3-200
Spec Number
511029-883
Specifications HA-2640/883
TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS
Device Characterized at: V
SUPPLY
= ±40V, R
LOAD
= 5kΩ, C
LOAD
= 10pF, AV = 1V/V, Unless Otherwise Specified.
PARAMETERS SYMBOL CONDITIONS NOTES TEMPERATURE
LIMITS
UNITSMIN MAX
Differential Input Resistance R
IN
VCM = 0V 1 +25oC50-MΩ
Full Power
Bandwidth
FPBW V
PEAK
= 10V 1, 2 +25oC 45 - kHz
V
PEAK
= 35V 1, 2 +25oC 13.6 - kHz
Minimum Closed Loop
Stable Gain
CLSG RL = 5kΩ, CL = 50pF 1 -55oC to +125oC 1 - V/V
Output Short Circuit Current +I
SC
V
OUT
= 0V, RL = 10Ω 1 +25oC - 25 mA
-I
SC
V
OUT
= 0V, RL = 10Ω 1 +25oC -25 - mA
Output Resistance R
OUT
Open Loop 1 +25oC - 600 Ω
Quiescent Power
Consumption
PC V
OUT
= 0V, I
OUT
= 0mA 1, 3 -55oC to +125oC - 320 mW
NOTES:
1. Parameters listed in Table 3 are controlled via design or process parameters and are not directly tested at final production. These parameters are lab characterized upon initial design release, or upon design changes. These parameters are guaranteed by characterization
based upon data from multiple production runs which reflect lot to lot and within lot variation.
2. Full Power Bandwidth guarantee based on Slew Rate measurement using FPBW = Slew Rate/(2πV
PEAK
).
3. Power Consumption based upon Quiescent Supply Current test maximum. (No load on outputs.)
TABLE 4. ELECTRICAL TEST REQUIREMENTS
MIL-STD-883 TEST REQUIREMENTS SUBGROUPS (SEE TABLES 1 AND 2)
Interim Electrical Parameters (Pre Burn-In) 1
Final Electrical Test Parameters 1 (Note 1), 2, 3, 4, 5, 6
Group A Test Requirements 1, 2, 3, 4, 5, 6
Groups C and D Endpoints 1
NOTE:
1. PDA applies to Subgroup 1 only.