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BY ESTOPPEL OR OTHERWISE, TO ANY INTELLECTUAL PROPERTY RIGHTS IS GRANTED BY THIS DOCUMENT. EXCEPT AS
PROVIDED IN INTEL'S TERMS AND CONDITIONS OF SALE FOR SUCH PRODUCTS, INTEL ASSUMES NO LIABILITY WHATSOEVER,
AND INTEL DISCLAIMS ANY EXPRESS OR IMPLIED WARRANTY, RELATING T O SALE AND/OR USE OF INTEL PRODUCT S INCLUDING
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PATENT, COPYRIGHT OR OTHER INTELLECTUAL PROPERTY RIGHT. Intel products are not intended for use in medical, life savin g, or
life sustaining applications.
Intel may make changes to specifications and product descriptions at any time, without notice.
Designers must not rely on the absence or characteristics of any features or instructions marked “reserved” or “undefined.” Intel
reserves these for future definition and shall have no responsibility whatsoev er for conflicts or incompatibilities arising from future
changes to them.
The Intel® Xeon® processor 5500 series and LGA1366 socket may contain design defects or errors known as errata which may
cause the product to deviate from published specifications. Current characterized errata are available on request.
Contact your local Intel sales office or your distributor to obtain the latest specifications and before placing your product order.
Intel processor numbers are not a measure of performance. Processor numb ers differentia te features withi n each processo r family,
not across different processor families. See http://www.intel.com/products/processor_number for details. Over time processor
numbers will increment based on changes in clock, speed, cache, FSB, or other features, and increments are not intended to
represent proportional or quantitative increases in any particular feature. Current roadmap processor number progression is not
necessarily representative of future roadmaps. See www.intel.com/products/processor_number for details.
Intel® Turbo Boost Technology requires a PC with a processor with Intel Turbo Boost Technology capability. Intel Turbo Boost
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Document NumberRevision Number DescriptionRevision Date
321323001Public ReleaseMarch 2009
§
Thermal/Mechanical Design Guide7
8Thermal/Mechanical Design Guide
Introduction
1Introduction
This document provides guidelines for the design of thermal and mechanical solutions
for 2-socket server and 2-socket Workstation processors in the Intel® Xeon® 5500
Platform. The processors covered include those listed in the Intel® Xeon® Processor 5500 Series Datasheet, Volume 1 and the follow-on processors. The design guidelines
apply to the follow-on processors in their current stage of development and are not
expected to change as they mature. The components described in this document
include:
• The processor thermal solution (heatsink) and associated retention hardware.
• The LGA1366 socket and the Independent Loading Mechanism (ILM) and back
plate.
Processors in 1-socket Workstation platforms are covered in the Intel® Xeon®
Processor 3500 Series Thermal/Mechanical Design Guide.
• To assist board and system thermal mechanical designers.
• To assist designers and suppliers of processor heatsinks.
Thermal profiles and other processor specifications are provided in the Datasheet.
Thermal/Mechanical Design Guide9
1.1References
Material and concepts available in the following documents may be beneficial when
reading this document.
Table 1-1.Reference Documents
DocumentLocationNotes
European Blue Angel Recycling Standards2
Intel® Xeon® Processor 5500 Series Datasheet, Volume 13213211
Intel® Xeon® Processor 5500 Series Mechanical Model3213261
Intel® Xeon® Processor 5500 Series Thermal Model3213271
Entry-level Electronics Bay Specification3
Notes:
1.Document numbers indicated in Location column are subject to change. See the appropriate Electronic
Design Kit (EDK) for the most up-to-date Document number.
