The EL7585 represents a multiple output regulators for use
in all large panel, TFT-LCD applications. It features a single
boost converter with integrated 3.5A FET, two positive LDOs
for V
for V
and V
ON
generation. The boost converter can be
OFF
generation, and a single negative LDO
LOGIC
programmed to operate in either P-mode or PI-mode for
improved load regulation.
The EL7585 also integrates fault protection for all four
channels. Once a fault is detected, the device is latched off
until the input supply or EN is cycled. This device also
features an integrated start-up sequence for V
then V
ON
or for V
OFF
, V
, and VON sequencing. The
BOOST
BOOST, VOFF
latter requires a single external transistor. The timing of the
start-up sequence is set using an external capacitor.
The EL7585 is specified for operation over the -40°C to
+85°C temperature range.
Ordering Information
PAR T
NUMBER
EL7585ILZ
(Note)
EL7585ILZ-T7
(Note)
EL7585ILZ-T13
(Note)
NOTE: Intersil Pb-free plus anneal products employ special Pb-free
material sets; molding compounds/die attach materials and 100%
matte tin plate termination finish, which are RoHS compliant and
compatible with both SnPb and Pb-free soldering operations. Intersil
Pb-free products are MSL classified at Pb-free peak reflow
temperatures that meet or exceed the Pb-free requirements of
IPC/JEDEC J STD-020.
PART
MARKINGPACKAGE
7585ILZ20 Ld 4x4 QFN
(Pb-free)
7585ILZ20 Ld 4x4 QFN
(Pb-free)
7585ILZ20 Ld 4x4 QFN
(Pb-free)
TA PE &
REEL
7”MDP0046
13”MDP0046
PKG.
DWG. #
-MDP0046
FN7345.2
Features
• 3.5A current limit FET options
• 3V to 5V input
• Up to 20V boost out
• 1% regulation on all outputs
•V
BOOST/VLOGIC-VOFF-VON
or V
LOGIC-VOFF-VBOOST
-
VON sequence control
• Programmable sequence delay
• Fully fault protected
,
• Thermal shutdown
• Internal soft-start
• 20 Ld QFN packages
• Pb-Free plus anneal available (RoHS Compliant)
Applications
• LCD monitors (15”+)
• LCD-TV (up to 40”+)
• Notebook displays (up to 16”)
• Industrial/medical LCD displays
Pinout
EL7585
(20 LD QFN)
TOP VIEW
PG
VDD
EN
SGND
20
19
18
17
16 FBB
CDLY
DELB
LX1
LX2
1
2
3
4
THERMAL
PAD
15
14
13
12
CINT
VREF
PGND
PGND
5
DRVP
6
7
8
DRVL
FBL
FBP
1
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 1-888-468-3774
| Intersil (and design) is a registered trademark of Intersil Americas Inc.
All other trademarks mentioned are the property of their respective owners.
Copyright Intersil Americas Inc. 2005-2006. All Rights Reserved
Maximum continuous junction temperature . . . . . . . . . . . . . . 125°C
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTES:
is measured in free air with the component mounted on a high effective thermal conductivity test board with “direct attach” features. See
1. θ
JA
Tech Brief TB379.
2. For θ
IMPORTANT NOTE: All parameters having Min/Max specifications are guaranteed. Typical values are for information purposes only. Unless otherwise noted, all tests
are at the specified temperature and are pulsed tests, therefore: T
Electrical SpecificationsV
, the “case temp” location is the center of the exposed metal pad on the package underside.
JC
= TC = T
J
= 5V, V
DD
-40°C to 85°C, unless otherwise specified.
BOOST
= 11V, I
A
LOAD
= 200mA, V
ON
= 15V, V
OFF
= -5V, V
= 2.5V, over temperature from
LOGIC
PARAMETERDESCRIPTIONCONDITIONMINTYPMAXUNIT
SUPPLY
V
S
Quiescent CurrentEnabled, LX not switching1.72.5mA
I
S
Supply Voltage35.5V
Disabled520µA
CLOCK
F
OSC
Oscillator Frequency90010001100kHz
BOOST
V
V
Boost Output Range5.520V
BOOST
FBB
Boost Feedback VoltageTA= 25°C1.1921.2051.218V
1.1881.2051.222V
V
F_FBB
V
REF
FBB Fault Trip Point0.9V
Reference VoltageTA= 25°C1.191.2151.235V
1.1871.2151.238V
V
C
REF
D
MAX
I
LXMAX
I
LEAK
r
DS(ON)
Capacitor22100nF
REF
Maximum Duty Cycle85%
Switch Current Limit3.5A
Switch Leakage CurrentVLX = 16V10µA
Switch On-Resistance160mΩ
EffBoost EfficiencySee curves92%
)Feedback Input Bias CurrentPl mode, V
I(V
FBB
/
∆V
BOOST
∆V
IN
∆V
BOOST
∆I
BOOST
∆V
BOOST
∆I
BOOST
V
CINT_T
Line RegulationC
/
Load Regulation - “P” modeC
/
Load Regulation - “PI” modeC
CINT Pl Mode Select Threshold4.74.8V
= 4.7nF, I
INT
pin strapped to VDD,
INT
50mA < I
= 4.7nF, 50mA < IO < 250mA0.1%
