Intersil Corporation BUZ20 Datasheet

Semiconductor
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BUZ20
[ /Title (BUZ20 )
Subject (12A, 100V,
0.200 Ohm, N­Channel Power MOS­FET)
Author ()
Key­words (Harris Semi­conduc­tor, N­Channel Power MOS­FET, TO­220AB)
Creator ()
DOCIN FO pdf­mark
Data Sheet
12A, 100V, 0.200 Ohm, N-Channel Power MOSFET
Formerly developmental type TA17411.
Ordering Information
PART NUMBER PACKAGE BRAND
BUZ20 TO-220AB BUZ20
NOTE: When ordering, use the entire part number.
Packaging
JEDEC TO-220AB
DRAIN (FLANGE)
October 1998 File Number 2254.1
Features
• 12A, 100V
•r
• SOA is Power Dissipation Limited
• Nanosecond Switching Speeds
• Linear Transfer Characteristics
• High Input Impedance
• Majority Carrier Device
• Related Literature
- TB334 “Guidelines for Soldering Surface Mount
= 0.200
DS(ON)
Components to PC Boards”
Symbol
D
G
S
SOURCE
DRAIN
GATE
[ /Page­Mode
Use­Outlines
DOC­VIEW
1
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-800-4-HARRIS
| Copyright © Harris Corporation 1998
BUZ20S
Absolute Maximum Ratings T
= 25oC, Unless Otherwise Specified
C
BUZ20 UNITS
Drain to Source Breakdown Voltage (Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .V
Drain to Gate Voltage (RGS = 20kΩ) (Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . V
DGR
Continuous Drain Current (TC = 30oC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . I
Pulsed Drain Current (Note 3) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . I
Gate to Source Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .V
Maximum Power Dissipation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .P
DS
D
DM
GS
D
100 V 100 V
12 A 48 A
±20 V
75 W
Linear Derating Factor. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.6 W/oC
Operating and Storage Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . TJ,T
STG
-55 to 150
o
C
DIN Humidity Category - DIN 40040 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . E
IEC Climatic Category - DIN IEC 68-1. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 55/150/56
Maximum Temperature for Soldering
Leads at 0.063in (1.6mm) from Case for 10s. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . T
Package Body for 10s, See Techbrief 334 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . T
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operationofthe device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
L
pkg
300 260
o
C
o
C
NOTE:
1. TJ= 25oC to 125oC.
Electrical Specifications T
= 25oC, Unless Otherwise Specified
C
PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNITS
Drain to Source Breakdown Voltage BV Gate Threshold Voltage V Zero Gate Voltage Drain Current I
DSSID
GS(TH)VGS
DSS
= 250µA, VGS = 0V 100 - - V
= VDS, ID = 1mA (Figure 9) 2.1 3 4 V TJ = 25oC, VDS = 100V, VGS = 0V - 20 250 µA TJ = 125oC, VDS = 100V, VGS = 0V - 100 1000 µA
Gate to Source Leakage Current I Drain to Source On Resistance (Note 2) r
DS(ON)ID
Forward Transconductance (Note 2) g Turn-On Delay Time t
d(ON)VCC
Rise Time t Turn-Off Delay Time t
d(OFF)
Fall Time t Input Capacitance C Output Capacitance C Reverse Transfer Capacitance C Thermal Resistance Junction to Case R Thermal Resistance Junction to Ambient R
GSS
VDS = 0V, VGS = 20V - 10 100 nA
= 6A, VGS = 10V (Figure 8) - 0.15 0.200
VDS = 25V, ID = 6A (Figure 11) 2.7 4.0 - S
fs
= 30V, I
RL = 10, (Figures 14, 15)
r
2.9A, V
D
= 10V, RGS=50Ω,
GS
-3045ns
-5075ns
- 110 140 ns
f
VDS = 25V, VGS = 0V, f = 1MHz (Figure 10) - 1500 2000 pF
ISS OSS RSS
θJC
θJA
-6080ns
- 300 500 pF
- 80 140 pF
1.67
75
o o
C/W C/W
Source to Drain Diode Specifications
PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNITS
Continuous Source to Drain Current I Pulsed Source to Drain Current I Source to Drain Diode Voltage V Reverse Recovery Time t Reverse Recovery Charge Q
SDM
TC = 25oC--12A
SD
TC = 25oC--48A TJ = 25oC, ISD = 24, VGS = 0V - 1.4 1.8 V
SD
TJ = 25oC, ISD = 12A, dISD/dt = 100A/µs,
rr
VR = 30V
RR
- 200 - ns
- 1.6 - µC
NOTES:
2. Pulse Test: Pulse width 300µs, duty cycle 2%.
3. Repetitive rating: pulse width limited by maximum junction temperature. See Transient Thermal Impedance curve (Figure 3).
2
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