International Rectifier IRF9140 Datasheet

PD - 93976A
REPETITIVE A V ALANCHE AND dv/dt RA TED IRF9140
HEXFETTRANSISTORS 100V, P-CHANNEL THRU-HOLE (TO-204AA/AE)
Product Summary
Part Number BVDSS RDS(on) ID
IRF9140 -100V 0.2 -18A
The HEXFETtechnology is the key to International Rectifier’s advanced line of power MOSFET transistors.
The efficient geometry and unique processing of this latest “State of the Art” design achieves: very low on-state resis­tance combined with high transconductance; superior re­verse energy and diode recovery dv/dt capability.
The HEXFET transistors also feature all of the well estab­lished advantages of MOSFETs such as voltage control, very fast switching, ease of parelleling and temperature stability of the electrical parameters.
They are well suited for applications such as switching power supplies, motor controls, inverters, choppers, audio amplifiers and high energy pulse circuits.
Features:
n Repetitive Avalanche Ratings n Dynamic dv/dt Rating n Hermetically Sealed n Simple Drive Requirements n Ease of Paralleling
TO-3
Absolute Maximum Ratings
Parameter Units
ID @ VGS = 0V, TC = 25°C Continuous Drain Current -1 8
ID @ VGS = 0V, TC = 100°C Continuous Drain Current -1 1
I
DM
PD @ TC = 25°C Max. Power Dissipation 12 5 W
V
GS
E
AS
I
AR
E
AR
dv/dt Peak Diode Recovery dv/dt -5.5
T
J
T
STG
For footnotes refer to the last page
Pulsed Drain Current -72
Linear Derating Factor 1. 0 W/°C Gate-to-Source Voltage ±20 V Single Pulse Avalanche Energy 500 mJ Avalanche Current -18 A Repetitive Avalanche Energy 12.5 mJ
Operating Junction -55 to 150 Storage Temperature Range Lead Temperature 300 (0.063 in. (1.6mm) from case for 10s) Weight 11.5(typical) g
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A
V/ns
o
C
01/22/01
IRF9140
Electrical Characteristics @ Tj = 25°C (Unless Otherwise Specified)
Parameter Min Typ Max Units Test Conditions
BV
DSS
BV
DS(on)
V
GS(th)
DSS
Drain-to-Source Breakdown Voltage -100 V VGS = 0V, ID = -1.0mA
/TJTemperature Coefficient of Breakdown -0.087 — V/°C Reference to 25°C, ID = -1.0mA
Voltage Static Drain-to-Source On-State 0. 2 VGS = -10V, ID = -11A Resistance — 0.23 VGS =-10V, ID = -18A Gate Threshold Voltage -2.0 -4.0 V VDS = VGS, ID = -250µA
t
C
g I
DSS
I
GSS
I
GSS
Q Q Q t
d(on)
t t
d(off)
L
fs
g gs gd
r
f
S + LD
iss oss rss
Forward Transconductance 6. 2 S ( ) VDS > -15V, IDS = -11A Zero Gate Voltage Drain Current -2 5 VDS= -80V , VGS=0V
-250 µA VDS = -80V
Gate-to-Source Leakage Forward -100 VGS = -20V Gate-to-Source Leakage Reverse 1 00 n A VGS = 20V Total Gate Charge 3 1 6 0 VGS =-10V, ID = -18A Gate-to-Source Charge 3. 7 1 3 nC VDS= -50V Gate-to-Drain (‘Miller’) Charge 7. 0 35.2 Turn-On Delay Time 3 5 VDD = -50V, ID = -18A, Rise Time 85 RG =9.1 Turn-Off Delay Time 85 Fall Time 65 Total Inductance 6. 1
Input Capacitance 1400 VGS = 0V, VDS = -25V Output Capacitance 6 00 p F f = 1.0MHz Reverse Transfer Capacitance 2 00
Source-Drain Diode Ratings and Characteristics
Parameter Min Typ Max Units Test Conditions
I
Continuous Source Current (Body Diode) - 18
S
I
Pulse Source Current (Body Diode) -72
SM
V
Diode Forward Voltage -4.2 V Tj = 25°C, IS =-18A, VGS = 0V
SD
t
Reverse Recovery Time 17 0 28 0 nS Tj = 25°C, IF = -18A, di/dt -100A/µs
rr
Q
Reverse Recovery Charge 3 .6 µC VDD -50V
RR
t
Forward Turn-On Time Intrinsic turn-on time is negligible. Turn-on speed is substantially controlled by L
on
VGS = 0V, TJ = 125°C
ns
Measured from drain lead (6mm/0.25in. from
nH
package) to source lead (6mm/0.25in. from package)
A
+ LD.
S
Thermal Resistance
Parameter Min Typ Max Units Test Conditions
thJC
thJA
Note: Corresponding Spice and Saber models are available on the G&S Website.
For footnotes refer to the last page
2 www.irf.com
Junction-to-Case 1. 0 Junction-to-Ambient — 30 Soldered to a 2” square copper-clad board
°C/W
IRF9140
Fig 2. Typical Output CharacteristicsFig 1. Typical Output Characteristics
Fig 3. Typical Transfer Characteristics
Fig 4. Normalized On-Resistance
Vs. Temperature
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