September 1995
HCS125MS
Radiation Hardened
Quad Buffer, Three-State
Features
• 3 Micron Radiation Hardened SOS CMOS
• Total Dose 200K RAD (Si)
• SEP Effective LET No Upsets: >100 MEV-cm
• Single Event Upset (SEU) Immunity < 2 x 10
2
/mg
-9
Errors/Bit-Day
(Typ)
• Dose Rate Survivability: >1 x 10
• Dose Rate Upset >10
10
RAD (Si)/s, 20ns Pulse
12
RAD (Si)/s
• Latch-Up Free Under Any Conditions
• Military Temperature Range: -55
o
C to +125oC
• Significant Power Reduction Compared to LSTTL ICs
• DC Operating Voltage Range: 4.5V to 5.5V
• Input Logic Levels
- VIL = 30% of VCC Max
- VIH = 70% of VCC Min
• Input Current Levels Ii ≤ 5µA at VOL, VOH
Description
The Intersil HCS125MS is a Radiation Hardened quad three-state
buffer, each having its own output enable input. A high level on the
enable input puts the output in a high impedance state.
The HCS125MS utilizes advanced CMOS/SOS technology to
achieve high-speed operation. This device is a member of
radiation hardened, high-speed, CMOS/SOS Logic Family.
The HCS125MS is supplied in a 14 lead Ceramic flatpack
(K suffix) or a SBDIP Package (D suffix).
Pinouts
14 LEAD CERAMIC DUAL-IN-LINE
METAL SEAL PACKAGE (SBDIP)
MIL-STD-1835 CDIP2-T14, LEAD FINISH C
TOP VIEW
OE1
1
A1
2
3
Y1
OE2
4
5
A2
6
Y2
7
GND
14 LEAD CERAMIC METAL SEAL
FLATPACK PACKAGE (FLATPACK)
MIL-STD-1835 CDFP3-F14, LEAD FINISH C
TOP VIEW
OE1
A1
Y1
OE2
A2
Y2
GND
1
2
3
4
5
6
7
14
VCC
OE4
13
12
A4
11
Y4
OE3
10
A3
9
Y3
8
14
13
12
11
10
9
8
VCC
OE4
A4
Y4
OE3
A3
Y3
Ordering Information
PART
NUMBER
HCS125DMSR -55oC to +125oC Intersil Class
HCS125KMSR -55oC to +125oC Intersil Class
HCS125D/
Sample
HCS125K/
Sample
HCS125HMSR +25oC Die Die
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 321-724-7143 | Copyright © Intersil Corporation 1999
TEMPERATURE
RANGE
+25oC Sample 14 Lead SBDIP
+25oC Sample 14 Lead Ceramic
SCREENING
LEVEL PACKAGE
14 Lead SBDIP
S Equivalent
14 Lead Ceramic
S Equivalent
Flatpack
Flatpack
123
Functional Diagram
An
OEn
L = Low, H = High, X = Don’t Care, Z = High Impedance
Yn
P
n
TRUTH TABLE
INPUTS OUTPUT
An OEn Yn
HLH
LLL
XHZ
Spec Number
518831
File Number 3559.1
Specifications HCS125MS
Absolute Maximum Ratings Reliability Information
Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .-0.5V to +7.0V
Input Voltage Range, All Inputs . . . . . . . . . . . . .-0.5V to VCC +0.5V
DC Input Current, Any One Input . . . . . . . . . . . . . . . . . . . . . . . .±10mA
DC Drain Current, Any One Output. . . . . . . . . . . . . . . . . . . . . . .±35mA
Storage Temperature Range (TSTG). . . . . . . . . . . -65oC to +150oC
Lead Temperature (Soldering 10sec). . . . . . . . . . . . . . . . . . +265oC
Junction Temperature (TJ) . . . . . . . . . . . . . . . . . . . . . . . . . . +175oC
ESD Classification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Class 1
(All Voltage Reference to the VSS Terminal)
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
Operating Conditions
Supply Voltage Range . . . . . . . . . . . . . . . . . . . . . . . +4.5V to +5.5V
Input Rise and Fall Time at 4.5V VCC (tr, tf) . . . . . . . 100ns/V Max.
