intersil DG406, DG407 Data Sheet

®
A A A A
A
A
A
A
DG406, DG407
Data Sheet March 13, 2006
Single 16-Channel/Differential 8-Channel, CMOS Analog Multiplexers
The DG406 and DG407 monolithic CMOS analog multiplexers are drop-in replacements for the popular DG506A and DG507A series devices. They each include an array of sixteen analog switches, a TTL and CMOS compatible digital decode circuit for channel selection, a voltage reference for logic thresholds, and an ENABLE input for device selection when several multiplexers are present.
These multiplexers feature lower signal ON resistance (<100) and faster transition time (t
TRANS
< 300ns) compared to the DG506A and DG507A. Charge injection has been reduced, simplifying sample and hold applications.
The improvements in the DG406 series are made possible by using a high voltage silicon-gate process. An epitaxial layer prevents the latch-up associated with older CMOS technologies. The 44V maximum voltage range permits controlling 30V
signals when operating with ±15V power
P-P
supplies. The sixteen switches are bilateral, equally matched for AC or
bidirectional signals. The ON resistance variation with analog signals is quite low over a ±5V analog input range.
Pinouts
DG406 (PDIP, SOIC)
V+
1 2
NC
3
NC
4
S
16
S
5
15
S
6
14
S
7
13
S
8
12
S
9
11
S
10
10
S
11
9
GND
12
NC
13 14
A
3
TOP VIEW
D
28
V-
27
S
26
8
S
25
7
S
24
6
S
23
5
S
22
4
S
21
3
20
S
2
S
19
1
EN
18 17
A
0
16
A
1
A
15
2
DG407 (PDIP, SOIC)
TOP VIEW
V+
1 2
D
B
3
NC
4
S
8B
S
5
7B
S
6
6B
S
7
5B
S
8
4B
S
9
3B
S
10
2B
S
11
1B
GND
12 13
NC
14
NC
28
D V-
27
S
26
S
25
S
24
S
23
S
22
S
21 20
S S
19
EN
18 17
A
16
A A
15
FN3116.9
Features
• ON-Resistance (Max). . . . . . . . . . . . . . . . . . . . . . . . 100
• Low Power Consumption (P
) . . . . . . . . . . . . . . . <1.2mW
D
• Fast Transition Time (Max). . . . . . . . . . . . . . . . . . . . 300ns
• Low Charge Injection
• TTL, CMOS Compatible
• Single or Split Supply Operation
Pb-Free Plus Anneal Available (RoHS Compliant)
Applications
• Battery Operated Systems
• Data Acquisition
• Medical Instrumentation
• Hi-Rel Systems
• Communication Systems
• Automatic Test Equipment
Related Literature
• Technical Brief TB363 “Guidelines for Handling and Processing Moisture Sensitive Surface Mount Devices (SMDs)”
Ordering Information
A
8 7 6 5 4 3 2 1
PART
NUMBER
DG406DJ DG406DJ -40 to 85 28 Ld PDIP E28.6 DG406DJZ
(See Note) DG406DY DG406DY -40 to 85 28 Ld SOIC M28.3 DG406DY-T DG406DY 28 Ld SOIC Tape and Reel M28.3 DG406DYZ
(See Note) DG406DYZ-T
(See Note) DG407DJ DG407DJ -40 to 85 28 Ld PDIP E28.6
0 1 2
DG407DJZ (Note)
DG407DY DG407DY -40 to 85 28 Ld SOIC M28.3 DG407DYZ
(Note)
*Pb-free PDIPs can be used for through hole wave solder processing only. They are not intended for use in Reflow solder processing applications.
NOTE: Intersil Pb-free plus anneal products employ special Pb-free material sets; molding compounds/die attach materials and 100% matte tin plate termination finish, which are RoHS compliant and compatible with both SnPb and Pb-free soldering operations. Intersil Pb-free products are MSL classified at Pb-free peak reflow temperatures that meet or exceed the Pb-free requirements of IPC/JEDEC J STD-020.
PART
MARKING
TEMP.
RANGE (°C) PACKAGE
DG406DJZ -40 to 85 28 Ld PDIP*
(Pb-free)
DG406DYZ -40 to 85 28 Ld SOIC
(Pb-free)
DG406DYZ 28 Ld SOIC Tape and Reel
(Pb-free)
DG407DJZ -40 to 85 28 Ld PDIP*
(Pb-free)
DG407DYZ -40 to 85 28 Ld SOIC
(Pb-free)
PKG.
