA
DC Drain Current, Any One Output. . . . . . . . . . . . . . . . . . . . . . .±25mA
(All Voltage Reference to the VSS Terminal)
Storage Temperature Range (TSTG). . . . . . . . . . . -65oC to +150oC
Lead Temperature (Soldering 10sec). . . . . . . . . . . . . . . . . . +265oC
Junction Temperature (TJ) . . . . . . . . . . . . . . . . . . . . . . . . . . +175oC
ESD Classification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Class 1
CAUTION: As with all semiconductors, stress listed under “Absolute Maximum Ratings” may be applied to devices (one at a time) without resulting in permanent
damage. This is a stress rating only. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. The conditions listed
under “Electrical Performance Characteristics” are the only conditions recommended for satisfactory device operation..
Operating Conditions
Supply Voltage (VCC). . . . . . . . . . . . . . . . . . . . . . . . +4.5V to +5.5V
Input Rise and Fall Times at 4.5V VCC (TR, TF). . . . Unlimited Max
Operating Temperature Range (TA) . . . . . . . . . . . . -55oC to +125oC
TABLE 1. DC ELECTRICAL PERFORMANCE CHARACTERISTICS
Thermal Resistance θ
SBDIP Package. . . . . . . . . . . . . . . . . . . . 74oC/W 24oC/W
Ceramic Flatpack Package . . . . . . . . . . . 116oC/W 30oC/W
Maximum Package Power Dissipation at +125oC Ambient
SBDIP Package. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.66W
Ceramic Flatpack Package . . . . . . . . . . . . . . . . . . . . . . . . . 0.43W
If device power exceeds package dissipation capability, provide heat
sinking or derate linearly at the following rate:
SBDIP Package. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .13.5mW/oC
Ceramic Flatpack Package . . . . . . . . . . . . . . . . . . . . . .8.6mW/oC
Input Low Voltage (VIL). . . . . . . . . . . . . . . . . . . . . . . . . 0.0V to 0.5V
Input High Voltage (VIH). . . . . . . . . . . . . . . . . . . . . . .VCC/2 to VCC
JA
θ
JC
GROUP
(NOTE 1)
PARAMETER SYMBOL
Quiescent Current ICC VCC = 5.5V,
Output Current
(Sink)
Output Current
(Source)
Output Voltage Low VOL VCC = 4.5V, VIH = 2.25V,
Output Voltage High VOH VCC = 4.5V, VIH = 2.25V,
Input Leakage
Current
Noise Immunity
Functional Test
NOTES:
1. All voltages reference to device GND.
2. For functional tests, VO ≥ 4.0V is recognized as a logic “1”, and VO ≤ 0.5V is recognized as a logic “0”.
IOL VCC = 4.5V, VIH = 4.5V,
IOH VCC = 4.5V, VIH = 4.5V,
IIN VCC = 5.5V, VIN = VCC or
FN VCC = 4.5V,
CONDITIONS
VIN = VCC or GND
VOUT = 0.4V, VIL = 0V
VOUT = VCC -0.4V,
VIL = 0V
IOL = 50µA, VIL = 0.5V
VCC = 5.5V, VIH = 2.75V,
IOL = 50µA, VIL = 0.5V
IOH = -50µA, VIL = 0.5V
VCC = 5.5V, VIH = 2.75V,
IOH = -50µA, VIL = 0.5V
GND
VIH = 2.25V,
VIL = 0.5V
A SUB-
GROUPS TEMPERATURE
1 +25oC-10µA
2, 3 +125oC, -55oC - 200 µA
1 +25oC 4.8 - mA
2, 3 +125oC, -55oC 4.0 - mA
1 +25oC -4.8 - mA
2, 3 +125oC, -55oC -4.0 - mA
1, 2, 3 +25oC, +125oC, -55oC - 0.1 V
1, 2, 3 +25oC, +125oC, -55oC - 0.1 V
1, 2, 3 +25oC, +125oC, -55oC VCC
1, 2, 3 +25oC, +125oC, -55oC VCC
1 +25oC -0.5 0.5 µA
2, 3 +125oC, -55oC -5.0 5.0 µA
7, 8A, 8B +25oC, +125oC, -55oC 4.0 0.5 V
LIMITS
UNITSMIN MAX
-V
-0.1
-V
-0.1
391
Spec Number 518607
Specifications HCTS14MS
TABLE 2. AC ELECTRICAL PERFORMANCE CHARACTERISTICS
GROUP
(NOTES 1, 2)
PARAMETER SYMBOL
Propagation Delay TPHL VCC = 4.5V, VIH = 3.0V,
TPLH VCC = 4.5V, VIH = 3.0V,
Input Switch Point VT+ VCC = 4.5V 9 +25oC 0.5 2.25 V
VT- VCC = 4.5V 9 +25oC 0.5 2.25 V
VH VCC = 4.5V 9 +25oC 0.1 1.40 V
NOTES:
1. All voltages referenced to device GND.
2. AC measurements assume RL = 500Ω, CL = 50pF, Input TR = TF = 3ns, VIL = GND, VIH = 3V.
TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS
PARAMETER SYMBOL CONDITIONS NOTES TEMPERATURE
Capacitance Power
Dissipation
Input Capacitance CIN VCC = 5.0V, VIH = 5.0V,
Output Transition
Time
NOTE:
1. The parameters listed in Table 3 are controlled via design or process parameters. Min and Max Limits are guaranteed but not directly
tested. These parameters are characterized upon initial design release and upon design changes which affect these characteristics.
CPD VCC = 5.0V, VIH = 5.0V,
TTHL
TTLH
CONDITIONS
VIL = 0V
VIL = 0V
VIL = 0V, f = 1MHz
VIL = 0V, f = 1MHz
VCC = 4.5V, VIH = 4.5V,
VIL = 0V
A SUB-
GROUPS TEMPERATURE
9 +25oC 2 19 ns
10, 11 +125oC, -55oC 2 21 ns
9 +25oC 2 25 ns
10, 11 +125oC, -55oC 2 26 ns
10, 11 +125oC, -55oC 0.5 2.25 V
10, 11 +125oC, -55oC 0.5 2.25 V
10, 11 +125oC, -55oC 0.1 1.40 V
1 +25oC - 26 pF
1 +125oC, -55oC - 39 pF
1 +25oC - 10 pF
1 +125oC - 10 pF
1 +25oC - 15 ns
1 +125oC - 22 ns
LIMITS
UNITSMIN MAX
LIMITS
UNITSMIN MAX
TABLE 4. DC POST RADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS
(NOTES 1, 2)
PARAMETER SYMBOL
Quiescent Current ICC VCC = 5.5V, VIN = VCC or GND +25oC - 0.2 mA
Output Current (Sink) IOL VCC = 4.5V, VIN = VCC or GND,
VOUT = 0.4V
Output Current (Source) IOH VCC = 4.5V, VIN = VCC or GND,
VOUT = VCC -0.4V
Output Voltage Low VOL VCC = 4.5V and 5.5V,
VIH = VCC/2
VIL = 0.4V at 200K RAD,
IOL = 50µA
CONDITIONS TEMPERATURE
+25oC 4.0 - mA
+25oC -4.0 - mA
+25oC - 0.1 V
200K RAD LIMITS
UNITSMIN MAX
Spec Number 518607
392