Intel Corporation G28F016SC-150, G28F016SC-120, G28F008SC-150, G28F008SC-120 Datasheet

E
December 1997
SmartVoltage FlashFile™ MEMORY FAMILY
4, 8, AND 16 MBIT
28F004SC, 28F008SC, 28F016SC
Includes Commercial and Extended Temperature Specifications
n
SmartVoltage Technology
2.7 V (Read-Only), 3.3 V or 5 V V
and 3.3 V, 5 V, or 12 V V
n
High-Performance
4, 8 Mbit 85 ns Read Access Time16 Mbit 95 ns Read Access Time
n
Enhanced Data Protection Features
Absolute Protection with VFlexible Block LockingBlock Write Lockout during Power
Transitions
n
Enhanced Automated Suspend Options
Program Suspend to ReadBlock Erase Suspend to ProgramBlock Erase Suspend to Read
n
Industry-Standard Packaging
40-Lead TSOP, 44-Lead PSOP
and 40 Bump µBGA* CSP
PP
PP
BYTE-WIDE
n
n
= GND
n
n
n n
PRELIMINARY
High-Density 64-Kbyte Symmetrical Erase Block Architecture
4 Mbit: Eight Blocks8 Mbit: Sixteen Blocks16 Mbit: Thirty-Two Blocks
Extended Cycling Capability
100,000 Block Erase Cycles
Low Power Management
Deep Power-Down Mode Automatic Power Savings Mode
Decreases I
Automated Program and Block Erase
Command User InterfaceStatus Register
SRAM-Compatible Write Interface
ETOX™ V Nonvolatile Flash Technology
in Static Mode
Intel’s byte-wide SmartVolt age FlashFile™ memory family renders a variet y of density offeri ngs in the same package. The 4-, 8-, and 16-Mbit byte-wide FlashFile memories provide high-density, low-cost, nonv olatile, read/write storage solutions for a wide range of applications. Thei r symmetrically-blocked architecture, fl exible voltage, and extended cy cling provide highly flexible components suitable for resident flash arrays , SIMMs, and memory cards. Enhanced suspend capabilities provide an ideal solution for code or data storage applications. For secure code storage applications, such as networking, where code is either directly executed out of flash or downl oaded to DRAM, the 4-, 8-, and 16-Mbit FlashFile mem ories offer three lev els of protection: absolute protection with V block locking. These alternatives give designers ultimate control of their code security needs.
This family of products is manufactured on Intel’s 0.4 µm ETOX™ V process technology. They come in industry-standard packages: the 40-lead TSOP, ideal for board-constrained applications, and the rugged 44-lead PSOP. Based on the 28F008S A architecture, the byte-wide SmartVol tage FlashFile memory family enables quick and easy upgrades for designs that demand state-of-the-art technology.
at GND, selective hardware block locking, or flexible software
PP
Order Number: 290600-003
Information in this document is provided in connection with Intel products. No license, express or implied, by estoppel or otherwise, to any intellectual property rights is granted by this document. Except as provided in Intel’s Terms and Conditions of Sale for such products, Intel assumes no liability whatsoever, and Intel disclaims any express or implied warranty, relating to sale and/or use of Intel products including liability or warranties relating to fitness for a particular purpose, merchantability, or infringement of any patent, copyright or other intellectual property right. Intel products are not intended for use in medical, life saving, or life sustaining applications.
Intel may make changes to specifications and product descriptions at any time, without notice. The 28F004SC, 28F008SC, 28F016SC may contain design defects or errors known as errata. Current characterized errata are
available on request. *Third-party brands and names are the property of their respective owners. Contact your local Intel sales office or your distributor to obtain the latest specifications and before placing your product order. Copies of documents which have an ordering number and are referenced in this document, or other Intel literature, may be
obtained from:
Intel Corporation P.O. Box 5937 Denver, CO 80217-9808
or call 1-800-548-4725
or visit Intel’s Website at http://www.intel.com
COPYRIGHT © INTEL CORPORATION 1996, 1997 CG-041493
E BYTE-WIDE SmartVoltage FlashFile™ MEMORY FAMILY

