HEXFET
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®
POWER MOSFET
Provisional Data Sheet No. PD-9.551B
JANTX2N6851
JANTXV2N6851
[REF:MIL-PRF-19500/564]
[GENERIC:IRFF9230]
P-CHANNEL
-200 V olt, 0.80
HEXFET technology is the key to International
Rectifier’s advanced line of power MOSFET transistors. The efficient geometry achieves very low onstate resistance combined with high transconductance.
HEXFET transistors also feature all of the well-establish advantages of MOSFETs, such as voltage
control, very fast switching, ease of paralleling and
electrical parameter temperature stability. They are
well-suited for applications such as switching power
supplies, motor controls, inverters, choppers, audio
amplifiers, and high energy pulse circuits, and virtually any application where high reliability is required.
ΩΩ
Ω HEXFET
ΩΩ
Product Summary
Part Number BVDSS RDS(on) ID
JANTX2N6851
JANTXV2N6851
Features:
■ Avalanche Energy Rating
■ Dynamic dv/dt Rating
■ Simple Drive Requirements
■ Ease of Paralleling
■ Hermetically Sealed
Absolute Maximum Ratings
Parameter JANTX2N6851, JANTXV2N6851 Units
ID @ VGS = -10V , TC = 25°C Continuous Drain Current -4.0
ID @ VGS = -10V, TC = 100°C Continuous Drain Current -2.4
I
DM
PD @ TC = 25°C Max. Power Dissipation 25 W
V
GS
dv/dt Peak Diode Recovery dv/dt ➂ -5.0
T
J
T
STG
Pulsed Drain Current ➀ -16
Linear Derating Factor 0.20 W/K ➄
Gate-to-Source Voltage ±20 V
Operating Junction -55 to 150
Storage Temperature Range
Lead Temperature 300
Weight 0.98 (typical) g
(0.063 in. (1.6mm) from
case for 10.5 seconds)
0.80Ω-200V
-4.0A
A
V/ns
o
C
JANTX2N6851, JANTXV2N6851 Device
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Electrical Characteristics @ Tj = 25°C (Unless Otherwise Specified)
Parameter Min. Typ. Max. Units Test Conditions
BV
DSS
∆BV
R
DS(on)
V
GS(th)
g
fs
I
DSS
I
GSS
I
GSS
Q
g
Q
gs
Q
gd
t
d(on)
t
r
t
d(off)
t
f
L
D
L
S
C
iss
C
oss
C
rss
DSS
Drain-to-Source Breakdown Voltage -200 — — V VGS = 0V, ID = -1.0 mA
/∆TJTemperature Coefficient of Breakdown — -0.22 — V/°C Reference to 25°C, ID = -1.0 mA
Voltage
Static Drain-to-Source — — 0.80 VGS = -10V, ID = -2.4A
On-State Resistance — — 1.68 Ω VGS = -10V, ID = -4.0A
Gate Threshold Voltage -2.0 — -4.0 V VDS = VGS, ID = -250µA
Forward Transconductance 2.2 — — S ( )VDS > -15V, IDS = -2.4A ➃
Zero Gate Voltage Drain Current — — -25 VDS = 0.8 x Max Rating,VGS = 0V
— — -250 VDS = 0.8 x Max Rating
Gate-to-Source Leakage Forward — — -100 VGS = -20V
Gate-to-Source Leakage Reverse — — 100 VGS = 20V
Total Gate Charge 14.7 — 34.8 VGS = -10V, ID = -4.0A
Gate-to-Source Charge 0.8 — 7.0 VDS = Max. Rating x 0.5
Gate-to-Drain (“Miller”) Charge 5.0 — 17 see figures 6 and 13
Turn-On Delay T ime — — 50 VDD = -100V, ID = -4.0A,
Rise Time — — 100 RG = 7.5Ω, VGS = -10V
Turn-Off Delay Time — — 100
Fall Time — — 8 0 see figure 10
Internal Drain Inductance — 5.0 —
Internal Source Inductance — 15.0 —
Input Capacitance — 700 — VGS = 0V, VDS = -25V
Output Capacitance — 200 — f = 1.0 MHz
Reverse Transfer Capacitance — 40 — see figure 5
Ω
µA
nA
nC
ns
Measured from the
drain lead, 6mm (0.25
in.) from package to
center of die.
nH
Measured from the
source lead, 6mm
(0.25 in.) from package
to source bonding pad.
pF
VGS = 0V, TJ = 125°C
Modified MOSFET
symbol showing the
internal inductances.
➃
Source-Drain Diode Ratings and Characteristics
Parameter Min. Typ. Max. Units Test Conditions
I
Continuous Source Current (Body Diode) — — -4.0 Modified MOSFET symbol showing the
S
I
Pulse Source Current (Body Diode) ➀ — — -16 integral reverse p-n junction rectifier.
SM
V
Diode Forward Voltage — — -6.0 V Tj = 25°C, IS = -4.0A, VGS = 0V ➃
SD
t
Reverse Recovery Time — — 400 ns Tj = 25°C, IF = -4.0A, di/dt ≤ -100A/µs
rr
Q
Reverse Recovery Charge — — 4.0 µCV
RR
t
Forward Turn-On Time
on
Intrinsic turn-on time is negligible. T urn-on speed is substantially controlled by LS + LD.
Thermal Resistance
Parameter Min. Typ. Max. Units Test Conditions
R
thJC
R
thJA
Junction-to-Case — — 5.0
Junction-to-Ambient — — 175 K/W Typical socket mount
A
≤ -50V ➃
DD