DWG. #
E28.6
M28.3
M28.3
E28.6
M28.3
1
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 1-888-468-3774
| Intersil (and design) is a registered trademark of Intersil Americas Inc.
Copyright © Intersil Americas Inc. 2000, 2003, 2004, 2006. All Rights Reserved
All other trademarks mentioned are the property of their respective owners.
Schematic Diagram (Typical Channel)
2
FN3116.9
March 13, 2006
DG406, DG407
DG406 TRUTH TABLE
A
A
3
A
2
A
1
EN ON SWITCH
0
XXXX0 None
00001 1 00011 2 00101 3 00111 4 01001 5 01011 6 01101 7 01111 8 10001 9 10011 10 10101 11 10111 12 11001 13 11011 14 11101 15 11111 16
DG407 TRUTH TABLE
A
2
A
1
A
0
EN ON SWITCH PAIR
XXX0 None 0001 1 0011 2 0101 3 0111 4 1001 5 1011 6 1101 7 1111 8
Logic “0” = V Logic “1” = V
< 0.8V.
AL
> 2.4V.
AH
X = Don’t Care.
3
FN3116.9
March 13, 2006
DG406, DG407
Absolute Maximum Ratings Thermal Information
V+ to V- . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 44.0V
GND to V-. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25V
Digital Inputs, V
, VD (Note 1). . . . . . (V-) -2V to (V+) +2V or 20mA,
S
Whichever Occurs First
Continuous Current (Any Terminal) . . . . . . . . . . . . . . . . . . . . . 30mA
Peak Current, S or D (Pulsed 1ms, 10% Duty Cycle Max) . . . . .100mA
Thermal Resistance (Typical, Note1)
PDIP Package*. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 60
SOIC Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 75
Maximum Junction Temperature . . . . . . . . . . . . . . . . . . . . . . .150
Maximum Storage Temperature Range. . . . . . . . . . -65
Maximum Lead Temperature (Soldering 10s) . . . . . . . . . . . . .300
(PLCC and SOIC - Lead Tips Only)
Operating Conditions
Temperature Range. . . . . . . . . . . . . . . . . . . . . . . . . . -40oC to 85oC
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the device at these or any other conditions above those indicated in the operational sections of this specificat ion is not implied.
*Pb-free PDIPs can be used for through hole wave solder processing only. They are not intended for use in Reflow solder processing applications.
NOTES:
is measured with the component mounted on a low effective thermal conductivity test board in free air. See Tech Brief TB379 for details.
1. θ
JA
2. Signals on S
, DX, EN or AX exceeding V+ or V- are clamped by internal diodes. Limit diode current to maximum current ratings.
X
θ
(oC/W)
JA
o
C to 150oC
o
o
C
C
Electrical Specifications T est Conditions: V+ = +15V, V- = -15V, V
PARAMETER TEST CONDITIONS TEMP (
= 0.8V, VAH = 2.4V Unless Otherwise Specified
AL
o
C)
(NOTE 3)
MIN
(NOTE 4)
TYP
(NOTE 3)
MAX UNITS
DYNAMIC CHARACTERISTICS
Transition Time, t
TRANS
(See Figure 1) 25 - 200 300 ns
Full - - 400 ns
Break-Before-Make Interval, t
OPEN
(See Figure 3) 25 25 50 - ns
Full 10 - - ns
Enable Turn-ON Time, t
ON(EN)
(See Figure 2) 25 - 150 200 ns
Full - - 400 ns
Enable Turn-OFF Time, t
OFF(EN)
25 - 70 150 ns
Full - - 300 ns Charge Injection, Q C OFF Isolation, OIRR V
Logic Input Capacitance, C Source OFF Capacitance, C
IN
S(OFF)
= 1nF, VS = 0V, RS = 0 25 - 40 - pC
L
= 0V, RL = 1kΩ,
EN
f = 100kHz (Note 7)
25 - -69 - dB
f = 1MHz 25 - 7 - pF VEN = 0V, VS = 0V,
25 - 8 - pF
f = 1MHz