CONTENTS

PAGE PAGE
1.0 INTRODUCTION .............................................5
1.1 New Features...............................................5
1.2 Product Overview.........................................5
1.3 Pinout and Pin Description...........................6
2.0 PRINCIPLES OF OPERATION .....................12
2.1 Data Protection ..........................................13
3.0 BUS OPERATION.........................................13
3.1 Read..........................................................13
3.2 Output Disable...........................................13
3.3 Standby......................................................13
3.4 Deep Power-Down.....................................13
3.5 Read Identifier Codes Operation................14
3.6 Write ..........................................................14
4.0 COMMAND DEFINITIONS............................14
4.1 Read Array Command................................17
4.2 Read Identifier Codes Command...............17
4.3 Read Status Register Command................17
4.4 Clear Status Register Command................17
4.5 Block Erase Command ..............................17
4.6 Program Command....................................18
4.7 Block Erase Suspend Command................18
4.8 Program Suspend Command.....................19
4.9 Set Block and Master Lock-Bit Commands 19
4.10 Clear Block Lock-Bits Command..............20
6.0 ELECTRICAL SPECIFICATIONS..................30
6.1 Absolute Maximum Ratings........................30
6.2 Commercial Temperature Operating
Conditions.................................................30
6.3 Capacitance...............................................30
6.4 DC Characteristics—Commercial
Temperature..............................................31
6.5 AC Characteristics—Read-Only
Operations—Commercial Temperature.....35
6.6 AC Characteristics—Write Operations—
Commercial Temperature..........................37
6.7 Block Erase, Program, and Lock-Bit Configuration Performance—Commercial
Temperature..............................................39
6.8 Extended Temperature Operating
Conditions.................................................40
6.9 DC Characteristics—Extended
Temperature..............................................40
6.10 AC Characteristics—Read-Only Operations
— Extended Temperature.........................40
7.0 ORDERING INFORMATION..........................41
8.0 ADDITIONAL INFORMATION.......................42
5.0 DESIGN CONSIDERATIONS........................28
5.1 Three-Line Output Control..........................28
5.2 RY/BY# Hardware Detection......................28
5.3 Power Supply Decoupling..........................28
Trace on Printed Circuit Boards...........28
5.4 V
PP
, VPP, RP# Transitions .........................28
5.5 V
CC
5.6 Power-Up/Down Protection........................28
Program and Erase Voltages on Sub-
5.7 V
PP
0.4µ SC Memory Family............................29
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BYTE-WIDE SmartVoltage FlashFile™ MEMORY FAMILY E

REVISION HISTORY

Number Description
-001 Original version
-002 Table 3 revised to reflect change in abbreviations from “W” for write to “P” for program.
-003 Added µBGA* CSP pinout and corrected error in PSOP pinout.
Ordering information graphic (Appendix A) corrected: from PB = Ext. Temp. 44-Lead PSOP to TB = Ext. Temp. 44-Lead PSOP. Corrected nomenclature table (Appendix A) to reflect actual Operating Temperature/ Package information Updated Ordering Information and table Correction to table, Section 6.2.3. Under I or GND, corrected to V
= VCC or GND
OUT
Test Conditions, previously read VIN = V
LO
Section 6.2.7, modified Program and Block Erase Suspend Latency Times
Added Design Consideration for V
Program and Erase Voltages on future sub-0.4µ
PP
devices.
CC
4
PRELIMINARY
E BYTE-WIDE SmartVoltage FlashFile™ MEMORY FAMILY
Voltage Combinations

1.0 INTRODUCTION

This datasheet contains 4-, 8-, and 16-Mbit SmartVoltage FlashFile memory specifications. Section 1.0 provides a flash memory overview. Sections 2.0, through 5.0 describe the memory organization and functionality. Section 6.0 covers electrical specifications for commercial and extended temperature product offerings. Section
7.0 contains ordering informat ion. Finally, the by te­wide SmartVoltage FlashFile memory family documentation also incl udes application notes and design tools which are referenced in Section 8.0.