INT
= 1.35V50500nA
FBB
= 100mA, VIN = 3V to 5.5V0.05%/V
OUT
3%
< 250mA
LOAD
2
FN7345.2
March 9, 2006
EL7585
Electrical SpecificationsV
DD
= 5V, V
BOOST
= 11V, I
LOAD
= 200mA, V
ON
= 15V, V
OFF
= -5V, V
= 2.5V, over temperature from
LOGIC
-40°C to 85°C, unless otherwise specified. (Continued)
PARAMETERDESCRIPTIONCONDITIONMINTYPMAXUNIT
VON LDO
V
FBP
V
F_FBP
I
FBP
FBP Regulation VoltageI
FBP Fault Trip PointV
FBP Input Bias CurrentV
GMPFBP Effective TransconductanceV
/∆I(VON)VON Load RegulationI(VON) = 0mA to 20mA-0.5%
∆V
ON
I
DRVP
I
L_DRVP
V
OFF
V
FBN
V
F_FBN
I
FBN
LDO
DRVP Sink Current MaxV
DRVP Leakage CurrentV
FBN Regulation VoltageI
FNN Fault Trip PointV
FBN Input Bias CurrentV
GMNFBN Effective TransconductanceV
∆V
OFF
∆I(V
OFF
I
DRVN
I
L_DRVN
V
LOGIC
V
FBL
V
F_FBL
I
FBL
G
ML
∆V
LOGIC
∆I(V
LOGIC
I
DRVL
I
L_DRL
/
)
LDO
/
)
Load RegulationI(V
V
OFF
DRVN Source Current MaxV
DRVN Leakage CurrentV
FBL Regulation VoltageI
FBL Fault Trip PointV
FBL Input Bias CurrentV
FBL Effective TransconductanceV
Load RegulationI(V
V
LOGIC
DRVL Sink Current MaxV
I
L_DRVL
= 0.2mA, TA = 25°C1.1761.21.224V
DRVP
= 0.2mA1.1721.21.228V
I
DRVP
falling0.820.870.92V
FBP
= 1.35V-250250nA
FBP
= 25V, I
DRVP
= 1.1V, V
FBP
= 1.5V, V
FBP
= 0.2mA, TA = 25°C0.1730.2030.233V
DRVN
= 0.2mA0.1710.2030.235V
I
DRVN
rising0.380.430.48V
FBN
= 0.2V-250250nA
FBN
= -6V, I
DRVN
) = 0mA to 20mA-0.5%
OFF
= 0.3V, V
FBN
= 0V, V
FBN
= 1mA, TA = 25°C1.1761.21.224V
DRVL
= 1mA1.1741.21.226V
I
DRVL
falling0.820.870.92V
FBL
= 1.35V-500500nA
FBL
= 2.5V, I
DRVL
) = 100mA to 500mA0.5%
LOGIC
= 1.1V, V
FBL
V
= 1.5V, V
FBL
= 0.2 to 2mA50ms
DRVP
= 25V24mA
DRVP
= 35V0.15µA
DRVP
= 0.2mA to 2mA50ms
DRVN
= -6V24mA
DRVN
= -20V0.15µA
DRVN
= 1mA to 8mA200ms
DRVL
= 2.5V816mA
DRVL
= 5.5V0.15µA
DRVL
SEQUENCING
t
ON
t
SS
t
DEL1
t
DEL2
t
DEL3
I
DELB
C
DEL
Turn On D elayC
Soft-start TimeC
Delay Between A
Delay Between VON and V
Delay Between V
V
BOOST
and V
VDD
and Delayed
OFF
OFF
OFF
DELB Pull-down CurrentV
Delay Capacitor10220nF
= 0.22µF30ms
DLY
= 0.22µF2ms
DLY
C
= 0.22µF10ms
DLY
C
= 0.22µF17ms
DLY
C
= 0.22µF10ms
DLY
> 0.6V50µA
DELB
V
< 0.6V1.4mA
DELB
FAULT DETECTION
t
FAULT
Fault Time OutC
= 0.22µF50ms
DLY
3
FN7345.2
March 9, 2006
EL7585
Electrical SpecificationsV
DD
= 5V, V
BOOST
= 11V, I
LOAD
= 200mA, V
ON
= 15V, V
OFF
= -5V, V
= 2.5V, over temperature from
LOGIC
-40°C to 85°C, unless otherwise specified. (Continued)
PARAMETERDESCRIPTIONCONDITIONMINTYPMAXUNIT
OTOver-temperature Threshold140°C
I
PG
PG Pull-down CurrentVPG > 0.6V15µA
VPG < 0.6V1.7mA
LOGIC ENABLE
V
HI
V
LO
I
LOW
I
HIGH
Logic High Threshold2.2V
Logic Low Threshold0.8V
Logic Low bias Current0.21µA
Logic High bias Currentat VEN = 5V121824µA
Pin Descriptions
PIN NAMEPIN NUMBERDESCRIPTION
1CDLYA capacitor connected from this pin to GND sets the delay time for start-up sequence and sets the fault
2DELBOpen drain output for gate drive of optional V
3, 4LX1, LX2Drain of the internal N channel boost FET; for EL7586, pin 4 is not connected
5DRVPPositive LDO base drive; open drain of an internal N channel FET
6FBPPositive LDO voltage feedback input pin; regulates to 1.2V nominal
7DRVLLogic LDO base drive; open drain of an internal N channel FET
8FBLLogic LDO voltage feedback input pin; regulates to 1.2V nominal
9, 17SGNDLow noise signal ground
10DRVNNegative LDO base drive; open drain of an internal P channel FET
11FBNNegative LDO voltage feedback input pin; regulates to 0.2V nominal
12, 13PGNDPower ground, connected to source of internal N channel boost FET
14VREFBandgap voltage bypass, connect a 0.1µF to SGND
15CINTV
16FBBBoost regulator voltage feedback input pin; regulates to 1.2V nominal
18ENEnable pin, High=Enable; Low or floating=Disable
19VDDPositive supply
20PG Push-pull gate drive of optional fault protection FET, when chip is disabled or when a fault has been
timeout time
integrator output, connect capacitor to SGND for PI mode or connect to VDD for P mode
The EL7585 is a highly integrated multiple output power
solution for TFT-LCD applications. The system consists of
one high efficiency boost converter and three linearregulator controllers (V
protection functions. A block diagram is shown in Figure 18.
