• Floating channel designed for bootstrap operation
Fully operational up to +200V
Tolerant to negative transient voltage, dV/dt immune
• Gate drive supply range from 10V to 20V
• Independent low and high side channels
• Input logicHIN/LIN active high
• Undervoltage lockout for both channels
• 3.3V and 5V input logic compatible
• CMOS Schmitt-triggered inputs with pull-down
• Matched propagation delay for both channels
• 8-Lead SOIC is also available LEAD-FREE (PbF)
Applications
• Audio Class D amplifiers
• High power DC-DC SMPS converters
• Other high frequency applications
Description
The IR2011 is a high power, high speed power MOSFET driver with independent high
and low side referenced output channels, ideal for Audio Class D and DC-DC converter
applications. L ogic inputs are compatible with standard CMOS or LSTTL output, down
to 3.0V logic. The output drivers feature a high pulse current buffer stage designed for
minimum driver cross-conduction. Propagation delays are matched to simplify use in
high frequency applications. The floating channel can be used to drive an N-channel
power MOSFET in the high side configuration which operates up to 200 volts. Proprietary HVIC and latch immune CMOS technologies enable ruggedized monolithic construction.
Typical Connection
Product Summary
V
OFFSET
IO+/-1.0A /1.0A typ.
V
OUT
t
on/off
Delay Matching20 ns max.
S) & (PbF
200V max.
10 - 20V
80 & 60 ns typ.
Packages
8-Lead SOIC
IR2011S
also available
LEAD-FREE (PbF)
8-Lead PDIP
IR2011
200V
)
45
V
V
HO
V
CC
S
B
18
TO
LOAD
HIN
LIN
COM
V
CC
(Refer to L ead Assignments for correct configuration). This/These diagram(s) show electrical connections only. Please
refer to our Application Notes and DesignTips for proper circuit board layout.
www.irf.com1
HIN
LIN
COM
LO
IR2011(S) & (PbF)
Absolute Maximum Ratings
Absolute maximum ratings indicate sustained limits beyond which damage to the device may occur. All voltage parameters are absolute voltages referenced to COM. The thermal resistance and power dissipation ratings are measured
under board mounted and still air conditions.
SymbolDefinitionMin.Max.Units
V
B
V
S
V
HO
V
CC
V
LO
V
IN
dVs/dtAllowable offset supply voltage transient (figure 2)—50V/ns
P
D
R
THJA
T
J
T
S
T
L
High side floating supply voltage-0.3250
High side floating supply offset voltageVB - 25VB + 0.3
High side floating output voltageVS - 0.3V
Low side fixed supply voltage-0.325
Low side output voltage-0.3VCC +0.3
Logic input voltage (HIN & LIN)COM -0.3V
Package power dissipation @ TA ≤ +25°C(8-lead DIP)—1.0
(8-lead SOIC)—0.625
Thermal resistance, junction to ambient(8-lead DIP)—125
(8-lead SOIC)—200
Junction temperature—150
Storage temperature-55150
Lead temperature (soldering, 10 seconds)—300
B
CC
+ 0.3
+0.3
°C/W
°C
V
W
Recommended Operating Conditions
For proper operation the device should be used within the recommended conditions. The VS and COM offset ratings
are tested with all supplies biased at 15V differential.
SymbolDefinitionMin.Max.Units
V
B
V
S
V
HO
V
CC
V
LO
V
IN
T
A
Note 1: Logic operational for VS of -4 to +200V. Logic state held for VS of -4V to -VBS.
2www.irf.com
High side floating supply absolute voltageVS + 10VS + 20
High side floating supply offset voltageNote 1200
High side floating output voltageV
Low side fixed supply voltage1020
Low side output voltage0VCC
Logic input voltage (HIN & LIN)COM5.5
Ambient temperature-40125°C
S
V
B
V
IR2011(S) & (PbF)
Dynamic Electrical Characteristics
V
(VCC, VBS) = 15V, CL = 1000 pF, T
BIAS
SymbolDefinitionMin. Typ. Max. Units Test Conditions
t
t
DM1Turn-on delay matching | t
DM2Turn-off delay matching | t
COM and are applicable to all logic input leads: HIN and LIN. The VO and IO parameters are referenced to COM and are
applicable to the respective output leads: HO or LO.
= 25°Cunless otherwise specified. The VIN, VTH and IIN parameters are referenced to