1.1 New Features

The byte-wide SmartVoltage FlashFile memory family maintains backwards-compatibility with
Intel’s 28F008SA and 28F008SA-L. Key enhancements include:
SmartVoltage Technology
Enhanced Suspend Capabilities
In-System Block Locking
They share a compatible status register, software commands, and pinouts. These similarities enable a clean upgrade from the 28F008SA and 28F008SA-L to byte-wide SmartVoltage FlashFile products. When upgrading, it is important to note the following differences:
Because of new feature and density options, the devices have different device identifier codes. This allows for software optimization.
V
To take advantage of SmartVoltage tech-
For more details see application note
28F008SC Compatibility with 28F008SA
number 292180)
has been lowered from 6.5 V to 1.5 V to
PPLK
support low V program, and lock-bit configuration operations. Designs that switch V operations should transition V
nology, allow V
voltages during block erase,
PP
off during read
PP
to GND.
PP
connection to 3.3 V or 5 V.
PP
.
AP-625,
(order

1.2 Product Overview

The byte-wide SmartVoltage FlashFile memory family provides density upgrades with pinout compatibility for the 4-, 8-, and 16-Mbit densities. The 28F004SC, 28F008SC, and 28F016SC are high-performance memories arranged as 512 Kbyte, 1 Mbyte, and 2 Mbyte of 8 bits. This data is grouped in eight, sixteen, and thirty-two 64-Kbyte blocks which are individually erasable, lockable, and unlockable in-system. Figure 4 illustrates the memory organization.
SmartVoltage technology enables fast factory programming and low-power designs. These components support read operations at 2. 7 V (read­only), 3.3 V, and 5 V V program operations at 3.3 V, 5 V, and 12 V V The 12 V V and erase performance which will increase your factory throughput. With the 3.3 V and 5 V V option, VCC and VPP can be tied together for a simple and voltage flexible design. This voltage flexibility is key for removable media that need to operate in a 3 V to 5 V system. In addition, the dedicated V when V
NOTE:
1. Block erase, program, and lock-bit configuration operation with V
Internal VCC and VPP detection circuitry automatically configures the device for optimum performance.
A Command User Interface (CUI) serves as the interface between the system processor and internal operation of the device. A valid command sequence written to the CUI initiates device automation. An internal Write State Machine (WSM) automatically executes the algorithms and timings necessary for block erase, program, and lock-bit configuration operations.
option renders the fastest program
PP
pin gives complete data protection
PP
V
PP
V
CC
VCC Voltage VPP Voltage
2.7 V
.
PPLK
Table 1. SmartVoltage Flash
and V
PP
(1)
3.3 V 3.3 V, 5 V, 12 V 5 V 5 V, 12 V
, 3.0 V are not supported.
CC
and block erase and
CC
PP
PP
.
PRELIMINARY
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BYTE-WIDE SmartVoltage FlashFile™ MEMORY FAMILY E
A block erase operation erases one of the device’s 64-Kbyte blocks typically within 1 second (5 V V
, 12 V VPP), independent of other blocks.
CC
Each block can be independently erased 100,000 times (1.6 million block erases per device). A block erase suspend operation allows system software to suspend block erase to read data f rom or write data to any other block.
Data is programmed in byte increments typically within 6 µs (5 V V
, 12 V VPP). A program
CC
suspend operation permits system software to read data or execute code from any other flash memory array location.
To protect programmed data, each block can be locked. This block locking mechanism uses a combination of bits, block lock-bits and a master lock-bit, to lock and unlock individual blocks. The block lock-bits gate block erase and program operations, while the master lock-bit gates block lock-bit configuration operations. Lock-bit config­uration operations (Set Bloc k Lock-Bit, Set M aster Lock-Bit, and Clear Bloc k Loc k-Bit s c ommands) set and clear lock-bits.
The status register and RY/BY# output indicate whether or not the device is busy executing or ready for a new command. Polling the status register, system software retrieves WSM feedback. The RY/BY# output gives an additional indicator of WSM activity by provi ding a hardware st atus s ignal. Like the status register, RY/BY#-low indicates that
the WSM is performing a bl ock erase, program, or lock-bit configuration operation. RY/BY#-high indicates that the WSM is ready for a new command, block erase is s uspended (and program is inactive), program i s suspended, or t he device i s in deep power-down mode.
The Automatic Power Savings (APS) feature substantially reduces active current when the device is in stati c mode (addresses not switching). In APS mode, the typical I 5 V V
.
CC
When CE# and RP# pins are at V
current is 1 mA at
CCR
CC
, the component enters a CMOS s tandby mode. Driving RP# to GND enables a deep power-down mode which significantly reduces power consumption, provides write protection, resets the device, and clears the status register. A reset time (t
PHQV
) is required from RP# switching high until output s are valid. Likewise, t he device has a wake time (t
PHEL
from RP#-high until writes to the CUI are recognized.