Table 1 lists the recommended components.
The EL7585 integrates an N-channel MOSFET boost
converter to minimize external component count and cost.
The A
VDD
, VON, V
independently set using external resistors. V
voltages require external charge pumps which are post
regulated using the integrated LDO controllers.
The main boost converter is a current mode PWM converter at
a fixed frequency of 1MHz which enables the use of low profile
inductors and multilayer ceramic capacitors. This results in a
compact, low cost power system for LCD panel design.
The EL7585 is designed for continuous current mode, but
they can also operate in discontinuous current mode at light
load. In continuous current mode, current flows continuously
in the inductor during the entire switching cycle in steady
state operation. The voltage conversion ratio in continuous
current mode is given by:
A
VDD
--------------- -
V
IN
Where D is the duty cycle of the switching MOSFET.
Figure 19 shows the block diagram of the boost regulator. It
uses a summing amplifier architecture consisting of GM
stages for voltage feedback, current feedback and slope
compensation. A comparator looks at the peak inductor
current cycle by cycle and terminates the PWM cycle if the
current limit is reached.
-------------=
1D–
1
An external resistor divider is required to divide the output
voltage down to the nominal reference voltage. Current
drawn by the resistor network should be limited to maintain
the overall converter efficiency. The maximum value of the
resistor network is limited by the feedback input bias current
and the potential for noise being coupled into the feedback
pin. A resistor network in the order of 60kΩ is recommended.
The boost converter output voltage is determined by the
following equation:
A
VDD
---------------------
×=
V
R
REF
1
R1R2+
The current through the MOSFET is limited to 3.5A peak.
This restricts the maximum output current based on the
following equation:
I
OMAXILMT
∆I
--------–
IN
L
---------
×=
V
2
O
V
Where ∆IL is peak to peak inductor ripple current, and is set by:
V
D
IN
---- -
---------
∆I
L
where f
×=
L
f
S
is the switching frequency.
S
FBB
COMPENSATION
Ifb
Iref
SLOPE
CURRENT
AMPLIFIER
GM
AMPLIFIER
REFERENCE
GENERATOR
CLOCK
LOGIC
VOLTAGE
AMPLIFIER
PWM
SHUTDOWN
& START-UP
CONTROL
BUFFER
Ifb
Iref
LX
CINT
FIGURE 19. BLOCK DIAGRAM OF THE BOOST REGULATOR
9
PGND
FN7345.2
March 9, 2006
EL7585
The following table gives typical values (margins are
considered 10%, 3%, 20%, 10%, and 15% on V
and I
V
:
OMAX
TAB LE 2 .
f
(V)VO (V)L (µH)
IN
3.396.811.040686
3.3126.810.719853
3.3156.810.527353
596.811.576797
5126.811.090686
5156.810.79902
S
(MHz)I
, VO, L, fS,
IN
OMAX
Input Capacitor
An input capacitor is used to supply the peak charging
current to the converter. It is recommended that C
IN
be
larger than 10µF. The reflected ripple voltage will be smaller
with larger C
. The voltage rating of input capacitor should
IN
be larger than maximum input voltage.
Boost Inductor
The boost inductor is a critical part which influences the
output voltage ripple, transient response, and efficiency.
Values of 3.3µH to 10µH are to match the internal slope
compensation. The inductor must be able to handle the
following average and peak current:
I
I
LAVG
I
LPKILAVG
-------------=
1D–
O
∆I
L
--------+=
2
Rectifier Diode
A high-speed diode is necessary due to the high switching
frequency. Schottky diodes are recommended because of
their fast recovery time and low forward voltage. The rectifier
diode must meet the output current and peak inductor
current requirements.
Output Capacitor
The output capacitor supplies the load directly and reduces
the ripple voltage at the output. Output ripple voltage
consists of two components: the voltage drop due to the
inductor ripple current flowing through the ESR of output
capacitor, and the charging and discharging of the output
capacitor.
