Intersil Corporation ACS00MS Datasheet

April 1995

ACS00MS

Radiation Hardened

Quad 2-Input NAND Gate

Features

• 1.25 Micron Radiation Hardened SOS CMOS

• Total Dose 300K RAD (Si)

• Single Event Upset (SEU) Immunity
<1 x 10

• SEU LET Threshold >80 MEV-cm

• Dose Rate Upset >10

-10

Errors/Bit-Day (Typ)

11

RAD (Si)/s, 20ns Pulse

2

/mg

• Latch-Up Free Under Any Conditions

o

• Military Temperature Range: -55

C to +125oC

• Significant Power Reduction Compared to ALSTTL Logic

• DC Operating Voltage Range: 4.5V to 5.5V

• Input Logic Levels

- VIL = 30% of VCC Max

- VIH = 70% of VCC Min

• Input Current ≤1µA at VOL, VOH

Description

The Intersil ACS00MS is a Radiation Hardened quad 2-Input
NAND gate. A high logic level on both inputs forces the output
to a logic low state.

The ACS00MS utilizes advanced CMOS/SOS technology to
achieve high-speed operation. This device is a member of radi­ation hardened, high-speed, CMOS/SOS Logic Family.

Pinouts

14 LEAD CERAMIC DUAL-IN-LINE

MIL-STD-1835 DESIGNATOR, CDIP2-T14, LEAD FINISH C

TOP VIEW

A1

1
2

B1

3

Y1

4

A2

5

B2

6

Y2

7

GND

14 LEAD CERAMIC FLAT PACK

MIL-STD-1835 DESIGNATOR, CDFP3-F14, LEAD FINISH C

TOP VIEW

A1
B1
Y1
A2
B2
Y2

GND

1
2
3
4
5
6
7

14

VCC

13

B4

12

A4

11

Y4

10

B3

9

A3

8

Y3

14
13

12
11
10

9
8

VCC
B4
A4
Y4
B3
A3
Y3

Ordering Information

PART NUMBER TEMPERATURE RANGE SCREENING LEVEL PACKAGE

ACS00DMSR -55oC to +125oC Intersil Class S Equivalent 14 Lead SBDIP
ACS00KMSR -55oC to +125oC Intersil Class S Equivalent 14 Lead Ceramic Flatpack
ACS00D/Sample +25oC Sample 14 Lead SBDIP
ACS00K/Sample +25oC Sample 14 Lead Ceramic Flatpack
ACS00HMSR +25oC Die Die

Truth Table

INPUTS OUTPUT

An Bn Yn

LLH

LHH
HLH
HHL

NOTE: L = Logic Level Low, H = Logic Level High

CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
http://www.intersil.com or 407-727-9207

| Copyright © Intersil Corporation 1999

Functional Diagram

An

Bn

1

Spec Number

File Number 3563.1

Yn

518813

Specifications ACS00MS

Absolute Maximum Ratings Reliability Information

Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .-0.5V to +6.0V

Input Voltage Range, All Inputs . . . . . . . . . . . . .-0.5V to VCC +0.5V

DC Input Current, Any One Input. . . . . . . . . . . . . . . . . . . . ±10mA

DC Drain Current, Any One Output. . . . . . . . . . . . . . . . . . . . . . .±50mA

Storage Temperature Range (TSTG). . . . . . . . . . . -65oC to +150oC

Lead Temperature (Soldering 10s). . . . . . . . . . . . . . . . . . . . +265oC

Junction Temperature (TJ) . . . . . . . . . . . . . . . . . . . . . . . . . . +175oC

ESD Classification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Class 1

(All Voltages Reference to VSS)

CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.

Operating Conditions

Supply Voltage Range . . . . . . . . . . . . . . . . . . . . . . . +4.5V to +5.5V

Input Rise and Fall Time at 4.5V VCC (TR, TF). . . . . . .10ns/V Max

Operating Temperature Range. . . . . . . . . . . . . . . . -55oC to +125oC

TABLE 1. DC ELECTRICAL PERFORMANCE CHARACTERISTICS

Thermal Impedance θ

DIP. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 74oC/W 24oC/W

Flatpack. . . . . . . . . . . . . . . . . . . . . . . . . . 116oC/W 30oC/W

Maximum Package Power Dissipation at +125oC

DIP. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.7W

Flatpack. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.4W

Maximum Device Power Dissipation. . . . . . . . . . . . . . . . . . .(TBD)W

Gate Count . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .16 Gates

Input High Voltage. . . . . . . . . . . . . . . . . . . . . . . VCC to 70% of VCC

Input Low Voltage . . . . . . . . . . . . . . . . . . . . . . . . .0V to 30% of VCC

JA

θ

JC

(NOTE 1)

PARAMETERS SYMBOL

Supply Current ICC VCC = 5.5V,

Output Current
(Source)

Output Current
(Sink)

Output Voltage High VOH VCC = 5.5V, VIH = 3.85V,

Output Voltage Low VOL VCC = 5.5V, VIH = 3.85V,

Input Leakage
Current

IOH VCC = 4.5V, VIH = 4.5V,

IOL VCC = 4.5V, VIH = 4.5V,

IIN VCC = 5.5V, VIN = VCC or

CONDITIONS

VIN = VCC or GND

VOUT = VCC -0.4V,
VIL = 0V, (Note 2)

