Intersil Corporation BUZ32 Datasheet

Semiconductor
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BUZ32
[ /Title (BUZ32)
Subject (9.5A, 200V,
0.400 Ohm, N­Channel Power MOS­FET)
Author ()
Key­words (Harris Semi­conduc­tor, N­Channel Power MOS­FET, TO­220AB)
Creator ()
DOCIN FO pdf­mark
Data Sheet
9.5A, 200V, 0.400 Ohm, N-Channel Power MOSFET
Formerly developmental type TA17412.
Ordering Information
PART NUMBER PACKAGE BRAND
BUZ32 TO-220AB BUZ32
NOTE: When ordering, use the entire part number.
Packaging
JEDEC TO-220AB
DRAIN (FLANGE)
October 1998 File Number 2416.1
Features
• 9.5A, 200V
•r
• SOA is Power Dissipation Limited
• Nanosecond Switching Speeds
• Linear Transfer Characteristics
• High Input Impedance
• Majority Carrier Device
• Related Literature
- TB334 “Guidelines for Soldering Surface Mount
= 0.400
DS(ON)
Components to PC Boards”
Symbol
D
G
S
SOURCE
DRAIN
GATE
[ /Page­Mode
UseOut­lines
DOC­VIEW pdfmark
1
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-800-4-HARRIS
| Copyright © Harris Corporation 1998
BUZ32
Absolute Maximum Ratings T
= 25oC, Unless Otherwise Specified
C
BUZ32 UNITS
Drain to Source Breakdown Voltage (Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .V
Drain to Gate Voltage (RGS = 20kΩ) (Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . V
Continuous Drain Current, TC = 55oC. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . I
Pulsed Drain Current (Note 3) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . I
Gate to Source Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .V
Maximum Power Dissipation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .P
Single Pulse Avalanche Energy Rating (Note 4) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .E
DS
DGR
D
DM
GS
D
AS
Linear Derating Factor. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.6 W/oC
Operating and Storage Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . TJ, T
STG
200 V 200 V
9.5 A 38 A
±20 V
75 W
150 mJ
-55 to 150
o
C
DIN Humidity Category - DIN 40040 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . E
IEC Climatic Category - DIN IEC 68-1. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 55/150/56
Maximum Temperature for Soldering
Leads at 0.063in (1.6mm) from Case for 10s. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . T
Package Body for 10s, See Techbrief 334 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . T
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operationofthe device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
L
pkg
300 260
o
C
o
C
NOTE:
1. TJ = 25oC to 125oC.
Electrical Specifications T
= 25oC, Unless Otherwise Specified
C
PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNITS
Drain to Source Breakdown Voltage BV Gate to Threshold Voltage V Zero Gate Voltage Drain Current I
DSSID
GS(TH)VGS
DSS
= 250µA, VGS = 0V 200 - - V
= VDS, ID = 1mA (Figure 9) 2.1 3 4 V TJ = 25oC, VDS = 200V, VGS = 0V - 20 250 µA TJ = 125oC, VDS = 200V, VGS = 0V - 100 1000 µA
Gate to Source Leakage Current I Drain to Source On Resistance (Note 2) r
DS(ON)ID
Forward Transconductance (Note 2) g Turn-On Delay Time t
d(ON)
Rise Time t Turn-Off Delay Time t
d(OFF)
Fall Time t Input Capacitance C Output Capacitance C Reverse Transfer Capacitance C Thermal Resistance Junction to Case R Thermal Resistance Junction to Ambient R
GSS
OSS RSS
VGS = 20V, VDS = 0V - 10 100 nA
= 4.5A, VGS = 10V (Figure 8) - 0.35 0.4
VDS = 25V, ID = 4.5A (Figure 11) 2.2 5.0 - S
fs
VCC = 30V, I RL = 10. (Figures 16, 17)
r
2.9A, V
D
= 10V, RGS = 50Ω,
GS
-3045 ns
-4060 ns
- 110 140 ns
f
VDS = 25V, VGS = 0V, f = 1MHz (Figure 10) - 1500 2000 pF
ISS
-6080 ns
- 250 400 pF
- 70 120 pF
θJC θJA
1.67
75
o o
C/W C/W
Source to Drain Diode Specifications
PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNITS
Continuous Source to Drain Current I Pulsed Source to Drain Current I Source to Drain Diode Voltage V Reverse Recovery Time t Reverse Recovery Charge Q
SD
SDM
SD
RR
TC = 25oC - - 9.5 A TC = 25oC--38A TJ = 25oC, ISD = 19A, VGS = 0V - 1.3 1.7 V TJ = 25oC, ISD = 9.5A, dISD/dt = 100A/µs,
rr
VR = 100V
- 400 - ns
- 6.0 - µC
NOTES:
2. Pulse Test: Pulse width 300µs, duty cycle 2%.
3. Repetitive rating: pulse width limited by maximum junction temperature. See Transient Thermal Impedance curve (Figure 3).
4. VDD = 20V, starting TJ = 25oC, L = 3.3µH, RG = 50, I
= 9A. (See Figures 14 and 15).
PEAK
2
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