The HA-5020/883 is a wide bandwidth, high slew rate
amplifier optimized for video applications and gains between
1 and 10. Manufactured on Intersil’s Reduced Feature
Complementary Bipolar DI process, this amplifier uses current mode feedback to maintain higher bandwidth at a given
gain than conventional voltage feedback amplifiers. Since it
is a closed loop device, the HA-5020/883 offers better gain
accuracy and lower distortion than open loop buffers.
The HA-5020/883 features low diff erential gain and phase and
will drive two double terminated 75Ω coax cables to video
levels with low distortion. Adding a gain flatness performance
of 0.1dB makes this amplifier ideal for demanding video
applications. The bandwidth and slew rate of the HA-5020/
883 are relatively independent of closed loop gain. The
105MHz unity gain bandwidth only decreases to 77MHz at a
gain of 10. The HA-5020/883 used in place of a conventional
op amp will yield a significant improvement in the speed
power product. To further reduce power , the HA-5020/883 has
a disable function which significantly reduces supply current,
while forcing the output to a true high impedance state. This
allows the outputs of multiple amplifiers to be wire-OR’d into
multiplexer configurations. The device also includes output
short circuit protection and output offset voltage adjustment.
The HA-5020/883 offers significant enhancements over
competing amplifiers, such as the EL2020. Improvements
include unity gain bandwidth, slew rate, video performance,
lower supply current, and superior DC specifications.
Ordering Information
PART
NUMBER
HA7-5020/883-55oC to +125oC8 Lead CerDIP
HA4-5020/883-55oC to +125oC20 Lead Ceramic LCC
TEMPERATURE
RANGEPACKAGE
Pinouts
HA-5020/883
(CERDIP)
TOP VIEW
BAL
1
2
-IN
+IN
V-
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 321-724-7143
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
TABLE 1. DC ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued)
Device Tested at: Supply Voltage = ±15V, R
Unless Otherwise Specified.
Specifications HA-5020/883
SOURCE
= 0Ω, A
= +1, RF = 1kΩ, R
VCL
LOAD
= 400Ω, V
OUT
= 0V, V
DISABLE
= V+,
LIMITS
UNITSMINMAX
PARAMETERSSYMBOLCONDITIONS
Disable Pin Input CurrentI
LOGIC
V
= 0V1, 2+25oC, +125oC-1 0 mA
DIS
GROUP A
SUBGROUPTEMPERATURE
3-55oC-1.50mA
Minimum DISABLE Pin
Current to Disable
Maximum DISABLE Pin
Current to Enable
Quiescent Power Supply
Current
I
DIS
Note 21+25oC-350µA
2, 3+125oC, -55oC-350µA
I
EN
Note 31+25oC20-µA
2, 3+125oC, -55oC20 - µA
I
CC
RL = 400Ω1+25oC-10mA
2, 3+125oC, -55oC-10mA
I
EE
RL = 400Ω1+25oC-10-mA
2, 3+125oC, -55oC-10-mA
Disabled Power Supply
Current
I
CCDIS
I
EEDIS
RL = 400Ω, V
RL = 400Ω, V
= 0V1+25oC-5.6mA
DIS
2, 3+125oC, -55oC-7.5mA
= 0V1+25oC-5.6-mA
DIS
2, 3+125oC, -55oC-7.5-mA
Offset Voltage
Adjustment
+V
-V
ADJ
ADJ
Note 41+25oC30-mV
2, 3+125oC, -55oC25 - mV
Note 41+25oC--30mV
2, 3+125oC, -55oC--25mV
NOTES:
1. Guaranteed from V
OUT
test by I
OUT
= V
OUT
/400Ω.
2. This is the minimum current which must be sourced from the DISABLE pin, to disable the output. The output is considered disabled when
V
≤ 10mV. Conditions are: VIN = 10V, RL = 100Ω. The test is performed by sourcing 350µA from the DISABLE pin, and testing that
OUT
the output decreases below the test limit (10mV).
3. This is the maximum current that can be sourced from the DISABLE pin with the device remaining enabled. The device is considered
disabled when the supply current decreases by at least 0.5mA. Conditions are: RL = 400Ω. Test is performed by sourcing 20µA from the
DISABLE pin, and testing that the supply current decreases by no more than the test limit (0.5mA).
4. The offset adjustment range is referred to the output. The inv erting input current (-I
1 and 5, wiper connected to V+. Since -I
flows through RF, an adjustment of offset voltage results. The amount of offset adjustment is
BIAS
proportional to the value of RF. Test conditions are: RL = Open, 10kΩ from pin 5 to V+, 1kΩ from pin 1 to V+, for +V
from pin 5 to V+, 10kΩ from pin 1 to V+, for -V
ADJ
.
