The HA-2557/883 is a monolithic, high speed, four quadrant,
analog multiplier constructed in Intersil’ Dielectrically Isolated High Frequency Process. The single-ended current
output of the HA-2557/883 has a 130MHz signal bandwidth
(R
= 50Ω). High bandwidth and low distortion make this part
L
an ideal component in video systems.
The suitability for precision video applications is demon-
strated further by low multiplication error (1.5%), low
feedthrough (-52dB), and differential inputs with low bias currents (8µA). The HA-2557/883 is also well suited for mixer
circuits as well as AGC applications for sonar, radar, and
medical imaging equipment.
The current output of the HA-2557/883 allows it to achieve
higher bandwidths than voltage output multipliers. Full scale output current is trimmed to 1.6mA. An internal 2500Ω feedback
resistor is also provided to accurately convert the current, if
desired, to a full scale output voltage of ±4V. The HA-2557/883 is
not limited to multiplication applications only; frequency doubling,
power detection, as well as many other configurations are also
possible.
Ordering Information
TEMPERATURE
PART NUMBER
HA1-2557/883-55oC to +125oC 16 Lead CerDIP
RANGEPACKAGE
Pinout
Schematic
HA-2557/883
(CERDIP)
TOP VIEW
V
V
XIO
8-12
V
BIAS
-
X
+
-
B
GND
V
16
1
GND
V
REF
V
B
YIO
V
A
YIO
+
V
Y
-
V
Y
V-
I
OUT
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
http://www.intersil.com or 407-727-9207
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
TABLE 2. AC ELECTRICAL PERFORMANCE CHARACTERISTICS
Table 2 Intentionally Left Blank. See AC Specifications in Table 3
TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS
Device Tested at: V
PARAMETERSSYMBOLCONDITIONSNOTESTEMPERATURE
VY, CHARACTERISTICS
BandwidthBW(VY)-3dB, VX = 4V,
AC FeedthroughV
Rise and Fall TimeTR, T
Overshoot+OS, -OSVY = -4V to +4V Step
Differential Input
Resistance
VX CHARACTERISTICS
BandwidthBW(VX)-3dB, VY = 4V,
AC FeedthroughV
Rise and Fall TimeTR, T
Overshoot+OS, -OSVX = -4V to +4V Step
Differential Input
Resistance
NOTE:
1. Parameters listed in Table 3 are controlled via design or process parameters and are not directly tested at final production. These parameters are lab characterized upon initial design release, or upon design changes. These parameters are guaranteed by characterization
based upon data from multiple production runs which reflect lot to lot and within lot variation.
2. Offset voltage applied to minimize feedthrough signal.
= ±15V, RZ (Pin 10) not connected, Unless Otherwise Specified.
SUPPLY
ISO
VY≤ 200mV
fO = 5MHz,
VY = 200mV
P-P
P-P
VX = Nulled
VY = -4V to +4V Step
F
VX = 4V,
10% to 90% pts
VX = 4V
RIN(VY)VY = ±4V, VX = 0V1+25oC650-kΩ
ISO
VX≤ 200mV
fO = 5MHz,
VX = 200mV
P-P
P-P
VY = Nulled
VX = -4V to +4V Step
F
VY = 4V, 10% to 90% pts
VY = 4V
RIN(VX)VX = ±4V, VY = 0V1+25oC650-kΩ
LIMITS
UNITSMINMAX
1+25oC90-MHz
1, 2+25oC--48dB
1+25oC-10ns
1+25oC-10%
1+25oC60-MHz
1, 2+25oC--50dB
1+25oC-10ns
1+25oC-15%
TABLE 4. ELECTRICAL TEST REQUIREMENTS
MIL-STD-883 TEST REQUIREMENTSSUBGROUPS (SEE TABLE 1)
Interim Electrical Parameters (Pre Burn-In)-
Final Electrical Test Parameters1 (Note 1), 2, 3
Group A Test Requirements1, 2, 3
Groups C and D Endpoints1
NOTE:
1. PDA applies to Subgroup 1 only.
8-14
Spec Number 511064-883
Die Characteristics
DIE DIMENSIONS:
71mils x 100mils x 19mils ± 1mils
METALLIZATION:
Type: Al, 1% Cu
Thickness: 16k
Å ± 2kÅ
GLASSIVATION:
Type: Nitride (Si
Silox Thickness: 12k
) over Silox (SiO2, 5% Phos)
3N4
Å ± 2kÅ
Nitride Thickness: 3.5kÅ ± 1.5kÅ
TRANSISTOR COUNT: 72
SUBSTRATE POTENTIAL: V-
WORST CASE CURRENT DENSITY:
0.47 x 10
5
A/cm2
Metallization Mask Layout
HA2557/883
HA-2557/883
V
YIO
V
YIO
VY+ (5)
VY- (6)
B (3)
A (4)
REF
(2) V
(1) GND
A
XIO
(16) V
B
XIO
(15) V
(13) VX+
(12) VX-
(11) V+
V- (7)
(8)
OUT
I
8-15
(10)
Z
R
Spec Number 511064-883
Test Circuits
NC
1
50Ω
REF
2
3
4
5
6
7
8
X
Y
V
OUT
NC
NC
NC
V
-15V
+
Y
FIGURE 1. AC AND TRANSIENT RESPONSE TEST CIRCUIT
16
15
NC
14
NC
13
+
V
X
X
12
11
+15V
10
NC
9
NC
HA2557/883
VY TRANSIENT RESPONSE
Vertical Scale: Top 5V/Div. Bottom: 100mV/Div.
Horizontal Scale: 20ns/Div.
Burn-In Circuit
- 15.5V
±0.5V
HA-2557/883 CERAMIC DIP
1
REF
2
NC
3
NC
4
NC
+
V
Y
5
Y
6
I
7
8
OUT
D1
0.01µF
D1 = D2 = 1N4002 OR EQUIVALENT (PER BOARD)
X
X
16
NC
15
NC
14
NC
V
+
X
13
12
0.01µF
+15.5 V
±0.5V
11
R
Z
10
9
D2
NC
8-16
Spec Number 511064-883
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