Drain OFF Capacitance, C
D(OFF)
DG406 25 - 160 - pF
VEN = 0V, VD = 0V, f = 1MHz
DG407 25 - 80 - pF
Drain ON Capacitance, C
D(ON)
DG406 25 - 180 - pF
VEN = 5V, VD = 0V, f = 1MHz
DG407 25 - 90 - pF
DIGITAL INPUT CHARACTERISTICS
Logic High Input Voltage, V Logic Low Input Voltage, V Logic High Input Current, I Logic Low Input Current, I
AL
INL
AH
INH
VA = 2.4V, 15V Full -1 - 1 µA VEN = 0V, 2.4V, VA = 0V Full -1 - 1 µA
Full 2.4 - - V
Full - - 0.8 V
ANALOG SWITCH CHARACTERISTICS
Drain-Source ON Resistance,
rDS(ON)
VD = ±10V, IS = +10mA (Note 5) 25 - 50 100
Full - - 125
Matching Between Channels,
r
DS(ON)
r
DS(ON)
VD = 10V, -10V (Note 6) 25 - 5 - %
4
FN3116.9
March 13, 2006
DG406, DG407
Electrical Specifications T est Conditions: V+ = +15V, V- = -15V, V
PARAMETER TEST CONDITIONS TEMP (
Source OFF Leakage Current, I
Drain OFF Leakage Current, I
S(OFF)
D(OFF)
VEN = 0V, VS = ±10V, V
= +10V
D
= 0.8V, VAH = 2.4V Unless Otherwise Specified (Continued)
AL
o
C)
(NOTE 3)
MIN
(NOTE 4)
TYP
(NOTE 3)
MAX UNITS
25 -0.5 0.01 0.5 nA
Full -5 - 5 nA
DG406 25 -1 0.04 1 nA
Full -40 - 40 nA
DG407 25 -1 0.04 1 nA
Full -20 - 20 nA Drain ON Leakage Current, I
D(ON)
VS = VD = ±10V (Note 5)
DG406 25 -1 0.04 1 nA
Full -40 - 40 nA
DG407 25 -1 0.04 1 nA
Full -20 - 20 nA
POWER SUPPLY CHARACTERISTICS
Positive Supply Current, I+ V
= VA = 0V or 5V
EN
(Standby)
25 - 13 30 µA
Full - - 75 µA Negative Supply Current, I- 25 -1 -0.01 - µA
Full -10 - - µA Positive Supply Current, I+ V
= 2.4V, VA = 0V
EN
(Enabled)
25 - 80 100 µA
Full - - 200 µA Negative Supply Current, I- 25 -1 -0.01 - µA
Full -10 - - µA
Electrical Specifications Single Supply Test Conditions: V+ = 12V, V- = 0V, V
Unless Otherwise Specified
PARAMETER
DYNAMIC CHARACTERISTICS
Switching Time of Multiplexer, t
Enable Turn-ON Time, t
TRANS
ON(EN)
Enable Turn-OFF Time, t
OFF(EN)
Charge Injection, Q C
TEST
CONDITIONS TEMP (
VS1 = 8V, VS8 = 0V, V
= 2.4V
IN
V
= 2.4V, V
INH
V
= 5V
S1
= 1nF, VS = 6V,
L
R
= 0
S
INL
= 0V,
o
C)
25 - 300 450 ns
25 - 250 600 ns 25 - 150 300 ns
25 - 20 - pC
= 0.8V, VAH = 2.4V,
AL
(NOTE 3)
MIN
(NOTE 4)
TYP
(NOTE 3)
MAX UNITS
5
FN3116.9
March 13, 2006
DG406, DG407
Electrical Specifications Single Supply Test Conditions: V+ = 12V, V- = 0V, V
= 0.8V, VAH = 2.4V,
AL
Unless Otherwise Specified (Continued)
PARAMETER
TEST
CONDITIONS TEMP (
o
C)
(NOTE 3)
MIN
(NOTE 4)
TYP
(NOTE 3)
MAX UNITS
ANALOG SWITCH CHARACTERISTICS
Analog Signal Range, V
ANALOG
Drain-Source ON-Resistance, r
DS(ON)
r Channels (Note 6), ∆r
Matching Between
DS(ON)
DS(ON)
Source Off Leakage Current, I Drain Off Leakage Current, I
S(OFF)
D(OFF)
VD = 3V, 10V, IS = -1mA (Note 5)
VEN = 0V, VD = 10V or 0.5V, V
= 0.5V or 10V
S
Full 0 - 12 V
25 - 90 120
25 - 5 - %
25 - 0.01 - nA
DG406 25 - 0.04 - nA DG407 25 - 0.04 - nA
Drain On Leakage Current, I
D(ON)
VS = VD = ±10V (Note 5)
DG406 25 - 0.04 - nA DG407 25 - 0.04 - nA
POWER SUPPLY CHARACTERISTICS
Positive Supply Current (I+) (Standby)
Negative Supply Current (I-) (Enabled)
= 0V or 5V,
V
EN
V
= 0V or 5V
A
25 - 13 30 µA
Full - 13 75 µA
25 -1 -0.01 - µA
Full -5 -0.01 - µA
NOTES:
3. The algebraic convention whereby the most negative value is a minimum and the most positive a maximum, is used in this data sheet.
