PD - 9.1403A
IRFIZ44N
HEXFET® Power MOSFET
l Advanced Process Technology
l Isolated Package
l High Voltage Isolation = 2.5KVRMS
l Sink to Lead Creepage Dist. = 4.8mm
l Fully Avalanche Rated
G
Description
Fifth Generation HEXFETs from International Rectifier
utilize advanced processing techniques to achieve
extremely low on-resistance per silicon area. This benefit,
combined with the fast switching speed and ruggedized
device design that HEXFET Power MOSFETs are well
known for, provides the designer with an extremely efficient
and reliable device for use in a wide variety of applications.
The TO-220 Fullpak eliminates the need for additional
insulating hardware in commercial-industrial applications.
The moulding compound used provides a high isolation
capability and a low thermal resistance between the tab
and external heatsink. This isolation is equivalent to using
a 100 micron mica barrier with standard TO-220 product.
The Fullpak is mounted to a heatsink using a single clip or
by a single screw fixing.
Absolute Maximum Ratings
Parameter Max. Units
ID @ TC = 25°C Continuous Drain Current, VGS @ 10V 31
ID @ TC = 100°C Continuous Drain Current, VGS @ 10V 22 A
I
DM
PD @TC = 25°C Power Dissipation 45 W
V
GS
E
AS
I
AR
E
AR
dv/d t Peak Diode Recovery dv/dt 5.0 V/ns
T
J
T
STG
Pulsed Drain Current 160
Linear Derating Factor 0.3 W/°C
Gate-to-Source Voltage ± 20 V
Single Pulse Avalanche Energy 210 mJ
Avalanche Current 25 A
Repetitive Avalanche Energy 4.5 mJ
Operating Junction and -55 to + 175
Storage Temperature Range
Soldering Temperature, for 10 seconds 300 (1.6mm from case )
Mounting torque, 6-32 or M3 srew 10 lbf•in (1.1N•m)
Thermal Resistance
Parameter Typ. Max. Units
R
θJC
R
θJA
Junction-to-Case ––– 3.3
Junction-to-Ambient ––– 65
D
R
DS(on)
V
DSS
= 55V
= 0.024Ω
ID = 31A
S
°C/W
°C
8/25/97
IRFIZ44N
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)
Parameter Min. Typ. Max. Units Conditions
V
(BR)DSS
∆V
(BR)DSS
R
DS(on)
V
GS(th)
g
fs
I
DSS
I
GSS
Q
g
Q
gs
Q
gd
t
d(on)
t
r
t
d(off)
t
f
L
D
L
S
C
iss
C
oss
C
rss
C Drain to Sink Capacitance ––– 12 – –– ƒ = 1.0MHz
Drain-to-Source Breakdown Voltage 55 ––– ––– V VGS = 0V, ID = 250µA
/∆T
Breakdown Voltage Temp. Coefficient ––– 0.055 ––– V/°C Reference to 25°C, ID = 1mA
J
Static Drain-to-Source On-Resistance ––– ––– 0.024 Ω VGS = 10V, ID = 17A
Gate Threshold Voltage 2.0 – –– 4.0 V VDS = VGS, ID = 250µA
Forward Transconductance 17 ––– –– – S VDS = 25V, ID = 25A
Drain-to-Source Leakage Current
––– ––– 25
––– ––– 250 VDS = 44V, VGS = 0V, TJ = 150°C
Gate-to-Source Forward Leakage ––– ––– 100 V
Gate-to-Source Reverse Leakage ––– ––– -100
VDS = 55V, VGS = 0V
µA
= 20V
GS
nA
VGS = -20V
Total Gate Charge ––– ––– 65 ID = 25A
Gate-to-Source Charge ––– – –– 12 nC VDS = 44V
Gate-to-Drain ("Miller") Charge ––– ––– 27 VGS = 10V, See Fig. 6 and 13
Turn-On Delay Time ––– 7.3 – –– VDD = 28V
Rise Time ––– 69 –– – ID = 25A
Turn-Off Delay Time ––– 47 ––– RG = 12Ω
ns
Fall Time ––– 60 ––– RD = 1.1Ω, See Fig. 10
Internal Drain Inductance
Internal Source Inductance ––– –––
4.5
––– –––
7.5
Between lead,
6mm (0.25in.)
nH
from package
and center of die contact
Input Capacitance ––– 1300 ––– VGS = 0V
Output Capacitance ––– 410 ––– VDS = 25V
Reverse Transfer Capacitance ––– 150 ––– ƒ = 1.0MHz, See Fig. 5
pF
D
G
S
Source-Drain Ratings and Characteristics
Parameter Min. Typ. Max. Units Conditions
I
S
I
SM
V
SD
t
rr
Q
rr
t
on
Notes:
Repetitive rating; pulse width limited by
max. junction temperature. ( See fig. 11 )
V
DD
RG = 25Ω, I
I
SD
TJ ≤ 175°C
Continuous Source Current MOSFET symbol
(Body Diode)
Pulsed Source Current integral reverse
(Body Diode)
––– –––
––– –––
Diode Forward Voltage ––– ––– 1.3 V TJ = 25°C, IS = 17A, VGS = 0V
Reverse Recovery Time ––– 6 5 98 ns TJ = 25°C, IF = 25A
Reverse RecoveryCharge ––– 160 240 µC di/dt = 100A/µs
Forward Turn-On Time Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)
Pulse width ≤ 300µs; duty cycle ≤ 2%.
= 25V, starting TJ = 25°C, L = 470µH
= 25A. (See Figure 12)
AS
≤ 25A, di/dt ≤ 320A/µs, V
DD
≤ V
(BR)DSS
,
t=60s, ƒ=60Hz
Uses IRFZ44N data and test conditions
31
160
showing the
A
p-n junction diode.
D
G
S
IRFIZ44N
–––
1000
VGS
TOP 15V
10V
8.0V
7.0V
6.0V
5.5V
5.0V
BOTT OM 4.5V
100
10
D
I , D rain-to-Sou rce C urrent (A )
1
0.1 1 10 100
V , D rain-to-Source Voltage (V)
DS
1000
4.5V
20µs PULSE WIDTH
T
T = 25°C
J
C
1000
VGS
TOP 15V
10V
8.0V
7.0V
6.0V
5.5V
5.0V
BOTT OM 4.5V
100
4.5V
10
D
I , Drain- to-S o urce C u rrent (A )
20µs PULSE WIDTH
T
T = 175°C
C
A
1
0.1 1 10 100
V , Drain-to-So urc e V oltag e (V)
DS
J
A
Fig 2. Typical Output CharacteristicsFig 1. Typical Output Characteristics
2.5
I = 41A
D
T = 25°C
100
10
D
I , Drain-to-Source C u rrent (A )
1
45678910
V , Gate-to-Source Voltage (V)
GS
J
T = 175°C
J
V = 2 5V
DS
20µs PU LSE W IDTH
Fig 3. Typical Transfer Characteristics
2.0
1.5
1.0
(Norm a lized)
0.5
DS(on)
R , Drain -to-Sour ce O n R e sis tanc e
A
0.0
-60 -40 -20 0 20 40 60 80 100 120 140 160 180
T , Ju nc tio n T em per atu re ( °C )
J
V = 10V
GS
A
Fig 4. Normalized On-Resistance
Vs. Temperature