Operating Temperature Range. . . . . . . . . . . . . . . . -55oC to +125oC
TABLE 1. DC ELECTRICAL PERFORMANCE CHARACTERISTICS
Thermal Resistance θ
SBDIP Package. . . . . . . . . . . . . . . . . . . . 74oC/W 24oC/W
Ceramic Flatpack Package . . . . . . . . . . . 116oC/W 30oC/W
Maximum Package Power Dissipation at +125oC Ambient
SBDIP Package. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .0.68W
Ceramic Flatpack Package . . . . . . . . . . . . . . . . . . . . . . . . . 0.43W
If device power exceeds package dissipation capability, provide heat
sinking or derate linearly at the following rate:
SBDIP Package. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .13.5mW/oC
Ceramic Flatpack Package . . . . . . . . . . . . . . . . . . . . . .8.6mW/oC
Gate Count . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .20 Gates
Input High Voltage. . . . . . . . . . . . . . . . . . . . . . . VCC to 70% of VCC
Input Low Voltage . . . . . . . . . . . . . . . . . . . . . . . . .0V to 30% of VCC
JA
θ
JC
(NOTE 1)
PARAMETER SYMBOL
Supply Current ICC VCC = 5.5V,
Output Current
(Source)
Output Current
(Sink)
Output Voltage High VOH VCC = 5.5V, VIH = 3.85V,
Output Voltage Low VOL VCC = 5.5V, VIH = 3.85V,
Input Leakage
Current
IOH VCC = 4.5V, VIH = 4.5V,
IOL VCC = 4.5V, VIH = 4.5V,
IIN VCC = 5.5V,
CONDITIONS
VIN = VCC or GND
VOUT = VCC -0.4V,
VIL = 0V, (Note 2)
VOUT = 0.4V, VIL = 0V,
(Note 2)
VIL = 1.65V, IOH = -50µA
VCC = 4.5V, VIH = 3.15V,
VIL = 1.35V, IOH = -50µA
VIL = 1.65V, IOL = 50µA
VCC = 4.5V, VIH = 3.15V,
VIL = 1.35V, IOL = 50µA
VIN = VCC or GND
GROUP
A SUB-
GROUPS TEMPERATURE
1 +25oC-40µA
2, 3 +125oC, -55oC - 750 µA
1 +25oC -7.2 - mA
2, 3 +125oC, -55oC -6.0 - mA
1 +25oC 7.2 - mA
2, 3 +125oC, -55oC 6.0 - mA
1, 2, 3 +25oC, +125oC, -55oC VCC
1, 2, 3 +25oC, +125oC, -55oC VCC
1, 2, 3 +25oC, +125oC, -55oC - 0.1 V
1, 2, 3 +25oC, +125oC, -55oC - 0.1 V
1 +25oC-±0.5 µA
2, 3 +125oC, -55oC-±5.0 µA
LIMITS
-V
-0.1
-V
-0.1
UNITSMIN MAX
Three-State Output
Leakage Current
Noise Immunity
Functional Test
NOTES:
1. All voltages reference to device GND.
2. Force/Measure functions may be interchanged.
3. For functional tests, VO ≥4.0V is recognized as a logic “1”, and VO ≤ 0.5V is recognized as a logic “0”.
IOZ VCC = 5.5V, Force Voltage
= 0V or VCC
FN VCC = 4.5V, VIH = 3.15V,
VIL = 1.35V, (Note 3)
1 +25oC-±1.0 µA
2, 3 +125oC, -55oC-±50 µA
7, 8A, 8B +25oC, +125oC, -55oC- - V
124
Spec Number 518831
Specifications HCS125MS
TABLE 2. AC ELECTRICAL PERFORMANCE CHARACTERISTICS
GROUP
(NOTES 1, 2)
PARAMETER SYMBOL
Propagation Delay
Input to Y
Enable Delay
OE toY
Disable Delay
OE toY
NOTES:
1. All voltages referenced to device GND.
2. AC measurements assume RL = 500Ω, CL = 50pF, Input TR = TF = 3ns.
PARAMETER SYMBOL CONDITIONS NOTES TEMPERATURE
Capacitance Power
Dissipation
TPHL
TPLH
TPZL
TPZH
TPLZ
TPHZ
TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS
CPD VCC = 5.0V, VIH = 5.0V,
CONDITIONS
VCC = 4.5V, VIH = 4.5V,
VIL = 0V
VCC = 4.5V, VIH = 4.5V,
VIL = 0V
VCC = 4.5V, VIH = 4.5V,
VIL = 0V
VIL = 0V, f = 1MHz
A SUB-
GROUPS TEMPERATURE
9 +25oC 2 21 ns
10, 11 +125oC, -55oC 2 25 ns
9 +25oC 2 25 ns
10, 11 +125oC, -55oC 2 30 ns
9 +25oC 2 25 ns
10, 11 +125oC, -55oC 2 30 ns
1 +25oC - 60 pF
1 +125oC, -55oC - 90 pF
LIMITS
UNITSMIN MAX
LIMITS
UNITSMIN MAX
Input Capacitance CIN VCC = 5.0V, VIH = 5.0V,
VIL = 0V, f = 1MHz
Output Capacitance COUT VCC = 5.0V, VIH = 5.0V,
VIL = 0V, f = 1MHz
Output Transition
Time
NOTE:
1. The parameters listed in Table 3 are controlled via design or process parameters. Min and Max Limits are guaranteed but not directly
tested. These parameters are characterized upon initial design release and upon design changes which affect these characteristics.
PARAMETER SYMBOL
Supply Current ICC VCC = 5.5V, VIN = VCC or GND +25oC - 0.75 mA
Output Current
(Source)
TTHL
TTLH
TABLE 4. POST IRRADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS
VCC = 4.5V, VIH = 4.5V,
VIL = 0V
(NOTE 1)
CONDITIONS TEMPERATURE
IOH VCC = VIH = 4.5V,
VOUT = VCC -0.4V, VIL = 0
1 +25oC - 10 pF
1 +125oC, -55oC - 10 pF
1 +25oC 1 20 pF
1 +125oC, -55oC 1 20 pF
1 +25oC 1 15 ns
1 +125oC, -55oC 1 22 ns
200K RAD
LIMITS
UNITSMIN MAX
+25oC -6.0 - mA
Output Current (Sink) IOL VCC = VIH = 4.5V,
VOUT = 0.4V, VIL = 0
+25oC 6.0 - mA
Spec Number 518831
125