2.Available at http://www.blauer-engel.de
3.Available at http://ssiforum.oaktree.com/
Introduction
1.2Definition of Terms
Table 1-2.Terms and Descriptions (Sheet 1 of 2)
TermDescription
BypassBypass is the area between a passive heatsink and any object that can act to form a
DTSDigital Thermal Sensor reports a relative die temperature as an offset from TCC
FSCFan Speed Control
IHSIntegrated Heat Spreader: a component of the processor pac k age used to enhance the
ILMIndependent Loading Mechanism provides the force needed to seat the 1366-LGA land
LGA1366 socketThe processor mates with the system board through this surface mount, 1366-contact
PECIThe Platform Environment Control Interface (PECI) is a one- wire in terface that pro vides
Ψ
CA
Ψ
CS
Ψ
SA
T
CASE
T
CASE_MAX
TCCThermal Control Circuit: Thermal monitor uses the TCC to reduce the die temperature
duct. For this example, it can be expressed as a dimension away from the outside
dimension of the fins to the nearest surface.
activation temperature.
thermal performance of the package. Component thermal solutions interface with the
processor at the IHS surface.
package onto the socket contacts.
socket.
a communication channel between Intel processor and chipset components to external
monitoring devices.
Case-to-ambient thermal characterization parameter (psi). A measure of thermal
solution performance using t otal package power. Defined as (T
Package Power. Heat source should always be specified for Ψ measurements.
Case-to-sink thermal characterization parameter. A measure of thermal interface
material performance using total package po wer. Defined as (T
Package Power.
Sink-to-ambient thermal characterization parameter. A measure of heatsink thermal
performance using total package power. Defined as (T
The case temperature of the processo r measured at the geom etric ce nter of the t opside
of the IHS.
The maximum case temperature as specified in a component specification.
by using clock modulation and/or operating frequency and input voltage adjustment
when the die temperature is very near its operating limits.
– TLA) / Total
CASE
– TS) / Total
CASE
– TLA) / Total Package Power.
S
10Thermal/Mechanical Design Guide
Introduction
Table 1-2.Terms and Descriptions (Sheet 2 of 2)
TermDescription
T
CONTROL
TDPThermal Design Power: Thermal solution should be designed to dissipate this target
Thermal MonitorA power reduction feature designed to decrease temperature after the processor has
Thermal ProfileLine that defines case temperature specification of a processor at a given power level.
TIMThermal Interface Material: The thermally conductive compound between the heatsink
T
LA
T
SA
UA unit of measure used to define server rack spacing height. 1U is equal to 1.75 in, 2U
T
control.
power level. TDP is not the maximum power that the processor can dissipate.
reached its maximum operating temperature.
and the processor case. This material fills the air gaps and voids, and enhances the
transfer of the heat from the processor case to the heatsink.
The measured ambient temperature locally surrounding the proces sor. The ambient
temperature should be measured just upstream of a p assive he atsink or at the fan inle t
for an active heatsink.
The system ambient air temperature external to a system chassis. This temperature is
usually measured at the chassis air inlets.
equals 3.50 in, etc.
is a static value below TCC activation used as a trigger point for fan speed
CONTROL
§
Thermal/Mechanical Design Guide11
Introduction
12Thermal/Mechanical Design Guide
LGA1366 Socket
2LGA1366 Socket
This chapter describes a surface mount, LGA (Land Grid Array) socket intended for
processors in the Intel® Xeon® 5500 Platform. The socket provides I/O, power and
ground contacts. The socket contains 1366 contacts arrayed about a cavity in the
center of the socket with lead-free solder balls for surface mounting on the
motherboard.
The socket has 1366 contacts with 1.016 mm X 1.016 mm pitch (X by Y) in a
43x41 grid array with 21x17 grid depopulation in the center of the array and selective
depopulation elsewhere.
The socket must be compatible with the package (processor) and the Independent
Loading Mechanism (ILM). The design includes a back plate which is integral to having
a uniform load on the socket solder joints. Socket loading specifications are listed in
Chapter 4.