1.3 Pinout and Pin Description

The family of devices is avail able in 40-lead TSOP (Thin Small Outline Package, 1.2 mm thick) and 44-lead PSOP (Plastic Small Outline Pac kage) and 40-bump µ BGA* CSP (28F008SC and 28F016SC only). Pinouts are shown in Figures 2, 3 and 4.
)
6
PRELIMINARY
E BYTE-WIDE SmartVoltage FlashFile™ MEMORY FAMILY
DQ - DQ
07
Input
Buffer
Command
Register
Write State
Machine
I/O Logic
Program/Erase Voltage Switch
V
CC
CE# WE# OE# RP#
RY/BY# V
PP
V
CC
GND
4-Mbit: A - A ,
0
18
8-Mbit: A - A ,
19
0
16-Mbit: A - A
020
Input
Buffer
Address
Latch
Address Counter
Y
Decoder
X
Decoder
Output Buffer
Identifier Register
Status
Register
Data
Comparator
Y Gating
4-Mbit: Eight
8-Mbit: Sixteen
16-Mb it: Thirty-Two
64-Kbyte Blocks

Figure 1. Block Diagram

Table 2. Pin Descriptions

Sym Type Name and Function
A0–A
DQ0–DQ7INPUT/
INPUT ADDRESS INPUTS: Inputs for addresses during read and write operations.
20
Addresses are internally latched during a write cycle. 4 Mbit A
16 Mbit A0–A
8 Mbit A0–A
–A
0
20
DATA INPUT/OUTPUTS: Inputs data and commands during CUI write cycles;
OUTPUT
outputs data during memory array, status register, and identifier code read cycles. Data pins float to high-impedance when the chip is deselected or outputs are disabled. Data is internally latched during a write cycle.
CE# INPUT CHIP ENABLE: Activates the device’s control logic, input buffers, decoders, and
sense amplifiers. CE#-high deselects the device and reduces power consumption to standby levels.
RP# INPUT RESET/DEEP POWER-DOWN: When driven low, RP# inhibits write operations
which provides data protection during power transitions, puts the device in deep power-down mode, and resets internal automation. RP#-high enables normal operation. Exit from deep power-down sets the device to read array mode.
RP# at V lock-bits when the master lock-bit is set. RP# = V
enables setting of the master lock-bit and enables configuration of block
HH
overrides block lock-bits,
HH
thereby enabling block erase and program operations to locked memory blocks. Block erase, program, or lock-bit configuration with V
< RP# < VHH produce
IH
spurious results and should not be attempted.
OE# INPUT OUTPUT ENABLE: Gates the device’s outputs during a read cycle.
PRELIMINARY
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BYTE-WIDE SmartVoltage FlashFile™ MEMORY FAMILY E
Table 3. Pin Descriptions (Continued)