4. Typical values are for Design Aid Only, not guaranteed nor production tested.
5. Sequence each switch ON.
6. ∆r
DS(ON)
= (r
DS(ON)
(Max) - r
DS(ON)
(Min)) ÷ r
DS(ON)
average.
7. Worst case isolation occurs on channel 8B due to proximity to the drain pin.
Test Circuits and Waveforms
+15V
V+
S2 - S
V-
-15V
6
S
1
15
S
16
D
LOGIC
INPUT
+2.4V
EN A3
A A
A
2 1
0
DG406
GND
FIGURE 1A. DG406 TEST CIRCUIT FIGURE 1B. DG407 TEST CIRCUIT
±10V
±
10V
+15V
V+
DG407
-15V
S
S
V-
+2.4V
LOGIC INPUT
V
O
35pF30050
EN
A
2
A
1
A
0
GND
= S1A - S8A, S2B - S7B, D
±10V
1B
±
8B
D
10V
B
A
V
O
35pF30050
FN3116.9
March 13, 2006
Test Circuits and Waveforms (Continued)
INPUT
V
3V 0V
S
V
S1B
0V
O
V
S8B
t
TRANS
FIGURE 1C. MEASUREMENT POINTS
FIGURE 1. TRANSITION TIME
LOGIC
SWITCH
OUTPUT
DG406, DG407
50%
ON
1
80%
S8 ON
50%
V
t
< 20ns
r
< 20ns
t
f
V
80%
S1
S8
t
TRANS
LOGIC INPUT V
A A A
EN
2 1 0
DG407
D
GND
+15V
V+
AND D
A
1B
-5V
S
B
V-
+15V
V+
A3 A
2
S2 - S
A
1
DG406
A
IN
EN
0
GND
V-
-5V
S
1
16
D
V
O
LOGIC INPUT V
IN
35pF30050
-15V = S1A - S8A, S2B - S8B, D
-15V
A
FIGURE 2A. DG406 TEST CIRCUIT FIGURE 2B. DG407 TEST CIRCUIT
tr < 20ns
< 20ns
t
LOGIC
INPUT
V
3V
0V
50%
IN
t
ON(EN)
50%
0V
f
t
OFF(EN)
SWITCH OUTPUT
V
O
V
90%
V
O
O
FIGURE 2C. MEASUREMENT POINTS
FIGURE 2. ENABLE SWITCHING TIMES
V
O
35pF30050
LOGIC
INPUT
+15V
3V
LOGIC
+2.4V
EN A3
A A
A
2 1
0
DG406 DG407
GND
V+
AND D
-15V
ALL S
D
V-
+5V (VS)
A
D,
B
V
O
35pF30050
INPUT
SWITCH
OUTPUT
V
0V
V
S
O
0V
t
OPEN
FIGURE 3A. TEST CIRCUIT FIGURE 3B. MEASUREMENT POINTS
FIGURE 3. BREAK-BEFORE-MAKE INTERVAL
7
80%
tr < 20ns
< 20ns
t
f
March 13, 2006
FN3116.9
Typical Performance Curves
DG406, DG407
160
140
120
100
±5V
80
±8V
±15V
±12V
±10V
, DRAIN VOLTAGE (V)
V
D
vs VD AND SUPPLY FIGURE 5. r
DS(ON)
V+ = 7.5V
V- = 0V
60
, ON RESISTANCE (Ω)
40
DS(ON)
r
±20V
20
0
-20 -16 -12 -8 -4 0 4 8 12 16 20
FIGURE 4. r
240
200
160
10V
120
12V
, ON-RESISTANCE (Ω)
80
DS(ON)
r
40
15V
20V
22V
80
70
125oC
60
85oC
50
25oC
40
0oC
30
, ON-RESISTANCE (Ω)
20
DS(ON)
r
10
0
-15 -10 -5 5 10015 V
, DRAIN VOLTAGE (V)
D
vs VD AND TEMPERATURE
DS(ON)
120
V+ = 15V, V- = -15V V
= -VD FOR I
S
80
VD = V
S(OPEN)
D(OFF)
FOR I
D(ON)
-40oC
-55oC V+ = 15V
V- = -15 V
40
I
0
, CURRENT (pA)
S
-40
, I
D
I
S(OFF)
DG407 I
D(ON)
DG406 I
, I
D(OFF)
D(ON)
, I
D(OFF)
-80
0
048121620