Figure 2-1. LGA1366 Socket with Pick and Place Cover Removed
packagesocket
package
cavity
cavity
socket
Thermal/Mechanical Design Guide13
Figure 2-2. LGA1366 Socket Contact Numbering (Top View of Socket)
AP
AN
AM
AL
AK
AJ
AH
AG
AF
AE
AD
AC
AB
AA
Y
W
V
U
T
R
P
N
M
L
K
J
H
G
F
E
D
C
B
A
31 29 27 25 23 21 19 17 15 13 11 9 7 5
32 30 28 26 24 22 20 18 16 14 12 10 8 6 4
AR
AU
AT
LGA1366 Socket
BA
AY
AW
AV
43 41 39 37 35 33 31 29 27 25 23 21 19 17 15 13
42 40 38 36 34 32 30 28 26 24 22 20 18 16 14 12
BA
AY
AW
AV
AU
AT
AR
AP
AN
AM
AL
AK
AJ
AH
AG
AF
AE
AD
AC
AB
AA
Y
W
V
U
T
R
P
N
M
L
K
J
H
G
F
E
D
C
B
A
14Thermal/Mechanical Design Guide
LGA1366 Socket
2.1Board Layout
The land pattern for the LGA1366 socket is 40 mils X 40 mils (X by Y), and the pad size
is 18 mils. Note that there is no round-off (conversion) error between socket pitch
(1.016 mm) and board pitch (40 mil) as these values are equivalent.
Figure 2-3. LGA1366 Socket Land Pattern (Top View of Board)
A C E GJL N R U W AA AC AE AG AJ AL AN AR AU AW BA
B D F HK M PT V Y AB AD AF AH AK AM AP AT AV AY
32
32
31
31
30
30
29
29
28
28
27
27
26
26
25
25
24
24
23
23
22
22
21
21
20
20
19
19
18
18
17
17
16
16
15
15
14
14
13
13
12
12
11
11
10
10
9
9
8
8
7
7
6
6
5
5
4
4
3
3
2
2
1
1
A C E GJ LN R U W AA AC AE AG AJ AL AN AR AU AW BA
B D FH K M PTV Y AB AD AF AH AK AM AP AT AV AY
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
16
15
14
13
12
Thermal/Mechanical Design Guide15
2.2Attachment to Motherboard
The socket is attached to the motherboard by 1366 solder balls. There are no additional
external methods (that is, screw, extra solder, adhesive, and so on) to attach the
socket.
As indicated in Figure 2-4, the Independent Loading Mechanism (ILM) is not present
during the attach (reflow) process.
Figure 2-4. Attachment to Motherboard
LGA1366 Socket
ILM
LGA 1366 Socket
2.3Socket Components
The socket has two main components, the socket body and Pick and Place (PnP) cover,
and is delivered as a single integral assembly. Refer to Appendix C for detailed
drawings.
2.3.1Socket Body Housing
The housing material is thermoplastic or equivalent with UL 94 V -0 flame rating capable
of withstanding 260 °C for 40 seconds (typical reflow/rework). The socket coefficient of
thermal expansion (in the XY plane), and creep properties, must be such that the
integrity of the socket is maintained for the conditions listed in the LGA1366 Socket
Validation Re ports.
The color of the housing will be dark as compared to the solder balls to provide the
contrast needed for pick and place vision systems.
2.3.2Solder Balls
A total of 1366 solder balls corresponding to the contacts are on the bottom of the
socket for surface mounting with the motherboard.
The socket has the following solder ball material:
• Lead free SAC (SnAgCu) solder alloy with a silver (Ag) content between 3% and
4% and a melting temperature of approximately 217 °C. The alloy must be
compatible with immersion silver (ImAg) motherboard surface finish and a SAC
alloy solder paste.
16Thermal/Mechanical Design Guide
LGA1366 Socket
The co-planarity (profile) and true position requirements are defined in Appendix C.
2.3.3Contacts
Base material for the contacts is high strength copper alloy.
For the area on socket contacts where processor lands will mate, there is a 0.381 μm
No contamination by solder in the contact area is allowed during solder reflow.
2.3.4Pick and Place Cover
The cover provides a planar surface for vacuum pick up used to place components in
the Surface Mount Technology (SMT) manufacturing line. The cover remains on the
socket during reflow to help prevent contamination during reflow. The cover can
withstand 260 °C for 40 seconds (typical reflow/rework profile) and the conditions
listed in the LGA1366 Socket Validation Reports without degrading.
