95MHz, Low Power, AV = 2, 8 x 8 Video
Crosspoint Switch
The HA457 is an 8 x 8 video crosspoint switch suitable for
high performance video systems. Its high level of integration
significantly reduces component count, board space, and
cost. The crosspoint switch contains a digitally controlled
matrix of 64 fully buffered switches that connect eight video
input signalsto any, or all, matrix outputs. Each matrix output
connects to an internal, high-speed (275V/µs), gain of two
buffer capable of driving 150Ω to ±2.5V.
The HA457 will directly drive a double terminated video
cable with some degradation of differential gain and phase.
Applications demanding the best composite video
performance should drive the cable with a unity gain video
buffer, such as the HFA1412 quad buffer (see Figure 7).
This crosspoint’s three-state output capability makes it
feasible to parallel multiple HA457s and form larger switch
matrices.
File Number4231.2
Features
• Pin Compatible, Cable Driving Upgrade for HA456 and
MAX456
• Fully Buffered Inputs and Outputs (A
= +2)
V
• Routes Any Input Channel to Any Output Channel
• Switches Standard and High Resolution Video Signals
402D1/ SER OUT Parallel Data Bit input D1 for parallel programming mode. Serial Data Output (MSB of shift
register) for cascading multiple HA457s in serial programming mode. Simply connect
Serial Data Out of one HA457 to Serial Data In of another HA457 to daisy chain multiple
devices.
413D0/SER INParallel Data Bit input D0 for parallel programming mode. Serial Data Input (input to shift
register) for serial programming mode.
42, 43, 14, 5, 7A2, A1, A0OutputChannelAddressBits.These inputs select the output being programmed in parallel
programming mode.
44, 2, 4, 7, 9, 11,
13, 15
5, 811, 14DGNDDigital Ground. Connect both DGND pins to AGND.
1016EDGE/LEVEL A user strapped input that defines whether synchronous channel switching is edge or level
12, 23, 3818, 29, 44V+Positive supply voltage. Connect all V+ pins together and decouple each pin to AGND
1420SER/PARA user strapped input that defines whether the serial (SER/PAR=1) or parallel
16, 3222, 38V-Negative supply voltage. Connect both V- pins together and decouple each pin to AGND
1824WRWRITE Input. In serial mode, data shifts into the shift register (Master Register) LSB from
1925LATCHSynchronous channel switch control input. If EDGE/LEVEL = 1, data is loaded from the
6, 8, 10, 13,
15, 17, 19, 21
IN0-IN7Analog Video Input Lines.
controlled. With this pin strapped high, the slave register loads from the master register
(thus changing the switch matrix state) on the rising edge of the LATCH signal. If it is
strapped low (level mode), the slave register is transparent while LATCH is low, passing
datadirectlyfromthe master registertotheswitch state decoders. StrappingEDGE/LEVEL
and LATCH low causes the channel switch to execute on the WR rising edge (not
recommended for serial mode operation).
(Figure 6).
(SER/PAR=0) digital programming interface is being utilized.
(Figure 6).
SER IN on the WR rising edge. In parallel mode, the Master Register loads with D3:0 (iff
D3:0=0000 through 1000), or theappropriateactionis taken (iff D3:0=1011 through1111),
on the WR rising edge (see Table 1).
Master Register to the Slave Register on the rising edge of LATCH. If EDGE/LEVEL = 0,
data is loaded from the Master to the Slave Register while LATCH = 0. In parallel mode,
commands 1011 through 1110 execute asynchronously, on the WR rising edge,
regardless of the state of LATCH or EDGE/LEVEL. Parallel mode command 1111
executes a software “Latch” (see Table 1).
2026CEChip Enable. When CE = 0 and CE = 1, the WR line is enabled.
2127CEChip Enable. When CE = 0 and CE = 1, the WR line is enabled.
22, 24, 26, 29,
31, 33, 35, 37
25, 27, 3031, 33, 36AGNDAnalog Ground.
3440D3Parallel Data Bit Input D3 when SER/PAR = 0. D3 is unused with serial programming.
3642D2Parallel Data Bit Input D2 when SER/PAR = 0. D2 is unused with serial programming.
Supply Voltage Range (Typical). . . . . . . . . . . . . . . . . . .±4.5V to ±5.5V
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
1. θJA is measured with the component mounted on an evaluation PC board in free air.
Digital Input Low VoltageAFull--0.8V
Digital Input High VoltageA252.0--V
AFull2.2--V
SER OUT Logic Low VoltageSerial Mode, I
SER OUT Logic High VoltageSerial Mode, I
SER OUT Leakage CurrentOutput Disabled, V
= 1.6mAAFull--0.4V
OL
= -0.4mAAFull3.0--V
OH
= 2.5VA25-0.25µA
OUT
AFull-110µA
AC CHARACTERISTICS (Note 4)
-3dB Bandwidth (Note 6)V
Slew Rate (Note 6)V
All Hostile Crosstalk (Note 6)10MHz, V
All Hostile Off Isolation (Note 6)10MHz, V
= 200mV
OUT
= 1V
V
OUT
= 2V
V
OUT
= 2V
V
OUT
= 4V
OUT
10MHz, V
10MHz, V
P-P
P-P
, RL= 150ΩB25-50-MHz
P-P
, RL = 150ΩB25-275-V/µs
P-P
= 1V
IN
= 1V
IN
= 1V
IN
= 1V
IN
Differential PhaseNTSC or PAL, R
NTSC or PAL, R
NTSC or PAL, R
Differential GainNTSC or PAL, R
NTSC or PAL, R
NTSC or PAL, R
P-P
, RL= 150ΩB25--55-dB
P-P
, RL = 1kΩB25--58-dB
P-P
, RL = 150ΩB25-95-dB
P-P
, RL = 1kΩB25-75-dB
P-P
= 150ΩB25-0.5-DEG
L
= 1kΩB25-0.05-DEG
L
≥ 10kΩB25-0.05-DEG
L
= 150ΩB25-0.05-%
L
= 1kΩB25-0.05-%
L
≥ 10kΩB25-0.02-%
L
B25-95-MHz
B25-75-MHz
B25-60-MHz
TIMING CHARACTERISTICS (See Figure 8 for more information)
Write Pulse Width High (t
Write Pulse Width Low (t
Chip-Enable Setup Time to Write (t
Chip-Enable Hold Time From Write (t
Data and Address Setup Time to Write (t
)AFull20--ns
WH
)AFull20--ns
WL
)AFull5--ns
CS
)AFull5--ns
CH
)Parallel ModeAFull20--ns
DS
Serial ModeAFull20--ns
Data and Address Hold Time From Write (t
Latch Pulse Width (t
Latch Delay From Write (t
LATCH Edge to Output Disabled (t
LATCH Edge to Output Enabled (t
)AFull40--ns
L
)AFull40--ns
D
OFF
ON
Output Break-Before-Make Delay
(t
ON -tOFF
)
)AFull25--ns
DH
)Serial ModeBFull-30-ns
)Serial ModeBFull-185-ns
Serial ModeBFull-155-ns
NOTES:
2. For the lowest crosstalk, and the best composite video performance, use R
≥ 1kΩ.
L
3. Test Level: A. Production Tested; B. Typical or Guaranteed Limit Based on Characterization; C. Design Typical for Information Only.
4. See AC Test Circuits (Figure 1 through Figure 4).
5. Excludes D1/SER OUT which is a bidirectional terminal and thus falls under the higher Output Leakage limit.
6. See Typical Performance Curves for more information.
5
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