Intersil Corporation HCTS109T Datasheet
HCTS109T
Data Sheet July 1999 File Number
Radiation Hardened Dual JK Flip Flop
Intersil’sSatellite Applications FlowTM(SAF) devices are fully
tested and guaranteed to 100kRAD total dose. These QML
Class T devices are processed to a standard flow intended
to meet the cost and shorter lead-time needs of large
volume satellite manufacturers, while maintaining a high
level of reliability.
The Intersil HCTS109T is a Radiation Hardened Dual JK Flip
Flop with set and reset. The flip flop changes state with the
positive transition of the clock (CP1 or CP2).
Specifications
Specifications for Rad Hard QML devices are controlled by
the Defense Supply Center in Columbus (DSCC). The SMD
numbers listed below must be used when ordering.
Detailed Electrical Specifications for the HCTS109T are
contained in SMD 5962-95769. A “hot-link” is provided from
our website for downloading.
www.intersil.com/spacedefense/ne wsafc lasst.asp
Intersil’s Quality Management Plan (QM Plan), listing all
Class T screening operations, is also available on our
website.
www.intersil.com/quality/manuals.asp
Ordering Information
TEMP.
ORDERING
NUMBER
5962R9576901TEC HCTS109DTR -55 to 125
PART
NUMBER
RANGE
(oC)
4624.1
Features
• QML Class T, Per MIL-PRF-38535
• Radiation Performance
5
- Gamma Dose (γ) 1 x 10
RAD(Si)
- Latch-Up Free Under Any Conditions
- SEP Effective LET No Upsets: >100 MEV-cm
- Single Event Upset (SEU) Immunity < 2 x 10
2
/mg
-9
Errors/Bit-Day (Typ)
• 3 Micron Radiation Hardened SOS CMOS
• Significant Power Reduction Compared to LSTTL ICs
• DC Operating Voltage Range: 4.5V to 5.5V
• LSTTL Input Logic Compatibility
-VIL = 0.8V Max
-V
= V
IH
• Input Current Levels Ii ≤ 5mA at V
CC/2
Min
OL
, V
OH
Pinouts
HCTS109T (SBDIP), CDIP2-T16
TOP VIEW
V
16
CC
15
R2
14
J2
13
K2
CP2
12
11
S2
Q2
10
9
Q2
K1
CP1
S1
Q1
Q1
GND
1
RI
2
J1
3
4
5
6
7
8
5962R9576901TXC HCTS109KTR -55 to 125
NOTE:
Minimumorderquantity for -T is 150 units through
distribution, or 450 units direct.
1
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
HCTS109T (FLATPACK), CDFP4-F16
TOP VIEW
R1
J1
K1
CP1
S1
Q1
Q1
GND
www.intersil.com or 407-727-9207
Satellite Applications Flow™ (SAF) is a trademark of Intersil Corporation.
116
2
3
4
5
6
7
8
15
14
13
12
11
10
9
| Copyright © Intersil Corporation 1999
V
CC
R2
J2
K2
CP2
S2
Q2
Q2
Functional Diagram
† Unpredictable and unstable condition if both S and R go high simultaneously.
HCTS109T
5 (11)
S
6 (10)
Q
Q
R
Q
7 (9)
Q
CP
V
CC
GND
2 (14)
J
3 (13)
K
4 (12)
1 (15)
R
16
8
S
J
F/F
K
CL
CL
TRUTH TABLE
INPUTS OUTPUTS
S RCPJ KQQ
LHXXXHL
HLXXXLH
LLXXXH† H†
HH LLLH
H H H L Toggle
H H L H No Change
HH HHHL
H H L X X No Change
2
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