As indicated in Figure 2-5, the cover remains on the socket during ILM installation, and
should remain on whenever possible to help prevent damage to the socket contacts.
Cover retention must be sufficient to support the socket weight during lifting,
translation, and placement (board manufacturing), and during board and system
shipping and handling.
The covers are designed to be interchangeable between socket suppliers. As indicated
in Figure 2-5, a Pin1 indicator on the cover provides a visual reference for proper
orientation with the socket.
Figure 2-5. Pick and Place Cover
ILM
Installation
Pin 1 Pin 1
Thermal/Mechanical Design Guide17
Pick and
Place Cover
2.4Package Installation / Removal
As indicated in Figure 2-6, access is provided to facilitate manual installation and
removal of the package.
To assist in package orientation and alignment with the socket:
• The package Pin1 triangle and the socket Pin1 chamfer provide visual reference for
proper orientation.
• The package substrate has orientation notches along two opposing edges of the
package, offset from the centerline. The socket has two corresponding orientation
posts to physically prevent mis-orientation of the package. These orientation
features also provide initial rough alignment of package to socket.
• The socket has alignment walls at the four corners to provide final alignment of the
package.
See Appendix F for information regard ing a tool designed to provide mechanical
.
Figure 2-6. Package Installation / Removal Features
assistance during processor installation and removal.
LGA1366 Socket
orientation
orientation
notch
notch
alignment
Pin1 triangle
Pin1 triangle
access
access
orientation
orientation
post
post
Pin1 chamfer
Pin1 chamfer
alignment
walls
walls
2.4.1Socket Standoffs and Package Seating Plane
Standoffs on the bottom of the socket base establish the minimum socket height after
solder reflow and are specified in Appendix C.
Similarly, a seating plane on the topside of the socket establishes the minimum
package height. See Section 4.2 for the calculated IHS height above the motherboard.
18Thermal/Mechanical Design Guide
LGA1366 Socket
2.5Durability
The socket must withstand 30 cycles of processor insertion and removal. The max
chain contact resistance from Table 4-4 must be met when mated in the 1st and 30th
cycles.
The socket Pick and Place cover must withstand 15 cycles of insertion and removal.
2.6Markings
There are three markings on the socket:
• LGA1366: Font type is Helvetica Bold - minimum 6 point (2.125 mm).
• Manufacturer's insignia (font size at supplier's discretion).
• Lot identification code (allows traceability of manufacturing date and location).
All markings must withstand 260 °C for 40 seconds (typical reflow/rework profile)
without degrading, and must be visible after the socket is mounted on the
motherboard.
LGA1366 and the manufacturer's insignia are molded or laser marked on the side wall.
2.7Component Insertion Forces
Any actuation must meet or exceed SEMI S8-95 Safety Guidelines for Ergonomics/
Human Factors Engineering of Semiconductor Manu facturing Equipment, example Table
R2-7 (Maximum Grip Forces). The socket must be designed so that it requires no force
to insert the package into the socket.
2.8Socket Size
Socket information needed for motherboard design is given in Appendix C.
This information should be used in conjunction with the reference motherboard keep-
out drawings provided in Appendix B to ensure compatibility with the reference thermal
mechanical components.
Thermal/Mechanical Design Guide19
2.9LGA1366 Socket NCTF Solder Joints
Intel has defined selected solder joints of the socket as non-critical to function (NCTF)
for post environmental testing. The processor signals at NCTF locations are typically
redundant ground or non-critical reserved, so the loss of the solder joint continuity at
end of life conditions will not affect the overall product functionality. Figure 2-7
.
Figure 2-7. LGA1366 NCTF Solder Joints
identifies the NCTF solder joints.
