• N-Channel Application-Specific MOSFETs
• Ideal for CPU Core DC-DC Converters
• Low Conduction Losses
• Low Switching Losses
• Minimizes Parallel MOSFETs for high current
applications
Description
This new device employs advanced HEXFET Power
MOSFET technology to achieve an unprecedented
balance of on-resistance and gate charge. The reduced
conduction and switching losses make it ideal for high
efficiency DC-DC converters that power the latest
generation of microprocessors.
SO-8
IRF7811AV
PD-94009
IRF7811A V
S
S
S
1
2
3
4
Top View
A
8
D
7
D
6
D
5
DG
The IRF7811AV has been optimized for all parameters
that are critical in synchronous buck converters including
, gate charge and Cdv/dt-induced turn-on immunity .
R
DS(on)
The IRF7811AV offers an extremely low combination of
Qsw & R
synchronous FET applications.
for reduced losses in both control and
DS(on)
The package is designed for vapor phase, infra-red,
convection, or wave soldering techniques. Power
dissipation of greater than 2W is possible in a typical
DEVICE CHARACTERISTICS
IRF7811AV
R
(on)
DS
Q
G
Q
sw
Q
oss
11mΩ
17nC
6.7nC
8.1nC
PCB mount application.
Absolute Maximum Ratings
Parameter Symbol IRF7811AV Units
Drain-Source Voltage V
Gate-Source Voltage V
Continuous Drain or Source T
Current (V
≥ 4.5V) TL = 90°C 11.8 A
GS
= 25°C I
A
Pulsed Drain Current I
Power Dissipation T
= 25°C P
A
T
= 90°C 3.0
L
Junction & Storage Temperature Range T
Continuous Source Current (Body Diode) I
Pulsed Source Current I
DS
GS
D
DM
D
J, TSTG
S
SM
30 V
±20
10.8
100
2.5 W
–55 to 150 °C
2.5 A
50
Thermal Resistance
Parameter Max. Units
Maximum Junction-to-Ambient R
Maximum Junction-to-Lead R
θJA
θJL
50 °C/W
20 °C/W
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12/13/00
IRF7811AV
Electrical Characteristics
Parameter Min Typ Max Units Conditions
Drain-to-Source BV
Breakdown Voltage
Static Drain-Source R
on Resistance
Gate Threshold Voltage V
Drain-Source Leakage I
Current
DSS
Current* 100 µA V
Gate-Source Leakage I
Current
Total Gate Chg Cont FET Q
Total Gate Chg Sync FET Q
Pre-Vth Q
Gate-Source Charge
Post-Vth Q
Gate-Source Charge
Gate to Drain Charge Q
Switch Chg(Q
+ Qgd) Q
gs2
Output Charge Q
Gate Resistance R
Turn-on Delay Time t
Rise Time t
Turn-off Delay Time td
Fall Time t
Input Capacitance C
Output Capacitance C
Reverse Tr ansfer Capacitance C
GSS
d (on)
r
f
Source-Drain Rating & Characteristics
Parameter Min Typ Max Units Conditions
Diode Forward V
Voltage
Reverse Recovery Q
Charge
Reverse Recovery Q
Charge (with Parallel (with 10BQ040)
Schottky) VDS = 16V, VGS = 0V, IS = 15A
Notes:
Repetitive rating; pulse width limited by max. junction temperature.
Pulse width ≤ 400 µs; duty cycle ≤ 2%.
When mounted on 1 inch square copper board, t < 10 sec.
T yp = measured - Q
Typical values of RDS(on) measured at VGS = 4.5V, QG, QSW and Q
30 – – V VGS = 0V, ID = 250µA
DSS
DS
GS(th)
(on)
11 14 mΩ VGS = 4.5V, ID = 15A
1.0 V VDS = VGS,ID = 250µA
20 VDS = 24V, VGS = 0
DS
Tj = 100°C
±100 nA VGS = ±20V
G
G
GS1
GS2
GD
sw
oss
G
17 26 VGS=5V, ID=15A, VDS=24V
14 21 VGS = 5V, VDS< 100mV
3.4 VDS = 16V, ID = 15A
1.6 nC
5.1
6.7
8.1 12 VDS = 16V, VGS = 0
2.2 Ω
8.6 VDD = 16V, ID = 15A
21 ns VGS = 5V
(off)
43 Clamped Inductive Load
10
– 1801 –
iss
– 723 – pF VDS = 16V, VGS = 0
oss
rss
SD
–46–
rr
1.3 V IS = 15A, VGS = 0V
50 nC di/dt ~ 700A/µs
VDS = 16V, VGS = 0V, IS = 15A
rr(s)
oss
43 nC di/dt = 700A/µs
= 24V, VGS = 0,
measured at VGS = 5.0V, IF = 15A.
OSS
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