The HA-2546/883 is a monolithic, high speed, two quadrant,
analog multiplier constructed in the Intersil Dielectrically Isolated High Frequency Process. The HA-2546/883 has a voltage output with a 30MHz signal bandwidth, 300V/µs slew
rate and a 17MHz control input bandwidth. High bandwidth
and slew rate make this part an ideal component for use in
video systems. The suitability for precision video applications is demonstrated further by the 0.1dB gain flatness at
5MHz, 1.6% multiplication error, -52dB feedthrough and differential inputs with 1.2µA bias currents. The HA-2546/883
also has low differential gain (0.1% typ.) and phase (0.1
typ.) errors.
The HA-2546/883 is well suited for AGC circuits as well as
mixer applications for sonar, radar, and medical imaging
equipment. The voltage output of the HA-2546/883 simplifies
many designs by eliminating the current-to-voltage conversion stage required for current output multipliers.
Ordering Information
TEMPERATURE
PART NUMBER
HA1-2546/883-55oC to +125oC16 Lead CerDIP
HA4-2546/883-55oC to +125oC20 Lead Ceramic LCC
RANGEPACKAGE
o
• Voltage Controlled Amplifier
• Vector Generator
Pinouts
HA-2546/883
(CERDIP)
TOP VIEW
GA A
1
GND
V
REF
V
YIO
V
YIO
V
V
V
OUT
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
http://www.intersil.com or 407-727-9207
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
1. Parameters listed in Table 3 are controlled via design or process parameters and are not directly tested at final production. These parameters are lab characterized upon initial design release, or upon design changes. These parameters are guaranteed by characterization
based upon data from multiple production runs which reflect lot to lot and within lot variation.
2. Full Power Bandwidth guarantee based on Slew Rate measurement using FPBW = Slew Rate/(2πV
PEAK
).
3. Measured between 10% and 90% points.
TABLE 4. ELECTRICAL TEST REQUIREMENTS
MIL-STD-883 TEST REQUIREMENTSSUBGROUPS (SEE TABLE 1)
Interim Electrical Parameters (Pre Burn-in)1
Final Electrical Test Parameters1(Note 1), 2, 3
Group A Test Requirements1, 2, 3
Groups C and D Endpoints1
NOTE:
1. PDA applies to Subgroup 1 only.
8-5
Spec Number 511050-883
Die Characteristics
DIE DIMENSIONS:
79.9mils x 119.7mils x 19mils± 1mils
METALLIZATION:
Type: Al, 1%Cu
Thickness: 16k
Å ± 2kÅ
GLASSIVATION:
Type: Nitride (Si
Silox Thickness: 12k
) over Silox (SiO2, 5% Phos)
3N4
Å ± 1.5kÅ
Nitride Thickness: 3.5kÅ ± 1.5kÅ
WORST CASE CURRENT DENSITY:
0.72 x 10
5
A/cm
2
TRANSISTOR COUNT: 87
Metallization Mask Layout
V
REF
(2)(1)
HA2546/883
HA-2546/883
GND
GA A GA C
(15)(16)
V
B (3)
YIO
V
A (4)
YIO
+ (5)
V
Y
(14) GA B
(13) V
+
X
(12) VX-
VY- (6)
(7)(8)(9)(10)
V-
V
OUT
VZ+VZ-
8-6
(11) V+
Spec Number 511050-883
Test Circuit
L
MSR
H
K9
50Ω
50Ω
M1
K5
K6
- 15V
K7A
0.001
µF
1K
Specifications HA2546/883
G
16
15
14
13
12
11
10
9
K11K8
100Ω
G
G
V
V
V
V
V
ADJA
ADJC
ADJB
X+
X-
CC
Z-
Z+
K10
1K
V
V
GND
V
REF
ADJB
ADJA
V
V
V
V
OUT
50Ω
1
2
3
4
Y+
Y-
EE
DUT
5
6
7
8
25
µF
µF
M2
V1V2
10
1000
pF
K1
K2
1000
pF
K7B
For Detailed Information, Refer to HA-2546/883 Test Tech Brief