VOUT = 0.4V, VIL = 0V,
(Note 2)

VIL = 1.65V, IOH = -50µA

VCC = 4.5V, VIH = 3.15V,
VIL = 1.35V, IOH = -50µA

VIL = 1.65V, IOL = 50µA

VCC = 4.5V, VIH = 3.15V,
VIL = 1.35V, IOL = 50µA

GND

GROUP

A SUB-

GROUPS TEMPERATURE

1 +25oC-5µA

2, 3 +125oC, -55oC - 100 µA

1 +25oC -12 - mA

2, 3 +125oC, -55oC-8-mA

1 +25oC12-mA

2, 3 +125oC, -55oC8-mA

1, 2, 3 +25oC, +125oC, -55oC VCC -0.1 - V

1, 2, 3 +25oC, +125oC, -55oC VCC -0.1 - V

1, 2, 3 +25oC, +125oC, -55oC - 0.1 V

1, 2, 3 +25oC, +125oC, -55oC - 0.1 V

1 +25oC-±0.5 µA

2, 3 +125oC, -55oC-±1.0 µA

LIMITS

UNITSMIN MAX

Noise Immunity
Functional Test

NOTES:

1. All voltages reference to device GND.

2. Force/measure functions may be interchanged.

3. For functional tests, VO ≥4.0V is recognized as a logic “1”, and VO ≤0.5V is recognized as a logic “0”.

FN VCC = 4.5V, VIH = 3.15V,

VIL = 1.35V, (Note 3)

7, 8A, 8B +25oC, +125oC, -55oC- - V

2

Spec Number 518813

Specifications ACS00MS

TABLE 2. AC ELECTRICAL PERFORMANCE CHARACTERISTICS

GROUP

(NOTES 1, 2)

PARAMETER SYMBOL

Propagation Delay
Input to Output

NOTES:

1. All voltages referenced to device GND.

2. AC measurements assume RL = 500Ω, CL = 50pF, Input TR = TF = 3ns.

PARAMETER SYMBOL CONDITIONS NOTE TEMP

Capacitance Power
Dissipation

Input Capacitance CIN VCC = 5.0V, VIH = 5.0V,

NOTE:

1. The parameters listed in Table 3 are controlled via design or process parameters. Min and Max Limits are guaranteed but not directly
tested. These parameters are characterized upon initial design release and upon design changes which affect these characteristics.

TPHL
TPLH

TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS

CPD VCC = 5.0V, VIH = 5.0V,

CONDITIONS

VCC = 4.5V, VIH = 4.5V,
VIL = 0V

VIL = 0V, f = 1MHz

VIL = 0V, f = 1MHz

A SUB-

GROUPS TEMPERATURE

9 +25oC 2 11 ns

10, 11 +125oC, -55oC 2 12 ns

1 +25oC - 22 - pF
1 +125oC - 24 - pF
1 +25oC--10pF
1 +125oC--10pF

LIMITS

UNITSMIN MAX

LIMITS

UNITSMIN TYP MAX

TABLE 4. POST IRRADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS

(NOTE 1)

PARAMETER SYMBOL

Supply Current ICC VCC = 5.5V, VIN = VCC or GND +25oC - 0.1 mA
Output Current

(Source)
Output Current (Sink) IOL VCC = VIH = 4.5V,

Output Voltage High VOH VCC = 5.5V, VIH = 3.85V,

Output Voltage Low VOL VCC = 5.5V, VIH = 3.85V,

Input Leakage Current IIN VCC = 5.5V, VIN = VCC or GND +25oC-±1 µA
Noise Immunity

Functional Test
Propagation Delay TPHL

NOTES:

1. All voltages referenced to device GND.

2. For functional tests, VO ≥4.0V is recognized as a logic “1”, and VO ≤0.5V is recognized as a logic “0”.

IOH VCC = VIH = 4.5V,

VOUT = VCC -0.4V, VIL = 0

VOUT = 0.4V, VIL = 0

VIL = 1.65V, IOH = -50µA
VCC = 4.5V, VIH = 3.15V,

VIL = 1.35V, IOH = -50µA

VIL = 1.65V, IOL = 50µA
VCC = 4.5V, VIH = 3.15V,

VIL = 1.35V, IOL = 50µA

FN VCC = 4.5V, VIH = 3.15V,

VIL = 1.35V , (Note 2)
VCC = 4.5V, VIH = 4.5V,

TPLH

VIL = 0V

CONDITIONS TEMPERATURE

+25oC -8.0 - mA

+25oC 8.0 - mA

+25oC VCC-0.1 - V

+25oC VCC-0.1 - V

+25oC - 0.1 V

+25oC - 0.1 V

+25oC--V

+25oC 2 12 ns

RAD LIMITS

UNITSMIN MAX

TABLE 5. DELTA PARAMETERS (+25oC)

(NOTE 1)

PARAMETER SYMBOL

Supply Current ICC ±1.0 µA
Output Current IOL/IOH ±15 %

NOTE:

1. All delta calculations are referenced to 0 hour readings or pre-life readings.

DELTA LIMIT UNITS

3

Spec Number 518813