, DRAIN VOLTAGE (V)
V
D
100nA
10nA
FIGURE 6. r
V+ = 15V, V- = -15V
OR VD = ±10V
V
S
vs VD AND SUPPLY FIGURE 7. ID, IS LEAKAGE CURRENTS vs ANALOG VOLTAGE
DS(ON)
1nA
I
, I
D(ON)
100pA
, CURRENT (A)
S
, I
D
I
10pA
D(OFF)
I
S(OFF)
1pA
0.1pA
-55 -35 -15 5 25 45 65 85 105 125 TEMPERATURE (
FIGURE 8. I
, IS LEAKAGE vs TEMPERATURE FIGURE 9. SWITCHING TIMES vs BIPOLAR SUPPLIES
D
o
C)
-120
-15
-10 -5 5 10015 V
, VD, SOURCE DRAIN VOLTAGE (V)
S
350
300
250
t
TRANS
200
t
150
TIME (ns)
ON(EN)
100
t
50
0
5101520
OFF(EN)
V
, SUPPLY VOLTAGE (±V)
SUPPLY
8
FN3116.9
March 13, 2006
Typical Performance Curves (Continued)
DG406, DG407
ISOL (dB)
-140
-120
-100
-80
-60
-40
-20
0 100
1K 10K 1M100K 10M
f, FREQUENCY (Hz)
700
600
500
t
400
300
TIME (ns)
200
100
0
5101520
TRANS
t
ON(EN)
t
OFF(EN)
V+, SUPPLY VOLTAGE (V)
V- = 0V
FIGURE 10. SWITCHING TIMES vs SINGLE SUPPLY FIGURE 11. OFF ISOLATION vs FREQUENCY
10
EN = 5V, AX = 0V OR 5V
8 6 4 2 0
-2
I, CURRENT (mA)
-4
-6
-8
-10 10
100 1K 100K 1M10K 10M
f, FREQUENCY (Hz)
I+
I
GND
I-
300
V+ = 15V, V- = -15V
280 260 240 220 200 180 160
TIME (ns)
140 120 100
80 60
-55 -35 -15 5 25 45 65 85 105 125
t
TRANS
t
ON(EN)
t
OFF(EN)
TEMPERATURE (
o
C)
FIGURE 12. SUPPLY CURRENTS vs SWITCHING FREQUENCY FIGURE 13. t
3
2
,(V)
A
V
1
0
0
5101520
V
, SUPPLY VOLTAGE (±V)
SUPPLY
FIGURE 14. SWITCHING THRESHOLD vs SUPPLY VOLTAGE
9
ON/tOFF
vs TEMPERATURE
FN3116.9
March 13, 2006
Die Characteristics
DG406, DG407
DIE DIMENSIONS:
2490µm x 4560µm x 485µm
METALLIZATION:
Type: SiAl Thickness: 12k
Å ±1kÅ
Metallization Mask Layout
S
16
S
15
S
14
S
13
DG406
PASSIVATION:
Type: Nitride Thickness: 8kÅ ±1kÅ
WORST CASE CURRENT DENSITY:
4
2
9.1 x 10
DNC V+
A/cm
V-
S
5
S
7
S
6
S
5
S
S
12
S
11
S
10
S
9
GND
A
3
A
1A2
A
EN
0
4
S
3
S
2
S
1
10
FN3116.9
March 13, 2006
Die Characteristics
DG406, DG407
DIE DIMENSIONS:
2490µm x 4560µm x 485µm
METALLIZATION:
Type: SiAl Thickness: 12k
Å ±1kÅ
Metallization Mask Layout
S
8B
S
7B
S
6B
PASSIVATION:
Type: Nitride Thickness: 8kÅ ±1kÅ
WORST CASE CURRENT DENSITY:
4
2
9.1 x 10
DG407
D
B
V+
A
A/cm
V-D
S
8A
S
7A
S
6A
S
5A
S
5B
S
4B
S
3B
S
2B
S
1B
A
NCGND
1A2
ENA
0
S
4A
S
3A
S
2A
S
1A
11
FN3116.9
March 13, 2006
DG406, DG407
Dual-In-Line Plastic Packages (PDIP)
N
-C-
E1
-B-
E
C
L
e
A
e
C
C
e
B
INDEX
AREA
BASE
PLANE
SEATING
PLANE
12 3 N/2
NOTES:
