International Rectifier IRFN044 Datasheet

Product Summary
Part Number BVDSS RDS(on) ID
IRFN044 60V 0.040 44A
Features:
Avalanche Energy Rating
Dynamic dv/dt Rating
Simple Drive Requirements
Ease of Paralleling
Surface Mount
Light-weight
N-CHANNEL
Provisional Data Sheet No. PD-9.1545
60 V olt, 0.040
ΩΩ
ΩΩ
HEXFET
HEXFET technology is the key to International Rectifier’s advanced line of power MOSFET transis­tors. The efficient geometry achieves very low on­state resistance combined with high transconductance.
HEXFET transistors also feature all of the well-es­tablish advantages of MOSFETs, such as voltage control, very fast switching, ease of paralleling and electrical parameter temperature stability. They are well-suited for applications such as switching power supplies, motor controls, inverters, choppers, audio amplifiers, and high energy pulse circuits.
The Surface Mount Device (SMD-1) package repre­sents another step in the continual evolution of sur­face mount technology. The SMD-1 will give designers the extra flexibility they need to increase circuit board density. International Rectifier has en­gineered the SMD-1 package to meet the specific needs of the power market by increasing the size of the termination pads, thereby enhancing thermal and electrical performance.
IRFN044
HEXFET
®
POWER MOSFET
Absolute Maximum Ratings
Parameter IRFN044 Units
ID @ VGS = 10V, TC = 25°C Continuous Drain Current 44
ID @ VGS = 10V, TC = 100°C Continuous Drain Current 27
I
DM
Pulsed Drain Current 176
PD @ TC = 25°C Max. Power Dissipation 125 W
Linear Derating Factor 1.0 W/K
V
GS
Gate-to-Source Voltage ±20 V
E
AS
Single Pulse Avalanche Energy 340 mJ
I
AR
Avalanche Current 44 A
E
AR
Repetitive Avalanche Energy 12.5 mJ
dv/dt Peak Diode Recovery dv/dt 4.5
V/ns
T
J
Operating Junction -55 to 150
T
STG
Storage Temperature Range Package Mounting Surface Temperature 300
(for 5 seconds)
Weight 2.6 (typical) g
o
C
A
Thermal Resistance
Parameter Min. Typ. Max. Units Test Conditions
R
thJC
Junction-to-Case 1.0
R
thJ-PCB
Junction-to-PC Board TBD K/W Soldered to a copper clad PC board
Source-Drain Diode Ratings and Characteristics
Parameter Min. Typ. Max. Units Test Conditions
I
S
Continuous Source Current (Body Diode) 44 Modified MOSFET symbol showing the
I
SM
Pulse Source Current (Body Diode) 176 integral reverse p-n junction rectifier.
V
SD
Diode Forward Voltage 2.5 V Tj = 25°C, IS = 44A, VGS = 0V
t
rr
Reverse Recovery Time 22 0 ns Tj = 25°C, IF = 44A, di/dt 100A/µs
Q
RR
Reverse Recovery Charge 1.6 µCV
DD
50V
t
on
Forward Turn-On Time
Intrinsic turn-on time is negligible. T urn-on speed is substantially controlled by LS + LD.
Electrical Characteristics @ Tj = 25°C (Unless Otherwise Specified)
Parameter Min. Typ. Max. Units Test Conditions
BV
DSS
Drain-to-Source Breakdown Voltage 60 V VGS = 0V, ID = 1.0 mA
BV
DSS
/TJTemperature Coefficient of Breakdown 0.68 V/°C Reference to 25°C, ID = 1.0 mA
Voltage
R
DS(on)
Static Drain-to-Source 0.040 VGS = 10V, ID = 27A On-State Resistance 0.050 VGS = 10V, ID = 44A
V
GS(th)
Gate Threshold Voltage 2.0 4 .0 V VDS = VGS, ID = 250µA
g
fs
Forward Transconductance 17 S ( )VDS > 15V, IDS = 27A
I
DSS
Zero Gate Voltage Drain Current 25 VDS = 0.8 x Max Rating,VGS = 0V
250 VDS = 0.8 x Max Rating
VGS = 0V, TJ = 125°C
I
GSS
Gate-to-Source Leakage Forward 100 VGS = 20V
I
GSS
Gate-to-Source Leakage Reverse -100 VGS = -20V
Q
g
Total Gate Charge 39 88 VGS =10V, ID = 44A
Q
gs
Gate-to-Source Charge 6.7 15 VDS = Max. Rating x 0.5
Q
gd
Gate-to-Drain (“Miller”) Charge 18 52 see figures 6 and 13
t
d(on)
Turn-On Delay Time 23 VDD = 30V , ID = 44A,
t
r
Rise Time 130 RG = 9.1, VGS = 10V
t
d(off)
Turn-Off Delay Time 81
t
f
Fall Tim e 79 see figure 10
L
D
Internal Drain Inductance 2. 0
L
S
Internal Source Inductance 4.1
C
iss
Input Capacitance 2400 VGS = 0V, VDS = 25V
C
oss
Output Capacitance 1100 f = 1.0 MHz
C
rss
Reverse Transfer Capacitance 2 30 see figure 5
IRFN044 Device
µA
nC
pF
nH
ns
Measured from the drain lead, 6mm (0.25 in.) from package to center of die.
Measured from the source lead, 6mm (0.25 in.) from package to source bonding pad.
Modified MOSFET symbol showing the internal inductances.
nA
A
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