) can be adjusted with an external pot between pins
BIAS
; RL = Open, 1kΩ
ADJ
TABLE 2. AC ELECTRICAL PERFORMANCE CHARACTERISTICS
Device Tested at: Supply Voltage = ±15V, R
PARAMETERSSYMBOLCONDITIONS
SOURCE
= 50Ω, R
LOAD
= 400Ω, C
LOAD
≤ 10pF, A
GROUP A
SUBGROUPTEMPERATURE
= +1V/V, Unless Otherwise Specified.
VCL
LIMITS
UNITSMINMAX
Slew Rate+SRVIN= -10V to +10V4+25oC600-V/µs
5, 6+125oC, -55oC400-V/µs
-SRVIN= +10V to -10V4+25oC600-V/µs
5, 6+125oC, -55oC400-V/µs
Spec Number 511080-883
3-97
Specifications HA-5020/883
TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS
Device Characterized at: Supply Voltage = ±15V, R
Unless Otherwise Specified.
PARAMETERSSYMBOLCONDITIONSNOTESTEMPERATURE
-3dB BandwidthBW
BW
1
10
VO = 100mV
VO = 100mV
RF = 360Ω, RL = Open
Gain FlatnessGF
GF
Rise Timet
Fall Timet
R
F
VO = 100mV
5
VO = 100mV
10
VO = 0V to 1V, RL = 100Ω1, 2+25oC-3.7ns
VO = 1V to 0V, RL = 100Ω1, 3+25oC-4.0ns
Overshoot+OVSVO = 0V to 1V, RL = 100Ω1+25oC-18.0%
-OVSVO = 1V to 0V, RL = 100Ω1+25oC-16.6%
Slew Rate+SR
VO = -10V to 10V, AV = +10,
10
RF = 360Ω, RL = Open
-SR
VO = 10V to -10V, AV = +10,
10
RF = 360Ω, RL = Open
Disable Time+t
Enable Time+t
DIS
-t
DIS
EN
-t
EN
VO = 2V to 0V, 50% of V
90% V
O
VO = -2V to 0V, 50% of V
90% V
O
VO = 0V to 2V, 50% to 90%1, 7+25oC-1.45µs
VO = 0V to -2V, 50% to 90%1, 7+25oC-1.49µs
NOTES:
1. Parameters listed in Table 3 are controlled via design or process parameters and are not directly tested at final production. These param-
eters are lab characterized upon initial design release, or upon design changes. These parameters are guaranteed by characterization
based upon data from multiple production runs which reflect lot to lot and within lot variation.
2. Measured from 10% to 90% of the output waveform.
3. Measured from 90% to 10% of the output waveform.
4. Measured from 25% to 75% of the output waveform.
5. Measured from 75% to 25% of the output waveform.
6. DISABLE = +15V to 0V. Measured from the 50% of DISABLE to V
7. DISABLE = 0V to +15V. Measured from the 50% of DISABLE to V
SOURCE
= 50Ω, R
= 400Ω, RF = 1kΩ, V
LOAD
DISABLE
= V+, C
LOAD
≤ 10pF, A
LIMITS
, AV = +11+25oC105-MHz
RMS
, AV = +10,
RMS
, f = 5MHz1+25oC-0.075+0.075dB
RMS
, f = 10MHz1+25oC-0.2+0.2dB
RMS
1+25oC77-MHz
1, 4+25oC1070-V/µs
1, 5+25oC860-V/µs
DIS
DIS
to
to
1, 6+25oC-3.13µs
1, 6+25oC-2.44µs
= ±200mV.
OUT
= ±1.8V.
OUT
VCL
= +1V/V,
UNITSMINMAX
TABLE 4. ELECTRICAL TEST REQUIREMENTS
MIL-STD-883 TEST REQUIREMENTSSUBGROUPS (SEE TABLES 1 AND 2)
Interim Electrical Parameters (Pre Burn-In)1
Final Electrical Test Parameters1 (Note 1), 2, 3, 4, 5, 6
Group A Test Requirements1, 2, 3, 4, 5, 6
Groups C and D Endpoints1
NOTE:
1. PDA applies to Subgroup 1 only.
3-98
Spec Number 511080-883
Die Characteristics
DIE DIMENSIONS:
65 x 60 x 19 mils ± 1 mils
1640µm x 1520µm x 483µm ± 25.4µm