A C EGJL NRU W AA AC AE AG AJ AL AN AR AU AW BA
BD FHK M PTVY AB AD AF AH AK AM AP AT AV AY
32
32
31
31
30
30
29
29
28
28
27
27
26
26
25
25
24
24
23
23
22
22
21
21
20
20
19
19
18
18
17
17
16
16
15
15
14
14
13
13
12
12
11
11
10
10
9
9
8
8
7
7
6
6
5
5
4
4
3
3
2
2
1
1
A C EGJL NR U W AA AC AE AG AJ AL AN AR AU AW BA
B D FHK M PTVY AB AD AF AH AK AM AP AT AV AY
LGA1366 Socket
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
16
15
14
13
12
Note:For platforms supporting the DP processor land C3 is CTF.
20Thermal/Mechanical Design Guide
§
Independent Loading Mechanism (ILM)
3Independent Loading
Mechanism (ILM)
The Independent Loading Mechanism (ILM) provides the force needed to seat the
1366-LGA land package onto the socket contacts. The ILM is physically separate from
the socket body. The assembly of the ILM to the board is expected to occur after wave
solder. The exact assembly location is dependent on manufacturing preference and test
flow.
Note:The ILM has two critical functions: deliver the force to seat the processor onto the
socket contacts and distribute the resulting compressive load evenly through the socket
solder joints.
Note:The mechanical design of the ILM is integral to the overall functionality of the LGA1366
socket. Intel performs detailed studies on integration of processor package, socket and
ILM as a system. These studies directly impact the design of the ILM. The Intel
reference ILM will be “build to print” from Intel controlled drawings. Intel recommends
using the Intel Reference ILM. Custom non-Intel ILM designs do not benefit from Intel's
detailed studies and may not incorporate critical design parameters.
3.1Design Concept
The ILM consists of two assemblies that will be procured as a set from the enabled
vendors. These two components are ILM cover assembly and back plate.
3.1.1ILM Cover Assembly Design Overview
The ILM Cover assembly consists of four major pieces: load lever, load plate, frame and
the captive fasteners.
The load lever and load plate are stainless steel. The frame and fasteners are high
carbon steel with appropriate plating. The fasteners are fabricated from a high carbon
steel. The frame provides the hinge locations for the load lever and load plate.
The cover assembly design ensures that once assembled to the back plate and the load
lever is closed, the only features touching the board are the captive fasteners. The
nominal gap of the frame to the board is ~1 mm when the load plate is closed on the
empty socket or when closed on the processor package.
When closed, the load plate applies two point loads onto the IHS at the “dimpled”
features shown in Figure 3-1. The reaction force from closing the load plate is
transmitted to the frame and through the captive fasteners to the back plate. Some of
the load is passed through the socket body to the board inducing a slight compression
on the solder joints.
Thermal/Mechanical Design Guide21
Figure 3-1. ILM Cover Assembly
Load Lever
Load Lever
Load Plate
Load Plate
Independent Loading Mechanism (IL M )
Captive Fastener (4x)
Captive Fastener (4x)
Frame
Frame
3.1.2ILM Back Plate Design Overview
The unified back plate for 2-socket server and 2-socket Workstation products consists
of a flat steel back plate with threaded studs for ILM attach, and internally threaded
nuts for heatsink attach. The threaded studs have a smooth surface feature that
provides alignment for the back plate to the motherboard for proper assembly of the
ILM around the socket. A clearance hole is located at the center of the plate to allow
access to test points and backside capacitors. An additional cut-out on two sides
provides clearance for backside voltage regulator components. An insulator is preapplied.
Back plates for processors in 1-socket Workstation platforms are covered in the
Intel® Xeon® Processor 3500 Series Thermal/Mechanical Design Guide.
22Thermal/Mechanical Design Guide
Independent Loading Mechanism (ILM)
Figure 3-2. Back Plate
t
t
t
u
u
u
C
C
C
t
t
t
u
u
u
o
o
o
-
-
-
Threaded studs
Threaded studs
Threaded studs
Clearance hole
Clearance hole
Clearance hole
Threaded nuts
Threaded nuts
Threaded nuts
3.2Assembly of ILM to a Motherboard
The ILM design allows a bottoms up assembly of the components to the board. In
step 1, (see Figure 3-3), the back plate is placed in a fixture. Holes in the motherboard
provide alignment to the threaded studs. In step 2, the ILM cover assembly is placed
over the socket and threaded studs. Using a T20 Torx* driver fasten the ILM cover
assembly to the back plate with the four captive fasteners. Torque to 8 ± 2 inchpounds. The length of the threaded studs accommodate board thicknesses from
0.062” to 0.100”.
