Intersil Corporation HCS05MS Datasheet

September 1995
HCS05MS
Radiation Hardened
Hex Inverter with Open Drain
Features
• 3 Micron Radiation Hardened SOS CMOS
• Total Dose 200K RAD (Si)
2
• SEP Effective LET No Upsets: >100 MEV-cm
• Single Event Upset (SEU) Immunity < 2 x 10
/mg
-9
Errors/Bit-Day
(Typ)
• Dose Rate Survivability: >1 x 10
10
• Dose Rate Upset >10
RAD (Si)/s 20ns Pulse
12
RAD (Si)/s
• Latch-Up Free Under Any Conditions
o
• Military Temperature Range: -55
C to +125oC
• Significant Power Reduction Compared to LSTTL ICs
• DC Operating Voltage Range: 4.5V to 5.5V
• Input Logic Levels
- VIL = 30% of VCC Max
- VIH = 70% of VCC Min
• Input Current Levels Ii 5µA at VOL, VOH
Description
The Intersil HCS05MS is a Radiation Hardened Hex inverter function with open drain outputs. These open drain outputs can drive into resistive loads with a separate voltage supply.
The HCS05MS utilizes advanced CMOS/SOS technology to achieve high-speed operation. This device is a member of radiation hardened, high-speed, CMOS/SOS Logic Family.
Pinouts
14 LEAD CERAMIC DUAL-IN-LINE
MIL-STD-1835 CDIP2-T14, LEAD FINISH C
TOP VIEW
A1
1
Y1
2 3
A2 Y2
4 5
A3 Y3
6
GND
7
14 LEAD CERAMIC METAL SEAL
FLATPACK PACKAGE (FLATPACK)
MIL-STD-1835 CDFP3-F14, LEAD FINISH C
TOP VIEW
1A1 Y1 A2 Y2 A3 Y3
GND
2
3
4
5
6
7
VCC
14
A6
13
Y6
12
A5
11
Y5
10
A4
9
Y4
8
14 13
12 11 10
9 8
VCC A6 Y6 A5 Y5 A4 Y4
The HCS05MS is supplied in a 14 lead Ceramic Flatpack (K suffix) or a Ceramic Dual-In-Line Package (D suffix).
Ordering Information
PART
NUMBER
HCS05DMSR -55oC to +125oC Intersil Class
HCS05KMSR -55oC to +125oC Intersil Class
HCS05D/ Sample
HCS05K/ Sample
HCS05HMSR +25oC Die Die
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures. 1-888-INTERSIL or 321-724-7143 | Copyright © Intersil Corporation 1999
TEMPERATURE
RANGE
+25oC Sample 14 Lead SBDIP
+25oC Sample 14 Lead Ceramic
SCREENING
LEVEL PACKAGE
14 Lead SBDIP
S Equivalent
14 Lead Ceramic
S Equivalent
Flatpack
Flatpack
35
Functional Diagram
An
INPUTS OUTPUTS
NOTES:
1. No pullup resistor
2. With pullup resistor
3. L = Low
4. H = High
Yn
TRUTH TABLE
An Yn
L Z (Note 1) H (Note 2)
HL
Spec Number
518829
File Number 3557.1
Specifications HCS05MS
Absolute Maximum Ratings Reliability Information
Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .-0.5V to +7.0V
Input Voltage Range, All Inputs . . . . . . . . . . . . .-0.5V to VCC +0.5V
DC Input Current, Any One Input . . . . . . . . . . . . . . . . . . . . . . . .±10mA
DC Drain Current, Any One Output. . . . . . . . . . . . . . . . . . . . . . .±25mA
(All Voltage Reference to the VSS Terminal)
Storage Temperature Range (TSTG) . . . . . . . . . . . -65oC to +150oC
Junction Temperature (TJ) . . . . . . . . . . . . . . . . . . . . . . . . . . +175oC
Lead Temperature (Soldering 10sec) . . . . . . . . . . . . . . . . . . +265oC
ESD Classification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Class 1
CAUTION: As with all semiconductors, stress listed under “Absolute Maximum Ratings” may be applied to devices (one at a time) without resulting in permanent damage. This is a stress rating only. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. The conditions listed under “Electrical Performance Characteristics” are the only conditions recommended for satisfactory device operation..
Operating Conditions
Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +4.5V to +5.5V
Input Rise and Fall Times at 4.5V VCC (TR, TF). . . . . 100ns/V Max
Operating Temperature Range (TA) . . . . . . . . . . . . -55oC to +125oC
TABLE 1. DC ELECTRICAL PERFORMANCE CHARACTERISTICS
Thermal Resistance θ
SBDIP Package. . . . . . . . . . . . . . . . . . . . 74oC/W 24oC/W
Ceramic Flatpack Package . . . . . . . . . . . 116oC/W 30oC/W
Maximum Package Power Dissipation at +125oC Ambient
SBDIP Package. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .0.68W
Ceramic Flatpack Package . . . . . . . . . . . . . . . . . . . . . . . . . 0.43W
If device power exceeds package dissipation capability, provide heat sinking or derate linearly at the following rate:
SBDIP Package. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .13.5mW/oC
Ceramic Flatpack Package . . . . . . . . . . . . . . . . . . . . . .8.6mW/oC
Input High Voltage (VIH). . . . . . . . . . . . . . . . . . . . . . . . 70% of VCC
Input Low Voltage (VIL). . . . . . . . . . . . . . . . . . . 0.0V to 30% of VCC
JA
θ
JC
GROUP
(NOTE 1)
PARAMETER SYMBOL
Supply Current ICC VCC = 5.5V,
Output Current (Sink)
Output Voltage Low VOL VCC = 5.5V, VIH = 3.85V,
Input Leakage Current
Three-State Output Leakage Current
Noise Immunity Functional Test
NOTES:
1. All voltages reference to device GND.
2. Force/Measure functions may be interchanged.
3. For functional tests, VO 4.0V is recognized as a logic “1”, and VO 0.5V is recognized as a logic “0”.
IOL VCC = VIH = 4.5V,
IIN VCC = 5.5V, VIN = VCC or
IOZH VCC = 5.5V,
FN VCC = 4.5V, VIH = 3.15,
CONDITIONS
VIN = VCC or GND
VOUT = 0.4V, VIL = 0V (Note 2)
VIL = 1.35V, IOL = 50µA VCC = 4.5V, VIH = 3.15V,
VIL = 1.35V, IOL = 50µA,
GND
Force Voltage = VCC
VIL = 1.35 (Note 3)
A SUB-
GROUPS TEMPERATURE
1 +25oC-10µA
2, 3 +125oC, -55oC - 200 µA
1 +25oC 4.8 - mA
2, 3 +125oC, -55oC 4.0 - mA
1, 2, 3 +25oC, +125oC, -55oC - 0.1 V
1, 2, 3 +25oC, +125oC, -55oC - 0.1 V
1 +25oC-±0.5 µA
2, 3 +125oC, -55oC-±5.0 µA
1 +25oC-1µA
2, 3 +125oC, -55oC-50µA
7, 8A, 8B +25oC, +125oC, -55oC- - V
LIMITS
UNITSMIN MAX
TABLE 2. AC ELECTRICAL PERFORMANCE CHARACTERISTICS
(NOTES 1, 2)
PARAMETER SYMBOL
Propagation Delay An to Yn
NOTES:
1. All voltages referenced to device GND.
2. Measurements assume RL = 500, CL = 50pF, Input TR = TF = 3ns.
TPLZ TPZL
CONDITIONS
VCC = 4.5V, VIH = 4.5V, VIL = 0V
36
GROUP
A SUB-
GROUPS TEMPERATURE
9 +25oC 2 18 ns
10, 11 +125oC, -55oC 2 20 ns
LIMITS
Spec Number 518829
UNITSMIN MAX
Specifications HCS05MS
TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS
LIMITS
PARAMETER SYMBOL CONDITIONS NOTES TEMPERATURE
Capacitance Power Dissipation
Input Capacitance CIN VCC = 5.0V, VIH = 5.0V,
Output Transition Time
NOTE:
1. The parameters listed in Table 3 are controlled via design or process parameters. Min and Max Limits are guaranteed but not directly tested. These parameters are characterized upon initial design release and upon design changes which affect these characteristics.
PARAMETER SYMBOL
CPD VCC = 5.0V, VIH = 5.0V,
VIL = 0.0V, f = 1MHz
VIL = 0.0V, f = 1MHz
TTHL VCC = 4.5V, VIH = 4.5V,
VIL = 0.0V
TABLE 4. POST IRRADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS
(NOTE 1)
CONDITIONS TEMPERATURE
1 +25oC - 15 pF 1 +125oC, -55oC - 23 pF 1 +25oC - 10 pF 1 +125oC, -55oC - 10 pF 1 +25oC 1 15 ns 1 +125oC, -55oC 1 22 ns
200K RAD
LIMITS
UNITSMIN MAX
UNITSMIN MAX
Supply Current ICC VCC = 5.5V, VIN = VCC or GND +25oC - 0.2 mA
Output Current (Sink) IOL VCC = VIH = 4.5V, VOUT = 0.4V, VIL = 0V +25oC 4.0 - mA
Output Voltage Low VOL VCC = 5.5V , VIH = 3.85V, VIL = 1.65V,
IOL = 50µA
VCC = 4.5V , VIH = 3.15V, VIL = 1.35V, IOL = 50µA
Input Leakage Current IIN VCC = 5.5V, VIN = VCC or GND +25oC-±5 µA
Three-State Output Leakage Current
Noise Immunity Functional Test
Propagation Delay TPLZ
NOTES:
1. All voltages referenced to device GND.
2. For functional tests, VO 4.0V is recognized as a logic “1”, and VO 0.5V is recognized as a logic “0”.
PARAMETER SYMBOL GROUP B SUBGROUP UNITS
IOZH VCC = 5.5V, Force Voltage = 0V or VCC +25oC-±50 µA
FN VCC = 4.5V, VIH =3.15V, VIL = 1.35V,
(Note 2)
VCC = 4.5V, VIH =4.5V, VIL = 0V +25oC 2 20 ns
TPZL
TABLE 5. DELTA PARAMETERS (+25oC)
+25oC - 0.1 V
+25oC - 0.1 V
+25oC--V
Supply Current ICC +3 µA
Three-State Leaking Current IOZH ±200 nA
Output Current IOL -15 %
37
Spec Number 518829
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