V
–
OVIN
V
RIPPLEILPK
ESR
----------------------- -
V
O
For low ESR ceramic capacitors, the output ripple is
dominated by the charging and discharging of the output
I
O
----------------
C
OUT
1
---- -
××+×=
f
S
capacitor. The voltage rating of the output capacitor should
be greater than the maximum output voltage.
NOTE: Capacitors have a voltage coefficient that makes their
effective capacitance drop as the voltage across them increases.
C
in the equation above assumes the effective value of the
OUT
capacitor at a particular voltage and not the manufacturer’s stated
value, measured at zero volts.
Compensation
The EL7585 can operate in either P mode or PI mode.
Connecting the C
pin directly to VIN will enable P mode;
INT
For better load regulation, use PI mode with a 4.7nF
capacitor in series with a 10K resistor between C
INT
and
ground. This value may be reduced to improve transient
performance, however, very low values will reduce loop
stability.
Boost feedback resistors
As the boost output voltage, A
effective voltage feedback in the IC increases the ratio of
voltage to current feedback at the summing comparator
because R
decreases relative to R1. To maintain stable
2
operation over the complete current range of the IC, the
voltage feedback to the FBB pin should be reduced
proportionally, as A
is reduced, by means of a series
VDD
resistor-capacitor network (R
with a pole frequency (f
) set to approximately 10kHz for C2
p
effective = 10µF and 4kHz for C
R7 = ((1/0.1 x R2) - 1/R1)^-1
C7 = 1/(2 x 3.142 x fp x R7)
PI mode C
(C23) and R
INT
The IC is designed to operate with a minimum C23 capacitor
of 4.7nF and a minimum C
Note that, for high voltage A
ceramic capacitors (C
) reduces their effective capacitance
2
greatly; a 16V 10µF ceramic can drop to around 3µF at 15V.
To improve the transient load response of A
a resistor may be added in series with the C
larger the resistor the lower the overshoot but at the expense
of stability of the converter loop - especially at high currents.
With L = 10µH, A
= 15V, C23 = 4.7nF, C2 (effective)
VDD
should have a capacitance of greater than 10µF. R
can have values up to 5kΩ for C
up to 10K for C
Larger values of R
A
load currents less than the current limit are used. To
VDD
ensure A
VDD
(effective) up to 30µF.
2
(R7) may be possible if maximum
INT
stability, the IC should be operated at the
maximum desired current and then the transient load
response of A
maximum value of R
should be used to determine the
VDD
INT
.
, is reduced below 12V the
VDD
and C7) in parallel with R1,
7
(effective) = 30µF.
2
(R10)
INT
(effective) = 10µF.
2
, the voltage coefficient of
VDD
in PI mode,
VDD
capacitor. The
23
(effective) up to 20µF and
2
INT
(R7)
10
FN7345.2
March 9, 2006
EL7585
Operation of the DELB Output Function
An open drain DELB output is provided to allow the boost
output voltage, developed at C
(see application diagram),
2
to be delayed via an external switch (Q4) to a time after the
V
supply and negative V
BOOST
charge pump supply
OFF
have achieved regulation during the start-up sequence
shown in Figure 28. This then allows the A
VDD
and VON
supplies to start-up from 0V instead of the normal offset
voltage of V
IN-VDIODE (D1
) if Q4 were not present.
When DELB is activated by the start-up sequencer, it sinks
50µA allowing a controlled turn-on of Q4 and charge-up of
C
. C16 can be used to control the turn-on time of Q4 to
9
reduce inrush current into C
by R
and R8 can be used to limit the VGS voltage of Q4 if
9
. The potential divider formed
9
required by the voltage rating of this device. When the
voltage at DELB falls to less than 0.6V, the sink current is
increased to ~1.2mA to firmly pull DELB to 0V.
The voltage at DELB is monitored by the fault protection
circuit so that if the initial 50µA sink current fails to pull DELB
below ~0.6V after the start-up sequencing has completed,
then a fault condition will be detected and a fault time-out
ramp will be initiated on the C
capacitor (C7).
DEL
Operation of the PG Output Function
The PG output consists of an internal pull-up PMOS device
to V
, to turn-off the external Q1 protection switch and a
IN
current limited pull-down NMOS device which sinks ~15µA
allowing a controlled turn-on of Q1 gate capacitance. C
is
O
used to control how fast Q1 turns-on - limiting inrush current
into C
. When the voltage at the PG pin falls to less than
1
0.6V, the PG sink current is increased to ~1.2mA to firmly
pull the pin to 0V.
The voltage at PG is monitored by the fault protection circuit
so that if the initial 15µA sink current fails to pull PG below
~0.6V after the start-up sequencing has completed, then a
fault condition will be detected and a fault time-out ramp will
be initiated on the C
capacitor (C7).
DEL
Cascaded MOSFET Application
A 20V N-channel MOSFET is integrated in the boost
regulator. For the applications where the output voltage is
greater than 20V, an external cascaded MOSFET is needed
as shown in Figure 20. The voltage rating of the external
MOSFET should be greater than V
V
IN
LX
EL7585
FIGURE 20. CASCADED MOSFET TOPOLOGY FOR HIGH
OUTPUT VOLTAGE APPLICATIONS
Linear-Regulator Controllers (VON, V
V
)
OFF
BOOST
FB
.