Sym Type Name and Function
WE# INPUT WRITE ENABLE: Controls writes to the CUI and array blocks. Addresses and data
RY/BY# OUTPUT READY/BUSY#: Indicates the status of the internal WSM. When low, the WSM is
V
PP
V
CC
SUPPLY BLOCK ERASE, PROGRAM, LOCK-BIT CONFIGURATION POWER SUPPLY:
SUPPLY DEVICE POWER SUPPLY: Internal detection automatically configures the device
GND SUPPLY GROUND: Do not float any ground pins. NC NO CONNECT: Lead is not internally connected; it may be driven or floated.
are latched on the rising edge of the WE# pulse.
performing an internal operation (block erase, program, or lock-bit configuration). RY/BY#-high indicates that the WSM is ready for new commands, block erase or program is suspended, or the device is in deep power-down mode. RY/BY# is always active.
For erasing array blocks, programming data, or configuring lock-bits.
SmartVoltage Flash 3.3 V, 5 V, and 12 V V
With VPP V
, memory contents cannot be altered. Block erase, program, and
PPLK
lock-bit configuration with an invalid V
(see
DC Characteristics
PP
PP
) produce spurious
results and should not be attempted.
for optimized read performance. Do not float any power pins.
SmartVoltage Flash 2.7 V (Read-Only), 3.3 V, and 5 V V
With VCC V
, all write attempts to the flash memory are inhibited. Device
LKO
operations at invalid V
voltages (see
CC
DC Characteristics
) produce spurious
CC
results and should not be attempted. Block erase, program, and lock-bit configuration operations with V
< 3.0 V are not supported.
CC
8
PRELIMINARY
E BYTE-WIDE SmartVoltage FlashFile™ MEMORY FAMILY
28F016SC 28F008SC
28F004SC
A
19A19
A
18
A
17
A
16
A
15
A
14
A
13
A
12
CE# V
CC
V
PP
RP#
A
11
A
10
A
9
A
8
A
7
A
6
A
5
A
4
A A A A A A
A CE# V
V
RP#
A
A
A
A
A
A
A
A
NC A
18
18
A
17
17
A
16
16
A
15
15
A
14
14
A
13
13
A
12
12
CE#
V
CC
CC
V
PP
PP
RP#
A
11
11
A
10
10
A
9
9
A
8
8
A
7
7
A
6
6
A
5
5
A
4
4
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20
40-LEAD TSOP
STANDARD PINOUT
10 mm x 20 mm
TOP VIEW
40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25 24 23 22 21
NC
NC WE# OE#
RY/BY#
DQ
7
DQ
6
DQ
5
DQ
4
V
CC
GND GND
DQ
3
DQ
2
DQ
1
DQ
0
A
0
A
1
A
2
A
3
WE# OE#
RY/BY#
DQ
DQ
DQ
DQ
V
GND GND
DQ DQ DQ
DQ

Figure 2. TSOP 40-Lead Pinout

NC NC
A A A A
A
20
NC
WE#
OE#
RY/BY#
DQ
7
7
DQ
6
6
DQ
5
5
DQ
4
4
V
CC
CC
GND GND
DQ
3
3
DQ
2
2
DQ
1
1
DQ
0
0
A
0
0
A
1
1
A
2
2
A
3
3
PRELIMINARY
9
BYTE-WIDE SmartVoltage FlashFile™ MEMORY FAMILY E
10

