• High Bandwidth Precision Data Acquisition Systems
• Inertial Navigation and Guidance Systems
• Ultrasonics
• SONAR / RADAR
• Digital to Analog Converter Deglitcher
Description
The HA-5320/883 was designed for use in precision, high speed
data acquisition systems.
The circuit consists of an input transconductance amplifier
capable of providing large amounts of charging current, a low
leakage analog switch, and an output integrating amplifier. The
analog switch sees virtual ground as its load; therefore, charge
injection on the hold capacitor is constant over the entire input/
output voltage range. The pedestal voltage resulting from this
charge injection can be adjusted to zero by use of the offset
adjust inputs. The device includes a hold capacitor. However, if
improved droop rate is required at the expense of acquisition
time, additional hold capacitance may be added externally.
This monolithic device is manufactured using the Intersil
Dielectric Isolation Process, minimizing stray capacitance and
eliminating SCR’s. This allows higher speed and latch-free
operation. For further information, please see Application Note
AN538.
Pinouts
HA-5320/883 (CERDIP)
Ordering Information
TOP VIEW
-INPUT
+INPUT
OFFSET ADJ
OFFSET ADJ
SIG GND
OUTPUT
V-
1
2
3
4
5
6
7
S/H CONTROL
14
SUPPLY GND
13
NC
12
C
11
EXT
10
NC
V+
9
INT. BW
8
PART NUMBER
HA1-5320/883-55oC to +125oC14 Lead CerDIP
HA4-5320/883-55oC to +125oC20 Lead Ceramic LCC
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
1. Internal power dissipation may limit output current below 20mA.
TABLE 2. AC ELECTRICAL PERFORMANCE CHARACTERISTICS
Table 2 Intentionally Left Blank. See AC Specifications in Table 3.
1+25oC-0.8V
2, 3+125oC, -55oC-0.8V
1+25oC2.0-V
2, 3+125oC, -55oC2.0-V
CAUTION: These devices are sensitive to electronic discharge. Proper IC handling procedures should be followed.
7-5
Spec Number 51 1096-883
Specifications HA-5320/883
TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS
LIMITS
PARAMETERSYMBOLCONDITIONSNOTESTEMPERATURE
Hold Mode FeedthroughV
Hold Step ErrorV
Sample Mode Noise
HMF
ERRORVIH
E
N(SAMPLE)
Voltage
Hold Mode Noise
E
N(HOLD)
Voltage
Input CapacitanceC
Input ResistanceR
Slew Rate+SRCL = 50pF, RL = 2kΩ,
IN
IN
VIN = 10V
= 3.5V, VIL = 0V,
T
RISE
DC to 10MHz, V
R
LOAD
DC to 10MHz, V
R
LOAD
V
= 0V1+25oC-5pF
S/H
V
= 0V, Delta VIN = 20V1+25oC1-MΩ
S/H
, 100kHz1+25oC-3mV
P-P
1+25oC-1111mV
(VIL to VIH) = 10ns
S/H
= 0V,
1+25oC-200µV
= 2kΩ
S/H
= 5V,
1+25oC-200µV
= 2kΩ
1+25oC30-V/µs
V
= -5V to +5V Step
OUT
10%, 90% pts
-SRCL = 50pF, RL = 2kΩ,
V
= +5V to -5V Step
OUT
1+25oC30-V/µs
10%, 90% pts
Rise and Fall TimesT
CL = 50pF, RL = 2kΩ,
R
V
OUT
1+25oC-150ns
= 0V to +200mV Step
10%, 90% pts
UNITSMINMAX
RMS
RMS
T
CL = 50pF, RL = 2kΩ,
F
V
OUT
1+25oC-150ns
= 0V to -200mV Step
10%, 90% pts
Overshoot+OSCL = 50pF, RL = 2kΩ,
V
= 0V to +200mV Step
OUT
-OSCL = 50pF, RL = 2kΩ,
V
= 0V to -200mV Step
OUT
0.1% Acquisition TimeT
0.1% CL = 50pF, RL = 2kΩ,
ACQ
V
= 0V to 10V Step
OUT
1+25oC-25%
1+25oC-25%
1+25oC-1.2µs
NOTE:
1. The parameters listed in this table are controlled via design or process parameters and are not directly tested. These parameters are
characterized upon initial design release and upon design changes which would affect these characteristics.
TABLE 4. ELECTRICAL TEST REQUIREMENTS
MIL-STD-883 TEST REQUIREMENTSSUBGROUPS (SEE TABLE 1)
Interim Electrical Parameters (Pre Burn-In)-
Final Electrical Test Parameters1(Note 1), 2, 3
Group A Test Requirements1, 2, 3
Groups C and D Endpoints1
NOTE:
1. PDA applies to Subgroup 1 only. No other subgroups are included in PDA.
7-6
Spec Number 51 1096-883
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