LOGIC
V
BOOST
, and
The EL7585 includes three independent linear-regulator
controllers, in which two are positive output voltage (V
and V
V
LOGIC
), and one is negative. The VON, V
LOGIC
OFF
linear-regulator controller functional diagrams,
ON
, and
applications circuits are shown in Figures 21, 22, and 23
respectively.
Calculation of the Linear Regulator Base-Emitter
Resistors (R
For the pass transistor of the linear regulator, low frequency
gain (Hfe) and unity gain freq. (f
datasheet. The pass transistor adds a pole to the loop
transfer function at f
phase margin at low frequency, the best choice for a pass
device is often a high frequency low gain switching
transistor. Further improvement can be obtained by adding a
base-emitter resistor R
Block Diagram), which increase the pole frequency to:
f
*(1+ Hfe *re/RBE)/Hfe, where re=KT/qIc. So choose the
p=fT
lowest value R
enough base current (I
current (I
We will take as an example the V
Fairchild FMMT549 PNP transistor is used as the external
pass transistor, Q5 in the application diagram, then for a
maximum V
sheet indicates Hfe_min = 100.
C
, RBP and RBN)
BL
) are usually specified in the
T
/Hfe. Therefore, in order to maintain
p=fT
(RBP, RBL, RBN in the Functional
BE
in the design as long as there is still
BE
) to support the maximum output
B
).
LOGIC
operating requirement of 500mA the data
LOGIC
linear regulator. If a
11
FN7345.2
March 9, 2006
EL7585
The base-emitter saturation voltage is: Vbe_max = 1.25V
(note this is normally a Vbe ~ 0.7V, however, for the Q5
transistor an internal Darlington arrangement is used to
increase it's current gain, giving a 'base-emitter' voltage of
2xV
BE
).
(Note that using a high current Darlington PNP transistor for
Q5 requires that V
IN
> V
+ 2V. Should a lower input
LOGIC
voltage be required, then an ordinary high gain PNP
transistor should be selected for Q5 so as to allow a lower
collector-emitter saturation voltage).
For the EL7585, the minimum drive current is:
I_DRVL_min = 8mA
The minimum base-emitter resistor, R
, can now be
BL
calculated as:
R
_min = VBE_max/(I_DRVL_min - Ic/Hfe_min) =
BL
1.25V/(8mA - 500mA/100) = 417Ω
This is the minimum value that can be used - so, we now
choose a convenient value greater than this minimum value;
say 500Ω. Larger values may be used to reduce quiescent
current, however, regulation may be adversely affected, by
supply noise if R
0.9V
PG_LDOP
+
-
GMP
FIGURE 21. VON FUNCTIONAL BLOCK DIAGRAM
is made too high in value.
BL
LDO_ON
1: Np
36V
ESD
CLAMP
DRVP
FBP
+
R
BP
7kΩ
V
R
R
20kΩ
BOOST
Q3
P1
P2
LX
0.1µF
CP (TO 36V)
0.1µF
VON (TO 35V)
C
ON
LX
0.1µF
CP (TO -26V)
PG_LDON
0.4V
FIGURE 22. V
0.9V
PG_LDOL
FIGURE 23. V
-
+
GMN
-
+
GML
-
+
ESD
CLAMP
+
-
1: Nn
36V
LDO_OFF
FBN
DRVN
R
BN
3kΩ
FUNCTIONAL BLOCK DIAGRAM
OFF
LDO_LOG
DRVL
FBL
1: N1
FUNCTIONAL BLOCK DIAGRAM
LOGIC
R
BL
500Ω
R
N2
20kΩ
R
V
REF
N1
Q2
OR V
V
IN
(3V TO 6V)
R
L1
R
L2
20kΩ
V
(TO -20V)
OFF
PROT
Q5
V
LOGIC
(1.3V TO 3.6V)
0.1µF
C
OFF
C
LOG
10µF
The VON power supply is used to power the positive supply
of the row driver in the LCD panel. The DC/DC consists of an
external diode-capacitor charge pump powered from the
inductor (LX) of the boost converter, followed by a low
dropout linear regulator (LDO_ON). The LDO_ON regulator
uses an external PNP transistor as the pass element. The
onboard LDO controller is a wide band (>10MHz)
transconductance amplifier capable of 4mA drive current,
which is sufficient for up to 40mA or more output current
under the low dropout condition (forced beta of 10). Typical
V
voltage supported by EL7585 ranges from +15V to
ON
+36V. A fault comparator is also included for monitoring the
output voltage. The under-voltage threshold is set at 25%
below the 1.2V reference.
12
The V
power supply is used to power the negative
OFF
supply of the row driver in the LCD panel. The DC/DC
March 9, 2006
FN7345.2
EL7585
consists of an external diode-capacitor charge pump
powered from the inductor (LX) of the boost converter,
followed by a low dropout linear regulator (LDO_OFF). The
LDO_OFF regulator uses an external NPN transistor as the
pass element. The onboard LDO controller is a wide band
(>10MHz) transconductance amplifier capable of 4mA drive
current, which is sufficient for up to 40mA or more output
current under the low dropout condition (forced beta of 10).