Figure 3. PSOP 44-Lead Pinout

PRELIMINARY
E BYTE-WIDE SmartVoltage FlashFile™ MEMORY FAMILY
87654321
A
A
Pin #1
Indicator
A
B
C
D
E
A
7
A
6
A
4
A
2
A
1
12345678
A
17
A
18
NC RY/BY# A
WE#
OE# D
RP# V
9
A
A
10
A
5
A
0
D
D
0
PP
CE# A
11
3
1
2
8
D3GNDD
GND D
Bottom View - Bump Side Up
A
A
15
A
16
D
6
7
V
12
CC
A
D
14
19
4
5
13
NC A
GNDD
V
CC
V
CC
13
NCA
V
CC
A
12
A
14
A
19
D
4
5
V
PP
CE#A
8
D
3
GND D
A
A
A
RY/BY#A
17
15
A
18
16
A
20
D6WE#
OE#D
7
RP# A
A
9
A
A
A
D
10
11
A
3
5
A
0
1
D
2
0
B
C
D
E
7
A
6
A
4
A
2
A
1
Top View - Bump Side Down
This is the view of the package as surface mounted on the board.
Note that the signals are mirror images of bottom view.
NOTES:
1. Figures are not drawn to scale.
2. Address A20 is not included in the 28F008SC.
3. More information on µBGA* packages is available by contacting your Intel/Distribution sales office.

Figure 4. µBGA* CSP 40-Ball Pinout (28F008SC and 28F016SC)

PRELIMINARY
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BYTE-WIDE SmartVoltage FlashFile™ MEMORY FAMILY E

2.0 PRINCIPLES OF OPERATION

The byte-wide SmartVoltage FlashFile memories include an on-chip WSM to manage block erase, program, and lock-bit configuration functions. It allows for: 100% TTL-level control inputs, fixed power supplies during block erasure, program, and lock-bit configuration, and minimal processor overhead with RAM-like interface timings.
After initial device power-up or return from deep power-down mode (see Bus Operations), the device defaults to read array mode. Mani pulation of external memory control pins allow array read, standby, and output disable operations.
Status register and identifier codes can be accessed through the CUI independent of the V
PP
voltage. High voltage on VPP enables successful block erasure, program, and lock-bit c onfiguration. All functions associated with altering memory contents—block erase, program, lock-bit
configuration, status, and identifier codes—are accessed via the CUI and verified through the status register.
Commands are written using standard micro­processor write timings . The CUI c ontents s erve as input to the WSM that controls block erase, program, and lock-bit configuration operat ions. The internal algorithms are regulated by the WSM, including pulse repetition, internal verification, and margining of data. Addresses and data are internally latched during write cycles. Writing the appropriate command outputs array data, acces ses the identifier codes, or outputs status register data.
Interface software that initiates and polls progress of block erase, program, and lock-bit configuration can be stored in any block. This code is c opied to and executed from system RAM during flash memory updates. After successful completion, reads are again possible via the Read Array command. Block erase suspend allows system software to suspend a block erase to read or write data from any other block. Program sus pend allows system software to suspend a program to read data from any other flash memory array location.
1FFFFF
1F0000
1EFFFF
1E0000
1DFFFF
1D0000
1CFFFF
1C0000
1BFFFF
1B0000
1AFFFF
1A0000
19FFFF
190000
18FFFF
180000
17FFFF
170000
16FFFF
160000
15FFFF
150000
14FFFF
140000
13FFFF
130000
12FFFF
120000
11FFFF
110000
10FFFF
100000
0FFFFF
0F0000
0EFFFF
0E0000
0DFFFF
0D0000
0CFFFF
0C0000
0BFFFF
0B0000
0AFFFF
0A0000
09FFFF
090000
08FFFF
080000
07FFFF
070000
06FFFF
060000
05FFFF
050000
04FFFF
040000
03FFFF
030000
02FFFF
020000
01FFFF
010000
00FFFF
000000
64-Kbyte Block
64-Kbyte Block 64-Kbyte Block 64-Kbyte Block 64-Kbyte Block 64-Kbyte Block
64-Kbyte Block
64-Kbyte Block 64-Kbyte Block 64-Kbyte Block 64-Kbyte Block 64-Kbyte Block 64-Kbyte Block
64-Kbyte Block
64-Kbyte Block 64-Kbyte Block 64-Kbyte Block 64-Kbyte Block 64-Kbyte Block
64-Kbyte Block
64-Kbyte Block 64-Kbyte Block 64-Kbyte Block 64-Kbyte Block 64-Kbyte Block 64-Kbyte Block
64-Kbyte Block
64-Kbyte Block 64-Kbyte Block 64-Kbyte Block 64-Kbyte Block 64-Kbyte Block
31 30 29 28 27 26 25 24 23 22 21 20 19 18 17 16 15 14 13 12 11 10
9 8 7 6 5 4
4-Mbit
3 2 1 0
16-Mbit
8-Mbit
12