Thermal/Mechanical Design Guide23
.
Figure 3-3. ILM Assembly
Independent Loading Mechanism (IL M )
Step 1: W ith so c k et b ody reflowe d on
Step 1: W ith so c k et b ody reflowe d on
board, and back plate in fixture, align
board, and back plate in fixture, align
board holes to back plate studs.
board holes to back plate studs.
Step 2: With back plate against bottom of
Step 2: With back plate against bottom of
board, align ILM cover assembly to back
board, align ILM cover assembly to back
plate studs.
plate studs.
24Thermal/Mechanical Design Guide
Independent Loading Mechanism (ILM)
As indicated in Figure 3-4, socket protrusion and ILM key features prevent 180-degree
rotation of ILM cover assembly with respect to the socket. The result is a specific Pin 1
orientation with respect to the ILM lever.
Figure 3-4. Pin1 and ILM Lever
Protrusion
ILM Key
ILM
Lever
Pin 1
§
Thermal/Mechanical Design Guide25
Independent Loading Mechanism (IL M )
26Thermal/Mechanical Design Guide
LGA1366 Socket and ILM Electrical, Mechanical, and Environmental Specifications
4LGA1366 Socket and ILM
Electrical, Mechanical, and
Environmental Specifications
This chapter describes the electrical, mechanical, and environmental specifications for
the LGA1366 socket and the Independent Loading Mechanism.
4.1Component Mass
Table 4-1.Socket Component Mass
ComponentMass
Socket Body, Contacts and PnP Cover15 gm
ILM Cover43 gm
ILM Back Plate for dual processor server products100 gm
4.2Package/Socket Stackup Height
Table 4-2 provides the stackup height of a processor in the 1366-land LGA package and
LGA1366 socket with the ILM closed and the processor fully seated in the socket.
Table 4-2.1366-land Package and LGA1366 Socket Stackup Height
Integrated Stackup Height (mm)
From Top of Board to Top of IHS
Notes:
1.This data is provided for information only , and shou ld be deri v ed from: (a) the h eight of the s ocke t seating
plane above the motherboard after reflow, given in Appendix C, (b) the height of the package, from the
package seating plane to the top of the IHS, and accounting for its nominal variation and tolerances that
are given in the corresponding processor EMTS.
2.This value is a RSS calculation.
7.729 ± 0.282 mm
4.3Socket Maximum Temperature
The power dissipated within the socket is a function of the current at the pin level and
the effective pin resistance. To ensure socket long term reliability, Intel defines socket
maximum temperature using a via on the underside of the motherboard. Exceeding the
temperature guidance may result in socket body deformation, or increases in thermal
and electrical resistance which can cause a thermal runaway and eventual electrical
failure. The guidance for socket maximum temperature is listed below:
• Via temperature under socket < 96 °C
Thermal/Mechanical Design Guide27
LGA1366 Socket and ILM Electrical, Mechanical, and Environmental Specifications
4.4Loading Specifications
The socket will be tested against the conditions listed in the LGA1366 Socket Validation
Reports with heatsink and the ILM attached, under the loading conditions outlined in
this chapter.
Table 4-3 provides load specifications for the LGA1366 socket with the ILM installed.
The maximum limits should not be exceeded during heatsink assembly, shipping
conditions, or standard use condition. Exceeding these limits during test may result in
component failure. The socket body should not be used as a mechanical reference or
load-bearing surface for thermal solutions.
