International Rectifier IRF9130 Datasheet

IRF9130
REPETITIVE A V ALANCHE AND dv/dt RA TED JANTX2N6804
HEXFETTRANSISTORS THRU-HOLE (TO-204AA/AE)
Product Summary
Part Number BVDSS RDS(on) ID
IRF9130 -100V 0.30 -11A
The HEXFETtechnology is the key to International Rectifier’s advanced line of power MOSFET transistors.
The efficient geometry and unique processing of this latest “State of the Art” design achieves: very low on-state resis­tance combined with high transconductance; superior re­verse energy and diode recovery dv/dt capability.
The HEXFET transistors also feature all of the well estab­lished advantages of MOSFETs such as voltage control, very fast switching, ease of parelleling and temperature stability of the electrical parameters.
They are well suited for applications such as switching power supplies, motor controls, inverters, choppers, audio amplifiers and high energy pulse circuits.
100V, P-CHANNEL
[REF:MIL-PRF-19500/562]
Features:
n Repetitive Avalanche Ratings n Dynamic dv/dt Rating n Hermetically Sealed n Simple Drive Requirements n Ease of Paralleling
JANTXV2N6804
TO-3
PD - 90549C
Absolute Maximum Ratings
Parameter Units
ID @ VGS = 0V, TC = 25°C Continuous Drain Current -1 1
ID @ VGS = 0V, TC = 100°C Continuous Drain Current -7.0
I
DM
PD @ TC = 25°C Max. Power Dissipation 7 5 W
V
GS
E
AS
I
AR
E
AR
dv/dt Peak Diode Recovery dv/dt -5.5
T
J
T
STG
For footnotes refer to the last page
Pulsed Drain Current -50
Linear Derating Factor 0.60 W/°C Gate-to-Source Voltage ±20 V Single Pulse Avalanche Energy 81 mJ Avalanche Current -11 A Repetitive Avalanche Energy 7.5 mJ
Operating Junction -55 to 150 Storage Temperature Range Lead Temperature 300 (0.063 in. (1.6mm) from case for 10s) Weight 11.5 (typical) g
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A
V/ns
o
C
01/22/01
IRF9130
Electrical Characteristics @ Tj = 25°C (Unless Otherwise Specified)
Parameter Min Typ Max Units Test Conditions
BV BV
V g I
I I Q Q Q t t t
t
L
DSS
GSS GSS
d(on)
r
d(off)
f
DSS
DSS
DS(on)
GS(th)
fs
g gs
gd
S + LD
iss oss rss
Drain-to-Source Breakdown Voltage -100 V VGS = 0V, ID = -1.0mA
/TJTemperature Coefficient of Breakdown -0.087 — V/°C Reference to 25°C, ID = -1.0mA
Voltage Static Drain-to-Source On-State — 0.30 VGS =-10V, ID =-7.0A Resistance — 0.35 VGS =-10V, ID =-11A Gate Threshold Voltage -2.0 — -4.0 V VDS = VGS, ID =-250µA Forward Transconductance 3 S ( ) VDS >-15V, IDS =-7.0A Zero Gate Voltage Drain Current - 25 VDS=-80V , VGS=0V
-250 VDS =-80V
VGS = 0V, TJ = 125°C Gate-to-Source Leakage Forward -100 VGS =-20V Gate-to-Source Leakage Reverse 10 0 VGS =-20V Total Gate Charge 2 9 VGS =-10V, ID=-11A Gate-to-Source Charge 7. 1 nC VDS =-50V Gate-to-Drain (‘Miller’) Charge 21 Turn-On Delay Time 6 0 VDD =-50V, ID =-11A, Rise Time 14 0 RG =7.5 Turn-Off Delay Time 140 Fall Time 1 40 Total Inductance 6. 1
Input Capacitance 8 60 VGS = 0V, VDS =25V Output Capacitance 3 50 pF f = 1.0MHz Reverse Transfer Capacitance 12 5
µA
nA
ns
nH
Measured from the center of drain pad to center of source pad
Source-Drain Diode Ratings and Characteristics
Parameter Min Typ Max Units Test Conditions
I
Continuous Source Current (Body Diode) -1 1
S
I
Pulse Source Current (Body Diode) -50
SM
V
Diode Forward Voltage -4.7 V Tj = 25°C, IS =-11A, VGS = 0V
SD
t
Reverse Recovery Time 250 nS Tj = 25°C, IF =-11A, di/dt ≤-100A/µs
rr
Q
Reverse Recovery Charge 3. 0 µc VDD -50V
RR
t
Forward Turn-On Time Intrinsic turn-on time is negligible. Turn-on speed is substantially controlled by L
on
A
S
Thermal Resistance
Parameter Min Typ Max Units Test Conditions
thJC
thJA
For footnotes refer to the last page
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Junction to Case 1.67 Junction-to-Ambient — 30 soldered to a 2” square copper-clad board
°C/W
+ LD.
IRF9130
Fig 2. Typical Output CharacteristicsFig 1. Typical Output Characteristics
Fig 3. Typical Transfer Characteristics
Fig 4. Normalized On-Resistance
Vs. Temperature
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