1. Controlling Dimensions: INCH. In case of conflict between English and Metric dimensions, the inch dimensions control.
2. Dimensioning and tolerancing per ANSI Y14.5M-1982.
3. Symbols are defined in the “MO Series Symbol List” in Section 2.2 of Publication No. 95.
4. Dimensions A, A1 and L are measured with the package seated in JEDEC seating plane gauge GS-3.
5. D, D1, and E1 dimensions do not include mold flash or protrusions. Mold flash or protrusions shall not exceed 0.010 inch (0.25mm).
6. E and are measured with the leads constrained to be perpendic-
7. e
e
A
ular to datum .
and eC are measured at the lead tips with the leads unconstrained.
B
e
must be zero or greater.
C
-C-
8. B1 maximum dimensions do not include dambar protrusions. Dambar protrusions shall not exceed 0.010 inch (0.25mm).
9. N is the maximum number of terminal positions.
10. Corner leads (1, N, N/2 and N/2 + 1) for E8.3, E16.3, E18.3, E28.3, E42.6 will have a B1 dimension of 0.030 - 0.045 inch (0.76 - 1.14mm).
12
FN3116.9
March 13, 2006
Small Outline Plastic Packages (SOIC)
DG406, DG407
N
INDEX AREA
123
SEA TING PLANE
-A­D
e
B
0.25(0.010) C AM BS
M
E
-B-
A
-C-
0.25(0.010) BM M
H
α
µ
A1
0.10(0.004)
L
h x 45
o
NOTES:
1. Symbols are defined in the “MO Series Symbol List” in Section 2.2 of Publication Number 95.
2. Dimensioning and tolerancing per ANSI Y14.5M-1982.
3. Dimension “D” does not include mold flash, protrusions or gate burrs. Mold flash, protrusion and gate burrs shall not exceed
0.15mm (0.006 inch) per side.
4. Dimension “E” does not include interlead flash or protrusions. In­terlead flash and protrusions shall not exceed 0.25mm (0.010 inch) per side.
5. The chamfer on the body is optional. If it is not present, a visual index feature must be located within the crosshatched area.
6. “L” is the length of terminal for soldering to a substrate.
7. “N” is the number of terminal positions.
8. Terminal numbers are shown for reference only.
9. The lead width “B”, as measured 0.36mm (0.014 inch) or greater above the seating plane, shall not exceed a maximum value of
0.61mm (0.024 inch)
10. Controlling dimension: MILLIMETER. Converted inch dimen­sions are not necessarily exact.
M28.3 (JEDEC MS-013-AE ISSUE C)
28 LEAD WIDE BODY SMALL OUTLINE PLASTIC PACKAGE
INCHES MILLIMETERS
SYMBOL
A 0.0926 0.1043 2.35 2.65 -
A1 0.0040 0.0118 0.10 0.30 -
B 0.013 0.0200 0.33 0.51 9 C 0.0091 0.0125 0.23 0.32 ­D 0.6969 0.7125 17.70 18.10 3 E 0.2914 0.2992 7.40 7.60 4
e 0.05 BSC 1.27 BSC -
H 0.394 0.419 10.00 10.65 -
C
h 0.01 0.029 0.25 0.75 5 L 0.016 0.050 0.40 1.27 6
N28 287
o
α
0
o
8
o
0
o
8
Rev. 0 12/93
NOTESMIN MAX MIN MAX
-
All Intersil U.S. products are manufactured, assembled and tested utilizing ISO9000 quality systems.
Intersil Corporation’s quality certifications can be viewed at www.intersil.com/design/quality
Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design, software and/or specifications at any time without notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
For information regarding Intersil Corporation and its products, see www.intersil.com
13
FN3116.9
March 13, 2006
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