Figure 5. Memory Map

PRELIMINARY
E BYTE-WIDE SmartVoltage FlashFile™ MEMORY FAMILY

2.1 Data Protection

Depending on the application, the system designer may choose to make the V switchable (available only when memory block erases, programs, or lock-bit configurations are required) or hardwired to V accommodates either design practice and encourages optimization of the processor-memory interface.
When V altered. When high voltage is applied to V two-step block erase, program, or lock-bit configuration command sequences provides pro­tection from unwanted operations. All write functions are disabled when V the write lockout voltage V V
IL
additional protection from i nadvertent code or data alteration by gating erase and program operations.
V
PP
. The device’s block locking capability provides
, memory contents cannot be
PPLK
power supply
PP
. The device
PPH1/2/3
voltage is below
CC
or when RP# is at
LKO
PP
, the

3.0 BUS OPERATION

The local CPU reads and writes flash memory in-system. All bus cycles to or from the flash memory conform to standard microprocessor bus cycles.

3.1 Read

3.2 Output Disable

With OE# at a logic-high level (VIH), the device outputs are disabled. Output pins DQ placed in a high-impedance state.
–DQ7 are
0

3.3 Standby

CE# at a logic-high level (VIH) places the device in standby mode which substantially reduces device power consumption. DQ in a high-impedance state independent of OE#. If deselected during block erase, program, or lock-bit configuration, the device continues functioning and consuming active power until the operation completes.
–DQ7 outputs are placed
0

3.4 Deep Power-Down

RP# at VIL initiates the deep power-down mode. In read mode, RP#-low deselects the memory,
places output drivers in a high-impedance state, and turns off all internal c ircuits. RP# mus t be held low for time t return from power-down until initial m emory access outputs are valid. After this wake-up interval, normal operation is restored. The CUI resets to read array mode, and the status register is set to 80H.
PLPH
. Time t
is required after
PHQV
Block information, i dentifier codes, or stat us register can be read independent of the V can be at either V
The first task is to write the appropri ate read-mode command (Read Array, Read Identifier Codes, or Read Status Register) to the CUI. Upon initial device power-up or after exit from deep power­down mode, the device automati cally resets to read array mode. Four control pins dictate the data flow in and out of the component: CE#, OE#, WE#, and RP#. CE# and OE# must be driven active to obtai n data at the outputs. CE# is the device selection control, and when active enables the selected memory device. OE# is the data out put (DQ control and when active drives the selected memory data onto the I/O bus . WE # mus t be at V and RP# must be at VIH or VHH. Figure 18 illustrates a read cycle.
or VHH.
IH
voltage. RP#
PP
0
–DQ7)
PRELIMINARY
During block erase, program, or lock-bit configuration, RP#-low will abort the operation. RY/BY# remains low until the reset operation is complete. Memory contents being altered are no longer valid; the data may be partially erased or written. Time t logic-high (V written.
As with any automated device, it is important to assert RP# during system reset. When the system comes out of reset, i t ex pect s t o read from t he flas h memory. Automated flash memori es provide status information when accessed during block erase, program, or lock-bit confi guration modes. If a CPU reset occurs with no flash memory reset, proper CPU initialization m ay not occur because the flas h
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memory may be providing status information instead of array data. Int el’s flash memories allow proper CPU initialization following a system reset through the use of the RP# input. In this application, RP# is controlled by the same RESET# signal that resets the system CPU.
is required after RP# goes to
PHWL
) before another command can be
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