Typical V
voltage supported by EL7585 ranges from -5V
OFF
to -20V. A fault comparator is also included for monitoring
the output voltage. The undervoltage threshold is set at
200mV above the 0.2V reference level.
The V
power supply is used to power the logic circuitry
LOGIC
within the LCD panel. The DC/DC may be powered directly
from the low voltage input, 3.3V or 5.0V, or it may be
powered through the fault protection switch. The
LDO_LOGIC regulator uses an external PNP transistor as
the pass element. The onboard LDO controller is a wide
band (>10MHz) transconductance amplifier capable of
16mA drive current, which is sufficient for up to 160mA or
more output current under the low dropout condition (forced
beta of 10). Typical V
ranges from +1.3V to V
voltage supported by EL7585
LOGIC
-0.2V. A fault comparator is also
DD
included for monitoring the output voltage. The undervoltage
threshold is set at 25% below the 1.2V reference.
Set-Up Output Voltage
Refer to the Typical Application Diagram, the output voltages
of V
, V
ON
equations:
OFF
, and V
are determined by the following
LOGIC
the transistor. VF is the forward-voltage of the charge pump
rectifier diode.
The number of negative charge pump stages is given by:
N
NEGATIVE
V
OUTPUTVCE
-------------------------------------------------
≥
V
INPUT
+
2VF×–
To achieve high efficiency and low material cost, the lowest
number of charge pump stages which can meet the above
requirements, is always preferred.
High Charge Pump Output Voltage (>36V)
Applications
In the applications where the charge pump output voltage is
over 36V, an external npn transistor need to be inserted into
between DRVP pin and base of pass transistor Q3 as shown
in Figure 24; or the linear regulator can control only one
stage charge pump and regulate the final charge pump
output as shown in Figure 25.
CHARGE PUMP
V
IN
VDD
NPN
OUTPUT
7kΩ
Q3
V
ON
EL7585
OR A
DRVP
CASCODE
TRANSISTOR
FBP
R
V
ONVREF
V
OFFVREFN
V
LOGICVREF
Where V
REF
×=
12
1
--------- -+
R
11
R
22
----------
V
R
×=
= 1.2V, V
REFNVREF
21
R
42
1
----------+
R
41
REFN
–()×+=
= 0.2V.
Resistor networks in the order of 250kΩ, 120kΩ and 10kΩ
are recommended for V
ON
, V
OFF
and V
LOGIC
, respectively.
Charge Pump
To generate an output voltage higher than V
multiple stages of charge pumps are needed. The number of
stage is determined by the input and output voltage. For
positive charge pump stages:
the linear regulator. It ranges from 0.3V to 1V depending on
BOOST
, single or
FIGURE 24. CASCODE NPN TRANSISTOR CONFIGURATION
FOR HIGH CHARGE PUMP OUTPUT VOLTAGE
(>36V)
LX
0.1µF
A
0.1µF
7kΩ
DRVP
EL7585
FIGURE 25. THE LINEAR REGULATOR CONTROLS ONE
FBP
STAGE OF CHARGE PUMP
0.47µF
Q3
0.1µF0.1µF
0.1µF
VDD
V
(>36V)
0.22µF
ON
13
FN7345.2
March 9, 2006
EL7585
Discontinuous/Continuous Boost Operation and
its Effect on the Charge Pumps
The EL7585 VON and V
edges to drive diode charge pumps from which LDO
regulators generate the V
appreciated that should a regular supply of LX switching
edges be interrupted, for example during discontinuous
operation at light A
VDD
affect the performance of V
depending on their exact loading conditions at the time.
To optimize V
ON/VOFF
discontinuous/continuous operation of the boost converter
can be adjusted, by suitable choice of inductor given V
V
, switching frequency and the A
OUT
be in continuous operation.
The following equation gives the boundary between
discontinuous and continuous boost operation. For
continuous operation (LX switching every clock cycle) we
require that:
I(A
_load) > D*(1-D)*VIN/(2*L*F
VDD
where the duty cycle, D = (A
For example, with V
IN
12V we find continuous operation of the boost converter can
be guaranteed for:
L = 10µH and I(A
L = 6.8µH and I(A
L = 3.3µH and I(A
VDD
VDD
VDD
architecture uses LX switching
OFF
ON
and V
supplies. It can be
OFF
boost load currents, then this may
ON
and V
regulation -
OFF
regulation, the boundary of
current loading, to
VDD
)
OSC
- VIN)/A
= 5V, F
VDD
OSC
VDD
= 1.0MHz and A
VDD
) > 61mA
) > 89mA
) > 184mA
IN
,
=
Charge Pump Output Capacitors
Ceramic capacitors with low ESR are recommended. With
ceramic capacitors, the output ripple voltage is dominated by
the capacitance value. The capacitance value can be
chosen by the following equation:
Figure 26 shows a detailed start-up sequence waveform. For
a successful power-up, there should be six peaks at V
When a fault is detected, the device will latch off until either
EN is toggled or the input supply is recycled.
If EN is L, the device is powered down. If EN is H, and the
input voltage (V
starts to charge C
) exceeds 2.5V, an internal current source
DD
to an upper threshold using a fast
DLY
ramp followed by a slow ramp. If EN is low at this point, the
C
ramp will be delayed until EN goes high.
DLY
The first four ramps on C
(two up, two down) are used to
DLY
initialize the fault protection switch and to check whether
there is a fault condition on C
DLY
or V
. If a fault is
REF
CDLY
detected, the outputs and the input protection will turn off
and the chip will power down.
If no fault is found, C
continues ramping up and down
CDLY
until the sequence is completed.
During the second ramp, the device checks the status of
V
and over temperature. At the peak of the second ramp,
REF
PG output goes low and enables the input protection PMOS
Q1. Q1 is a controlled FET used to prevent in-rush current into
V
on is controlled by C
off and disconnect the inductor from V
BOOST
before V
is enabled internally. Its rate of turn
BOOST
. When a fault is detected, M1 will turn
o
.
IN
With the input protection FET on, NODE1 (See Typical
Application Diagram) will rise to ~V
enabled so V
BOOST
rises to VIN-V
diode. Hence, there is a step at V
. Initially the boost is not
IN
through the output
DIODE
during this part of the
BOOST
start-up sequence. If this step is not desirable, an external
PMOS FET can be used to delay the output until the boost is
enabled internally. The delayed output appears at A
For EL7585, V
BOOST
and V
soft-start at the beginning
LOGIC
VDD
.
of the third ramp. The soft-start ramp depends on the value
of the C
capacitor. For C
DLY
of 220nF, the soft-start time
DLY
is ~2ms.
V
turns on at the start of the fourth peak. At the fifth
OFF
peak, the open drain o/p DELB goes low to turn on the
external PMOS Q4 to generate a delayed V
VON is enabled at the beginning of the sixth ramp. A
PG, V
, DELB and VON are checked at end of this ramp.
OFF
BOOST
output.
VDD
,
Fault Protection
During the startup sequence, prior to BOOST soft-start,
V
is checked to be within ±20% of its final value and the
REF
device temperature is checked. If either of these are not
within the expected range, the part is disabled until the
power is recycled or EN is toggled.
If C
while if C
occur and the sequence will not complete.
Once the start-up sequence is completed, the chip
continuously monitors C
FBB and PG and checks for faults. During this time, the
.
voltage on the C
fault is detected, or the EN pin is pulled low.
A fault on C
chip immediately. If a fault on any other output is detected,
C
DELAY
the upper fault threshold (typically 2.4V), at which point the
chip is disabled until the power is recycled or EN is toggled.
If the fault condition is removed prior to the end of the ramp,
the voltage on the C
is shorted low, then the sequence will not start,
DELAY
is shorted H, the first down ramp will not
DELAY
, DELB, FBP, FBL, FBN, V
DLY
capacitor remains at 1.15V until either a
DLY
, V
DELAY
or temperature will shut down the
REF
will ramp up linearly with a 5µA (typical) current to
capacitor returns to 1.15V.
DLY
REF
,
14
FN7345.2
March 9, 2006
EL7585
Typical fault thresholds for FBP, FBL, FBN and FBB are
included in the tables. PG and DELB fault thresholds are
typically 0.6V.
C
has an internal current-limited clamp to keep the
INT
voltage within its normal range. If C
boost regulator will attempt to regulate to 0V. If C
is shorted low, the
INT
INT
is
shorted H, the regulator switches to P mode.
If any of the regulated outputs (V
V
) are driven above their target levels the drive
LOGIC
BOOST
, VON, V
OFF
or
circuitry will switch off until the output returns to its expected
value.
If V
is excessively loaded, the current limit will
BOOST
prevent damage to the chip. While in current limit, the part
acts like a current source and the regulated output will drop.
If the output drops below the fault threshold, a ramp will be
initiated on C
and, provided that the fault is sustained,
DELAY
the chip will be disabled on completion of the ramp.
In some circumstances, (depending on ambient temperature
and thermal design of the board), continuous operation at
current limit may result in the over-temperature threshold
being exceeded, which will cause the part to disable
immediately.
All I/O also have ESD protection, which in many cases will
also provide overvoltage protection, relative to either ground
or V
. However, these will not generally operate unless
DD
abs max ratings are exceeded.
Component Selection for Start-Up Sequencing and
Fault Protection
The C
to stabilize the V
22nF to 1µF and should not be more than five times the
capacitor on C
The C
range from 47nF minimum to several microfarads - only
limited by the leakage in the capacitor reaching µA levels.
C
DEL
above). Note with 220nF on C
typically 50ms and the use of a larger/smaller value will vary
this time proportionally (e.g. 1µF will give a fault time-out
period of typically 230ms).
capacitor is typically set at 220nF and is required
REF
capacitor is typically 220nF and has a usable
DEL
should be at least 1/5 of the value of C
output. The range of C
REF
to ensure correct start-up operation.
DEL
the fault time-out will be
DEL
REF
REF
is from
(See
Fault Sequencing
The EL7585 has an advanced fault detection system which
protects the IC from both adjacent pin shorts during
operation and shorts on the output supplies.
A high quality layout/design of the PCB, in respect of
grounding quality and decoupling is necessary to avoid
falsely triggering the fault detection scheme - especially
during start-up. The user is directed to the layout guidelines
and component selection sections to avoid problems during
initial evaluation and prototype PCB generation.
15
FN7345.2
March 9, 2006
V
V
BOOST
CDLY
EN
V
REF
EL7585
ON
REF
PG ON
V
LOGIC
, V
VDD
A
SOFT-START
ON
OFF
V
SOFT-START
ON
DELB ON
V
FAULT DETECTED
CHIP DISABLED
V
LOGIC
V
OFF
DELAYED
V
BOOST
V
ON
t
ON
t
OS
t
DEL1
START-UP SEQUENCE
TIMED BY C
DLY
t
DEL2
NORMAL
OPERATION
FAULT
PRESENT
16
FIGURE 26. START-UP SEQUENCE
FN7345.2
March 9, 2006
EL7585
Over-Temperature Protection
An internal temperature sensor continuously monitors the
die temperature. In the event that the die temperature
exceeds the thermal trip point of 140°C, the device will shut
down.
Layout Recommendation
The device's performance including efficiency, output noise,
transient response and control loop stability is dramatically
affected by the PCB layout. PCB layout is critical, especially
at high switching frequency.
There are some general guidelines for layout:
1. Place the external power components (the input
capacitors, output capacitors, boost inductor and output
diodes, etc.) in close proximity to the device. Traces to
these components should be kept as short and wide as
possible to minimize parasitic inductance and resistance.
2. Place V
3. Minimize the length of traces carrying fast signals and
high current.
4. All feedback networks should sense the output voltage
directly from the point of load, and be as far away from LX
node as possible.
and VDD bypass capacitors close to the pins.
REF
5. The power ground (PGND) and signal ground (SGND)
pins should be connected at only one point near the main
decoupling capacitors.
6. The exposed die plate, on the underneath of the
package, should be soldered to an equivalent area of
metal on the PCB. This contact area should have multiple
via connections to the back of the PCB as well as
connections to intermediate PCB layers, if available, to
maximize thermal dissipation away from the IC.
7. To minimize the thermal resistance of the package when
soldered to a multi-layer PCB, the amount of copper track
and ground plane area connected to the exposed die
plate should be maximized and spread out as far as
possible from the IC. The bottom and top PCB areas
especially should be maximized to allow thermal
dissipation to the surrounding air.
8. A signal ground plane, separate from the power ground
plane and connected to the power ground pins only at the
exposed die plate, should be used for ground return
A two-layer demo board is available to illustrate the proper
layout implementation. A four-layer demo board can be used
to further optimize the layout recommendations.
Demo Board Layout
FIGURE 27. TOP LAYERFIGURE 28. BOTTOM LAYER
17
FN7345.2
March 9, 2006
Typical Application Diagram
EL7585
V
C
10
4.7µF
NODE 1
V
LOGIC
(2.5V)
IN
4.7µF
LX
A
L
Q
1
1nF
NODE 1
C
C
0
1
10µF
x2
PG
C
7
CDELAY
1
6.8µH
LX
FBB
D
1
46.5kΩ
R
5kΩ
Q
4
C
R
C
2
9
R
2
10µF
1MΩ
X2
1
R7 OPEN
OPEN
C
7
16
22nF
R
8
10kΩ
C
9
0.1µF
VDD
(12V)
0.22µF
10Ω
R
6
VDD
C64.7µF
R
10kΩ
7
V
REF
0.1µF
C
41
C
R
43
500Ω
Q
5
C
31
5.4kΩ
22
0.1µF
R
42
R
41
5kΩ
EN
VREF
DRVL
FBL
SGND
DELB
CINT
DRVP
FBP
DRVN
FBN
PGND
R
10
10kΩ
V
R
REF
C
C
R
12
R
20kΩ
22
R
20K
23
P
R
7kΩ
11
R
3kΩ
21
4.7nF
1nF
13
230kΩ
23
104K
Q
Q
3
C
15
0.47µF
2
C
20
4.7µF
C
14
0.1µF
C
25
0.1µF D
12
21
C
13
0.1µF
C
12
0.1µFD
C
24
0.1µF
LX
D
LX
C
0.1µF
11
11
V
ON
(15V)
V
OFF
(-5V)
NOTE: The SGND should be connected to the exposed die plate and connected to the PGND at one point only.
18
FN7345.2
March 9, 2006
QFN Package Outline Drawing
EL7585
NOTE: The package drawing shown here may not be the latest version. To check the latest revision, please refer to the Intersil website at
http://www.intersil.com/design/packages/index.asp
All Intersil U.S. products are manufactured, assembled and tested utilizing ISO9000 quality systems.
Intersil Corporation’s quality certifications can be viewed at www.intersil.com/design/quality
Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design, software and/or specifications at any time without
notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and
reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result
from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
For information regarding Intersil Corporation and its products, see www.intersil.com
19
FN7345.2
March 9, 2006
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