International Rectifier IRFIZ34N Datasheet

PD - 9.1489A
TO-220 FULLPAK
IRFIZ34N
HEXFET® Power MOSFET
l Advanced Process Technology l Isolated Package l High Voltage Isolation = 2.5KVRMS  l Sink to Lead Creepage Dist. = 4.8mm l Fully Avalanche Rated
G
Description
Fifth Generation HEXFETs from International Rectifier utilize advanced processing techniques to achieve extremely low on-resistance per silicon area. This benefit, combined with the fast switching speed and ruggedized device design that HEXFET Power MOSFETs are well known for, provides the designer with an extremely efficient and reliable device for use in a wide variety of applications.
The TO-220 Fullpak eliminates the need for additional insulating hardware in commercial-industrial applications. The moulding compound used provides a high isolation capability and a low thermal resistance between the tab and external heatsink. This isolation is equivalent to using a 100 micron mica barrier with standard TO-220 product. The Fullpak is mounted to a heatsink using a single clip or by a single screw fixing.
Absolute Maximum Ratings
Parameter Max. Units
ID @ TC = 25°C Continuous Drain Current, VGS @ 10V 21 ID @ TC = 100°C Continuous Drain Current, VGS @ 10V 15 A I
DM
PD @TC = 25°C Power Dissipation 37 W
V
GS
E
AS
I
AR
E
AR
dv/d t Peak Diode Recovery dv/dt  5.0 V/ns T
J
T
STG
Pulsed Drain Current  100
Linear Derating Factor 0.24 W/°C Gate-to-Source Voltage ± 20 V Single Pulse Avalanche Energy 110 mJ Avalanche Current 16 A Repetitive Avalanche Energy 3.7 mJ
Operating Junction and -55 to + 175 Storage Temperature Range Soldering Temperature, for 10 seconds 300 (1.6mm from case ) Mounting torque, 6-32 or M3 screw 10 lbf•in (1.1N•m)
Thermal Resistance
Parameter Typ. Max. Units
R
θJC
R
θJA
Junction-to-Case ––– 4.1 Junction-to-Ambient ––– 65
D
R
DS(on)
= 55V
DSS
= 0.04
ID = 21A
S
°C/W
°C
8/25/97
IRFIZ34N
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)
Parameter Min. Typ. Max. Units Conditions
V
(BR)DSS
V
(BR)DSS
R
DS(on)
V
GS(th)
g
fs
I
DSS
I
GSS
Q
g
Q
gs
Q
gd
t
d(on)
t
r
t
d(off)
t
f
L
D
L
S
C
iss
C
oss
C
rss
C Drain to Sink Capacitance ––– 12 – –– ƒ = 1.0MHz
Drain-to-Source Breakdown Voltage 55 ––– ––– V VGS = 0V, ID = 250µA
/T
Breakdown Voltage Temp. Coefficient ––– 0.052 ––– V/°C Reference to 25°C, ID = 1mA
J
Static Drain-to-Source On-Resistance ––– ––– 0.04 VGS = 10V, ID = 11A Gate Threshold Voltage 2.0 – –– 4.0 V VDS = VGS, ID = 250µA Forward Transconductance 6.5 ––– ––– S VDS = 25V, ID = 16A
Drain-to-Source Leakage Current
––– ––– 25
––– ––– 250 VDS = 44V, VGS = 0V, TJ = 150°C Gate-to-Source Forward Leakage ––– ––– 100 V Gate-to-Source Reverse Leakage ––– ––– -100
VDS = 55V, VGS = 0V
µA
= 20V
GS
nA
VGS = -20V Total Gate Charge ––– ––– 34 ID = 16A Gate-to-Source Charge ––– – –– 6.8 nC VDS = 44V Gate-to-Drain ("Miller") Charge ––– ––– 14 VGS = 10V, See Fig. 6 and 13  Turn-On Delay Time ––– 7.0 ––– VDD = 28V Rise Time ––– 49 –– – ID = 16A Turn-Off Delay Time ––– 31 ––– RG = 18
ns Fall Time ––– 40 ––– RD = 1.8Ω, See Fig. 10  Internal Drain Inductance
Internal Source Inductance ––– –––
4.5
––– –––
7.5
Between lead, 6mm (0.25in.)
nH
from package
and center of die contact Input Capacitance ––– 700 ––– VGS = 0V Output Capacitance ––– 240 ––– VDS = 25V Reverse Transfer Capacitance ––– 1 00 ––– ƒ = 1.0MHz, See Fig. 5
pF
D
G
S
Source-Drain Ratings and Characteristics
Parameter Min. Typ. Max. Units Conditions
I
S
I
SM
V
SD
t
rr
Q
rr
t
on
Notes:
Repetitive rating; pulse width limited by
max. junction temperature. ( See fig. 11 )
V
DD
RG = 25, I
I
SD
TJ ≤ 175°C
Continuous Source Current MOSFET symbol (Body Diode) Pulsed Source Current integral reverse (Body Diode) 
––– –––
––– –––
Diode Forward Voltage ––– ––– 1.6 V TJ = 25°C, IS = 11A, VGS = 0V Reverse Recovery Time ––– 5 7 86 ns TJ = 25°C, IF = 16A Reverse RecoveryCharge ––– 130 200 µC di/dt = 100A/µs Forward Turn-On Time Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)
Pulse width 300µs; duty cycle 2%.
= 25V, starting TJ = 25°C, L = 610µH
= 16A. (See Figure 12)
AS
16A, di/dt 420A/µs, V
DD
V
(BR)DSS
,
t=60s, ƒ=60Hz
Uses IRFZ34N data and test conditions
21
100
showing the
A
p-n junction diode.

D
G
S
IRFIZ34N
1000
VGS TOP 15V 10V
8.0V
7.0V
6.0V
5.5V
5.0V BOTT OM 4.5V
100
10
D
I , D rain-to-Sou rce C urrent (A )
1
0.1 1 10 100
V , D rain-to-Source Voltage (V)
DS
100
4.5V
20µs PULSE WIDTH
T
J
T = 25°C
C
1000
VGS TOP 15V 10V
8.0V
7.0V
6.0V
5.5V
5.0V BOTT OM 4.5V
100
10
4.5V
D
I , D rain-to-Sou rce C urrent (A )
20µs PULSE WIDTH
T
T = 175°C
J
A
1
0.1 1 10 100
V , Drain-to-So urc e V oltag e (V)
DS
C
A
Fig 2. Typical Output CharacteristicsFig 1. Typical Output Characteristics
2.4
I = 2 6A
D
T = 25°C
J
T = 175°C
J
10
D
I , Drain-to-Source C u rrent (A)
1
45678910
V , Gate-to-S o urce Voltage (V)
GS
V = 25V
DS
20µs PULSE WIDTH
Fig 3. Typical Transfer Characteristics
2.0
1.6
1.2
(N o r m a lized)
0.8
0.4
DS(on)
R , D rain-to -S ou rce O n R e sista nc e
A
0.0
-60 -40 -20 0 20 40 60 80 100 120 140 160 180
T , Ju nc tio n T em per atu re ( °C )
J
V = 10V
GS
A
Fig 4. Normalized On-Resistance
Vs. Temperature
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