International Rectifier IRF7822 Datasheet

HEXFET® Power MOSFET for DC-DC Converters
N-Channel Application-Specific MOSFETs
Ideal for CPU Core DC-DC Conv erters
Low Conduction Losses
Low Switching Losses
Description
This new device employs advanced HEXFET Power MOSFET technology to achieve an unprecedented balance of on-resistance and gate charge. The reduced conduction and switching losses make it ideal for high efficiency DC-DC converters that power the latest generation of microprocessors.
The IRF7822 has been optimized for all parameters that are critical in synchronous buck converters including R
, gate charge and Cdv/dt-induced turn-on immunity .
DS(on)
The IRF7822 offers particulary low R dt immunity for synchronous FET applications.
The package is designed for vapor phase, infra-red, convection, or wave soldering techniques. Power dissipation of greater than 3W is possible in a typical PCB mount application.
and high Cdv/
DS(on)
PD - 94279
IRF7822
1
S
2
S
3
S
4
SO-8
DEVICE CHARACTERISTICSU
IRF7822
R
(on)
DS
Q
G
Q
sw
Q
oss
5.0m 44nC 12nC 27nC
Top View
A
8
D
7
D
6
D
5
DG
Absolute Maximum Ratings
Parameter Symbol IRF7822 Units
Drain-Source Voltage V Gate-Source Voltage V Continuous Drain or Source T Current (V
4.5V) TA = 70°C 13 A
GS
= 25°C I
Pulsed Drain CurrentQ I
Power Dissipation T
= 25°CP
T
= 70°C 3.0
A
Junction & Storage Temperature Range T Continuous Source Current (Body Diode) I Pulsed Source CurrentQ I
DS
GS
D
DM
D
J, TSTG
S
SM
30 V
±12
18
150
3.1 W
–55 to 150 °C
3.8 A
150
Thermal Resistance
Parameter Max. Units
Maximum Junction-to-AmbientS R Maximum Junction-to-Lead R
θJA
θJL
40 °C/W 20 °C/W
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07/11/01
IRF7822
Electrical Characteristics
Parameter Min Typ Max Units Conditions
Drain-to-Source BV Breakdown Voltage
Static Drain-Source R on Resistance
Gate Threshold Voltage V Drain-Source Leakage I
Current
Current* 150 µA V
Gate-Source Leakage I Current
DSS
GSS
Total Gate Chg Cont FET Q Total Gate Chg Sync FET Q Pre-Vth Q
Gate-Source Charge Post-Vth Q
Gate-Source Charge Gate to Drain Charge Q Switch Chg(Q
+ Qgd) Q
gs2
Output Charge Q Gate Resistance R Turn-on Delay Time t Rise Time t
d (on)
r
Tur n-off Delay Time td Fall Time t
f
Input Capacitance C Output Capacitance C Reverse Transfer Capacitance C
30 –– VVGS = 0V, ID = 250µA
DSS
DS
GS(th)
(on)
5.0 6.5 m VGS = 4.5V, ID = 15AR
1.0 V VDS = VGS,ID = 250µA 30 VDS = 24V, VGS = 0
DS
Tj = 100°C
±100 nA VGS = ±12V
G
G
GS1
GS2
GD
sw
oss
G
44 60 VGS=5.0V, ID=15A, VDS=16V 38 VGS = 5.0V, VDS< 100mV 13 VDS = 16V, ID = 15A
3.0 nC
9.0 12 27 VDS = 16V, VGS = 0
1.5 15 VDD = 16V, ID = 15A
5.5 ns VGS = 5.0V
(off)
22 Clamped Inductive Load 12
iss
oss
rss
5500 – – 1000 pF VDS = 16V, VGS = 0 – 300
= 24V, VGS = 0,
Source-Drain Rating & Characteristics
Parameter Min Typ Max Units Conditions
Diode Forward V Voltage*
Reverse Recovery Q ChargeT
Reverse Recovery Q
SD
rr
rr(s)
1.0 V IS = 15AR, VGS = 0V
120 nC di/dt ~ 700A/µs
VDS = 16V, VGS = 0V, IS = 15A
108 nC di/dt = 700A/µs Charge (with Parallel (with 10BQ040) Schottky)T VDS = 16V, VGS = 0V, IS = 15A
Notes:
Q Repetitive rating; pulse width limited by max. junction temperature . R Pulse width 400 µs; duty cycle 2%. S When mounted on 1 inch square copper board T Typ = measured - Q UTypical values of RDS(on) measured at VGS = 4.5V, QG, QSW and Q
measured at VGS = 5.0V , IF = 15A.
oss
OSS
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