Table 4-3.Socket and ILM Mechanical Specifications
ParameterMinMaxNotes
Static compressive load from ILM cover to
processor IHS
Heatsink Static Compressive Load0 N [0 lbf]266 N [60 lbf]1, 2, 3
Total Static Compressive Load
(ILM plus Heatsink)
Dynamic Compressive Load
(with heatsink installed)
Pick and Place Cover Insertion / Removal forceN/A10.2 N [2.3 lbf]
Load Lever actuation forceN/A38.3 N [8.6 lbf] in the
470 N [106 lbf]623 N [140 lbf]3, 4
470 N (106 lbf)890 N (200 lbf)3, 4
N/A890 N [200 lbf] 1, 3, 5, 6
vertical direction
10.2 N [2.3 lbf] in the
lateral direction.
Notes:
1.These specifications apply to uniform compressive loading in a direction perpendicular to the IHS top
surface.
2.This is the minimum and maximum static force that can be applied by the heatsink and it’s retention
solution to maintain the heatsink to IHS interface. This does not imply the Intel reference TIM is validated
to these limits.
3.Loading limits are for the LGA1366 socket.
4.This minimum limit defines the compress ive forc e required to electrically seat the processor onto the sock et
contacts.
5.Dynamic loading is defined as an 11 ms duration average load superimposed on the static load
requirement.
6.T est condition used a heatsink mass of 550 gm [1.21 lb] with 50 g acceler ation measured at heatsi nk mass.
The dynamic portion of this specification in the product application can have flexibility in specific values, but
the ultimate product of mass times acceleration should not exceed this dynamic load.
4.5Electrical Requirements
LGA1366 socket electrical requirements are measured from the socket-seating plane of
the processor to the component side of the socket PCB to which it is attached. All
specifications are maximum values (unless otherwise stated) for a single socket
contact, but includes effects of adjacent contacts where indicated.
28Thermal/Mechanical Design Guide
LGA1366 Socket and ILM Electrical, Mechanical, and Environmental Specifications
Table 4-4.Electrical Requirements for LGA1366 Socket
ParameterValueComment
Mated loop inductance, Loop
Mated partial mutual inductance, L
Maximum mutual capacitance, C.
Socket Average Contact R esistance
(EOL)
Max Individual Contact Resistance
(EOL)
Bulk Resistance Increase
Dielectric Withstand Voltage
Insulation Resistance
<3.9nH
NA
<1 pF
15.2 mΩ
≤ 100 mΩ
≤ 3 mΩ
360 Volts RMS
800 MΩ
The inductance calculated for two contacts,
considering one forward conductor an d one return
conductor. These values must be satisfied at the
worst-case height of the socket.
The inductance on a contact due to any single
neighboring contact.
The capacitance between two contacts
The socket average contact resistance target is
derived from average of every chain contact
resistance for each part used in testing, with a
chain contact resistance defined as the resistance
of each chain minus resistance of shorting bars
divided by number of lands in the daisy chain.
The specification listed is at room temperature
and has to be satisfied at all time.
Socket Contact Resistance: The resistance of
the socket contact, solderball, and interface
resistance to the interposer land.
The specification listed is at room temperature
and has to be satisfied at all time.
Socket Contact Resistance: The resistance of
the socket contact, solderball, and interface
resistance to the interposer land; gaps included.
The bulk resistance increase per contact from
24 °C to 107 °C
4.6Environmental Requirements
Design, including materials, shall be consistent with the manufacture of units that meet
the following environmental reference points.
The reliability targets in this chapter are based on the expected field use environment
for these products. The test sequence for new sockets will be developed using the
knowledge-based reliability evaluation methodology, which is acceleration factor
dependent. A simplified process flow of this methodology can be seen in Figure 4-1.
Thermal/Mechanical Design Guide29
LGA1366 Socket and ILM Electrical, Mechanical, and Environmental Specifications
Figure 4-1. Flow Chart of Knowledge-Based Reliability Evaluation Methodology
Establish the
market/expected use
environment for the
technology
Develop Speculative
stress conditions based on
historical data, content
experts, and literature
search
Freeze stressing
requirements and perform
additional data turns
Perform stressing to
validate accelerated
stressing assumptions and
determine acceleration
factors
A detailed description of this methodology can be found at: